CN100476415C - 分析和识别制造零件中的缺陷的系统及方法 - Google Patents

分析和识别制造零件中的缺陷的系统及方法 Download PDF

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Publication number
CN100476415C
CN100476415C CNB2004100636333A CN200410063633A CN100476415C CN 100476415 C CN100476415 C CN 100476415C CN B2004100636333 A CNB2004100636333 A CN B2004100636333A CN 200410063633 A CN200410063633 A CN 200410063633A CN 100476415 C CN100476415 C CN 100476415C
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China
Prior art keywords
defect
inspected
approach vector
control unit
inspected part
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Expired - Lifetime
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Chinese (zh)
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CN1576829A (zh
Inventor
S·T·尚卡拉帕
G·A·莫尔
M·S·迪内斯
B·W·拉休克
R·C·麦克法兰
E·L·迪克松
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General Electric Co
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General Electric Co
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    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/70—Determining position or orientation of objects or cameras
    • G06T7/73—Determining position or orientation of objects or cameras using feature-based methods
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
    • G06V2201/00—Indexing scheme relating to image or video recognition or understanding
    • G06V2201/06—Recognition of objects for industrial automation

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  • Engineering & Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Quality & Reliability (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)
  • Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)
  • Image Processing (AREA)
  • Image Analysis (AREA)
CNB2004100636333A 2003-07-09 2004-07-09 分析和识别制造零件中的缺陷的系统及方法 Expired - Lifetime CN100476415C (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US10/615402 2003-07-09
US10/615,402 US7272254B2 (en) 2003-07-09 2003-07-09 System and method for analyzing and identifying flaws in a manufactured part

Publications (2)

Publication Number Publication Date
CN1576829A CN1576829A (zh) 2005-02-09
CN100476415C true CN100476415C (zh) 2009-04-08

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CNB2004100636333A Expired - Lifetime CN100476415C (zh) 2003-07-09 2004-07-09 分析和识别制造零件中的缺陷的系统及方法

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US (1) US7272254B2 (enExample)
EP (1) EP1496474A1 (enExample)
JP (1) JP2005031085A (enExample)
CN (1) CN100476415C (enExample)

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JP6750841B2 (ja) 2015-06-26 2020-09-02 キヤノン株式会社 検査方法、検査装置、処理装置、プログラム及び記録媒体
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CN110705097B (zh) * 2019-09-29 2023-04-14 中国航发北京航空材料研究院 一种航空发动机转动件无损检测数据的去重方法
CN111979752B (zh) * 2020-08-31 2021-10-01 福建顺源纺织有限公司 一种纺织材料加工用带检测功能的切断机
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Publication number Publication date
JP2005031085A (ja) 2005-02-03
US7272254B2 (en) 2007-09-18
EP1496474A1 (en) 2005-01-12
CN1576829A (zh) 2005-02-09
US20050008213A1 (en) 2005-01-13

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Granted publication date: 20090408