JP2005031085A - 製造部品のキズを解析し、識別するシステム及び方法 - Google Patents

製造部品のキズを解析し、識別するシステム及び方法 Download PDF

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Publication number
JP2005031085A
JP2005031085A JP2004201256A JP2004201256A JP2005031085A JP 2005031085 A JP2005031085 A JP 2005031085A JP 2004201256 A JP2004201256 A JP 2004201256A JP 2004201256 A JP2004201256 A JP 2004201256A JP 2005031085 A JP2005031085 A JP 2005031085A
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under inspection
location
work
approach vector
scratch
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JP2004201256A
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Japanese (ja)
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JP2005031085A5 (enExample
Inventor
Suneel Tumkur Shankarappa
スネール・トゥムクール・シャンカラッパ
Gregory Alan Mohr
グレゴリー・アラン・モーア
Mysore Siddu Dinesh
マイソール・シッドゥ・ディネシュ
Brian Walter Lasiuk
ブライアン・ウォルター・ラシウク
Ronald Cecil Mcfarland
ロナルド・セシル・マクファーランド
Elizabeth Lokenberg Dixon
エリザベス・ローケンベルグ・ディクソン
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General Electric Co
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General Electric Co
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Application filed by General Electric Co filed Critical General Electric Co
Publication of JP2005031085A publication Critical patent/JP2005031085A/ja
Publication of JP2005031085A5 publication Critical patent/JP2005031085A5/ja
Pending legal-status Critical Current

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    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/70—Determining position or orientation of objects or cameras
    • G06T7/73—Determining position or orientation of objects or cameras using feature-based methods
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
    • G06V2201/00—Indexing scheme relating to image or video recognition or understanding
    • G06V2201/06—Recognition of objects for industrial automation

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  • Engineering & Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Quality & Reliability (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)
  • Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)
  • Image Processing (AREA)
  • Image Analysis (AREA)
JP2004201256A 2003-07-09 2004-07-08 製造部品のキズを解析し、識別するシステム及び方法 Pending JP2005031085A (ja)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US10/615,402 US7272254B2 (en) 2003-07-09 2003-07-09 System and method for analyzing and identifying flaws in a manufactured part

Publications (2)

Publication Number Publication Date
JP2005031085A true JP2005031085A (ja) 2005-02-03
JP2005031085A5 JP2005031085A5 (enExample) 2007-08-16

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JP2004201256A Pending JP2005031085A (ja) 2003-07-09 2004-07-08 製造部品のキズを解析し、識別するシステム及び方法

Country Status (4)

Country Link
US (1) US7272254B2 (enExample)
EP (1) EP1496474A1 (enExample)
JP (1) JP2005031085A (enExample)
CN (1) CN100476415C (enExample)

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CN108072674B (zh) * 2018-02-07 2019-07-23 西安交通大学 一种基于数字射线的燃气轮机叶片缺陷三维空间定位方法
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CN111979752B (zh) * 2020-08-31 2021-10-01 福建顺源纺织有限公司 一种纺织材料加工用带检测功能的切断机
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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US10366484B2 (en) 2015-06-26 2019-07-30 Canon Kabushiki Kaisha Inspection method, inspection apparatus, processing apparatus, and recording medium for detecting defects of a work

Also Published As

Publication number Publication date
US7272254B2 (en) 2007-09-18
EP1496474A1 (en) 2005-01-12
CN1576829A (zh) 2005-02-09
US20050008213A1 (en) 2005-01-13
CN100476415C (zh) 2009-04-08

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