CN100440497C - 集成半导体结构 - Google Patents
集成半导体结构 Download PDFInfo
- Publication number
- CN100440497C CN100440497C CNB038157144A CN03815714A CN100440497C CN 100440497 C CN100440497 C CN 100440497C CN B038157144 A CNB038157144 A CN B038157144A CN 03815714 A CN03815714 A CN 03815714A CN 100440497 C CN100440497 C CN 100440497C
- Authority
- CN
- China
- Prior art keywords
- metal
- semiconductor structure
- interconnection
- pad metal
- top layer
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Images
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/90—Bond pads, in general
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/90—Bond pads, in general
- H10W72/921—Structures or relative sizes of bond pads
- H10W72/923—Bond pads having multiple stacked layers
- H10W72/9232—Bond pads having multiple stacked layers with additional elements interposed between layers
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/90—Bond pads, in general
- H10W72/931—Shapes of bond pads
- H10W72/934—Cross-sectional shape, i.e. in side view
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/90—Bond pads, in general
- H10W72/951—Materials of bond pads
- H10W72/952—Materials of bond pads comprising metals or metalloids, e.g. PbSn, Ag or Cu
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/90—Bond pads, in general
- H10W72/981—Auxiliary members, e.g. spacers
- H10W72/983—Reinforcing structures, e.g. collars
Landscapes
- Internal Circuitry In Semiconductor Integrated Circuit Devices (AREA)
- Wire Bonding (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| DE10229493A DE10229493B4 (de) | 2002-07-01 | 2002-07-01 | Integrierte Halbleiterstruktur |
| DE10229493.3 | 2002-07-01 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN1666336A CN1666336A (zh) | 2005-09-07 |
| CN100440497C true CN100440497C (zh) | 2008-12-03 |
Family
ID=29796063
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CNB038157144A Expired - Fee Related CN100440497C (zh) | 2002-07-01 | 2003-06-12 | 集成半导体结构 |
Country Status (7)
| Country | Link |
|---|---|
| US (1) | US7190077B2 (https=) |
| EP (1) | EP1518272B1 (https=) |
| JP (1) | JP4065876B2 (https=) |
| CN (1) | CN100440497C (https=) |
| DE (2) | DE10229493B4 (https=) |
| TW (1) | TWI237890B (https=) |
| WO (1) | WO2004004002A1 (https=) |
Families Citing this family (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2006108329A (ja) * | 2004-10-04 | 2006-04-20 | Fujitsu Ltd | 半導体装置 |
| CN100413066C (zh) * | 2005-11-30 | 2008-08-20 | 中芯国际集成电路制造(上海)有限公司 | 低k介电材料的接合焊盘和用于制造半导体器件的方法 |
| JP5353313B2 (ja) * | 2009-03-06 | 2013-11-27 | 富士通セミコンダクター株式会社 | 半導体装置 |
| KR101823677B1 (ko) | 2011-04-21 | 2018-01-30 | 엘지이노텍 주식회사 | 엘이디 조명장치 |
| US20130154099A1 (en) * | 2011-12-16 | 2013-06-20 | Semiconductor Components Industries, Llc | Pad over interconnect pad structure design |
| CN102571135B (zh) * | 2012-02-15 | 2014-05-14 | 京信通信系统(中国)有限公司 | 射频半集成应用装置 |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5751065A (en) * | 1993-08-05 | 1998-05-12 | Lucent Technologies Inc. | Integrated circuit with active devices under bond pads |
| EP1143513A1 (en) * | 2000-04-03 | 2001-10-10 | Nec Corporation | Semiconductor device and method of fabricating the same |
Family Cites Families (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2598328B2 (ja) * | 1989-10-17 | 1997-04-09 | 三菱電機株式会社 | 半導体装置およびその製造方法 |
| KR100267105B1 (ko) * | 1997-12-09 | 2000-11-01 | 윤종용 | 다층패드를구비한반도체소자및그제조방법 |
| US5986343A (en) * | 1998-05-04 | 1999-11-16 | Lucent Technologies Inc. | Bond pad design for integrated circuits |
| US6232662B1 (en) * | 1998-07-14 | 2001-05-15 | Texas Instruments Incorporated | System and method for bonding over active integrated circuits |
| US6087732A (en) * | 1998-09-28 | 2000-07-11 | Lucent Technologies, Inc. | Bond pad for a flip-chip package |
| JP2000183104A (ja) * | 1998-12-15 | 2000-06-30 | Texas Instr Inc <Ti> | 集積回路上でボンディングするためのシステム及び方法 |
| TW430935B (en) * | 1999-03-19 | 2001-04-21 | Ind Tech Res Inst | Frame type bonding pad structure having a low parasitic capacitance |
| US7201784B2 (en) * | 2003-06-30 | 2007-04-10 | Intel Corporation | Surfactant slurry additives to improve erosion, dishing, and defects during chemical mechanical polishing of copper damascene with low k dielectrics |
-
2002
- 2002-07-01 DE DE10229493A patent/DE10229493B4/de not_active Expired - Fee Related
-
2003
- 2003-05-23 TW TW092114098A patent/TWI237890B/zh not_active IP Right Cessation
- 2003-06-12 EP EP03761414A patent/EP1518272B1/de not_active Expired - Lifetime
- 2003-06-12 DE DE50311482T patent/DE50311482D1/de not_active Expired - Lifetime
- 2003-06-12 CN CNB038157144A patent/CN100440497C/zh not_active Expired - Fee Related
- 2003-06-12 US US10/519,860 patent/US7190077B2/en not_active Expired - Lifetime
- 2003-06-12 WO PCT/DE2003/001955 patent/WO2004004002A1/de not_active Ceased
- 2003-06-12 JP JP2004516476A patent/JP4065876B2/ja not_active Expired - Fee Related
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5751065A (en) * | 1993-08-05 | 1998-05-12 | Lucent Technologies Inc. | Integrated circuit with active devices under bond pads |
| EP1143513A1 (en) * | 2000-04-03 | 2001-10-10 | Nec Corporation | Semiconductor device and method of fabricating the same |
Also Published As
| Publication number | Publication date |
|---|---|
| DE50311482D1 (https=) | 2009-06-10 |
| TWI237890B (en) | 2005-08-11 |
| DE10229493A1 (de) | 2004-01-29 |
| TW200402863A (en) | 2004-02-16 |
| US7190077B2 (en) | 2007-03-13 |
| JP2006502561A (ja) | 2006-01-19 |
| EP1518272A1 (de) | 2005-03-30 |
| US20050242374A1 (en) | 2005-11-03 |
| WO2004004002A1 (de) | 2004-01-08 |
| EP1518272B1 (de) | 2009-04-29 |
| CN1666336A (zh) | 2005-09-07 |
| DE10229493B4 (de) | 2007-03-29 |
| JP4065876B2 (ja) | 2008-03-26 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| JP4308671B2 (ja) | ワイヤボンドパッドを有する半導体装置とその製作方法 | |
| US6803302B2 (en) | Method for forming a semiconductor device having a mechanically robust pad interface | |
| KR101203220B1 (ko) | 신호 전도를 허용하면서 인터커넥트 패드에 대한 구조적서포트를 제공하기 위한 방법 및 장치 | |
| US6100589A (en) | Semiconductor device and a method for making the same that provide arrangement of a connecting region for an external connecting terminal | |
| US7795130B2 (en) | Active area bonding compatible high current structures | |
| JP4601910B2 (ja) | 半導体集積回路装置及び半導体集積回路装置の製造方法 | |
| CN100440497C (zh) | 集成半导体结构 | |
| US20080122100A1 (en) | Novel bond pad design to minimize dielectric cracking | |
| US7666712B2 (en) | Design of BEOL patterns to reduce the stresses on structures below chip bondpads | |
| US8946912B2 (en) | Active area bonding compatible high current structures | |
| JP2006318989A (ja) | 半導体装置 | |
| US20040232448A1 (en) | Layout style in the interface between input/output (I/O) cell and bond pad | |
| JPH05226584A (ja) | 集積回路装置 |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20081203 Termination date: 20180612 |