CH522291A - Verfahren zur Herstellung eines Halbleiterbauelements - Google Patents

Verfahren zur Herstellung eines Halbleiterbauelements

Info

Publication number
CH522291A
CH522291A CH511071A CH511071A CH522291A CH 522291 A CH522291 A CH 522291A CH 511071 A CH511071 A CH 511071A CH 511071 A CH511071 A CH 511071A CH 522291 A CH522291 A CH 522291A
Authority
CH
Switzerland
Prior art keywords
manufacturing
semiconductor component
semiconductor
component
Prior art date
Application number
CH511071A
Other languages
English (en)
Inventor
Wolfgang Dr Henning
Hoerschelmann Konstantin Von
Krueger Ingo
Herbert Dr Weidlich
Original Assignee
Siemens Ag
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Siemens Ag filed Critical Siemens Ag
Publication of CH522291A publication Critical patent/CH522291A/de

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/48Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor
    • H01L23/482Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor consisting of lead-in layers inseparably applied to the semiconductor body
    • H01L23/485Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor consisting of lead-in layers inseparably applied to the semiconductor body consisting of layered constructions comprising conductive layers and insulating layers, e.g. planar contacts
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/28Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection
    • H01L23/29Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection characterised by the material, e.g. carbon
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/0001Technical content checked by a classifier
    • H01L2924/0002Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10STECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S148/00Metal treatment
    • Y10S148/113Nitrides of boron or aluminum or gallium
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10STECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S148/00Metal treatment
    • Y10S148/114Nitrides of silicon

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Ceramic Engineering (AREA)
  • Manufacturing & Machinery (AREA)
  • Bipolar Transistors (AREA)
  • Weting (AREA)
CH511071A 1970-04-27 1971-04-07 Verfahren zur Herstellung eines Halbleiterbauelements CH522291A (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE2020531A DE2020531C2 (de) 1970-04-27 1970-04-27 Verfahren zur Herstellung von Silizium-Höchstfrequenz-Planartransistoren

Publications (1)

Publication Number Publication Date
CH522291A true CH522291A (de) 1972-06-15

Family

ID=5769521

Family Applications (1)

Application Number Title Priority Date Filing Date
CH511071A CH522291A (de) 1970-04-27 1971-04-07 Verfahren zur Herstellung eines Halbleiterbauelements

Country Status (8)

Country Link
US (1) US3798080A (de)
JP (1) JPS5652444B1 (de)
CA (1) CA918307A (de)
CH (1) CH522291A (de)
DE (1) DE2020531C2 (de)
FR (1) FR2086373B1 (de)
GB (1) GB1308764A (de)
NL (1) NL7104800A (de)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3977920A (en) * 1970-10-30 1976-08-31 Hitachi, Ltd. Method of fabricating semiconductor device using at least two sorts of insulating films different from each other
US3860466A (en) * 1971-10-22 1975-01-14 Texas Instruments Inc Nitride composed masking for integrated circuits
JPS6028397B2 (ja) * 1978-10-26 1985-07-04 株式会社東芝 半導体装置の製造方法
US4402128A (en) * 1981-07-20 1983-09-06 Rca Corporation Method of forming closely spaced lines or contacts in semiconductor devices
JPS6192150U (de) * 1984-11-22 1986-06-14
JP6900727B2 (ja) 2017-03-28 2021-07-07 横河電機株式会社 エンジニアリング支援システム、エンジニアリング支援方法、クライアント装置、及びクライアントプログラム
JP6897452B2 (ja) 2017-09-22 2021-06-30 横河電機株式会社 情報収集システム
JP2019057196A (ja) 2017-09-22 2019-04-11 横河電機株式会社 情報収集装置、情報収集方法

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3477886A (en) * 1964-12-07 1969-11-11 Motorola Inc Controlled diffusions in semiconductive materials
US3597667A (en) * 1966-03-01 1971-08-03 Gen Electric Silicon oxide-silicon nitride coatings for semiconductor devices
DE158928C (de) * 1966-09-26
DE1614435B2 (de) * 1967-02-23 1979-05-23 Siemens Ag, 1000 Berlin Und 8000 Muenchen Verfahren zum Herstellen von aus Germanium bestehenden, doppeldiffundierten Halbleiteranordnungen
US3475234A (en) * 1967-03-27 1969-10-28 Bell Telephone Labor Inc Method for making mis structures
NL6807952A (de) * 1967-07-06 1969-01-08
FR2020020B1 (de) * 1968-10-07 1974-09-20 Ibm
US3615940A (en) * 1969-03-24 1971-10-26 Motorola Inc Method of forming a silicon nitride diffusion mask

Also Published As

Publication number Publication date
DE2020531C2 (de) 1982-10-21
US3798080A (en) 1974-03-19
JPS5652444B1 (de) 1981-12-12
GB1308764A (en) 1973-03-07
FR2086373B1 (de) 1977-08-05
NL7104800A (de) 1971-10-29
FR2086373A1 (de) 1971-12-31
DE2020531A1 (de) 1971-11-18
CA918307A (en) 1973-01-02

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Legal Events

Date Code Title Description
PL Patent ceased