CA2745558C - Device and system for measuring material thickness - Google Patents

Device and system for measuring material thickness Download PDF

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Publication number
CA2745558C
CA2745558C CA2745558A CA2745558A CA2745558C CA 2745558 C CA2745558 C CA 2745558C CA 2745558 A CA2745558 A CA 2745558A CA 2745558 A CA2745558 A CA 2745558A CA 2745558 C CA2745558 C CA 2745558C
Authority
CA
Canada
Prior art keywords
piezoelectric element
substrate
piezoelectric
sensing device
disposed
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
CA2745558A
Other languages
English (en)
French (fr)
Other versions
CA2745558A1 (en
Inventor
Matthew Krohn
Paul Aloysius Meyer
James Norman Barshinger
Ying Fan
Fred Matthews
Nathan Smith
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
General Electric Co
Original Assignee
General Electric Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by General Electric Co filed Critical General Electric Co
Publication of CA2745558A1 publication Critical patent/CA2745558A1/en
Application granted granted Critical
Publication of CA2745558C publication Critical patent/CA2745558C/en
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

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Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B17/00Measuring arrangements characterised by the use of infrasonic, sonic or ultrasonic vibrations
    • G01B17/02Measuring arrangements characterised by the use of infrasonic, sonic or ultrasonic vibrations for measuring thickness
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/04Analysing solids
    • G01N29/11Analysing solids by measuring attenuation of acoustic waves
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/22Details, e.g. general constructional or apparatus details
    • G01N29/228Details, e.g. general constructional or apparatus details related to high temperature conditions
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/22Details, e.g. general constructional or apparatus details
    • G01N29/24Probes
    • G01N29/2437Piezoelectric probes
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10NELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10N30/00Piezoelectric or electrostrictive devices
    • H10N30/30Piezoelectric or electrostrictive devices with mechanical input and electrical output, e.g. functioning as generators or sensors
    • H10N30/302Sensors
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2291/00Indexing codes associated with group G01N29/00
    • G01N2291/02Indexing codes associated with the analysed material
    • G01N2291/025Change of phase or condition
    • G01N2291/0258Structural degradation, e.g. fatigue of composites, ageing of oils

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • General Health & Medical Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Acoustics & Sound (AREA)
  • Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)
  • Length Measuring Devices Characterised By Use Of Acoustic Means (AREA)
  • Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
CA2745558A 2010-07-21 2011-07-07 Device and system for measuring material thickness Expired - Fee Related CA2745558C (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US12/840,485 2010-07-21
US12/840,485 US8264129B2 (en) 2010-07-21 2010-07-21 Device and system for measuring material thickness

Publications (2)

Publication Number Publication Date
CA2745558A1 CA2745558A1 (en) 2012-01-21
CA2745558C true CA2745558C (en) 2018-09-04

Family

ID=44584009

Family Applications (1)

Application Number Title Priority Date Filing Date
CA2745558A Expired - Fee Related CA2745558C (en) 2010-07-21 2011-07-07 Device and system for measuring material thickness

Country Status (5)

Country Link
US (2) US8264129B2 (https=)
EP (1) EP2410587A3 (https=)
JP (1) JP5342608B2 (https=)
CN (1) CN102346022A (https=)
CA (1) CA2745558C (https=)

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CN113834454B (zh) * 2021-09-07 2024-01-26 青岛理工大学 单个超声探头实现宽范围润滑膜厚度测量的方法及验证平台
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Also Published As

Publication number Publication date
EP2410587A3 (en) 2013-07-17
EP2410587A2 (en) 2012-01-25
US20120019105A1 (en) 2012-01-26
JP2012027020A (ja) 2012-02-09
CN102346022A (zh) 2012-02-08
US8264129B2 (en) 2012-09-11
CA2745558A1 (en) 2012-01-21
JP5342608B2 (ja) 2013-11-13
US20120294124A1 (en) 2012-11-22

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EEER Examination request

Effective date: 20160506

MKLA Lapsed

Effective date: 20210707