CA2090616C - Apparatus and methods for trace component analysis - Google Patents
Apparatus and methods for trace component analysis Download PDFInfo
- Publication number
- CA2090616C CA2090616C CA002090616A CA2090616A CA2090616C CA 2090616 C CA2090616 C CA 2090616C CA 002090616 A CA002090616 A CA 002090616A CA 2090616 A CA2090616 A CA 2090616A CA 2090616 C CA2090616 C CA 2090616C
- Authority
- CA
- Canada
- Prior art keywords
- ions
- mass spectrometer
- ion
- time
- flight mass
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 238000000034 method Methods 0.000 title claims abstract description 45
- 238000004458 analytical method Methods 0.000 title claims description 21
- 150000002500 ions Chemical class 0.000 claims abstract description 275
- 239000013626 chemical specie Substances 0.000 claims abstract description 18
- 230000005684 electric field Effects 0.000 claims description 24
- 238000004519 manufacturing process Methods 0.000 claims description 16
- 238000009826 distribution Methods 0.000 claims description 9
- 238000001819 mass spectrum Methods 0.000 claims description 7
- 238000001514 detection method Methods 0.000 claims description 6
- 230000000979 retarding effect Effects 0.000 claims description 4
- 230000001846 repelling effect Effects 0.000 claims description 2
- 230000026058 directional locomotion Effects 0.000 claims 2
- 230000007935 neutral effect Effects 0.000 abstract description 6
- 238000006243 chemical reaction Methods 0.000 description 5
- 230000001419 dependent effect Effects 0.000 description 5
- 230000000694 effects Effects 0.000 description 5
- 239000007789 gas Substances 0.000 description 5
- 230000035945 sensitivity Effects 0.000 description 5
- 238000000752 ionisation method Methods 0.000 description 4
- 241000894007 species Species 0.000 description 4
- 230000001133 acceleration Effects 0.000 description 3
- 150000001875 compounds Chemical class 0.000 description 3
- 230000006872 improvement Effects 0.000 description 3
- 238000005086 pumping Methods 0.000 description 3
- 238000001228 spectrum Methods 0.000 description 3
- XKRFYHLGVUSROY-UHFFFAOYSA-N Argon Chemical compound [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 description 2
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 2
- 229910000831 Steel Inorganic materials 0.000 description 2
- 239000003570 air Substances 0.000 description 2
- 239000012491 analyte Substances 0.000 description 2
- 230000008901 benefit Effects 0.000 description 2
- 230000008859 change Effects 0.000 description 2
- 239000003153 chemical reaction reagent Substances 0.000 description 2
- 238000004587 chromatography analysis Methods 0.000 description 2
- 238000009792 diffusion process Methods 0.000 description 2
- 238000013467 fragmentation Methods 0.000 description 2
- 238000006062 fragmentation reaction Methods 0.000 description 2
- 238000010884 ion-beam technique Methods 0.000 description 2
- 238000010183 spectrum analysis Methods 0.000 description 2
- 239000010959 steel Substances 0.000 description 2
- 239000000126 substance Substances 0.000 description 2
- 230000006978 adaptation Effects 0.000 description 1
- 230000002411 adverse Effects 0.000 description 1
- 239000012080 ambient air Substances 0.000 description 1
- 238000013459 approach Methods 0.000 description 1
- 229910052786 argon Inorganic materials 0.000 description 1
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 238000012512 characterization method Methods 0.000 description 1
- 238000005056 compaction Methods 0.000 description 1
- 230000000295 complement effect Effects 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 238000007599 discharging Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000000105 evaporative light scattering detection Methods 0.000 description 1
- 230000005284 excitation Effects 0.000 description 1
- 239000012530 fluid Substances 0.000 description 1
- 239000012634 fragment Substances 0.000 description 1
- 239000001307 helium Substances 0.000 description 1
- 229910052734 helium Inorganic materials 0.000 description 1
- SWQJXJOGLNCZEY-UHFFFAOYSA-N helium atom Chemical compound [He] SWQJXJOGLNCZEY-UHFFFAOYSA-N 0.000 description 1
- 230000003993 interaction Effects 0.000 description 1
- 239000007788 liquid Substances 0.000 description 1
- 238000003754 machining Methods 0.000 description 1
- 238000004949 mass spectrometry Methods 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 230000007246 mechanism Effects 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 229910052757 nitrogen Inorganic materials 0.000 description 1
- 239000001301 oxygen Substances 0.000 description 1
- 229910052760 oxygen Inorganic materials 0.000 description 1
- 238000005192 partition Methods 0.000 description 1
- 239000000941 radioactive substance Substances 0.000 description 1
- 230000004044 response Effects 0.000 description 1
- 230000035939 shock Effects 0.000 description 1
- 230000001360 synchronised effect Effects 0.000 description 1
- 238000001196 time-of-flight mass spectrum Methods 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/26—Mass spectrometers or separator tubes
- H01J49/34—Dynamic spectrometers
- H01J49/40—Time-of-flight spectrometers
- H01J49/401—Time-of-flight spectrometers characterised by orthogonal acceleration, e.g. focusing or selecting the ions, pusher electrode
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/26—Mass spectrometers or separator tubes
- H01J49/34—Dynamic spectrometers
- H01J49/40—Time-of-flight spectrometers
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
- Electron Tubes For Measurement (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US574,638 | 1990-08-29 | ||
| US07574638 US5070240B1 (en) | 1990-08-29 | 1990-08-29 | Apparatus and methods for trace component analysis |
| PCT/US1991/006153 WO1992004728A1 (en) | 1990-08-29 | 1991-08-28 | Apparatus and methods for trace component analysis |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CA2090616A1 CA2090616A1 (en) | 1992-03-01 |
| CA2090616C true CA2090616C (en) | 2002-07-09 |
Family
ID=24296972
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CA002090616A Expired - Fee Related CA2090616C (en) | 1990-08-29 | 1991-08-28 | Apparatus and methods for trace component analysis |
Country Status (8)
| Country | Link |
|---|---|
| US (1) | US5070240B1 (OSRAM) |
| EP (1) | EP0546097B1 (OSRAM) |
| JP (1) | JP3176918B2 (OSRAM) |
| KR (1) | KR100232430B1 (OSRAM) |
| CA (1) | CA2090616C (OSRAM) |
| DE (1) | DE69132461T2 (OSRAM) |
| TW (1) | TW234741B (OSRAM) |
| WO (1) | WO1992004728A1 (OSRAM) |
Families Citing this family (50)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| GB2228139B (en) * | 1989-02-09 | 1993-11-17 | Graseby Ionics Ltd | Ion mobility detector |
| US5157260A (en) * | 1991-05-17 | 1992-10-20 | Finnian Corporation | Method and apparatus for focusing ions in viscous flow jet expansion region of an electrospray apparatus |
| WO1993011554A1 (en) * | 1991-12-03 | 1993-06-10 | Graseby Dynamics Limited | Corona discharge ionisation source |
| US5306910A (en) * | 1992-04-10 | 1994-04-26 | Millipore Corporation | Time modulated electrified spray apparatus and process |
| GB9304462D0 (en) * | 1993-03-04 | 1993-04-21 | Kore Tech Ltd | Mass spectrometer |
| DE4322102C2 (de) * | 1993-07-02 | 1995-08-17 | Bergmann Thorald | Flugzeit-Massenspektrometer mit Gasphasen-Ionenquelle |
| GB9324213D0 (en) * | 1993-11-25 | 1994-01-12 | Kore Tech Ltd | Vacuum inlet |
| DE69535979D1 (de) * | 1994-02-28 | 2009-08-20 | Analytica Of Branford Inc | Multipol-ionenleiter für massenspektrometrie |
| DE19511333C1 (de) * | 1995-03-28 | 1996-08-08 | Bruker Franzen Analytik Gmbh | Verfahren und Vorrichtung für orthogonalen Einschuß von Ionen in ein Flugzeit-Massenspektrometer |
| US5625184A (en) * | 1995-05-19 | 1997-04-29 | Perseptive Biosystems, Inc. | Time-of-flight mass spectrometry analysis of biomolecules |
| US6002127A (en) * | 1995-05-19 | 1999-12-14 | Perseptive Biosystems, Inc. | Time-of-flight mass spectrometry analysis of biomolecules |
| US5572023A (en) * | 1995-05-30 | 1996-11-05 | Board Of Regents, The University Of Texas System | Electrospray methods and apparatus for trace analysis |
| US5825025A (en) * | 1995-11-08 | 1998-10-20 | Comstock, Inc. | Miniaturized time-of-flight mass spectrometer |
| US5744797A (en) * | 1995-11-22 | 1998-04-28 | Bruker Analytical Instruments, Inc. | Split-field interface |
| US5808299A (en) * | 1996-04-01 | 1998-09-15 | Syagen Technology | Real-time multispecies monitoring by photoionization mass spectrometry |
| US5945678A (en) * | 1996-05-21 | 1999-08-31 | Hamamatsu Photonics K.K. | Ionizing analysis apparatus |
| US5869829A (en) * | 1996-07-03 | 1999-02-09 | Analytica Of Branford, Inc. | Time-of-flight mass spectrometer with first and second order longitudinal focusing |
| US6316768B1 (en) * | 1997-03-14 | 2001-11-13 | Leco Corporation | Printed circuit boards as insulated components for a time of flight mass spectrometer |
| GB2324906B (en) | 1997-04-29 | 2002-01-09 | Masslab Ltd | Ion source for a mass analyser and method of providing a source of ions for analysis |
| US6323482B1 (en) | 1997-06-02 | 2001-11-27 | Advanced Research And Technology Institute, Inc. | Ion mobility and mass spectrometer |
| US6498342B1 (en) | 1997-06-02 | 2002-12-24 | Advanced Research & Technology Institute | Ion separation instrument |
| US6960761B2 (en) | 1997-06-02 | 2005-11-01 | Advanced Research & Technology Institute | Instrument for separating ions in time as functions of preselected ion mobility and ion mass |
| US5905258A (en) * | 1997-06-02 | 1999-05-18 | Advanced Research & Techology Institute | Hybrid ion mobility and mass spectrometer |
| US6040573A (en) * | 1997-09-25 | 2000-03-21 | Indiana University Advanced Research & Technology Institute Inc. | Electric field generation for charged particle analyzers |
| US6229142B1 (en) | 1998-01-23 | 2001-05-08 | Micromass Limited | Time of flight mass spectrometer and detector therefor |
| JP2939540B2 (ja) * | 1998-01-30 | 1999-08-25 | 科学技術庁金属材料技術研究所長 | パルス励起原子線とパルス紫外光の生成方法およびその装置 |
| DE19822674A1 (de) * | 1998-05-20 | 1999-12-09 | Gsf Forschungszentrum Umwelt | Gaseinlaß für eine Ionenquelle |
| US6849847B1 (en) | 1998-06-12 | 2005-02-01 | Agilent Technologies, Inc. | Ambient pressure matrix-assisted laser desorption ionization (MALDI) apparatus and method of analysis |
| US6211516B1 (en) | 1999-02-09 | 2001-04-03 | Syagen Technology | Photoionization mass spectrometer |
| US6630664B1 (en) * | 1999-02-09 | 2003-10-07 | Syagen Technology | Atmospheric pressure photoionizer for mass spectrometry |
| US7119342B2 (en) * | 1999-02-09 | 2006-10-10 | Syagen Technology | Interfaces for a photoionization mass spectrometer |
| US7109476B2 (en) | 1999-02-09 | 2006-09-19 | Syagen Technology | Multiple ion sources involving atmospheric pressure photoionization |
| US6326615B1 (en) | 1999-08-30 | 2001-12-04 | Syagen Technology | Rapid response mass spectrometer system |
| FR2801674B1 (fr) * | 1999-11-29 | 2002-02-01 | Air Liquide | Dispositif d'ionisation d'un gaz pour l'analyse d'impuretes presentes a l'etat de trace dans ce gaz et procede d'ionisation utilisant un tel dispositif |
| US6998605B1 (en) * | 2000-05-25 | 2006-02-14 | Agilent Technologies, Inc. | Apparatus for delivering ions from a grounded electrospray assembly to a vacuum chamber |
| US6737642B2 (en) | 2002-03-18 | 2004-05-18 | Syagen Technology | High dynamic range analog-to-digital converter |
| US7091477B2 (en) | 2003-06-09 | 2006-08-15 | Ionica Mass Spectrometry Group, Inc. | Mass spectrometer interface |
| US7385187B2 (en) * | 2003-06-21 | 2008-06-10 | Leco Corporation | Multi-reflecting time-of-flight mass spectrometer and method of use |
| JP4629663B2 (ja) * | 2004-02-27 | 2011-02-09 | 独立行政法人科学技術振興機構 | 超臨界流体ジェット法を用いる質量分析法と装置 |
| GB0424426D0 (en) | 2004-11-04 | 2004-12-08 | Micromass Ltd | Mass spectrometer |
| US20080296400A1 (en) * | 2005-01-14 | 2008-12-04 | John Arthur Cooper | Quantitative aerosol generator (QAG) method and apparatus |
| US20090108090A1 (en) * | 2005-01-14 | 2009-04-30 | Cooper Environmental Services Llc | Quantitative aerosol generator (qag) |
| US7385189B2 (en) * | 2005-06-29 | 2008-06-10 | Agilent Technologies, Inc. | Nanospray ionization device and method |
| WO2010039512A1 (en) * | 2008-09-30 | 2010-04-08 | Advion Biosciences, Inc. | Atmospheric pressure ionization (api) interface structures for a mass spectrometer |
| KR101766637B1 (ko) * | 2011-05-13 | 2017-08-23 | 한국표준과학연구원 | 비행시간 기반 질량 분석을 위한 펄싱 클러스터 가스 이온건 |
| WO2013098645A2 (en) * | 2011-12-28 | 2013-07-04 | Medimass, Ltd. | System and method for rapid evaporative ionization of liquid phase samples |
| CN105304451B (zh) * | 2015-10-23 | 2017-06-16 | 浙江好创生物技术有限公司 | 一种应用于质谱仪的电喷雾离子源及质谱分析方法 |
| EP3660504B1 (en) * | 2018-11-30 | 2025-01-01 | Thermo Fisher Scientific (Bremen) GmbH | Systems and methods for determining mass of an ion species |
| CN111665103B (zh) * | 2020-05-13 | 2023-08-18 | 中国科学院微电子研究所 | 一种低真空痕量气体的快速无损采样分析装置和方法 |
| CN114256054B (zh) * | 2021-12-28 | 2023-07-04 | 广州禾信仪器股份有限公司 | 一种飞行时间质谱仪及检测系统 |
Family Cites Families (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3621240A (en) * | 1969-05-27 | 1971-11-16 | Franklin Gro Corp | Apparatus and methods for detecting and identifying trace gases |
| US4072862A (en) * | 1975-07-22 | 1978-02-07 | Mamyrin Boris Alexandrovich | Time-of-flight mass spectrometer |
| US4390784A (en) * | 1979-10-01 | 1983-06-28 | The Bendix Corporation | One piece ion accelerator for ion mobility detector cells |
| US4755344A (en) * | 1980-04-11 | 1988-07-05 | The United States Of America As Represented By The United States Department Of Energy | Method and apparatus for the production of cluster ions |
| US4458149A (en) * | 1981-07-14 | 1984-07-03 | Patrick Luis Muga | Time-of-flight mass spectrometer |
| US4667100A (en) * | 1985-04-17 | 1987-05-19 | Lagna William M | Methods and apparatus for mass spectrometric analysis of fluids |
| DE3524536A1 (de) * | 1985-07-10 | 1987-01-22 | Bruker Analytische Messtechnik | Flugzeit-massenspektrometer mit einem ionenreflektor |
| JPH07118295B2 (ja) * | 1985-10-30 | 1995-12-18 | 株式会社日立製作所 | 質量分析計 |
-
1990
- 1990-08-29 US US07574638 patent/US5070240B1/en not_active Expired - Lifetime
-
1991
- 1991-07-31 TW TW080105971A patent/TW234741B/zh active
- 1991-08-28 WO PCT/US1991/006153 patent/WO1992004728A1/en not_active Ceased
- 1991-08-28 EP EP91917594A patent/EP0546097B1/en not_active Expired - Lifetime
- 1991-08-28 CA CA002090616A patent/CA2090616C/en not_active Expired - Fee Related
- 1991-08-28 JP JP51625991A patent/JP3176918B2/ja not_active Expired - Fee Related
- 1991-08-28 KR KR1019930700629A patent/KR100232430B1/ko not_active Expired - Fee Related
- 1991-08-28 DE DE69132461T patent/DE69132461T2/de not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| US5070240A (en) | 1991-12-03 |
| JPH06501130A (ja) | 1994-01-27 |
| US5070240B1 (en) | 1996-09-10 |
| EP0546097B1 (en) | 2000-11-02 |
| KR930702775A (ko) | 1993-09-09 |
| TW234741B (OSRAM) | 1994-11-21 |
| EP0546097A1 (en) | 1993-06-16 |
| DE69132461T2 (de) | 2001-05-10 |
| EP0546097A4 (en) | 1995-04-19 |
| WO1992004728A1 (en) | 1992-03-19 |
| DE69132461D1 (de) | 2000-12-07 |
| KR100232430B1 (ko) | 1999-12-01 |
| JP3176918B2 (ja) | 2001-06-18 |
| CA2090616A1 (en) | 1992-03-01 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| EEER | Examination request | ||
| MKLA | Lapsed | ||
| MKLA | Lapsed |
Effective date: 20090828 |