CA2078374A1 - Methode d'affichage de defauts et appareil connexe - Google Patents

Methode d'affichage de defauts et appareil connexe

Info

Publication number
CA2078374A1
CA2078374A1 CA2078374A CA2078374A CA2078374A1 CA 2078374 A1 CA2078374 A1 CA 2078374A1 CA 2078374 A CA2078374 A CA 2078374A CA 2078374 A CA2078374 A CA 2078374A CA 2078374 A1 CA2078374 A1 CA 2078374A1
Authority
CA
Canada
Prior art keywords
image data
defect
storing
image
displaying
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
CA2078374A
Other languages
English (en)
Other versions
CA2078374C (fr
Inventor
Hideyuki Hanafusa
Masami Nishio
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Futec Inc
Original Assignee
Individual
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Individual filed Critical Individual
Publication of CA2078374A1 publication Critical patent/CA2078374A1/fr
Application granted granted Critical
Publication of CA2078374C publication Critical patent/CA2078374C/fr
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/8901—Optical details; Scanning details
    • G01N21/8903—Optical details; Scanning details using a multiple detector array
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N5/00—Details of television systems
    • H04N5/44—Receiver circuitry for the reception of television signals according to analogue transmission standards
    • H04N5/445—Receiver circuitry for the reception of television signals according to analogue transmission standards for displaying additional information
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G06T7/001—Industrial image inspection using an image reference approach
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8887—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges based on image processing techniques
    • G01N2021/889—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges based on image processing techniques providing a bare video image, i.e. without visual measurement aids
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/10—Image acquisition modality
    • G06T2207/10004—Still image; Photographic image
    • G06T2207/10012—Stereo images
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30108—Industrial image inspection
    • G06T2207/30124—Fabrics; Textile; Paper

Landscapes

  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Textile Engineering (AREA)
  • Pathology (AREA)
  • Theoretical Computer Science (AREA)
  • Quality & Reliability (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Signal Processing (AREA)
  • Multimedia (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Image Processing (AREA)
  • Image Analysis (AREA)
CA002078374A 1991-09-19 1992-09-16 Methode d'affichage de defauts et appareil connexe Expired - Fee Related CA2078374C (fr)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP3239808A JPH0581408A (ja) 1991-09-19 1991-09-19 欠点画像表示方法
JP3-239808 1991-09-19

Publications (2)

Publication Number Publication Date
CA2078374A1 true CA2078374A1 (fr) 1993-03-20
CA2078374C CA2078374C (fr) 1997-12-23

Family

ID=17050165

Family Applications (1)

Application Number Title Priority Date Filing Date
CA002078374A Expired - Fee Related CA2078374C (fr) 1991-09-19 1992-09-16 Methode d'affichage de defauts et appareil connexe

Country Status (6)

Country Link
US (1) US5377279A (fr)
EP (1) EP0536570B1 (fr)
JP (1) JPH0581408A (fr)
KR (1) KR960003873B1 (fr)
CA (1) CA2078374C (fr)
DE (1) DE69219267T2 (fr)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN112304957A (zh) * 2020-11-20 2021-02-02 天津朗硕机器人科技有限公司 一种基于机器视觉的外观缺陷智能检测方法及系统
CN115046478A (zh) * 2022-08-10 2022-09-13 深之蓝海洋科技股份有限公司 水下相对位姿的测量方法和装置

Families Citing this family (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3297950B2 (ja) * 1993-07-13 2002-07-02 シャープ株式会社 平面型表示パネル検査装置
US5680471A (en) * 1993-07-27 1997-10-21 Kabushiki Kaisha Toshiba Image processing apparatus and method
US5880772A (en) * 1994-10-11 1999-03-09 Daimlerchrysler Corporation Machine vision image data acquisition system
DE4447061A1 (de) * 1994-12-29 1996-07-04 Huels Chemische Werke Ag Verfahren zur Beurteilung der Druckqualität
DE19650234C1 (de) * 1996-12-04 1998-04-30 Duerkopp Adler Ag Gegenstand zur Kennzeichnung einer Auswahlfläche in einem Arbeitsstück, insbesondere einer Tierhaut
US6236429B1 (en) * 1998-01-23 2001-05-22 Webview, Inc. Visualization system and method for a web inspection assembly
AT406528B (de) * 1998-05-05 2000-06-26 Oesterr Forsch Seibersdorf Verfahren und einrichtung zur feststellung, insbesondere zur visualisierung, von fehlern auf der oberfläche von gegenständen
JP2000067247A (ja) * 1998-06-08 2000-03-03 Toshiba Corp 画像認識装置
US5991046A (en) * 1998-07-14 1999-11-23 Valmet Automation Inc. Method and apparatus for optically measuring properties of a moving web
JP2000036033A (ja) * 1998-07-21 2000-02-02 Toshiba Eng Co Ltd 明暗検査装置および明暗検査方法
EP0979995A1 (fr) * 1998-08-12 2000-02-16 Hildeco OY Ltd. Procédé et système pour surveiller une bande de papier, une pâte à papier, ou un fil en mouvement dans une machine à papier
US6831995B1 (en) * 1999-03-23 2004-12-14 Hitachi, Ltd. Method for detecting a defect in a pixel of an electrical display unit and a method for manufacturing an electrical display unit
US6693292B1 (en) * 1999-06-30 2004-02-17 Vishay Infrared Components, Inc. Optical spot sensor
DE10260817B3 (de) * 2002-12-23 2004-08-26 Infineon Technologies Ag Verfahren und Vorrichtung zur Analyse von Kratzern auf Halbleiterwafern
CN101403704B (zh) * 2007-12-07 2010-11-17 东华大学 氟塑料薄膜在线疵点检测系统和方法
GB2471886A (en) * 2009-07-16 2011-01-19 Buhler Sortex Ltd Inspection apparatus
US9729755B2 (en) * 2011-08-31 2017-08-08 Xerox Corporation Intelligent image correction with preview
US11164333B2 (en) * 2020-01-31 2021-11-02 Gracenote, Inc. Monitoring icon status in a display from an external device

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4223346A (en) * 1979-04-05 1980-09-16 Armco Inc. Automatic defect detecting inspection apparatus
GB2081891A (en) * 1980-08-11 1982-02-24 Wiggins Teape The Group Ltd Web monitoring apparatus
GB2159623B (en) * 1981-11-11 1986-05-29 Dainippon Printing Co Ltd Print inspecting method
CH656466A5 (de) * 1982-02-15 1986-06-30 Alusuisse Verfahren und vorrichtung zur oberflaechenkontrolle eines werkstoffes.
DE3347645C1 (de) * 1983-12-30 1985-10-10 Dr.-Ing. Ludwig Pietzsch Gmbh & Co, 7505 Ettlingen Verfahren und Einrichtung zum opto-elektronischen Pruefen eines Flaechenmusters an einem Objekt
US4675730A (en) * 1985-09-06 1987-06-23 Aluminum Company Of America Video surface inspection system
JPS62279931A (ja) * 1986-05-29 1987-12-04 レンゴ−株式会社 片面段ボ−ルの不良検出装置
US4857747A (en) * 1988-02-24 1989-08-15 Albany International Corporation Method and apparatus for analyzing the formation of a web of material via generating a formation index
US4979034A (en) * 1988-07-21 1990-12-18 Konica Corporation Image memory apparatus
JPH03188358A (ja) * 1989-12-19 1991-08-16 Hajime Sangyo Kk 物体の表面検査装置
CA2078114A1 (fr) * 1990-03-13 1991-09-14 Jean-Louis C. Guay Systeme d'inspection de bande
GB9024936D0 (en) * 1990-11-16 1991-01-02 Leicester Polytechnic Methods and apparatus for fabric inspection

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN112304957A (zh) * 2020-11-20 2021-02-02 天津朗硕机器人科技有限公司 一种基于机器视觉的外观缺陷智能检测方法及系统
CN115046478A (zh) * 2022-08-10 2022-09-13 深之蓝海洋科技股份有限公司 水下相对位姿的测量方法和装置
CN115046478B (zh) * 2022-08-10 2022-12-02 深之蓝海洋科技股份有限公司 水下相对位姿的测量方法和装置

Also Published As

Publication number Publication date
DE69219267T2 (de) 1997-08-21
CA2078374C (fr) 1997-12-23
KR960003873B1 (ko) 1996-03-23
EP0536570B1 (fr) 1997-04-23
JPH0581408A (ja) 1993-04-02
KR930007254A (ko) 1993-04-22
EP0536570A3 (en) 1993-12-15
DE69219267D1 (de) 1997-05-28
EP0536570A2 (fr) 1993-04-14
US5377279A (en) 1994-12-27

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