CA2010234A1 - Methode et instrument pour determiner la masse d'echantillons a l'aide d'un quistor - Google Patents

Methode et instrument pour determiner la masse d'echantillons a l'aide d'un quistor

Info

Publication number
CA2010234A1
CA2010234A1 CA2010234A CA2010234A CA2010234A1 CA 2010234 A1 CA2010234 A1 CA 2010234A1 CA 2010234 A CA2010234 A CA 2010234A CA 2010234 A CA2010234 A CA 2010234A CA 2010234 A1 CA2010234 A1 CA 2010234A1
Authority
CA
Canada
Prior art keywords
ions
quistor
instrument
mass
analyzing samples
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
CA2010234A
Other languages
English (en)
Other versions
CA2010234C (fr
Inventor
Jochen Franzen
Reemt-Holger Gabling
Gerhard Heinen
Gerhard Weiss
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Bruker Daltonics GmbH and Co KG
Original Assignee
Individual
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Individual filed Critical Individual
Publication of CA2010234A1 publication Critical patent/CA2010234A1/fr
Application granted granted Critical
Publication of CA2010234C publication Critical patent/CA2010234C/fr
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • H01J49/34—Dynamic spectrometers
    • H01J49/42—Stability-of-path spectrometers, e.g. monopole, quadrupole, multipole, farvitrons
    • H01J49/4205—Device types
    • H01J49/424—Three-dimensional ion traps, i.e. comprising end-cap and ring electrodes
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • H01J49/34—Dynamic spectrometers
    • H01J49/42—Stability-of-path spectrometers, e.g. monopole, quadrupole, multipole, farvitrons
    • H01J49/426—Methods for controlling ions
    • H01J49/427—Ejection and selection methods
    • H01J49/429—Scanning an electric parameter, e.g. voltage amplitude or frequency

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)
CA002010234A 1989-02-18 1990-02-16 Methode et instrument pour determiner la masse d'echantillons a l'aide d'un quistor Expired - Lifetime CA2010234C (fr)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
EP89102850.8 1989-02-18
EP89102850A EP0383961B1 (fr) 1989-02-18 1989-02-18 Méthode et appareil pour l'analyse de masses avec un quistor

Publications (2)

Publication Number Publication Date
CA2010234A1 true CA2010234A1 (fr) 1990-08-18
CA2010234C CA2010234C (fr) 1998-05-12

Family

ID=8200978

Family Applications (1)

Application Number Title Priority Date Filing Date
CA002010234A Expired - Lifetime CA2010234C (fr) 1989-02-18 1990-02-16 Methode et instrument pour determiner la masse d'echantillons a l'aide d'un quistor

Country Status (5)

Country Link
US (1) US4975577A (fr)
EP (1) EP0383961B1 (fr)
AT (1) ATE101942T1 (fr)
CA (1) CA2010234C (fr)
DE (1) DE68913290T2 (fr)

Families Citing this family (35)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE4017264A1 (de) * 1990-05-29 1991-12-19 Bruker Franzen Analytik Gmbh Massenspektrometrischer hochfrequenz-quadrupol-kaefig mit ueberlagerten multipolfeldern
US5134286A (en) * 1991-02-28 1992-07-28 Teledyne Cme Mass spectrometry method using notch filter
US5436445A (en) * 1991-02-28 1995-07-25 Teledyne Electronic Technologies Mass spectrometry method with two applied trapping fields having same spatial form
US5173604A (en) * 1991-02-28 1992-12-22 Teledyne Cme Mass spectrometry method with non-consecutive mass order scan
US5381007A (en) * 1991-02-28 1995-01-10 Teledyne Mec A Division Of Teledyne Industries, Inc. Mass spectrometry method with two applied trapping fields having same spatial form
US5274233A (en) * 1991-02-28 1993-12-28 Teledyne Mec Mass spectrometry method using supplemental AC voltage signals
US5196699A (en) * 1991-02-28 1993-03-23 Teledyne Mec Chemical ionization mass spectrometry method using notch filter
US5449905A (en) * 1992-05-14 1995-09-12 Teledyne Et Method for generating filtered noise signal and broadband signal having reduced dynamic range for use in mass spectrometry
US5200613A (en) * 1991-02-28 1993-04-06 Teledyne Mec Mass spectrometry method using supplemental AC voltage signals
US5206507A (en) * 1991-02-28 1993-04-27 Teledyne Mec Mass spectrometry method using filtered noise signal
US5256875A (en) * 1992-05-14 1993-10-26 Teledyne Mec Method for generating filtered noise signal and broadband signal having reduced dynamic range for use in mass spectrometry
US5451782A (en) * 1991-02-28 1995-09-19 Teledyne Et Mass spectometry method with applied signal having off-resonance frequency
US5248883A (en) * 1991-05-30 1993-09-28 International Business Machines Corporation Ion traps of mono- or multi-planar geometry and planar ion trap devices
DE4139037C2 (de) * 1991-11-27 1995-07-27 Bruker Franzen Analytik Gmbh Verfahren zum Isolieren von Ionen einer auswählbaren Masse
DE4142869C1 (fr) * 1991-12-23 1993-05-19 Bruker - Franzen Analytik Gmbh, 2800 Bremen, De
DE4142871C1 (fr) * 1991-12-23 1993-05-19 Bruker - Franzen Analytik Gmbh, 2800 Bremen, De
DE4142870C2 (de) * 1991-12-23 1995-03-16 Bruker Franzen Analytik Gmbh Verfahren für phasenrichtiges Messen der Ionen aus Ionenfallen-Massenspektrometern
US5198665A (en) * 1992-05-29 1993-03-30 Varian Associates, Inc. Quadrupole trap improved technique for ion isolation
US5302826A (en) * 1992-05-29 1994-04-12 Varian Associates, Inc. Quadrupole trap improved technique for collisional induced disassociation for MS/MS processes
DE4316738C2 (de) * 1993-05-19 1996-10-17 Bruker Franzen Analytik Gmbh Auswurf von Ionen aus Ionenfallen durch kombinierte elektrische Dipol- und Quadrupolfelder
US5378891A (en) * 1993-05-27 1995-01-03 Varian Associates, Inc. Method for selective collisional dissociation using border effect excitation with prior cooling time control
DE4324224C1 (de) * 1993-07-20 1994-10-06 Bruker Franzen Analytik Gmbh Quadrupol-Ionenfallen mit schaltbaren Multipol-Anteilen
DE4324233C1 (de) * 1993-07-20 1995-01-19 Bruker Franzen Analytik Gmbh Verfahren zur Auswahl der Reaktionspfade in Ionenfallen
DE4326549C1 (de) * 1993-08-07 1994-08-25 Bruker Franzen Analytik Gmbh Verfahren für eine Regelung der Raumladung in Ionenfallen
JPH095298A (ja) * 1995-06-06 1997-01-10 Varian Assoc Inc 四重極イオントラップ内の選択イオン種を検出する方法
DE19751401B4 (de) * 1997-11-20 2007-03-01 Bruker Daltonik Gmbh Quadrupol-Hochfrequenz-Ionenfallen für Massenspektrometer
US6124592A (en) * 1998-03-18 2000-09-26 Technispan Llc Ion mobility storage trap and method
US6469298B1 (en) * 1999-09-20 2002-10-22 Ut-Battelle, Llc Microscale ion trap mass spectrometer
DE10028914C1 (de) * 2000-06-10 2002-01-17 Bruker Daltonik Gmbh Interne Detektion von Ionen in Quadrupol-Ionenfallen
US20050253059A1 (en) * 2004-05-13 2005-11-17 Goeringer Douglas E Tandem-in-time and-in-space mass spectrometer and associated method for tandem mass spectrometry
US7034293B2 (en) * 2004-05-26 2006-04-25 Varian, Inc. Linear ion trap apparatus and method utilizing an asymmetrical trapping field
US7656236B2 (en) 2007-05-15 2010-02-02 Teledyne Wireless, Llc Noise canceling technique for frequency synthesizer
US8179045B2 (en) 2008-04-22 2012-05-15 Teledyne Wireless, Llc Slow wave structure having offset projections comprised of a metal-dielectric composite stack
US8505382B2 (en) 2011-02-10 2013-08-13 Ut-Battelle, Llc Nonlinear nanomechanical oscillators for ultrasensitive inertial detection
US9202660B2 (en) 2013-03-13 2015-12-01 Teledyne Wireless, Llc Asymmetrical slow wave structures to eliminate backward wave oscillations in wideband traveling wave tubes

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4540884A (en) * 1982-12-29 1985-09-10 Finnigan Corporation Method of mass analyzing a sample by use of a quadrupole ion trap
EP0409362B1 (fr) * 1985-05-24 1995-04-19 Finnigan Corporation Méthode de mise en oeuvre d'un piège à ions
US4755670A (en) * 1986-10-01 1988-07-05 Finnigan Corporation Fourtier transform quadrupole mass spectrometer and method
US4818869A (en) * 1987-05-22 1989-04-04 Finnigan Corporation Method of isolating a single mass or narrow range of masses and/or enhancing the sensitivity of an ion trap mass spectrometer
ATE99834T1 (de) * 1988-04-13 1994-01-15 Bruker Franzen Analytik Gmbh Methode zur massenanalyse einer probe mittels eines quistors und zur durchfuehrung dieses verfahrens entwickelter quistor.

Also Published As

Publication number Publication date
US4975577A (en) 1990-12-04
ATE101942T1 (de) 1994-03-15
DE68913290D1 (de) 1994-03-31
EP0383961B1 (fr) 1994-02-23
EP0383961A1 (fr) 1990-08-29
CA2010234C (fr) 1998-05-12
DE68913290T2 (de) 1994-05-26

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