CA2524003A1 - Systeme et procede pour modifier les champs de franges d'un appareil multipolaire a radiofrequences - Google Patents
Systeme et procede pour modifier les champs de franges d'un appareil multipolaire a radiofrequences Download PDFInfo
- Publication number
- CA2524003A1 CA2524003A1 CA002524003A CA2524003A CA2524003A1 CA 2524003 A1 CA2524003 A1 CA 2524003A1 CA 002524003 A CA002524003 A CA 002524003A CA 2524003 A CA2524003 A CA 2524003A CA 2524003 A1 CA2524003 A1 CA 2524003A1
- Authority
- CA
- Canada
- Prior art keywords
- voltage
- end device
- multipole
- pole pair
- entrance
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/26—Mass spectrometers or separator tubes
- H01J49/34—Dynamic spectrometers
- H01J49/42—Stability-of-path spectrometers, e.g. monopole, quadrupole, multipole, farvitrons
- H01J49/4205—Device types
- H01J49/422—Two-dimensional RF ion traps
- H01J49/4225—Multipole linear ion traps, e.g. quadrupoles, hexapoles
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/02—Details
- H01J49/06—Electron- or ion-optical arrangements
- H01J49/067—Ion lenses, apertures, skimmers
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Electron Tubes For Measurement (AREA)
- Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US10/448,376 US7019290B2 (en) | 2003-05-30 | 2003-05-30 | System and method for modifying the fringing fields of a radio frequency multipole |
US10/448,376 | 2003-05-30 | ||
PCT/CA2004/000685 WO2004107389A2 (fr) | 2003-05-30 | 2004-05-07 | Systeme et procede pour modifier les champs de franges d'un appareil multipolaire a radiofrequences |
Publications (2)
Publication Number | Publication Date |
---|---|
CA2524003A1 true CA2524003A1 (fr) | 2004-12-09 |
CA2524003C CA2524003C (fr) | 2013-02-05 |
Family
ID=33451472
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CA2524003A Expired - Fee Related CA2524003C (fr) | 2003-05-30 | 2004-05-07 | Systeme et procede pour modifier les champs de franges d'un appareil multipolaire a radiofrequences |
Country Status (5)
Country | Link |
---|---|
US (1) | US7019290B2 (fr) |
EP (1) | EP1634319A2 (fr) |
JP (1) | JP4769183B2 (fr) |
CA (1) | CA2524003C (fr) |
WO (1) | WO2004107389A2 (fr) |
Families Citing this family (15)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP1747573A4 (fr) * | 2004-05-20 | 2010-09-22 | Mds Inc Dba Mds Sciex | Procede d'obtention de champs de protection aux extremites d'entree et de sortie d'un spectrometre de masse |
US7633060B2 (en) | 2007-04-24 | 2009-12-15 | Thermo Finnigan Llc | Separation and axial ejection of ions based on m/z ratio |
US7880140B2 (en) * | 2007-05-02 | 2011-02-01 | Dh Technologies Development Pte. Ltd | Multipole mass filter having improved mass resolution |
US7557344B2 (en) * | 2007-07-09 | 2009-07-07 | Mds Analytical Technologies, A Business Unit Of Mds Inc. | Confining ions with fast-oscillating electric fields |
JP5341323B2 (ja) * | 2007-07-17 | 2013-11-13 | 株式会社日立ハイテクノロジーズ | 質量分析装置 |
US8334506B2 (en) | 2007-12-10 | 2012-12-18 | 1St Detect Corporation | End cap voltage control of ion traps |
US7973277B2 (en) | 2008-05-27 | 2011-07-05 | 1St Detect Corporation | Driving a mass spectrometer ion trap or mass filter |
JP5600430B2 (ja) * | 2009-12-28 | 2014-10-01 | 株式会社日立ハイテクノロジーズ | 質量分析装置及び質量分析方法 |
DE102010022184B4 (de) * | 2010-05-21 | 2013-04-04 | Bruker Daltonik Gmbh | Mischfrequenz-Stabsystem als Ionenreaktor |
US9305757B2 (en) * | 2011-12-29 | 2016-04-05 | Dh Technologies Development Pte. Ltd. | Ion extraction method for ion trap mass spectrometry |
EP3044805A4 (fr) * | 2013-09-13 | 2017-03-15 | DH Technologies Development PTE. Ltd. | Schéma de détection à rf uniquement et détection simultanée de multiples ions |
US9870911B2 (en) * | 2013-12-23 | 2018-01-16 | Dh Technologies Development Pte. Ltd. | Method and apparatus for processing ions |
TWI693625B (zh) * | 2017-05-09 | 2020-05-11 | 譜光儀器股份有限公司 | 四極離子阱裝置及四極離子阱質譜儀 |
CN108183061A (zh) * | 2017-11-20 | 2018-06-19 | 上海裕达实业有限公司 | 八电极线性离子阱质量分析器 |
CN110176384B (zh) * | 2019-04-25 | 2022-07-05 | 上海裕达实业有限公司 | 可变极数的多极离子导引装置及射频信号施加方法 |
Family Cites Families (35)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
IT528250A (fr) * | 1953-12-24 | |||
US3617736A (en) * | 1968-06-19 | 1971-11-02 | Hewlett Packard Co | Quadrupole mass filter with electrode structure for fringing-field compensation |
US3699330A (en) * | 1971-02-22 | 1972-10-17 | Bendix Corp | Mass filter electrode |
US4755670A (en) * | 1986-10-01 | 1988-07-05 | Finnigan Corporation | Fourtier transform quadrupole mass spectrometer and method |
US5206506A (en) * | 1991-02-12 | 1993-04-27 | Kirchner Nicholas J | Ion processing: control and analysis |
US5179278A (en) * | 1991-08-23 | 1993-01-12 | Mds Health Group Limited | Multipole inlet system for ion traps |
US5689111A (en) * | 1995-08-10 | 1997-11-18 | Analytica Of Branford, Inc. | Ion storage time-of-flight mass spectrometer |
DE19523859C2 (de) * | 1995-06-30 | 2000-04-27 | Bruker Daltonik Gmbh | Vorrichtung für die Reflektion geladener Teilchen |
US6075244A (en) * | 1995-07-03 | 2000-06-13 | Hitachi, Ltd. | Mass spectrometer |
AU6653296A (en) * | 1995-08-11 | 1997-03-12 | Mds Health Group Limited | Spectrometer with axial field |
US5576540A (en) * | 1995-08-11 | 1996-11-19 | Mds Health Group Limited | Mass spectrometer with radial ejection |
US5942752A (en) * | 1996-05-17 | 1999-08-24 | Hewlett-Packard Company | Higher pressure ion source for two dimensional radio-frequency quadrupole electric field for mass spectrometer |
US6177668B1 (en) * | 1996-06-06 | 2001-01-23 | Mds Inc. | Axial ejection in a multipole mass spectrometer |
US6028308A (en) * | 1996-11-18 | 2000-02-22 | Mds Inc. | Resolving RF mass spectrometer |
US5767513A (en) * | 1997-03-31 | 1998-06-16 | The United States Of America As Represented By The Secretary Of The Air Force | High temperature octopole ion guide with coaxially heated rods |
WO1998052209A1 (fr) * | 1997-05-12 | 1998-11-19 | Mds Inc. | Spectrometre de masse uniquement rf a excitation auxiliaire |
US6093929A (en) * | 1997-05-16 | 2000-07-25 | Mds Inc. | High pressure MS/MS system |
US6194717B1 (en) * | 1999-01-28 | 2001-02-27 | Mds Inc. | Quadrupole mass analyzer and method of operation in RF only mode to reduce background signal |
US6504148B1 (en) * | 1999-05-27 | 2003-01-07 | Mds Inc. | Quadrupole mass spectrometer with ION traps to enhance sensitivity |
US6534764B1 (en) * | 1999-06-11 | 2003-03-18 | Perseptive Biosystems | Tandem time-of-flight mass spectrometer with damping in collision cell and method for use |
WO2001015201A2 (fr) * | 1999-08-26 | 2001-03-01 | University Of New Hampshire | Spectrometre de masse a plusieurs etapes |
US6153880A (en) * | 1999-09-30 | 2000-11-28 | Agilent Technologies, Inc. | Method and apparatus for performance improvement of mass spectrometers using dynamic ion optics |
US6528784B1 (en) * | 1999-12-03 | 2003-03-04 | Thermo Finnigan Llc | Mass spectrometer system including a double ion guide interface and method of operation |
US6525312B1 (en) * | 2000-02-25 | 2003-02-25 | Mds Inc. | Mass spectrometer with method for real time removal of background signal |
US6417511B1 (en) * | 2000-07-17 | 2002-07-09 | Agilent Technologies, Inc. | Ring pole ion guide apparatus, systems and method |
US6720554B2 (en) * | 2000-07-21 | 2004-04-13 | Mds Inc. | Triple quadrupole mass spectrometer with capability to perform multiple mass analysis steps |
CA2317085C (fr) * | 2000-08-30 | 2009-12-15 | Mds Inc. | Dispositif et methode permettant de prevenir l'admission des gaz de la source d'ions dans les chambres de reaction/collision en spectrometrie de masse |
US6700120B2 (en) * | 2000-11-30 | 2004-03-02 | Mds Inc. | Method for improving signal-to-noise ratios for atmospheric pressure ionization mass spectrometry |
US6744043B2 (en) * | 2000-12-08 | 2004-06-01 | Mds Inc. | Ion mobilty spectrometer incorporating an ion guide in combination with an MS device |
JP3386048B2 (ja) * | 2000-12-14 | 2003-03-10 | 株式会社島津製作所 | イオントラップ型質量分析装置 |
US6713757B2 (en) * | 2001-03-02 | 2004-03-30 | Mds Inc. | Controlling the temporal response of mass spectrometers for mass spectrometry |
AU2002350343A1 (en) * | 2001-12-21 | 2003-07-15 | Mds Inc., Doing Business As Mds Sciex | Use of notched broadband waveforms in a linear ion trap |
US6797950B2 (en) * | 2002-02-04 | 2004-09-28 | Thermo Finnegan Llc | Two-dimensional quadrupole ion trap operated as a mass spectrometer |
US6723986B2 (en) * | 2002-03-15 | 2004-04-20 | Agilent Technologies, Inc. | Apparatus for manipulation of ions and methods of making apparatus |
US6703607B2 (en) * | 2002-05-30 | 2004-03-09 | Mds Inc. | Axial ejection resolution in multipole mass spectrometers |
-
2003
- 2003-05-30 US US10/448,376 patent/US7019290B2/en not_active Expired - Lifetime
-
2004
- 2004-05-07 EP EP04731562A patent/EP1634319A2/fr not_active Ceased
- 2004-05-07 CA CA2524003A patent/CA2524003C/fr not_active Expired - Fee Related
- 2004-05-07 WO PCT/CA2004/000685 patent/WO2004107389A2/fr active Application Filing
- 2004-05-07 JP JP2006508086A patent/JP4769183B2/ja not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
JP4769183B2 (ja) | 2011-09-07 |
US7019290B2 (en) | 2006-03-28 |
US20040238734A1 (en) | 2004-12-02 |
WO2004107389A3 (fr) | 2006-02-16 |
EP1634319A2 (fr) | 2006-03-15 |
WO2004107389A2 (fr) | 2004-12-09 |
CA2524003C (fr) | 2013-02-05 |
JP2006526261A (ja) | 2006-11-16 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
EEER | Examination request | ||
MKLA | Lapsed |
Effective date: 20220301 |
|
MKLA | Lapsed |
Effective date: 20200831 |