CA1228682A - Combined thermal analyzer and x-ray diffractometer - Google Patents
Combined thermal analyzer and x-ray diffractometerInfo
- Publication number
- CA1228682A CA1228682A CA000477340A CA477340A CA1228682A CA 1228682 A CA1228682 A CA 1228682A CA 000477340 A CA000477340 A CA 000477340A CA 477340 A CA477340 A CA 477340A CA 1228682 A CA1228682 A CA 1228682A
- Authority
- CA
- Canada
- Prior art keywords
- sample
- ray
- detector
- holder assembly
- sample holder
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
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- VGGSQFUCUMXWEO-UHFFFAOYSA-N Ethene Chemical compound C=C VGGSQFUCUMXWEO-UHFFFAOYSA-N 0.000 description 1
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- UFHFLCQGNIYNRP-UHFFFAOYSA-N Hydrogen Chemical compound [H][H] UFHFLCQGNIYNRP-UHFFFAOYSA-N 0.000 description 1
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- 229910052786 argon Inorganic materials 0.000 description 1
- AXGTXDWPVWSEOX-UHFFFAOYSA-N argon methane Chemical compound [Ar].[H]C[H].[H]C[H] AXGTXDWPVWSEOX-UHFFFAOYSA-N 0.000 description 1
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 1
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- 229910052732 germanium Inorganic materials 0.000 description 1
- GNPVGFCGXDBREM-UHFFFAOYSA-N germanium atom Chemical compound [Ge] GNPVGFCGXDBREM-UHFFFAOYSA-N 0.000 description 1
- 230000009477 glass transition Effects 0.000 description 1
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- 229910044991 metal oxide Inorganic materials 0.000 description 1
- 150000004706 metal oxides Chemical class 0.000 description 1
- UODJXAGZCXOXCY-UHFFFAOYSA-N methane xenon Chemical compound C.[Xe] UODJXAGZCXOXCY-UHFFFAOYSA-N 0.000 description 1
- 230000000869 mutational effect Effects 0.000 description 1
- 229910052757 nitrogen Inorganic materials 0.000 description 1
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- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 1
- 238000003860 storage Methods 0.000 description 1
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- 238000002076 thermal analysis method Methods 0.000 description 1
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Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
- G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N25/00—Investigating or analyzing materials by the use of thermal means
- G01N25/20—Investigating or analyzing materials by the use of thermal means by investigating the development of heat, i.e. calorimetry, e.g. by measuring specific heat, by measuring thermal conductivity
- G01N25/48—Investigating or analyzing materials by the use of thermal means by investigating the development of heat, i.e. calorimetry, e.g. by measuring specific heat, by measuring thermal conductivity on solution, sorption, or a chemical reaction not involving combustion or catalytic oxidation
- G01N25/4846—Investigating or analyzing materials by the use of thermal means by investigating the development of heat, i.e. calorimetry, e.g. by measuring specific heat, by measuring thermal conductivity on solution, sorption, or a chemical reaction not involving combustion or catalytic oxidation for a motionless, e.g. solid sample
- G01N25/4866—Investigating or analyzing materials by the use of thermal means by investigating the development of heat, i.e. calorimetry, e.g. by measuring specific heat, by measuring thermal conductivity on solution, sorption, or a chemical reaction not involving combustion or catalytic oxidation for a motionless, e.g. solid sample by using a differential method
Landscapes
- Chemical & Material Sciences (AREA)
- Biochemistry (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- General Physics & Mathematics (AREA)
- General Health & Medical Sciences (AREA)
- Analytical Chemistry (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Engineering & Computer Science (AREA)
- Combustion & Propulsion (AREA)
- Crystallography & Structural Chemistry (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
- Investigating Or Analyzing Materials Using Thermal Means (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US59589384A | 1984-04-02 | 1984-04-02 | |
| US595,893 | 1984-04-02 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CA1228682A true CA1228682A (en) | 1987-10-27 |
Family
ID=24385144
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CA000477340A Expired CA1228682A (en) | 1984-04-02 | 1985-03-25 | Combined thermal analyzer and x-ray diffractometer |
Country Status (5)
| Country | Link |
|---|---|
| JP (1) | JPS612050A (enrdf_load_html_response) |
| CA (1) | CA1228682A (enrdf_load_html_response) |
| DE (1) | DE3512046A1 (enrdf_load_html_response) |
| FR (1) | FR2566128B1 (enrdf_load_html_response) |
| GB (1) | GB2156974B (enrdf_load_html_response) |
Families Citing this family (14)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH07119650B2 (ja) * | 1987-06-01 | 1995-12-20 | 株式会社村田製作所 | 分光分析法 |
| JP2695165B2 (ja) * | 1987-10-09 | 1997-12-24 | 株式会社日立製作所 | 結晶構造解析法 |
| JPH0623697B2 (ja) * | 1987-12-25 | 1994-03-30 | 新日本製鐵株式会社 | 熱分析・顕微分光方法及びその装置 |
| DE19603520C1 (de) * | 1996-02-01 | 1997-07-31 | Hansgeorg Ratzenberger | Anordnung zur dynamischen-multi-simultan-Thermoanalyse |
| EP1184649A1 (de) * | 2000-09-04 | 2002-03-06 | Eidgenössische Technische Hochschule Zürich | Kalorimeter |
| JP2004125582A (ja) | 2002-10-02 | 2004-04-22 | Rigaku Corp | 分析装置及び分析方法 |
| EP2283346B1 (en) * | 2008-06-06 | 2018-11-21 | PerkinElmer Health Sciences, Inc. | Calorimeter and methods of using it and control systems therefor |
| JP2010048618A (ja) * | 2008-08-20 | 2010-03-04 | Tokyo Institute Of Technology | 相転移する試料の相転移条件の測定方法およびそのための測定装置 |
| JP5219281B2 (ja) * | 2009-03-02 | 2013-06-26 | 株式会社リガク | Ｘ線分析装置 |
| JP5361005B2 (ja) * | 2010-12-20 | 2013-12-04 | 株式会社リガク | Ｘ線回折・熱分析同時測定装置 |
| JP6294673B2 (ja) * | 2014-01-08 | 2018-03-14 | 住友ゴム工業株式会社 | 高分子材料解析方法 |
| WO2016170450A1 (en) * | 2015-04-20 | 2016-10-27 | Sabic Global Technologies B.V. | Method of improving dehydrogenation of hydrocarbons |
| FR3072777B1 (fr) * | 2017-10-23 | 2019-12-27 | Centre National De La Recherche Scientifique | Four d'analyse portable pour ligne de rayonnement |
| CN116183053B (zh) * | 2023-01-09 | 2025-08-15 | 中国航发沈阳发动机研究所 | 一种微小测温晶体温度数据分析方法 |
Family Cites Families (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| GB923025A (en) * | 1959-10-22 | 1963-04-10 | Rigaku Denki Company Ltd | An automatic recording system of x-ray diffraction patterns |
| GB945788A (en) * | 1959-12-22 | 1964-01-08 | Rigaku Denki Company Ltd | A system for measuring the lattice spacing of a crystal by means of x-rays |
| GB936910A (en) * | 1959-12-22 | 1963-09-18 | Rigaku Denki Company Ltd | A system for measuring the lattice spacing of a crystal by means of x-rays |
| US3263484A (en) * | 1962-04-04 | 1966-08-02 | Perkin Elmer Corp | Differential microcalorimeter |
| JPS4956694A (enrdf_load_html_response) * | 1972-09-29 | 1974-06-01 | ||
| GB2079465B (en) * | 1980-07-02 | 1984-06-27 | Nat Res Dev | Measurement of true density |
| JPS5735422A (en) * | 1980-08-12 | 1982-02-26 | Toshiba Corp | Semiconductor circuit |
| JPS5798847A (en) * | 1980-12-11 | 1982-06-19 | Nec Corp | X-ray diffractometer |
| GB2109924B (en) * | 1981-11-25 | 1985-02-06 | Schlumberger Electronics | Apparatus and method for measuring temperature profile |
| JPS5913945A (ja) * | 1982-07-15 | 1984-01-24 | Natl Inst For Res In Inorg Mater | 超高温可変雰囲気の物質構造解析装置 |
-
1985
- 1985-02-25 GB GB08504770A patent/GB2156974B/en not_active Expired
- 1985-03-25 CA CA000477340A patent/CA1228682A/en not_active Expired
- 1985-03-28 FR FR8504661A patent/FR2566128B1/fr not_active Expired
- 1985-04-02 DE DE19853512046 patent/DE3512046A1/de active Granted
- 1985-04-02 JP JP60069889A patent/JPS612050A/ja active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0548415B2 (enrdf_load_html_response) | 1993-07-21 |
| DE3512046C2 (enrdf_load_html_response) | 1989-05-18 |
| DE3512046A1 (de) | 1985-10-03 |
| GB8504770D0 (en) | 1985-03-27 |
| FR2566128A1 (fr) | 1985-12-20 |
| GB2156974A (en) | 1985-10-16 |
| FR2566128B1 (fr) | 1987-01-16 |
| GB2156974B (en) | 1988-10-05 |
| JPS612050A (ja) | 1986-01-08 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| MKEX | Expiry |