CA1189638A - Procedure for determining coating rates - Google Patents

Procedure for determining coating rates

Info

Publication number
CA1189638A
CA1189638A CA000403859A CA403859A CA1189638A CA 1189638 A CA1189638 A CA 1189638A CA 000403859 A CA000403859 A CA 000403859A CA 403859 A CA403859 A CA 403859A CA 1189638 A CA1189638 A CA 1189638A
Authority
CA
Canada
Prior art keywords
radiation
coating
detector
coating layers
paper
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
CA000403859A
Other languages
English (en)
French (fr)
Inventor
Heikki Venalainen
Rauno Rantanen
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Stora Enso Oyj
Original Assignee
Enso Gutzeit Oy
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Enso Gutzeit Oy filed Critical Enso Gutzeit Oy
Application granted granted Critical
Publication of CA1189638A publication Critical patent/CA1189638A/en
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B15/00—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons
    • G01B15/02—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring thickness
    • G01B15/025—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring thickness by measuring absorption

Landscapes

  • Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • General Physics & Mathematics (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
  • Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Emergency Protection Circuit Devices (AREA)
  • Paper (AREA)
CA000403859A 1981-05-29 1982-05-27 Procedure for determining coating rates Expired CA1189638A (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
FI811652 1981-05-29
FI811652A FI62420C (fi) 1981-05-29 1981-05-29 Foerfarande foer att maeta belaeggningsmaengd

Publications (1)

Publication Number Publication Date
CA1189638A true CA1189638A (en) 1985-06-25

Family

ID=8514438

Family Applications (1)

Application Number Title Priority Date Filing Date
CA000403859A Expired CA1189638A (en) 1981-05-29 1982-05-27 Procedure for determining coating rates

Country Status (7)

Country Link
CA (1) CA1189638A (fi)
DE (1) DE3219962A1 (fi)
FI (1) FI62420C (fi)
FR (1) FR2506929B1 (fi)
GB (1) GB2099994B (fi)
NO (1) NO154570C (fi)
SE (1) SE449137B (fi)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FI68320C (fi) * 1982-12-01 1985-08-12 Valtion Teknillinen Foerfarande foer att medelst straolning fraon en radioisotopkaella utan att foerstoera provet maeta foerdelningen av fyll-och/eller belaeggningsmedel i tjockleksriktningen av papp erartong eller liknande och halten av dessa medel anordnin rgafoer tillaempande av foerfarandet samt anvaendningar av erfoarandet och anordningarna
FI68321C (fi) * 1982-12-01 1985-08-12 Valtion Teknillinen Foerfarande foer att medelst straolning utsaend av ett roentgenroer utan att foerstoera provet maeta foerdelningen av fyll- och/eller belaeggningsmedel i tjockleksriktningen av papper kartong eller liknande och halten av dessa medel anordningar foer tillaempande av foerfarandet samt anvaendningar av foerfarandet och anordningarna
DE3890059T (fi) * 1987-02-06 1989-01-19
DE4106313A1 (de) * 1991-02-28 1992-09-03 Heidelberger Druckmasch Ag Verfahren und vorrichtung zur ermittlung der menge beziehungsweise der schichtdicke eines fluids
SE509846C2 (sv) * 1996-12-17 1999-03-15 Toolex Alpha Ab Förfarande för optisk tjockleksmätning av ett limskikt jämte optisk skiva och dess framställning samt limmedel och dess användning
US6508956B1 (en) 2001-07-25 2003-01-21 Lexmark International, Inc Paper coating test method and composition

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE925197C (de) * 1953-11-11 1955-03-14 Exatest Ges Fuer Messtechnik M Verfahren zur beruehrungslosen Dickenmessung von bandfoermigem, vorzugsweise von warmgewalztem Gut mittels harter elektromagnetischer Strahlung
US3405267A (en) * 1964-06-17 1968-10-08 Industrial Nucleonics Corp Inner layer displacement measuring method and apparatus
DE1548333A1 (de) * 1965-09-22 1969-08-21 Atomic Energy Authority Uk Schichtstaerkenmesser
FR1495097A (fr) * 1966-09-22 1967-09-15 Atomic Energy Authority Uk Calibres d'épaisseur fonctionnant par transmission
FI40587B (fi) * 1967-04-01 1968-11-30 Valmet Oy
US4037104A (en) * 1976-04-29 1977-07-19 Nucleonic Data Systems, Inc. Dual beam X-ray thickness gauge
US4147931A (en) * 1976-12-13 1979-04-03 Pertti Puumalainen Procedure for measuring unit area weights
FI53757C (fi) * 1976-12-13 1978-07-10 Pertti Puumalainen Foerfarande foer maetning av ytvikterna
US4081676A (en) * 1976-12-17 1978-03-28 Sentrol Systems Ltd. On-line system for monitoring sheet material additives
FI59489C (fi) * 1978-11-21 1981-08-10 Enso Gutzeit Oy Foerfarande foer maetning av belaeggningsmaengder

Also Published As

Publication number Publication date
GB2099994B (en) 1985-02-20
FR2506929B1 (fr) 1986-09-26
FI62420B (fi) 1982-08-31
NO154570C (no) 1986-10-22
DE3219962A1 (de) 1982-12-16
NO821806L (no) 1982-11-30
FR2506929A1 (fr) 1982-12-03
FI62420C (fi) 1982-12-10
SE8203315L (sv) 1982-11-30
GB2099994A (en) 1982-12-15
NO154570B (no) 1986-07-14
SE449137B (sv) 1987-04-06

Similar Documents

Publication Publication Date Title
US4377869A (en) Procedure for measuring coating rates
JPH0247697B2 (fi)
JP2849665B2 (ja) 基板上の皮膜の厚さと組成を計測するための方法
CA1189638A (en) Procedure for determining coating rates
US4147931A (en) Procedure for measuring unit area weights
US4458360A (en) Procedure for determining coating rates
EP0112079B1 (en) Measuring method and apparatus
US3754138A (en) Inner layer position measurement
US5579362A (en) Method of and apparatus for the quantitative measurement of paint coating
US4575634A (en) Assaying composite structures
CA1079414A (en) Procedure for measuring unit area weights
CA1163381A (en) X-ray fluorescent analysis with matrix compensation
US7253414B2 (en) Multi-energy gamma attenuation for real time continuous measurement of bulk material
US4668867A (en) Radiation gauge for determining weight percentages of the constituents of graphite-epoxy composite materials
USRE30884E (en) On-line system for monitoring sheet material additives
Hawkesworth Films for neutron radiography: an investigation of film-intensifying screen image recorders
JP2732460B2 (ja) 蛍光ｘ線分析方法
JP2613511B2 (ja) 蛍光ｘ線分析装置
JP3333940B2 (ja) Ｘ線を使用して層の厚みを測定する装置の較正装置および較正方法
CA1154883A (en) Procedure for measuring coating rates
Afshari et al. Quantitative measurement of lead in paint by XRF analysis without manual substrate correction
JPS6333096B2 (fi)
JPS592487Y2 (ja) 螢光ｘ線による鍍金厚測定装置
JP3399861B2 (ja) Ｘ線分析装置
JPH03181840A (ja) 密度測定方法及び装置

Legal Events

Date Code Title Description
MKEX Expiry