BRPI0906496A2 - inspeção de emenda de lata - Google Patents

inspeção de emenda de lata

Info

Publication number
BRPI0906496A2
BRPI0906496A2 BRPI0906496A BRPI0906496A BRPI0906496A2 BR PI0906496 A2 BRPI0906496 A2 BR PI0906496A2 BR PI0906496 A BRPI0906496 A BR PI0906496A BR PI0906496 A BRPI0906496 A BR PI0906496A BR PI0906496 A2 BRPI0906496 A2 BR PI0906496A2
Authority
BR
Brazil
Prior art keywords
tin
seam inspection
seam
inspection
tin seam
Prior art date
Application number
BRPI0906496A
Other languages
English (en)
Inventor
Albertus Zandhuis Johannes
Original Assignee
Alexis Grobjohann
Heinz Grobjohann
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Family has litigation
First worldwide family litigation filed litigation Critical https://patents.darts-ip.com/?family=39186263&utm_source=google_patent&utm_medium=platform_link&utm_campaign=public_patent_search&patent=BRPI0906496(A2) "Global patent litigation dataset” by Darts-ip is licensed under a Creative Commons Attribution 4.0 International License.
Application filed by Alexis Grobjohann, Heinz Grobjohann filed Critical Alexis Grobjohann
Publication of BRPI0906496A2 publication Critical patent/BRPI0906496A2/pt

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/22Details, e.g. general constructional or apparatus details
    • G01N29/223Supports, positioning or alignment in fixed situation
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B15/00Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B15/00Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons
    • G01B15/02Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring thickness
    • G01B15/025Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring thickness by measuring absorption
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/083Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the radiation being X-rays

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Biochemistry (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Electromagnetism (AREA)
  • Toxicology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
BRPI0906496A 2008-01-24 2009-01-20 inspeção de emenda de lata BRPI0906496A2 (pt)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
GBGB0801307.0A GB0801307D0 (en) 2008-01-24 2008-01-24 Can seam inspection
GB0817009A GB2456852A (en) 2008-01-24 2008-09-17 Can seam inspection
PCT/GB2009/000156 WO2009093015A1 (en) 2008-01-24 2009-01-20 Can seam inspection

Publications (1)

Publication Number Publication Date
BRPI0906496A2 true BRPI0906496A2 (pt) 2017-06-13

Family

ID=39186263

Family Applications (1)

Application Number Title Priority Date Filing Date
BRPI0906496A BRPI0906496A2 (pt) 2008-01-24 2009-01-20 inspeção de emenda de lata

Country Status (11)

Country Link
US (1) US8712009B2 (pt)
EP (1) EP2235509A1 (pt)
JP (1) JP5548137B2 (pt)
KR (1) KR20100135224A (pt)
CN (1) CN101939637B (pt)
AU (1) AU2009207481B2 (pt)
BR (1) BRPI0906496A2 (pt)
GB (2) GB0801307D0 (pt)
HK (1) HK1152753A1 (pt)
MX (1) MX2010007874A (pt)
WO (1) WO2009093015A1 (pt)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102008053825A1 (de) * 2008-10-27 2010-04-29 Cmc Kuhnke Gmbh Positioniereinrichtung für die Untersuchung eines Dosenfalzquerschnittes und der Dosenfalzfaltenbildung mittels Röntgenstrahlen
JP5877657B2 (ja) 2011-06-06 2016-03-08 倉敷紡績株式会社 ボトル缶の口金部検査方法および検査装置
FR3073044B1 (fr) * 2017-10-27 2020-10-02 Tiama Procede et dispositif de mesure de dimensions par rayons x, sur des recipients en verre vide defilant en ligne
FR3073043B1 (fr) * 2017-10-27 2019-11-15 Tiama Procede et installation de controle dimensionnel en ligne d'objets manufactures

Family Cites Families (27)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3852600A (en) * 1973-02-21 1974-12-03 Westinghouse Electric Corp X-ray method and apparatus for detecting mislocation of steel reinforcements in green tires
US4365339A (en) * 1975-12-23 1982-12-21 General Electric Company Tomographic apparatus and method for reconstructing planar slices from non-absorbed and non-scattered radiation
US4644573A (en) * 1979-09-17 1987-02-17 Picker Corporation Computed tomography method and apparatus
JPS6315767Y2 (pt) * 1981-04-07 1988-05-06
WO1988008970A1 (en) * 1987-05-06 1988-11-17 Toyo Seikan Kabushiki Kaisha Method of inspecting can seaming
JPH0721467B2 (ja) * 1987-05-06 1995-03-08 東洋製罐株式会社 缶巻締め部の検査方法
JPS63274853A (ja) * 1987-05-06 1988-11-11 Toyo Seikan Kaisha Ltd 缶巻締め部の検査方法
JP2662979B2 (ja) * 1988-06-03 1997-10-15 北海製罐株式会社 金属缶の2重巻締め部の検査方法及び装置
US4989225A (en) 1988-08-18 1991-01-29 Bio-Imaging Research, Inc. Cat scanner with simultaneous translation and rotation of objects
US4998268A (en) * 1989-02-09 1991-03-05 James Winter Apparatus and method for therapeutically irradiating a chosen area using a diagnostic computer tomography scanner
JPH0566120A (ja) * 1991-09-06 1993-03-19 Hitachi Medical Corp 缶巻締め部の測定方法
JP3408848B2 (ja) * 1993-11-02 2003-05-19 株式会社日立メディコ 散乱x線補正法及びx線ct装置並びに多チャンネルx線検出器
US5794499A (en) 1993-12-03 1998-08-18 Sapporo Breweries Ltd. Method of and apparatus for disassembling can for measurement of can seam dimensions
JP2956541B2 (ja) * 1995-07-24 1999-10-04 東洋製罐株式会社 缶巻締め部の検査方法及びその検査装置
JP2000055835A (ja) * 1998-08-11 2000-02-25 Hitachi Ltd 缶巻締部の寸法測定装置
DE19843397C1 (de) * 1998-09-22 2000-05-11 Hans Juergen Beierling Computertomographisches Verfahren und Computertomograph zur Prüfung eine Gegenstandes
DE19950794A1 (de) * 1999-10-21 2001-06-13 Siemens Ag Röntgeneinrichtung und Verfahren zur Beeinflussung von Röntgenstrahlung
US6987831B2 (en) * 1999-11-18 2006-01-17 University Of Rochester Apparatus and method for cone beam volume computed tomography breast imaging
RU2175126C1 (ru) * 2000-12-25 2001-10-20 Потрахов Николай Николаевич Способ неразрушающего контроля качества кольцевого соединения (варианты)
JP4699621B2 (ja) * 2001-03-09 2011-06-15 大和製罐株式会社 キャップの気密性非破壊検査方法及びその装置
JP2004093443A (ja) 2002-09-02 2004-03-25 Katsuhiko Ogiso 多層構造容器の寸法測定法
US20060044564A1 (en) * 2004-09-02 2006-03-02 Draayer Jerry P Systems and methods for investigation of living matter
DE102005062065A1 (de) 2005-12-22 2007-07-12 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. CT-Messverfahren
WO2008035286A2 (en) * 2006-09-22 2008-03-27 Koninklijke Philips Electronics N.V. Advanced computer-aided diagnosis of lung nodules
US7970102B2 (en) * 2008-07-24 2011-06-28 Inspx Llc Apparatus and method for detecting foreign materials in a container
DE102008053825A1 (de) * 2008-10-27 2010-04-29 Cmc Kuhnke Gmbh Positioniereinrichtung für die Untersuchung eines Dosenfalzquerschnittes und der Dosenfalzfaltenbildung mittels Röntgenstrahlen
JP4868034B2 (ja) * 2009-07-16 2012-02-01 横河電機株式会社 放射線検査装置

Also Published As

Publication number Publication date
KR20100135224A (ko) 2010-12-24
CN101939637B (zh) 2013-03-20
HK1152753A1 (en) 2012-03-09
CN101939637A (zh) 2011-01-05
MX2010007874A (es) 2010-12-21
EP2235509A1 (en) 2010-10-06
GB0801307D0 (en) 2008-03-05
AU2009207481B2 (en) 2014-03-20
JP5548137B2 (ja) 2014-07-16
AU2009207481A1 (en) 2009-07-30
GB2456852A (en) 2009-07-29
WO2009093015A1 (en) 2009-07-30
JP2011510316A (ja) 2011-03-31
US8712009B2 (en) 2014-04-29
GB0817009D0 (en) 2008-10-22
US20110150316A1 (en) 2011-06-23

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Legal Events

Date Code Title Description
B07A Application suspended after technical examination (opinion) [chapter 7.1 patent gazette]
B08F Application dismissed because of non-payment of annual fees [chapter 8.6 patent gazette]

Free format text: REFERENTE A 10A ANUIDADE.

B08K Patent lapsed as no evidence of payment of the annual fee has been furnished to inpi [chapter 8.11 patent gazette]

Free format text: EM VIRTUDE DO ARQUIVAMENTO PUBLICADO NA RPI 2497 DE 13-11-2018 E CONSIDERANDO AUSENCIA DE MANIFESTACAO DENTRO DOS PRAZOS LEGAIS, INFORMO QUE CABE SER MANTIDO O ARQUIVAMENTO DO PEDIDO DE PATENTE, CONFORME O DISPOSTO NO ARTIGO 12, DA RESOLUCAO 113/2013.