BRPI0711422B1 - aparelho e método para análise colorimétrica angular - Google Patents
aparelho e método para análise colorimétrica angular Download PDFInfo
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- BRPI0711422B1 BRPI0711422B1 BRPI0711422A BRPI0711422A BRPI0711422B1 BR PI0711422 B1 BRPI0711422 B1 BR PI0711422B1 BR PI0711422 A BRPI0711422 A BR PI0711422A BR PI0711422 A BRPI0711422 A BR PI0711422A BR PI0711422 B1 BRPI0711422 B1 BR PI0711422B1
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Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/55—Specular reflectivity
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/55—Specular reflectivity
- G01N2021/558—Measuring reflectivity and transmission
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/55—Specular reflectivity
- G01N21/57—Measuring gloss
- G01N2021/575—Photogoniometering
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/8422—Investigating thin films, e.g. matrix isolation method
- G01N2021/8427—Coatings
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Spectrometry And Color Measurement (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US11/418,062 US7548317B2 (en) | 2006-05-05 | 2006-05-05 | Apparatus and method for angular colorimetry |
| US11/418,062 | 2006-05-05 | ||
| PCT/US2007/068230 WO2007131162A2 (en) | 2006-05-05 | 2007-05-04 | Apparatus and method for angular colorimetry |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| BRPI0711422A2 BRPI0711422A2 (pt) | 2011-11-01 |
| BRPI0711422A8 BRPI0711422A8 (pt) | 2018-03-06 |
| BRPI0711422B1 true BRPI0711422B1 (pt) | 2018-12-26 |
Family
ID=38660902
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| BRPI0711422A BRPI0711422B1 (pt) | 2006-05-05 | 2007-05-04 | aparelho e método para análise colorimétrica angular |
Country Status (9)
| Country | Link |
|---|---|
| US (1) | US7548317B2 (enExample) |
| EP (1) | EP2021770B1 (enExample) |
| JP (3) | JP5340920B2 (enExample) |
| CN (1) | CN101479593B (enExample) |
| BR (1) | BRPI0711422B1 (enExample) |
| CA (1) | CA2650945C (enExample) |
| MX (1) | MX2008014191A (enExample) |
| RU (1) | RU2427821C2 (enExample) |
| WO (1) | WO2007131162A2 (enExample) |
Families Citing this family (57)
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| US20100005911A1 (en) * | 2008-07-11 | 2010-01-14 | Atlas Material Testing Technology, Llc | Weathering Test Apparatus With Real-Time Color Measurement |
| US8169612B2 (en) * | 2009-05-28 | 2012-05-01 | Koosur Technologies Inc. | System and method for performing ellipsometric measurements on an arbitrarily large or continuously moving sample |
| RU2454638C1 (ru) * | 2010-12-17 | 2012-06-27 | Федеральное государственное унитарное предприятие "Всероссийский научно-исследовательский институт автоматики им. Н.Л. Духова" (ФГУП "ВНИИА") | Детектор светового излучения |
| DE102011117713B4 (de) * | 2011-07-28 | 2014-02-27 | Alfred-Wegener-Institut Helmholtz-Zentrum für Polar- und Meeresforschung | Transportables Goniospektrometer mit konstantem Observationszentrum |
| CN103018007A (zh) * | 2011-09-22 | 2013-04-03 | 致茂电子股份有限公司 | 一种光学感测系统及装置 |
| JP2013096784A (ja) * | 2011-10-31 | 2013-05-20 | Toppan Printing Co Ltd | 表面特性測定装置及びコンピュータプログラム |
| CN102564740A (zh) * | 2011-12-28 | 2012-07-11 | 北京奥博泰科技有限公司 | 一种变角度玻璃反射测量装置及方法 |
| CN102589698B (zh) * | 2012-03-14 | 2014-07-16 | 中国科学院物理研究所 | 一种可变角度反射测量装置及其操作方法 |
| CN102818538B (zh) * | 2012-09-14 | 2014-09-10 | 洛阳兰迪玻璃机器股份有限公司 | 基于调制玻璃线结构激光图像的检测系统 |
| JP6221738B2 (ja) * | 2013-01-07 | 2017-11-01 | セイコーエプソン株式会社 | 記録媒体判別装置および記録媒体判別方法 |
| CN103076159A (zh) * | 2013-01-08 | 2013-05-01 | 孙体生 | 一种反射器光度测试的光路系统 |
| CN104215187A (zh) * | 2013-05-31 | 2014-12-17 | 昆山胜泽光电科技有限公司 | 测量ar减反膜厚度和折射率的装置 |
| CN103344613B (zh) * | 2013-07-26 | 2016-09-28 | 杭州远方光电信息股份有限公司 | 一种材料反射特性测量装置及方法 |
| CN103712919B (zh) * | 2013-11-02 | 2015-12-30 | 深圳市科彩印务有限公司 | 一种素面镭射纸颜色特性的表征与检测方法 |
| CN104330240B (zh) * | 2013-12-13 | 2016-08-31 | 北京印刷学院 | 一种用分光光度计测量光柱镭射纸光栅参数的方法 |
| DE102014100594A1 (de) * | 2014-01-20 | 2015-07-23 | Isra Surface Vision Gmbh | Vorrichtung zur Inspektion eines mit einer beschichteten Oberfläche versehenen Materials und entsprechendes Verfahren |
| JP6267550B2 (ja) * | 2014-03-12 | 2018-01-24 | キヤノン株式会社 | 測定装置および測定方法 |
| CN103852430B (zh) * | 2014-03-28 | 2016-04-13 | 北京印刷学院 | 一种喷铝纸pop油墨印刷色的测量与表征方法 |
| CN103940844B (zh) * | 2014-05-15 | 2017-10-10 | 黑龙江大学 | 线性调频多光束激光外差测量金属线膨胀系数的方法 |
| US10061058B2 (en) * | 2014-05-21 | 2018-08-28 | Universal City Studios Llc | Tracking system and method for use in surveying amusement park equipment |
| CN104316190A (zh) * | 2014-11-03 | 2015-01-28 | 苏州精创光学仪器有限公司 | 测量玻璃不同角度颜色、亮度和反射率光谱的方法 |
| US9625309B2 (en) * | 2014-12-03 | 2017-04-18 | Ecole Polytechnique Federale De Lausanne (Epfl) | Device for determining a bidirectional reflectance distribution function of a subject |
| CN105042343B (zh) * | 2015-06-09 | 2017-12-22 | 中国人民解放军武汉军械士官学校 | 一种便携式宽光谱多靶标光源装置 |
| CN106908390B (zh) * | 2015-12-23 | 2019-11-19 | 高准精密工业股份有限公司 | 光学装置 |
| CN105675544B (zh) * | 2016-04-19 | 2018-10-12 | 大连爱瑞德纳米科技有限公司 | 太阳能隔热膜反射率及透射率测试仪 |
| RU2718483C2 (ru) * | 2016-09-23 | 2020-04-08 | Общество с ограниченной ответственностью "Гардиан Стекло Сервиз" | Система и/или способ распознавания покрытия для стекла |
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| JP2018189517A (ja) * | 2017-05-08 | 2018-11-29 | キヤノン株式会社 | 計測装置、および物品製造方法 |
| RU2663301C1 (ru) * | 2017-06-01 | 2018-08-03 | Российская Федерация, от имени которой выступает Государственная корпорация по космической деятельности "РОСКОСМОС" | Устройство для измерения коэффициентов отражения и излучения материалов и покрытий |
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| US10429174B2 (en) * | 2017-12-20 | 2019-10-01 | Texas Instruments Incorporated | Single wavelength reflection for leadframe brightness measurement |
| CN108226057A (zh) * | 2018-03-23 | 2018-06-29 | 北京奥博泰科技有限公司 | 一种镀膜玻璃反射比和颜色的测量装置及方法 |
| EA038184B1 (ru) * | 2019-01-14 | 2021-07-20 | Общество С Ограниченной Ответственностью "Эссентоптикс" | Спектрофотометр |
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| CN110763657B (zh) * | 2019-11-20 | 2022-05-13 | 江苏赛诺格兰医疗科技有限公司 | 用于反射材料反射率测试系统的光电数字转换系统 |
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| RU207344U1 (ru) * | 2021-05-11 | 2021-10-25 | Федеральное государственное бюджетное научное учреждение «Федеральный научный агроинженерный центр ВИМ» (ФГБНУ ФНАЦ ВИМ) | Измеритель цвета |
| JP7700232B2 (ja) | 2021-06-18 | 2025-06-30 | 浜松ホトニクス株式会社 | 測定装置 |
| CN113695267B (zh) * | 2021-08-30 | 2023-05-26 | 深圳市洲明科技股份有限公司 | 一种墨色分选装置及其分选方法 |
| CN113985592B (zh) * | 2021-09-24 | 2024-09-03 | 江苏锐精光电研究院有限公司 | 基于色散元件的多角度全内反射照明成像装置 |
| CN115031841B (zh) * | 2022-08-10 | 2022-12-09 | 武汉精立电子技术有限公司 | 一种光学测量设备、安装方法及应用方法 |
| CN117740736B (zh) * | 2023-11-30 | 2024-11-19 | 江苏北方湖光光电有限公司 | 一种低反射光吸收层表面漫反射测量方法 |
Family Cites Families (24)
| Publication number | Priority date | Publication date | Assignee | Title |
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| US4054391A (en) * | 1975-12-18 | 1977-10-18 | Xerox Corporation | Specular reflectance microdensitometer |
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-
2006
- 2006-05-05 US US11/418,062 patent/US7548317B2/en active Active
-
2007
- 2007-05-04 CN CN2007800217670A patent/CN101479593B/zh not_active Expired - Fee Related
- 2007-05-04 CA CA2650945A patent/CA2650945C/en active Active
- 2007-05-04 MX MX2008014191A patent/MX2008014191A/es active IP Right Grant
- 2007-05-04 WO PCT/US2007/068230 patent/WO2007131162A2/en not_active Ceased
- 2007-05-04 BR BRPI0711422A patent/BRPI0711422B1/pt not_active IP Right Cessation
- 2007-05-04 JP JP2009510095A patent/JP5340920B2/ja not_active Expired - Fee Related
- 2007-05-04 RU RU2008147913/28A patent/RU2427821C2/ru active
- 2007-05-04 EP EP07783273.1A patent/EP2021770B1/en not_active Not-in-force
-
2013
- 2013-06-05 JP JP2013118474A patent/JP5797695B2/ja not_active Expired - Fee Related
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2015
- 2015-06-03 JP JP2015113311A patent/JP2015200664A/ja active Pending
Also Published As
| Publication number | Publication date |
|---|---|
| US7548317B2 (en) | 2009-06-16 |
| JP5797695B2 (ja) | 2015-10-21 |
| JP2013228396A (ja) | 2013-11-07 |
| CN101479593A (zh) | 2009-07-08 |
| CN101479593B (zh) | 2012-10-10 |
| JP2009536358A (ja) | 2009-10-08 |
| EP2021770A2 (en) | 2009-02-11 |
| MX2008014191A (es) | 2009-02-04 |
| WO2007131162A2 (en) | 2007-11-15 |
| US20070258093A1 (en) | 2007-11-08 |
| BRPI0711422A8 (pt) | 2018-03-06 |
| RU2008147913A (ru) | 2010-06-10 |
| EP2021770B1 (en) | 2013-08-21 |
| JP5340920B2 (ja) | 2013-11-13 |
| CA2650945A1 (en) | 2007-11-15 |
| RU2427821C2 (ru) | 2011-08-27 |
| JP2015200664A (ja) | 2015-11-12 |
| BRPI0711422A2 (pt) | 2011-11-01 |
| WO2007131162A3 (en) | 2008-11-06 |
| CA2650945C (en) | 2017-08-22 |
| EP2021770A4 (en) | 2010-08-04 |
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