JP5340920B2 - 角度に対する色度測定(angularcolorimetry)のための装置及びその方法 - Google Patents
角度に対する色度測定(angularcolorimetry)のための装置及びその方法 Download PDFInfo
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- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
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Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US11/418,062 US7548317B2 (en) | 2006-05-05 | 2006-05-05 | Apparatus and method for angular colorimetry |
| US11/418,062 | 2006-05-05 | ||
| PCT/US2007/068230 WO2007131162A2 (en) | 2006-05-05 | 2007-05-04 | Apparatus and method for angular colorimetry |
Related Child Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2013118474A Division JP5797695B2 (ja) | 2006-05-05 | 2013-06-05 | 角度に対する色度測定(angularcolorimetry)のための装置及びその方法 |
Publications (3)
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| JP2009536358A JP2009536358A (ja) | 2009-10-08 |
| JP2009536358A5 JP2009536358A5 (enExample) | 2012-12-20 |
| JP5340920B2 true JP5340920B2 (ja) | 2013-11-13 |
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| JP2009510095A Expired - Fee Related JP5340920B2 (ja) | 2006-05-05 | 2007-05-04 | 角度に対する色度測定(angularcolorimetry)のための装置及びその方法 |
| JP2013118474A Expired - Fee Related JP5797695B2 (ja) | 2006-05-05 | 2013-06-05 | 角度に対する色度測定(angularcolorimetry)のための装置及びその方法 |
| JP2015113311A Pending JP2015200664A (ja) | 2006-05-05 | 2015-06-03 | 角度に対する色度測定(angularcolorimetry)のための装置及びその方法 |
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| Application Number | Title | Priority Date | Filing Date |
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| JP2013118474A Expired - Fee Related JP5797695B2 (ja) | 2006-05-05 | 2013-06-05 | 角度に対する色度測定(angularcolorimetry)のための装置及びその方法 |
| JP2015113311A Pending JP2015200664A (ja) | 2006-05-05 | 2015-06-03 | 角度に対する色度測定(angularcolorimetry)のための装置及びその方法 |
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| MX (1) | MX2008014191A (enExample) |
| RU (1) | RU2427821C2 (enExample) |
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Families Citing this family (57)
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| RU2454638C1 (ru) * | 2010-12-17 | 2012-06-27 | Федеральное государственное унитарное предприятие "Всероссийский научно-исследовательский институт автоматики им. Н.Л. Духова" (ФГУП "ВНИИА") | Детектор светового излучения |
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| WO2022191131A1 (ja) * | 2021-03-08 | 2022-09-15 | 大日本印刷株式会社 | 干渉色の評価方法、光学フィルム、偏光板、及び画像表示装置 |
| RU207344U1 (ru) * | 2021-05-11 | 2021-10-25 | Федеральное государственное бюджетное научное учреждение «Федеральный научный агроинженерный центр ВИМ» (ФГБНУ ФНАЦ ВИМ) | Измеритель цвета |
| WO2022264495A1 (ja) | 2021-06-18 | 2022-12-22 | 浜松ホトニクス株式会社 | 測定装置 |
| CN113695267B (zh) * | 2021-08-30 | 2023-05-26 | 深圳市洲明科技股份有限公司 | 一种墨色分选装置及其分选方法 |
| CN113985592B (zh) * | 2021-09-24 | 2024-09-03 | 江苏锐精光电研究院有限公司 | 基于色散元件的多角度全内反射照明成像装置 |
| CN115031841B (zh) * | 2022-08-10 | 2022-12-09 | 武汉精立电子技术有限公司 | 一种光学测量设备、安装方法及应用方法 |
| CN117740736B (zh) * | 2023-11-30 | 2024-11-19 | 江苏北方湖光光电有限公司 | 一种低反射光吸收层表面漫反射测量方法 |
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| CA1226453A (en) * | 1984-06-19 | 1987-09-08 | Gerald H. Shaffer | Device and method for measuring light diffusely reflected from a nonuniform specimen |
| EP0189551B1 (de) * | 1984-12-14 | 1988-10-26 | Flachglas Aktiengesellschaft | Verfahren und Vorrichtung zum Prüfen von transparenten Materialbahnen, insbesondere Flachglasbändern |
| FI78355C (fi) * | 1986-05-27 | 1989-07-10 | Puumalaisen Tutkimuslaitos Oy | Metod foer maetning av glans och apparatur foer tillaempning av metoden. |
| JPH0769215B2 (ja) * | 1987-03-28 | 1995-07-26 | 茂夫 南 | 薄膜状試料の分光分析方法 |
| JPS6435306A (en) * | 1987-07-31 | 1989-02-06 | Ricoh Kk | Incidence angle determining method for refractive index and film thickness measurement |
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| CN1144906A (zh) * | 1995-09-06 | 1997-03-12 | 东南大学 | 薄膜厚度和折射率的成像检测法及其设备 |
| JP3631365B2 (ja) * | 1998-02-10 | 2005-03-23 | 日本ペイント株式会社 | 変角分光反射率の測定方法 |
| US6432729B1 (en) * | 1999-09-29 | 2002-08-13 | Lam Research Corporation | Method for characterization of microelectronic feature quality |
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| AUPR420201A0 (en) * | 2001-04-04 | 2001-05-03 | Varian Australia Pty Ltd | Measuring specular reflectance of a sample |
| DE10246563A1 (de) * | 2002-10-05 | 2004-04-15 | november Aktiengesellschaft Gesellschaft für Molekulare Medizin | Vorrichtung und Verfahren zur Bestimmung der Farbe/n auf einer Oberfläche |
| FR2849181B1 (fr) * | 2002-12-23 | 2005-12-23 | Commissariat Energie Atomique | Procede d'etude des reliefs d'une structure par voie optique |
| JP3760234B2 (ja) * | 2003-02-27 | 2006-03-29 | 独立行政法人産業技術総合研究所 | 双楕円柱面鏡を用いた対称x型光学系 |
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| CN100485364C (zh) * | 2004-09-22 | 2009-05-06 | 上海光谱仪器有限公司 | 一种光学参数绝对值测量仪及其测量方法 |
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| EP2021770A2 (en) | 2009-02-11 |
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| JP2013228396A (ja) | 2013-11-07 |
| CA2650945C (en) | 2017-08-22 |
| BRPI0711422A8 (pt) | 2018-03-06 |
| WO2007131162A2 (en) | 2007-11-15 |
| EP2021770B1 (en) | 2013-08-21 |
| JP2015200664A (ja) | 2015-11-12 |
| RU2008147913A (ru) | 2010-06-10 |
| MX2008014191A (es) | 2009-02-04 |
| JP5797695B2 (ja) | 2015-10-21 |
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