BR112016007071A2 - turbidímetro nefelométrico e método para detecção da contaminação de um cuvete de amostra de um turbidímetro nefelométrico - Google Patents

turbidímetro nefelométrico e método para detecção da contaminação de um cuvete de amostra de um turbidímetro nefelométrico

Info

Publication number
BR112016007071A2
BR112016007071A2 BR112016007071A BR112016007071A BR112016007071A2 BR 112016007071 A2 BR112016007071 A2 BR 112016007071A2 BR 112016007071 A BR112016007071 A BR 112016007071A BR 112016007071 A BR112016007071 A BR 112016007071A BR 112016007071 A2 BR112016007071 A2 BR 112016007071A2
Authority
BR
Brazil
Prior art keywords
cuvette
turbidimeter
nephelometric turbidimeter
nephelometric
diffuser
Prior art date
Application number
BR112016007071A
Other languages
English (en)
Other versions
BR112016007071B1 (pt
Inventor
Golitz Andreas
Mitreiter Andreas
Leyer Axel
De Heij Bas
Gassner Bernd
Hanschke Clemens
Steinhauer Frank
Kumpch Hans-Joachim
Heidemanns Lothar
Battefeld Manfred
Kussmann Michael
Küppers Michael
Original Assignee
Hach Lange Gmbh
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hach Lange Gmbh filed Critical Hach Lange Gmbh
Publication of BR112016007071A2 publication Critical patent/BR112016007071A2/pt
Publication of BR112016007071B1 publication Critical patent/BR112016007071B1/pt

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47Scattering, i.e. diffuse reflection
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47Scattering, i.e. diffuse reflection
    • G01N21/49Scattering, i.e. diffuse reflection within a body or fluid
    • G01N21/51Scattering, i.e. diffuse reflection within a body or fluid inside a container, e.g. in an ampoule
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/01Arrangements or apparatus for facilitating the optical investigation
    • G01N21/15Preventing contamination of the components of the optical system or obstruction of the light path
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47Scattering, i.e. diffuse reflection
    • G01N21/4785Standardising light scatter apparatus; Standards therefor
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/94Investigating contamination, e.g. dust
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/01Arrangements or apparatus for facilitating the optical investigation
    • G01N21/15Preventing contamination of the components of the optical system or obstruction of the light path
    • G01N2021/152Scraping; Brushing; Moving band
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/01Arrangements or apparatus for facilitating the optical investigation
    • G01N21/15Preventing contamination of the components of the optical system or obstruction of the light path
    • G01N2021/155Monitoring cleanness of window, lens, or other parts
    • G01N2021/157Monitoring by optical means
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47Scattering, i.e. diffuse reflection
    • G01N2021/4704Angular selective
    • G01N2021/4726Detecting scatter at 90°
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47Scattering, i.e. diffuse reflection
    • G01N2021/473Compensating for unwanted scatter, e.g. reliefs, marks
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00Features of devices classified in G01N21/00
    • G01N2201/06Illumination; Optics
    • G01N2201/063Illuminating optical parts
    • G01N2201/0634Diffuse illumination

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Optical Measuring Cells (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)

Abstract

resumo turbidímetro nefelométrico e método para detecção da contaminação de um cuvete de amostra de um turbidímetro nefelométrico a invenção se refere a um turbidímetro nefelométrico (10) para medir uma turbidez de uma amostra líquida (49) em um cuvete de amostra (40). o turbidímetro (10) compreende: uma fonte de luz de medição (20) para emitir um feixe de luz paralelo axial (60) direcionado para o cuvete (40), um detector de luz de dispersão (30) disposto para receber luz dispersa (66) que não advém de modo axial do cuvete (40) e um difusor comutável (50) com um corpo de difusor óptico (52) e um atuador de difusor (54) para mover o corpo de difusor (52,52') entre uma posição de repouso na qual o corpo de difusor (52) não interfere com o feixe de luz emitido (60) e uma posição de teste entre a fonte de luz (20) e o cuvete (40) na qual o corpo de difusor (52') interfere com o feixe de luz emitido (60) para gerar luz de teste difusa (63) que entra no cuvete (40). 1/1
BR112016007071-2A 2013-09-30 2013-09-30 turbidímetro nefelométrico e método para detecção da contaminação de um cuvete de amostra de um turbidímetro nefelométrico BR112016007071B1 (pt)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/EP2013/070353 WO2015043675A1 (en) 2013-09-30 2013-09-30 Nephelometric turbidimeter and method for detection of the contamination of a sample cuvette of a nephelometric turbidimeter

Publications (2)

Publication Number Publication Date
BR112016007071A2 true BR112016007071A2 (pt) 2017-08-01
BR112016007071B1 BR112016007071B1 (pt) 2020-12-08

Family

ID=49274646

Family Applications (1)

Application Number Title Priority Date Filing Date
BR112016007071-2A BR112016007071B1 (pt) 2013-09-30 2013-09-30 turbidímetro nefelométrico e método para detecção da contaminação de um cuvete de amostra de um turbidímetro nefelométrico

Country Status (8)

Country Link
US (2) US9851297B2 (pt)
EP (1) EP3052921B1 (pt)
JP (1) JP6246376B2 (pt)
KR (1) KR101832074B1 (pt)
CN (1) CN105637342B (pt)
BR (1) BR112016007071B1 (pt)
CA (1) CA2924771C (pt)
WO (1) WO2015043675A1 (pt)

Families Citing this family (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US10082461B2 (en) * 2014-07-29 2018-09-25 Nanometrics Incorporated Optical metrology with purged reference chip
CA2953026A1 (en) 2014-09-19 2016-03-24 Hach Company Nephelometric turbidimeter with axial illumination and circumferential photodetector
EP3023768B1 (en) * 2014-11-21 2020-03-04 Hach Lange GmbH A nephelometric turbidimeter and method for controlling the humidity of venting air in a nephelometric turbidimeter
EP3026421B1 (en) * 2014-11-27 2017-05-03 Hach Lange GmbH A nephelometric process turbidimeter
CN104833624A (zh) * 2015-05-20 2015-08-12 浙江科技学院 一种基于光纤的浊度测量方法及装置
CN109690320B (zh) * 2016-09-14 2022-11-08 株式会社日立高新技术 自动分析装置及其分析方法
CN106706536B (zh) * 2017-02-09 2023-06-23 天健创新(北京)监测仪表股份有限公司 一种管网末梢的浊度检测装置
JP6966858B2 (ja) * 2017-03-30 2021-11-17 倉敷紡績株式会社 性状測定装置及び性状測定方法
JP7054343B2 (ja) * 2017-12-26 2022-04-13 川崎重工業株式会社 分注装置及び分注方法
CN109813657B (zh) * 2019-03-06 2021-07-06 广西速竟科技有限公司 一种污水水质高效检测仪
KR102182384B1 (ko) * 2019-07-12 2020-11-24 주식회사 제이텍 수용액의 비접촉식 온라인 광학 분석장치
CN110726719A (zh) * 2019-10-17 2020-01-24 广西贺州市桂东电子科技有限责任公司 一种阳极化成箔电解液氯离子含量检测装置及其检测方法
CN110736723B (zh) * 2019-10-18 2022-08-16 常州罗盘星检测科技有限公司 一种在线式同时检测低浊和高浊的方法与系统
CN114766006A (zh) * 2019-11-27 2022-07-19 哈希公司 浊度计清洁
US10823662B1 (en) * 2020-02-18 2020-11-03 Horiba Instruments, Incorporated Special purpose cuvette assembly and method for optical microscopy of nanoparticle colloids
KR20240057200A (ko) * 2022-10-24 2024-05-02 엘지전자 주식회사 탁도 측정 장치 및 방법

Family Cites Families (34)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3497690A (en) * 1967-09-21 1970-02-24 Bausch & Lomb Method and apparatus for classifying biological cells by measuring the size and fluorescent response thereof
US3727066A (en) * 1968-02-16 1973-04-10 Baxter Laboratories Inc Probe photometer with fluid sensing device
IT969233B (it) * 1972-01-26 1974-03-30 Meier J Procedimento per determinare la tra sparenza ai raggi e o la torbidita di un mezzo apparecchio per l atta zione di detto procedimento ed ap plicazione del detto procedimento
US4165179A (en) * 1976-08-19 1979-08-21 Nippon Precision Optical Instrument Co., Ltd. Device for wiping optical window in turbidimeter or similar optical instrument for examining liquid sample
US4055768A (en) * 1976-09-07 1977-10-25 Bromberg Nathan S Light measuring apparatus
US4118625A (en) * 1977-05-02 1978-10-03 Dynatech Laboratories Incorporated Nephelometer having pulsed energy source
GB2010479A (en) 1977-09-21 1979-06-27 Partech Ltd Turbidity Measurement
US4325910A (en) * 1979-07-11 1982-04-20 Technicraft, Inc. Automated multiple-purpose chemical-analysis apparatus
US4305659A (en) * 1980-03-06 1981-12-15 Baxter Travenol Laboratories, Inc. Photometric apparatus and method
JPS56140240A (en) * 1980-04-04 1981-11-02 Hitachi Ltd Photometer for blood coagulation measurement
JPH02259451A (ja) * 1989-03-30 1990-10-22 Shimadzu Corp 濁度計
CN2068681U (zh) * 1990-05-29 1991-01-02 上海自来水公司节水设备总厂 探头式光电浑浊度测量传感器
JP3242500B2 (ja) * 1993-09-07 2001-12-25 東亜ディーケーケー株式会社 吸光光度計の自己診断方法
JPH07243964A (ja) * 1994-03-07 1995-09-19 Doriko Kk 水質測定装置及び水質測定方法、並びに排水処理方法
US5506679A (en) * 1994-09-08 1996-04-09 Hach Company Nephelometer instrument
US5467187A (en) * 1994-09-29 1995-11-14 Hf Scientific, Inc. Automatic calibration system for turbidimeters using a pulsing fluid flow to reciprocate a standard in a cuvette
BR9816343B1 (pt) * 1997-05-23 2012-08-21 método de operação de um aparelho de teste microbiológico diagnóstico e método de execução de teste microbiológico diagnóstico.
US5912737A (en) * 1998-06-01 1999-06-15 Hach Company System for verifying the calibration of a turbidimeter
DE19922812C2 (de) * 1999-05-19 2001-10-25 Merck Patent Gmbh Messung von Trübungen mittels Reflektometrie
JP3669686B2 (ja) * 1999-11-18 2005-07-13 松下電器産業株式会社 散乱光計測方法、尿検査方法および散乱光計測装置
US6307630B1 (en) * 1999-11-19 2001-10-23 Hach Company Turbidimeter array system
DE10204963A1 (de) * 2002-02-06 2003-08-14 Isco Inc Fotometrische Sonde für Untersuchungen an Flüssigkeiten sowie Verfahren hierfür
JP2006153738A (ja) 2004-11-30 2006-06-15 Dkk Toa Corp 積分球式濁度計
US20090149776A1 (en) * 2007-12-05 2009-06-11 Adams Scott C Optical sensor for detecting infection and other anomalous conditions associated with catheter systems
KR100903133B1 (ko) * 2007-12-17 2009-06-16 한국전자통신연구원 광공동을 이용한 고감도 혼탁도 센서 및 센싱 방법
KR20090098453A (ko) * 2008-03-14 2009-09-17 삼성전자주식회사 탁도센서와 이를 갖는 가전기기
DE102008018592A1 (de) 2008-04-11 2009-10-15 Endress + Hauser Conducta Gesellschaft für Mess- und Regeltechnik mbH + Co. KG Verfahren und Vorrichtung zur Trübungsmessung
US7663751B1 (en) * 2009-02-10 2010-02-16 Herbert Leckie Mitchell Nephelometer instrument for measuring turbidity of water
DE102010002420A1 (de) * 2010-02-26 2011-09-01 Robert Bosch Gmbh Verfahren und Vorrichtung zur Bestimmung der Qualität der Messergebnisse eines Streulichtmessgerätes
CN202693474U (zh) * 2012-08-17 2013-01-23 重庆市科学技术研究院 一种用于水质在线检测的浊度传感器
CN202886281U (zh) * 2012-11-27 2013-04-17 重庆市科学技术研究院 一种浊度传感器
CN202974867U (zh) * 2012-12-19 2013-06-05 重庆川仪分析仪器有限公司 带清洗功能的浊度仪
JP6189179B2 (ja) * 2013-11-01 2017-08-30 シスメックス株式会社 容器洗浄装置および分析装置
US9182344B1 (en) * 2014-11-18 2015-11-10 Herbert Mitchell Device for the detector of fouling on optical surfaces of a nephelometric turbidimeter submerged in a liquid

Also Published As

Publication number Publication date
US20160231240A1 (en) 2016-08-11
EP3052921A1 (en) 2016-08-10
EP3052921B1 (en) 2018-07-25
KR20160077047A (ko) 2016-07-01
US10126236B2 (en) 2018-11-13
CN105637342B (zh) 2019-03-26
BR112016007071B1 (pt) 2020-12-08
JP6246376B2 (ja) 2017-12-13
WO2015043675A1 (en) 2015-04-02
CA2924771A1 (en) 2015-04-02
US9851297B2 (en) 2017-12-26
JP2016532128A (ja) 2016-10-13
KR101832074B1 (ko) 2018-02-23
CN105637342A (zh) 2016-06-01
CA2924771C (en) 2018-08-07
US20180059016A1 (en) 2018-03-01

Similar Documents

Publication Publication Date Title
BR112016007071A2 (pt) turbidímetro nefelométrico e método para detecção da contaminação de um cuvete de amostra de um turbidímetro nefelométrico
BR112014032930A2 (pt) coleta de amostra e sistema de análise bioluminescente
BR112018072627A2 (pt) realização de medições óticas em uma amostra
BR112016029542A2 (pt) análise não invasiva de substância
BRPI1013532A2 (pt) espectrômetro sem cubeta
MX365089B (es) Analisis de imagen y medicion de muestras biologicas.
WO2007090378A3 (de) Messvorrichtung zur bestimmung der grösse, grössenverteilung und menge von partikeln im nanoskopischen bereich
BR112017018841A2 (pt) sensor óptico, e, método.
WO2016132222A3 (en) Scanning infrared measurement system
BR112014004698A2 (pt) dispositivo de teste compreendendo um filtro ótico e um método de teste
MX371134B (es) Aparato para la inspeccion optica de pequenos volumenes de muestra liquida y cubetas para las mismas.
MX350930B (es) Sensor fluorométrico multicanal y método de uso del mismo.
BR112017019008A2 (pt) medição online de pó preto em gás e pipelines de óleo
FR2959864A1 (fr) Dispositif et procede d'inspection de plaquettes semi-conductrices en mouvement.
WO2018069024A4 (en) Particle characterisation instrument
SG11201802651PA (en) System and method for optically measuring the stability and aggregation of particles
EP2843392A3 (en) Apparatus for photometric measurement of biological liquids
BR112014016019A2 (pt) monitor de analito
EP2784481A3 (en) Particle measuring apparatus
WO2013140350A3 (fr) Procede et appareil de caracterisation d'echantillons par mesure de la diffusion lumineuse et de la fluorescence.
CL2016003141A1 (es) Método y aparato para el proceso de flotación por espuma utilizando mediciones ópticas
GB201203186D0 (en) Measurement apparatus
BR112014026197A2 (pt) analisador de amostra e método para analisar uma amostra de ensaio
BR112022011312A2 (pt) Análise de um analito disposto dentro de um meio
WO2017078504A3 (ko) 공정가스 분석장치

Legal Events

Date Code Title Description
B06F Objections, documents and/or translations needed after an examination request according art. 34 industrial property law
B06U Preliminary requirement: requests with searches performed by other patent offices: suspension of the patent application procedure
B09A Decision: intention to grant
B16A Patent or certificate of addition of invention granted

Free format text: PRAZO DE VALIDADE: 20 (VINTE) ANOS CONTADOS A PARTIR DE 30/09/2013, OBSERVADAS AS CONDICOES LEGAIS.