BR112015012550A2 - matriz detectora e método - Google Patents

matriz detectora e método

Info

Publication number
BR112015012550A2
BR112015012550A2 BR112015012550A BR112015012550A BR112015012550A2 BR 112015012550 A2 BR112015012550 A2 BR 112015012550A2 BR 112015012550 A BR112015012550 A BR 112015012550A BR 112015012550 A BR112015012550 A BR 112015012550A BR 112015012550 A2 BR112015012550 A2 BR 112015012550A2
Authority
BR
Brazil
Prior art keywords
sub
cavity
detector matrix
light photons
detector
Prior art date
Application number
BR112015012550A
Other languages
English (en)
Portuguese (pt)
Inventor
Anthony Chappo Marc
Peter Luhta Randall
Original Assignee
Koninklijke Philips Nv
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Koninklijke Philips Nv filed Critical Koninklijke Philips Nv
Publication of BR112015012550A2 publication Critical patent/BR112015012550A2/pt

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/20—Measuring radiation intensity with scintillation detectors
    • G01T1/2018—Scintillation-photodiode combinations
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/20—Measuring radiation intensity with scintillation detectors
    • G01T1/208—Circuits specially adapted for scintillation detectors, e.g. for the photo-multiplier section
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/161—Applications in the field of nuclear medicine, e.g. in vivo counting

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Molecular Biology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Engineering & Computer Science (AREA)
  • Biomedical Technology (AREA)
  • General Health & Medical Sciences (AREA)
  • Medical Informatics (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Optics & Photonics (AREA)
  • Measurement Of Radiation (AREA)
  • Apparatus For Radiation Diagnosis (AREA)
BR112015012550A 2012-12-03 2013-11-22 matriz detectora e método BR112015012550A2 (pt)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US201261732513P 2012-12-03 2012-12-03
PCT/IB2013/060327 WO2014087295A1 (en) 2012-12-03 2013-11-22 Imaging detector

Publications (1)

Publication Number Publication Date
BR112015012550A2 true BR112015012550A2 (pt) 2018-02-06

Family

ID=50030353

Family Applications (1)

Application Number Title Priority Date Filing Date
BR112015012550A BR112015012550A2 (pt) 2012-12-03 2013-11-22 matriz detectora e método

Country Status (7)

Country Link
US (1) US9638810B2 (enExample)
EP (1) EP2926165B1 (enExample)
JP (1) JP6445978B2 (enExample)
CN (1) CN104838286B (enExample)
BR (1) BR112015012550A2 (enExample)
RU (1) RU2015126552A (enExample)
WO (1) WO2014087295A1 (enExample)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN107850676B (zh) * 2015-08-07 2022-01-14 皇家飞利浦有限公司 基于量子点的成像探测器
JP2019531464A (ja) * 2016-08-03 2019-10-31 コーニンクレッカ フィリップス エヌ ヴェＫｏｎｉｎｋｌｉｊｋｅ Ｐｈｉｌｉｐｓ Ｎ．Ｖ． 三次元固体イメージング光検出器
JP7065843B6 (ja) * 2016-10-26 2022-06-07 コーニンクレッカ フィリップス エヌ ヴェ 一体型スルーホール相互接続部を備える放射線検出器シンチレータ
EP3382719A1 (en) * 2017-03-27 2018-10-03 Koninklijke Philips N.V. Detector arrangement for an x-ray phase contrast system and method for x-ray contrast imaging
EP3499272A1 (en) * 2017-12-14 2019-06-19 Koninklijke Philips N.V. Structured surface part for radiation capturing devices, method of manufacturing such a part and x-ray detector
EP3850399A1 (en) * 2018-09-10 2021-07-21 Koninklijke Philips N.V. Dual-sensor subpixel radiation detector
EP3690489A1 (en) * 2019-01-29 2020-08-05 Koninklijke Philips N.V. Dual-sensor subpixel radiation detector
CN113031044B (zh) * 2019-12-25 2024-01-19 同方威视技术股份有限公司 用于辐射检查的探测器及探测装置
US20230349827A1 (en) * 2020-02-28 2023-11-02 Atomic Energy Of Canada Limited/Énergie Atomique Du Canada Limitée Method and apparatus for detecting alpha particles in a sample containing sample media and water
US11860319B2 (en) * 2022-03-10 2024-01-02 GE Precision Healthcare LLC High-resolution detector having a reduced number of pixels

Family Cites Families (21)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0416147B1 (de) 1989-09-06 1992-12-23 Siemens Aktiengesellschaft Röntgendetektor
DE9012148U1 (de) * 1989-09-06 1991-01-10 Siemens AG, 8000 München Röntgendetektor
DE4011861A1 (de) 1990-04-09 1991-10-10 Siemens Ag Halbleiterelement mit einer schwach dotierten silizium-schicht mit einer pin-diodenstruktur
SE513536C2 (sv) 1999-01-21 2000-09-25 Christer Froejdh Arrangemang för en röntgenbildpunktsdetektoranordning samt anordning vid ett röntgenavbildningsarrangemang
JP2001027673A (ja) 1999-07-15 2001-01-30 Hitachi Medical Corp Ｘ線検出器及びこれを用いるｘ線ｃｔ装置
US6593636B1 (en) 2000-12-05 2003-07-15 Udt Sensors, Inc. High speed silicon photodiodes and method of manufacture
US6510195B1 (en) 2001-07-18 2003-01-21 Koninklijke Philips Electronics, N.V. Solid state x-radiation detector modules and mosaics thereof, and an imaging method and apparatus employing the same
US6933489B2 (en) 2002-05-10 2005-08-23 Hamamatsu Photonics K.K. Back illuminated photodiode array and method of manufacturing the same
US7810740B2 (en) 2002-11-18 2010-10-12 Hamamatsu Photonics K.K. Back illuminated photodiode array, manufacturing method and semiconductor device thereof
US20060067472A1 (en) * 2004-09-30 2006-03-30 Possin George E Method and apparatus for measuring X-ray energy
US7329875B2 (en) 2004-11-23 2008-02-12 General Electric Company Detector array for imaging system and method of making same
JP4192990B2 (ja) 2006-03-13 2008-12-10 日立金属株式会社 放射線検出装置
RU2408110C2 (ru) 2006-03-30 2010-12-27 Конинклейке Филипс Электроникс, Н.В. Матрица детекторов излучения
US8816287B2 (en) 2008-01-14 2014-08-26 Weinberg Medical Physics Llc Structures for radiation detection and energy conversion using quantum dots
US7977643B2 (en) 2008-01-14 2011-07-12 Irving Weinberg Radiation detector assembly, radiation detector, and method for radiation detection
WO2010018475A2 (en) * 2008-08-13 2010-02-18 Koninklijke Philips Electronics, N.V. Method and apparatus for detecting low and high x-ray flux
US9151668B1 (en) 2011-01-12 2015-10-06 Radiation Monitoring Devices, Inc. Quantum dot radiation detection, systems and methods
KR101132852B1 (ko) 2011-01-26 2012-04-03 주식회사 동부하이텍 픽셀 어레이 및 이를 포함하는 이미지센서
US8970706B2 (en) 2011-09-22 2015-03-03 Basil Henry Scott Dual pixel pitch imaging array with extended dynamic range
US9373732B2 (en) 2012-02-07 2016-06-21 Semiconductor Components Industries, Llc Image sensors with reflective optical cavity pixels
KR102007277B1 (ko) 2013-03-11 2019-08-05 삼성전자주식회사 3차원 이미지 센서의 거리 픽셀 및 이를 포함하는 3차원 이미지 센서

Also Published As

Publication number Publication date
US20150276939A1 (en) 2015-10-01
EP2926165B1 (en) 2020-05-27
CN104838286B (zh) 2019-06-21
CN104838286A (zh) 2015-08-12
EP2926165A1 (en) 2015-10-07
RU2015126552A (ru) 2017-01-11
WO2014087295A1 (en) 2014-06-12
JP2016503506A (ja) 2016-02-04
US9638810B2 (en) 2017-05-02
JP6445978B2 (ja) 2018-12-26

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Legal Events

Date Code Title Description
B08F Application dismissed because of non-payment of annual fees [chapter 8.6 patent gazette]

Free format text: REFERENTE A 5A ANUIDADE.

B08K Patent lapsed as no evidence of payment of the annual fee has been furnished to inpi [chapter 8.11 patent gazette]

Free format text: EM VIRTUDE DO ARQUIVAMENTO PUBLICADO NA RPI 2494 DE 23-10-2018 E CONSIDERANDO AUSENCIA DE MANIFESTACAO DENTRO DOS PRAZOS LEGAIS, INFORMO QUE CABE SER MANTIDO O ARQUIVAMENTO DO PEDIDO DE PATENTE, CONFORME O DISPOSTO NO ARTIGO 12, DA RESOLUCAO 113/2013.