JP2010525359A5 - - Google Patents

Download PDF

Info

Publication number
JP2010525359A5
JP2010525359A5 JP2010504927A JP2010504927A JP2010525359A5 JP 2010525359 A5 JP2010525359 A5 JP 2010525359A5 JP 2010504927 A JP2010504927 A JP 2010504927A JP 2010504927 A JP2010504927 A JP 2010504927A JP 2010525359 A5 JP2010525359 A5 JP 2010525359A5
Authority
JP
Japan
Prior art keywords
reflective layer
detector
scintillator
substrate
wavelength
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2010504927A
Other languages
English (en)
Japanese (ja)
Other versions
JP2010525359A (ja
JP4790863B2 (ja
Filing date
Publication date
Application filed filed Critical
Priority claimed from PCT/IB2008/051469 external-priority patent/WO2008129473A2/en
Publication of JP2010525359A publication Critical patent/JP2010525359A/ja
Publication of JP2010525359A5 publication Critical patent/JP2010525359A5/ja
Application granted granted Critical
Publication of JP4790863B2 publication Critical patent/JP4790863B2/ja
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

JP2010504927A 2007-04-23 2008-04-17 部分的に透明なシンチレータ基板を有する検出器、検査装置及びその製造方法 Expired - Fee Related JP4790863B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
EP07106737 2007-04-23
EP07106737.5 2007-04-23
PCT/IB2008/051469 WO2008129473A2 (en) 2007-04-23 2008-04-17 Detector with a partially transparent scintillator substrate

Publications (3)

Publication Number Publication Date
JP2010525359A JP2010525359A (ja) 2010-07-22
JP2010525359A5 true JP2010525359A5 (enExample) 2011-06-02
JP4790863B2 JP4790863B2 (ja) 2011-10-12

Family

ID=39876037

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2010504927A Expired - Fee Related JP4790863B2 (ja) 2007-04-23 2008-04-17 部分的に透明なシンチレータ基板を有する検出器、検査装置及びその製造方法

Country Status (6)

Country Link
US (1) US20100116996A1 (enExample)
EP (1) EP2142943A2 (enExample)
JP (1) JP4790863B2 (enExample)
CN (1) CN101669041B (enExample)
RU (1) RU2468392C2 (enExample)
WO (1) WO2008129473A2 (enExample)

Families Citing this family (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2938705B1 (fr) * 2008-11-14 2011-02-25 Trixell Detecteur de rayonnement x a l'etat solide
JPWO2011010482A1 (ja) * 2009-07-24 2012-12-27 コニカミノルタエムジー株式会社 放射線画像検出器
US9995831B2 (en) 2010-04-26 2018-06-12 Koninklijke Philips N.V. X-ray detector with improved spatial gain uniformity and resolution and method of fabricating such X-ray detector
JP5469040B2 (ja) 2010-11-18 2014-04-09 富士フイルム株式会社 放射線画像撮影装置
JP2012141291A (ja) * 2010-12-16 2012-07-26 Fujifilm Corp 放射線撮影装置
US8772728B2 (en) 2010-12-31 2014-07-08 Carestream Health, Inc. Apparatus and methods for high performance radiographic imaging array including reflective capability
JP5653829B2 (ja) * 2011-04-25 2015-01-14 富士フイルム株式会社 放射線撮影装置、放射線撮影システム及び放射線撮影方法
WO2013061762A1 (ja) * 2011-10-25 2013-05-02 富士フイルム株式会社 放射線画像撮影システム及び放射線検出装置
JP6179362B2 (ja) 2013-11-14 2017-08-16 コニカミノルタ株式会社 ブライトバーンの消去方法およびブライトバーン消去機能を有する放射線画像撮影装置
JP6546933B2 (ja) * 2014-04-17 2019-07-17 ガタン インコーポレイテッドGatan,Inc. ハイブリッドエネルギー変換器
CN105326523B (zh) * 2014-07-28 2020-07-28 Ge医疗系统环球技术有限公司 医疗用x射线探测器
US11016204B2 (en) 2015-12-11 2021-05-25 Shanghai United Imaging Healthcare Co., Ltd. Imaging system and method for making the same
RU2694331C1 (ru) * 2018-10-26 2019-07-11 Акционерное общество "Научно-исследовательский институт технической физики и автоматизации" (АО "НИИТФА") Способ двухэнергетической томографии в коническом пучке и схема устройства двухэнергетического детектора
RU2702316C1 (ru) * 2018-10-26 2019-10-07 Акционерное общество "Научно-исследовательский институт технической физики и автоматизации" (АО "НИИТФА") Способ верификации укладки пациента при дистанционной лучевой терапии и схема устройства двухэнергетического детектора
US11194063B2 (en) * 2019-12-30 2021-12-07 Rayence Co., Ltd. X-ray detector having driver micro integrated chips printed on photodiode layer
WO2025193664A1 (en) * 2024-03-11 2025-09-18 Arizona Board Of Regents On Behalf Of Arizona State University Method and apparatus for synchronizing optical and electron beam pulses

Family Cites Families (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2598250B1 (fr) * 1986-04-30 1988-07-08 Thomson Csf Panneau de prise de vue radiologique, et procede de fabrication
FR2605166B1 (fr) * 1986-10-09 1989-02-10 Thomson Csf Dispositif photosensible a l'etat solide, procede de lecture et procede de fabrication
FR2627924B1 (fr) * 1988-02-26 1990-06-22 Thomson Csf Dispositif photosensible et detecteur d'images comportant un tel dispositif, notamment detecteur d'images a double energie
FR2631132B1 (fr) * 1988-05-03 1991-09-20 Thomson Csf Detecteur d'images radiologiques
FR2634947B1 (fr) * 1988-07-29 1990-09-14 Thomson Csf Matrice photosensible a deux diodes de meme polarite et une capacite par point photosensible
US5563421A (en) * 1995-06-07 1996-10-08 Sterling Diagnostic Imaging, Inc. Apparatus and method for eliminating residual charges in an image capture panel
US5949848A (en) * 1996-07-19 1999-09-07 Varian Assocaites, Inc. X-ray imaging apparatus and method using a flat amorphous silicon imaging panel
US5936230A (en) * 1996-11-19 1999-08-10 Xerox Corporation High light collection X-ray image sensor array
JP2000131444A (ja) * 1998-10-28 2000-05-12 Canon Inc 放射線検出装置、放射線検出システム、及び放射線検出装置の製造方法
JP2000171614A (ja) * 1998-12-07 2000-06-23 Teijin Ltd 半透過反射体
JP2001074845A (ja) * 1999-09-03 2001-03-23 Canon Inc 半導体装置及びそれを用いた放射線撮像システム
WO2002006853A1 (en) * 2000-03-31 2002-01-24 Koninklijke Philips Electronics N.V. Fdxd-detector for measuring dose
DE10034575A1 (de) * 2000-07-14 2002-01-24 Philips Corp Intellectual Pty Röntgendetektor mit verbesserter Lichtausbeute
DE10132924A1 (de) * 2001-07-06 2003-01-16 Philips Corp Intellectual Pty Flacher dynamischer Strahlungsdetektor
AU2003230134A1 (en) * 2002-05-29 2003-12-12 Koninklijke Philips Electronics N.V. X-ray detector with csi: ti conversion layer
WO2004095067A1 (en) * 2003-04-24 2004-11-04 Philips Intellectual Property & Standards Gmbh X-ray detector element
WO2004111680A2 (en) * 2003-06-19 2004-12-23 Koninklijke Philips Electronics N.V. Solid-state radiation detector

Similar Documents

Publication Publication Date Title
JP2010525359A5 (enExample)
RU2009142853A (ru) Детектор с частично прозрачной подложкой сцинтиллятора
WO2007111669A3 (en) Combined x-ray and optical tomographic imaging system
US9031195B2 (en) Imaging detector and methods for image detection
CN111465840A (zh) 用于相衬x射线成像的高分辨率x射线探测的方法和系统
JP2011500147A5 (enExample)
JP2007232636A5 (enExample)
Horstmann et al. Full-field speckle interferometry for non-contact photoacoustic tomography
JP2012045400A5 (enExample)
WO2010070527A3 (en) Semicircular inversed offset scanning for enlarged field of view 3d
JP2014510270A (ja) 有効大きさが実サイズより大きい検出器アレイ{detectorarrayhavingeffectivesizelargerthanactualsize}
EP1869500A1 (fr) Dispositif limitant l'apparition d'artefacts de decodage pour gamma camera a masque code
JP2013152160A5 (enExample)
JP5526062B2 (ja) 放射線画像撮影装置および欠陥画素位置情報取得方法
EP2387779A1 (en) Tomographic imaging using poissonian detector data
US20130039533A1 (en) Methods and systems for image detection
Taheri et al. ZnO nanowires in polycarbonate membrane as a high resolution X-ray detector (a Geant4 simulation)
Miller et al. Recent advances in BazookaSPECT: Real-time data processing and the development of a gamma-ray microscope
CN104323790A (zh) 同轴相衬成像方法及系统和相衬ct方法及系统
Cao et al. Bayesian reconstruction strategy of fluorescence-mediated tomography using an integrated SPECT-CT-OT system
JP2005253815A (ja) クロストーク補正方法およびx線ct装置
WO2007106674A3 (en) Nuclear medicine imaging system with high efficiency transmission measurement
KR100973338B1 (ko) 부분 화소형 섬광체 엑스선 센서
JP2019531464A5 (enExample)
KR100964653B1 (ko) 광 테이프를 이용한 대면적 x선 검출장치의 제조 방법