JP2016503506A5 - - Google Patents

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Publication number
JP2016503506A5
JP2016503506A5 JP2015544582A JP2015544582A JP2016503506A5 JP 2016503506 A5 JP2016503506 A5 JP 2016503506A5 JP 2015544582 A JP2015544582 A JP 2015544582A JP 2015544582 A JP2015544582 A JP 2015544582A JP 2016503506 A5 JP2016503506 A5 JP 2016503506A5
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JP
Japan
Prior art keywords
sub
photosensitive
detector array
detector
scintillator
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Application number
JP2015544582A
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English (en)
Japanese (ja)
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JP6445978B2 (ja
JP2016503506A (ja
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Priority claimed from PCT/IB2013/060327 external-priority patent/WO2014087295A1/en
Publication of JP2016503506A publication Critical patent/JP2016503506A/ja
Publication of JP2016503506A5 publication Critical patent/JP2016503506A5/ja
Application granted granted Critical
Publication of JP6445978B2 publication Critical patent/JP6445978B2/ja
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

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JP2015544582A 2012-12-03 2013-11-22 イメージング検出器 Expired - Fee Related JP6445978B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US201261732513P 2012-12-03 2012-12-03
US61/732,513 2012-12-03
PCT/IB2013/060327 WO2014087295A1 (en) 2012-12-03 2013-11-22 Imaging detector

Publications (3)

Publication Number Publication Date
JP2016503506A JP2016503506A (ja) 2016-02-04
JP2016503506A5 true JP2016503506A5 (enExample) 2017-01-05
JP6445978B2 JP6445978B2 (ja) 2018-12-26

Family

ID=50030353

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2015544582A Expired - Fee Related JP6445978B2 (ja) 2012-12-03 2013-11-22 イメージング検出器

Country Status (7)

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US (1) US9638810B2 (enExample)
EP (1) EP2926165B1 (enExample)
JP (1) JP6445978B2 (enExample)
CN (1) CN104838286B (enExample)
BR (1) BR112015012550A2 (enExample)
RU (1) RU2015126552A (enExample)
WO (1) WO2014087295A1 (enExample)

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Publication number Priority date Publication date Assignee Title
JP6876033B2 (ja) * 2015-08-07 2021-05-26 コーニンクレッカ フィリップス エヌ ヴェＫｏｎｉｎｋｌｉｊｋｅ Ｐｈｉｌｉｐｓ Ｎ．Ｖ． 量子ドットに基づくイメージング検出器
CN109642957A (zh) * 2016-08-03 2019-04-16 皇家飞利浦有限公司 三维固态成像光电探测器
EP3532872B1 (en) * 2016-10-26 2024-05-01 Koninklijke Philips N.V. Radiation detector scintillator with an integral through-hole interconnect
EP3382719A1 (en) * 2017-03-27 2018-10-03 Koninklijke Philips N.V. Detector arrangement for an x-ray phase contrast system and method for x-ray contrast imaging
EP3499272A1 (en) * 2017-12-14 2019-06-19 Koninklijke Philips N.V. Structured surface part for radiation capturing devices, method of manufacturing such a part and x-ray detector
CN112673286B (zh) * 2018-09-10 2024-11-01 皇家飞利浦有限公司 双传感器子像素辐射探测器
EP3690489A1 (en) * 2019-01-29 2020-08-05 Koninklijke Philips N.V. Dual-sensor subpixel radiation detector
CN113031044B (zh) * 2019-12-25 2024-01-19 同方威视技术股份有限公司 用于辐射检查的探测器及探测装置
CA3169083A1 (en) * 2020-02-28 2021-09-02 Nicholas SIMPSON Method and apparatus for detecting alpha particles in a sample containing sample media and water
US11860319B2 (en) * 2022-03-10 2024-01-02 GE Precision Healthcare LLC High-resolution detector having a reduced number of pixels

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DE9012148U1 (de) * 1989-09-06 1991-01-10 Siemens AG, 8000 München Röntgendetektor
EP0416147B1 (de) * 1989-09-06 1992-12-23 Siemens Aktiengesellschaft Röntgendetektor
DE4011861A1 (de) 1990-04-09 1991-10-10 Siemens Ag Halbleiterelement mit einer schwach dotierten silizium-schicht mit einer pin-diodenstruktur
SE513536C2 (sv) 1999-01-21 2000-09-25 Christer Froejdh Arrangemang för en röntgenbildpunktsdetektoranordning samt anordning vid ett röntgenavbildningsarrangemang
JP2001027673A (ja) 1999-07-15 2001-01-30 Hitachi Medical Corp Ｘ線検出器及びこれを用いるｘ線ｃｔ装置
US6593636B1 (en) 2000-12-05 2003-07-15 Udt Sensors, Inc. High speed silicon photodiodes and method of manufacture
US6510195B1 (en) 2001-07-18 2003-01-21 Koninklijke Philips Electronics, N.V. Solid state x-radiation detector modules and mosaics thereof, and an imaging method and apparatus employing the same
US6933489B2 (en) 2002-05-10 2005-08-23 Hamamatsu Photonics K.K. Back illuminated photodiode array and method of manufacturing the same
US7810740B2 (en) 2002-11-18 2010-10-12 Hamamatsu Photonics K.K. Back illuminated photodiode array, manufacturing method and semiconductor device thereof
US20060067472A1 (en) * 2004-09-30 2006-03-30 Possin George E Method and apparatus for measuring X-ray energy
US7329875B2 (en) * 2004-11-23 2008-02-12 General Electric Company Detector array for imaging system and method of making same
JP4192990B2 (ja) 2006-03-13 2008-12-10 日立金属株式会社 放射線検出装置
RU2408110C2 (ru) 2006-03-30 2010-12-27 Конинклейке Филипс Электроникс, Н.В. Матрица детекторов излучения
US7977643B2 (en) 2008-01-14 2011-07-12 Irving Weinberg Radiation detector assembly, radiation detector, and method for radiation detection
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US8660236B2 (en) * 2008-08-13 2014-02-25 Koninklijke Philips N.V. Method and apparatus for detecting low and high x-ray flux
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KR101132852B1 (ko) 2011-01-26 2012-04-03 주식회사 동부하이텍 픽셀 어레이 및 이를 포함하는 이미지센서
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