BR0007163A - Método de calibração de um conversor de analógico para digital, e, equipamento de calibração para calibrar um conversor de analógico para digital - Google Patents

Método de calibração de um conversor de analógico para digital, e, equipamento de calibração para calibrar um conversor de analógico para digital

Info

Publication number
BR0007163A
BR0007163A BR0007163-3A BR0007163A BR0007163A BR 0007163 A BR0007163 A BR 0007163A BR 0007163 A BR0007163 A BR 0007163A BR 0007163 A BR0007163 A BR 0007163A
Authority
BR
Brazil
Prior art keywords
analog
digital converter
digital
calibration
voltage sector
Prior art date
Application number
BR0007163-3A
Other languages
English (en)
Inventor
Paavo Kosonen
Original Assignee
Nokia Networks Oy
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nokia Networks Oy filed Critical Nokia Networks Oy
Publication of BR0007163A publication Critical patent/BR0007163A/pt

Links

Classifications

    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/10—Calibration or testing
    • H03M1/1009—Calibration
    • H03M1/1033—Calibration over the full range of the converter, e.g. for correcting differential non-linearity
    • H03M1/1038—Calibration over the full range of the converter, e.g. for correcting differential non-linearity by storing corrected or correction values in one or more digital look-up tables
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/12—Analogue/digital converters
    • H03M1/14—Conversion in steps with each step involving the same or a different conversion means and delivering more than one bit
    • H03M1/16—Conversion in steps with each step involving the same or a different conversion means and delivering more than one bit with scale factor modification, i.e. by changing the amplification between the steps
    • H03M1/162—Conversion in steps with each step involving the same or a different conversion means and delivering more than one bit with scale factor modification, i.e. by changing the amplification between the steps the steps being performed sequentially in a single stage, i.e. recirculation type

Landscapes

  • Physics & Mathematics (AREA)
  • Nonlinear Science (AREA)
  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Analogue/Digital Conversion (AREA)
  • Arrangements For Transmission Of Measured Signals (AREA)
  • Indication And Recording Devices For Special Purposes And Tariff Metering Devices (AREA)
  • Testing, Inspecting, Measuring Of Stereoscopic Televisions And Televisions (AREA)

Abstract

"MéTODO DE CALIBRAçãO DE UM CONVERSOR DE ANALóGICO PARA DIGITAL, E, EQUIPAMENTO DE CALIBRAçãO PARA CALIBRAR UM CONVERSOR DE ANALóGICO PARA DIGITAL" Equipamento de calibração para calibrar um conversor de analógico para digital, equipamento de calibração esse que compreende dispositivo para fornecer códigos de controle para o conversor de analógico para digital, em conseq³ência do que um valor digital é obtido a saída do conversor, dispositivo para calcular um residual do setor de tensão a ser calibrado como uma diferença do segundo e do primeiro valor digital, dispositivo para calcular um termo de correção relacionado com o setor de tensão pela adição do termo de correção do setor de tensão calibrado adjacente ao residual do setor de tensão e dispositivo para usar o termo de correção na correção do valor digital obtido do conversor de analógico para digital, quando o conversor de analógico para digital é usado para converter um sinal incluído no setor de tensão de uma forma analógica para digital.
BR0007163-3A 1999-09-20 2000-09-19 Método de calibração de um conversor de analógico para digital, e, equipamento de calibração para calibrar um conversor de analógico para digital BR0007163A (pt)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
FI992001A FI107482B (fi) 1999-09-20 1999-09-20 Menetelmä analogia-digitaalimuuntimen kalibroimiseksi sekä kalibrointilaite
PCT/FI2000/000790 WO2001022594A1 (en) 1999-09-20 2000-09-19 Method of calibrating an analog-to-digital converter, and a calibration equipment

Publications (1)

Publication Number Publication Date
BR0007163A true BR0007163A (pt) 2001-07-31

Family

ID=8555314

Family Applications (1)

Application Number Title Priority Date Filing Date
BR0007163-3A BR0007163A (pt) 1999-09-20 2000-09-19 Método de calibração de um conversor de analógico para digital, e, equipamento de calibração para calibrar um conversor de analógico para digital

Country Status (10)

Country Link
US (1) US6384757B1 (pt)
EP (1) EP1131888B1 (pt)
JP (1) JP3523639B2 (pt)
CN (1) CN1131593C (pt)
AT (1) ATE334506T1 (pt)
AU (1) AU7292000A (pt)
BR (1) BR0007163A (pt)
DE (1) DE60029558T2 (pt)
FI (1) FI107482B (pt)
WO (1) WO2001022594A1 (pt)

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US6714886B2 (en) * 2002-02-13 2004-03-30 Eric C. Sung System and method of DC calibration of amplifiers
CN1306708C (zh) * 2002-04-03 2007-03-21 华邦电子股份有限公司 随机失误码的检测方法及检测装置
US20040046684A1 (en) * 2002-09-11 2004-03-11 Paolo Cusinato Low power pipeline analog-to-digital converter
TWI231098B (en) * 2002-12-27 2005-04-11 Novatek Microelectronics Corp Correcting system and method of successive approximation A/D converter
US6690310B1 (en) * 2003-02-13 2004-02-10 Northrop Grumman Corporation Method and apparatus for adaptively compensating for an inaccuracy in an analog-to-digital converter
US7196649B2 (en) * 2004-02-03 2007-03-27 Hrl Laboratories, Llc Reprogrammable distributed reference ladder for analog-to-digital converters
US7429771B2 (en) * 2004-05-07 2008-09-30 Matsushita Electric Industrial Co., Ltd. Semiconductor device having halo implanting regions
US7119728B2 (en) * 2004-02-27 2006-10-10 Sanyo Electric Co., Ltd. Analog/digital converting device
TWI227071B (en) * 2004-04-13 2005-01-21 Realtek Semiconductor Corp Pipeline ADC calibrating method utilizing extra ADC module and apparatus thereof
US7091891B2 (en) * 2004-04-28 2006-08-15 Analog Devices, Inc. Calibration of analog to digital converter by means of multiplexed stages
JP2006067201A (ja) * 2004-08-26 2006-03-09 Matsushita Electric Ind Co Ltd パイプラインａ／ｄ変換器およびその出力誤差補正方法
US7161515B2 (en) * 2004-11-04 2007-01-09 Tektronix, Inc. Calibration system and method for a linearity corrector using filter products
CN1815893B (zh) * 2004-11-04 2012-04-18 特克特朗尼克公司 利用滤波器乘积的线性校正器
US7385536B2 (en) * 2004-12-14 2008-06-10 Texas Instruments Incorporated Methods and circuits for output of sample-and-hold in pipelined ADC
JP4372111B2 (ja) * 2005-03-04 2009-11-25 三洋電機株式会社 アナログデジタル変換器
US7187310B2 (en) * 2005-03-04 2007-03-06 Kamal El-Sankary Circuit calibration using voltage injection
US7295937B2 (en) * 2005-07-20 2007-11-13 Texas Instruments Incorporated Method and system for determining noise components of an analog-to-digital converter
CN101040442B (zh) * 2005-09-16 2012-04-25 松下电器产业株式会社 模/数转换器及模/数转换方法
US8483343B2 (en) * 2005-10-03 2013-07-09 Clariphy Communications, Inc. High-speed receiver architecture
US7778320B2 (en) * 2005-10-03 2010-08-17 Clariphy Communications, Inc. Multi-channel equalization to compensate for impairments introduced by interleaved devices
US8139630B2 (en) * 2005-10-03 2012-03-20 Clariphy Communications, Inc. High-speed receiver architecture
US7576676B2 (en) * 2006-02-02 2009-08-18 Clariphy Communications, Inc. Analog-to-digital converter using lookahead pipelined architecture and open-loop residue amplifiers
US8831074B2 (en) 2005-10-03 2014-09-09 Clariphy Communications, Inc. High-speed receiver architecture
US7852913B2 (en) * 2005-10-03 2010-12-14 Clariphy Communications, Inc. High-speed receiver architecture
JP4774953B2 (ja) * 2005-11-28 2011-09-21 株式会社日立製作所 時間インターリーブａｄ変換器
US8094056B2 (en) * 2006-02-02 2012-01-10 Clariphy Communications, Inc. Analog-to-digital converter
KR100845134B1 (ko) * 2006-11-06 2008-07-09 삼성전자주식회사 디지털 자동 보정기능을 가지는 파이프 라인아날로그-디지털 변환기 및 그것의 디지털 보정방법
US7688238B2 (en) * 2007-03-27 2010-03-30 Slicex, Inc. Methods and systems for calibrating a pipelined analog-to-digital converter
US7808417B2 (en) * 2007-09-14 2010-10-05 Clariphy Communications, Inc. Analog-to-digital converter
EP2246984B1 (de) 2009-04-28 2013-07-03 VEGA Grieshaber KG Diagnoseschaltung zur Überwachung einer Analog-Digital-Wandlungsschaltung
CN101800548B (zh) * 2010-02-04 2013-03-20 中国电子科技集团公司第五十八研究所 电荷耦合流水线模数转换器的差模误差校准电路
CN102043093B (zh) * 2010-05-25 2013-01-23 中联重科股份有限公司 测量电流型模数转换器的转换电阻的阻值的方法
JP5554644B2 (ja) * 2010-06-29 2014-07-23 パナソニック株式会社 固体撮像装置
US8836549B2 (en) * 2011-12-20 2014-09-16 Analog Devices, Inc. Use of logic circuit embedded into comparator for foreground offset cancellation
US8754794B1 (en) * 2012-07-25 2014-06-17 Altera Corporation Methods and apparatus for calibrating pipeline analog-to-digital converters
US20140306689A1 (en) * 2013-04-10 2014-10-16 Texas Instruments, Incorporated High resolution current pulse analog measurement
US9727342B2 (en) * 2013-12-20 2017-08-08 Utah State University Error resilient pipeline
US9306591B2 (en) * 2014-05-08 2016-04-05 SiTune Corporation Calibration of high speed asynchronous convertor
US9264059B2 (en) 2014-05-08 2016-02-16 SiTune Corporation Calibration of time-interleaved analog-to-digital converter
CN106899298A (zh) * 2015-12-17 2017-06-27 北京展讯高科通信技术有限公司 校准误差确认方法、装置及移动终端
CN107359878B (zh) * 2017-08-17 2020-04-14 电子科技大学 一种基于最小量化误差的流水线adc的前端校准方法
US10608655B1 (en) 2018-12-06 2020-03-31 Analog Devices, Inc. Inter-stage gain calibration in double conversion analog-to-digital converter

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JP2679658B2 (ja) * 1995-01-13 1997-11-19 日本電気株式会社 Ａ／ｄ変換器
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US6184809B1 (en) 1998-08-19 2001-02-06 Texas Instruments Incorporated User transparent self-calibration technique for pipelined ADC architecture

Also Published As

Publication number Publication date
JP3523639B2 (ja) 2004-04-26
AU7292000A (en) 2001-04-24
DE60029558T2 (de) 2007-06-06
CN1322404A (zh) 2001-11-14
EP1131888A1 (en) 2001-09-12
ATE334506T1 (de) 2006-08-15
US6384757B1 (en) 2002-05-07
JP2003510880A (ja) 2003-03-18
FI107482B (fi) 2001-08-15
EP1131888B1 (en) 2006-07-26
CN1131593C (zh) 2003-12-17
FI19992001A (fi) 2001-03-20
DE60029558D1 (de) 2006-09-07
WO2001022594A1 (en) 2001-03-29

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Legal Events

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B08F Application dismissed because of non-payment of annual fees [chapter 8.6 patent gazette]

Free format text: REFERENTE A 12A ANUIDADE.

B08K Patent lapsed as no evidence of payment of the annual fee has been furnished to inpi [chapter 8.11 patent gazette]

Free format text: REFERENTE AO DESPACHO 8.6 PUBLICADO NA RPI 2167 DE 17/07/2012.