AU5134100A - Surface plasmon resonance detection with high angular resolution and fast response time - Google Patents

Surface plasmon resonance detection with high angular resolution and fast response time

Info

Publication number
AU5134100A
AU5134100A AU51341/00A AU5134100A AU5134100A AU 5134100 A AU5134100 A AU 5134100A AU 51341/00 A AU51341/00 A AU 51341/00A AU 5134100 A AU5134100 A AU 5134100A AU 5134100 A AU5134100 A AU 5134100A
Authority
AU
Australia
Prior art keywords
response time
surface plasmon
plasmon resonance
fast response
angular resolution
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
AU51341/00A
Other languages
English (en)
Inventor
Salah Boussaad
Wenlue Huang
Nongjian Tao
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Florida International University FIU
Original Assignee
Florida International University FIU
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Florida International University FIU filed Critical Florida International University FIU
Publication of AU5134100A publication Critical patent/AU5134100A/en
Abandoned legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/55—Specular reflectivity
    • G01N21/552—Attenuated total reflection
    • G01N21/553—Attenuated total reflection and using surface plasmons

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Length Measuring Devices By Optical Means (AREA)
AU51341/00A 1999-05-17 2000-05-16 Surface plasmon resonance detection with high angular resolution and fast response time Abandoned AU5134100A (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US13448299P 1999-05-17 1999-05-17
US60134482 1999-05-17
PCT/US2000/013283 WO2000070328A1 (fr) 1999-05-17 2000-05-16 Detection de resonance plasmonique de surface avec resolution angulaire elevee et temps de reponse court

Publications (1)

Publication Number Publication Date
AU5134100A true AU5134100A (en) 2000-12-05

Family

ID=22463595

Family Applications (1)

Application Number Title Priority Date Filing Date
AU51341/00A Abandoned AU5134100A (en) 1999-05-17 2000-05-16 Surface plasmon resonance detection with high angular resolution and fast response time

Country Status (11)

Country Link
EP (1) EP1194763A4 (fr)
JP (1) JP2002544516A (fr)
CN (1) CN1216282C (fr)
AU (1) AU5134100A (fr)
CA (1) CA2373343A1 (fr)
DE (1) DE1194763T1 (fr)
ES (1) ES2177473T1 (fr)
HK (1) HK1044041A1 (fr)
IL (1) IL146207A (fr)
RU (1) RU2226684C2 (fr)
WO (1) WO2000070328A1 (fr)

Families Citing this family (25)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CA2431399C (fr) 2000-12-13 2009-04-28 Institut D'optique Theorique Et Appliquee Procede de caracterisation d'une surface, et dispositif pour sa mise en oeuvre
FR2817962B1 (fr) * 2000-12-13 2004-08-06 Inst Optique Theorique Et Appl Procede de caracterisation de surface, application et dispositif mettant en oeuvre le procede
KR20040012384A (ko) * 2002-08-03 2004-02-11 이종협 고감도 표면 플라즈몬 공명장치와 이를 이용한 중금속의흡착과 선택도의 측정방법
US7701582B2 (en) * 2003-11-19 2010-04-20 Beanor Oy Method and device for carrying out surface plasmon resonance measurement
ES2261009B1 (es) * 2004-06-11 2007-11-16 Consejo Superior De Investigaciones Cientificas. Dispositivo y metodo para detectar cambios en el indice de refraccion de un medio dielectrico.
US7869013B2 (en) * 2004-09-15 2011-01-11 Agency For Science, Technology And Research Surface plasmon resonance and quartz crystal microbalance sensor
US7317519B2 (en) 2004-10-29 2008-01-08 Agilent Technologies, Inc. Swept-angle SPR measurement system
US7643156B2 (en) * 2005-06-14 2010-01-05 Fujifilm Corporation Sensor, multichannel sensor, sensing apparatus, and sensing method
JP4481967B2 (ja) * 2005-09-05 2010-06-16 キヤノン株式会社 センサ装置
CN100412528C (zh) * 2005-10-20 2008-08-20 汪胜前 气体和液体浓度检测传感器及检测系统
JP4663590B2 (ja) * 2006-06-14 2011-04-06 日本電信電話株式会社 ピーク位置変動量測定装置、その測定方法及びプログラム
CN101473211A (zh) * 2006-07-03 2009-07-01 和舰科技(苏州)有限公司 一种氮氧化硅薄膜的等离子处理程度的光学检测方法
CN100489500C (zh) * 2007-01-23 2009-05-20 中国科学院长春应用化学研究所 电化学原位时间分辨表面等离子体共振测量仪
KR100876608B1 (ko) * 2007-08-20 2008-12-31 한국생명공학연구원 회전거울을 이용한 표면 플라즈몬 공명 센서
JP5344828B2 (ja) 2008-02-28 2013-11-20 富士フイルム株式会社 センシング装置
WO2011066667A1 (fr) * 2009-12-01 2011-06-09 国家纳米科学中心 Capteur de résonance plasmonique de surface (spr) basé sur la mesure de l'angle de résonance et procédé de mesure associé
CN103675053B (zh) * 2013-09-27 2016-05-11 中国科学院电子学研究所 一种基于表面等离子体谐振的局部电化学成像测试系统
WO2015121704A2 (fr) * 2013-11-01 2015-08-20 Miller Marvin J Détection d'agents pathogènes
JP6346040B2 (ja) * 2014-09-10 2018-06-20 日本電信電話株式会社 屈折率測定装置
CN105699335B (zh) * 2016-04-12 2019-01-04 岭南师范学院 一种多功能spr检测仪
CN109490279A (zh) * 2018-09-10 2019-03-19 桂林电子科技大学 D形微柱镜旋转式spr传感芯片
CN110133066A (zh) * 2019-05-24 2019-08-16 暨南大学 电化学等离子体光纤重金属检测系统及方法
CN110823835B (zh) * 2019-12-16 2022-02-25 长沙学院 一种波导耦合长程表面等离子共振传感器及其测量方法
RU2770648C1 (ru) * 2021-03-09 2022-04-19 Общество С Ограниченной Ответственностью "Микросенсор" Оптический сенсор на основе плазмон-индуцированной прозрачности и Фано-резонансов
RU2758779C1 (ru) * 2021-03-17 2021-11-01 Федеральное государственное бюджетное образовательное учреждение высшего образования «Сибирский государственный университет геосистем и технологий» Сенсор на основе поверхностно-плазмонного резонанса

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
NL8700851A (nl) * 1987-04-10 1988-11-01 Tno Werkwijze en inrichting voor het detecteren van zeer lage concentraties van een in een meetmedium aanwezige chemische component onder toepassing van oppervlakte-plasmonresonantie en elektrochemisch gestimuleerde adsorptie.
GB9107796D0 (en) * 1991-04-12 1991-05-29 Nat Res Dev Methods of and apparatus for measurement using acousto-optic devices
GB9212416D0 (en) * 1992-06-11 1992-07-22 Medical Res Council Reversible binding substances
US5351127A (en) * 1992-06-17 1994-09-27 Hewlett-Packard Company Surface plasmon resonance measuring instruments
GB9414599D0 (en) * 1994-07-20 1994-09-07 Scient Generics Ltd Biosensor
JPH09292334A (ja) * 1996-04-30 1997-11-11 Fuji Photo Film Co Ltd 表面プラズモンセンサー
JPH10267841A (ja) * 1997-03-24 1998-10-09 Kokuritsu Shintai Shogaisha Rehabilitation Center Souchiyou 表面プラズモン共鳴センシングデバイス
US5986762A (en) * 1998-06-15 1999-11-16 Imation Corp. Optical sensor having optimized surface profile

Also Published As

Publication number Publication date
EP1194763A4 (fr) 2006-01-11
ES2177473T1 (es) 2002-12-16
IL146207A (en) 2005-05-17
HK1044041A1 (zh) 2002-10-04
JP2002544516A (ja) 2002-12-24
IL146207A0 (en) 2002-07-25
WO2000070328A1 (fr) 2000-11-23
DE1194763T1 (de) 2002-10-17
CN1216282C (zh) 2005-08-24
CA2373343A1 (fr) 2000-11-23
EP1194763A1 (fr) 2002-04-10
CN1364233A (zh) 2002-08-14
RU2226684C2 (ru) 2004-04-10

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Legal Events

Date Code Title Description
MK6 Application lapsed section 142(2)(f)/reg. 8.3(3) - pct applic. not entering national phase