AU4458801A - High frequency circuit impedance measuring probe for inner-layer-containing laminated sheet used for multi-layer printed board - Google Patents

High frequency circuit impedance measuring probe for inner-layer-containing laminated sheet used for multi-layer printed board

Info

Publication number
AU4458801A
AU4458801A AU44588/01A AU4458801A AU4458801A AU 4458801 A AU4458801 A AU 4458801A AU 44588/01 A AU44588/01 A AU 44588/01A AU 4458801 A AU4458801 A AU 4458801A AU 4458801 A AU4458801 A AU 4458801A
Authority
AU
Australia
Prior art keywords
layer
high frequency
printed board
laminated sheet
frequency circuit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
AU44588/01A
Inventor
Motoyuki Akamatsu
Tatsumi Iwaishi
Yukio Matsushita
Mitsuhide Nagaso
Toru Nakashiba
Masanobu Takedomi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Electric Works Co Ltd
Original Assignee
Matsushita Electric Works Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from JP2000089912A external-priority patent/JP2001281281A/en
Priority claimed from JP2000124530A external-priority patent/JP2001305159A/en
Priority claimed from JP2000157452A external-priority patent/JP2001337118A/en
Application filed by Matsushita Electric Works Ltd filed Critical Matsushita Electric Works Ltd
Publication of AU4458801A publication Critical patent/AU4458801A/en
Abandoned legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06772—High frequency probes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K1/00—Printed circuits
    • H05K1/02—Details
    • H05K1/0266—Marks, test patterns or identification means
    • H05K1/0268—Marks, test patterns or identification means for electrical inspection or testing
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00—Apparatus or processes for manufacturing printed circuits
    • H05K3/46—Manufacturing multilayer circuits
    • H05K3/4611—Manufacturing multilayer circuits by laminating two or more circuit boards
    • H05K3/4638—Aligning and fixing the circuit boards before lamination; Detecting or measuring the misalignment after lamination; Aligning external circuit patterns or via connections relative to internal circuits

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measuring Leads Or Probes (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
AU44588/01A 2000-03-28 2001-03-28 High frequency circuit impedance measuring probe for inner-layer-containing laminated sheet used for multi-layer printed board Abandoned AU4458801A (en)

Applications Claiming Priority (7)

Application Number Priority Date Filing Date Title
JP2000089912A JP2001281281A (en) 2000-03-28 2000-03-28 Probe for impedance measurement
JP2000-89912 2000-03-28
JP2000124530A JP2001305159A (en) 2000-04-25 2000-04-25 Countermeasure type probe against static electricity
JP2000-124530 2000-04-25
JP2000-157452 2000-05-26
JP2000157452A JP2001337118A (en) 2000-05-26 2000-05-26 Probe for measuring impedance
PCT/JP2001/002570 WO2001073451A1 (en) 2000-03-28 2001-03-28 High frequency circuit impedance measuring probe for inner-layer-containing laminated sheet used for multi-layer printed board

Publications (1)

Publication Number Publication Date
AU4458801A true AU4458801A (en) 2001-10-08

Family

ID=27342844

Family Applications (1)

Application Number Title Priority Date Filing Date
AU44588/01A Abandoned AU4458801A (en) 2000-03-28 2001-03-28 High frequency circuit impedance measuring probe for inner-layer-containing laminated sheet used for multi-layer printed board

Country Status (3)

Country Link
AU (1) AU4458801A (en)
TW (1) TWI271521B (en)
WO (1) WO2001073451A1 (en)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102017004336A1 (en) * 2017-05-05 2018-11-08 Friedrich-Alexander-Universität Erlangen-Nürnberg Device and method for contacting an electronic or electrical system
CN109061245B (en) * 2018-10-12 2023-12-05 上海军友射频技术有限公司 Radio frequency probe for testing impedance of PCB
TWI774191B (en) * 2021-01-14 2022-08-11 欣興電子股份有限公司 Device and method for measuring thickness of dielectric layer in circuit board

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5769263A (en) * 1980-10-17 1982-04-27 Matsushita Electric Works Ltd Method for checking internal layer pattern
JPS61187464U (en) * 1985-05-14 1986-11-21
JPS62114365U (en) * 1986-01-08 1987-07-21
JPH0580077A (en) * 1991-09-19 1993-03-30 Matsushita Electric Ind Co Ltd Rf terminal probe
JPH0633073U (en) * 1992-10-09 1994-04-28 株式会社アドバンテスト Coaxial probe contact pin connection terminal
JPH10213593A (en) * 1997-01-29 1998-08-11 Alps Electric Co Ltd Contact and connecting jig using the same
JPH10319041A (en) * 1997-05-20 1998-12-04 Nec Tohoku Ltd Inspection probe
JP3112873B2 (en) * 1997-10-31 2000-11-27 日本電気株式会社 High frequency probe
JPH11289140A (en) * 1998-04-01 1999-10-19 Murata Mfg Co Ltd High frequency circuit board, high frequency signal measuring probe and high frequency signal measuring method employing it
US6051978A (en) * 1998-04-27 2000-04-18 Delaware Capital Formation, Inc. TDR tester for x-y prober

Also Published As

Publication number Publication date
TWI271521B (en) 2007-01-21
WO2001073451A1 (en) 2001-10-04

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Legal Events

Date Code Title Description
MK6 Application lapsed section 142(2)(f)/reg. 8.3(3) - pct applic. not entering national phase