WO2001073451A1 - High frequency circuit impedance measuring probe for inner-layer-containing laminated sheet used for multi-layer printed board - Google Patents

High frequency circuit impedance measuring probe for inner-layer-containing laminated sheet used for multi-layer printed board Download PDF

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Publication number
WO2001073451A1
WO2001073451A1 PCT/JP2001/002570 JP0102570W WO0173451A1 WO 2001073451 A1 WO2001073451 A1 WO 2001073451A1 JP 0102570 W JP0102570 W JP 0102570W WO 0173451 A1 WO0173451 A1 WO 0173451A1
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WO
WIPO (PCT)
Prior art keywords
probe
ground electrode
probe needle
conductor layer
conductor
Prior art date
Application number
PCT/JP2001/002570
Other languages
French (fr)
Japanese (ja)
Inventor
Toru Nakashiba
Yukio Matsushita
Tatsumi Iwaishi
Masanobu Takedomi
Mitsuhide Nagaso
Motoyuki Akamatsu
Original Assignee
Matsushita Electric Works, Ltd.
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from JP2000089912A external-priority patent/JP2001281281A/en
Priority claimed from JP2000124530A external-priority patent/JP2001305159A/en
Priority claimed from JP2000157452A external-priority patent/JP2001337118A/en
Application filed by Matsushita Electric Works, Ltd. filed Critical Matsushita Electric Works, Ltd.
Priority to AU44588/01A priority Critical patent/AU4458801A/en
Publication of WO2001073451A1 publication Critical patent/WO2001073451A1/en

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Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02General constructional details
    • G01R1/06Measuring leads; Measuring probes
    • G01R1/067Measuring probes
    • G01R1/06772High frequency probes
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02General constructional details
    • G01R1/06Measuring leads; Measuring probes
    • G01R1/067Measuring probes
    • G01R1/06711Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K1/00Printed circuits
    • H05K1/02Details
    • H05K1/0266Marks, test patterns or identification means
    • H05K1/0268Marks, test patterns or identification means for electrical inspection or testing
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/46Manufacturing multilayer circuits
    • H05K3/4611Manufacturing multilayer circuits by laminating two or more circuit boards
    • H05K3/4638Aligning and fixing the circuit boards before lamination; Detecting or measuring the misalignment after lamination; Aligning external circuit patterns or via connections relative to internal circuits

Definitions

  • the present invention relates to a probe used for measuring a high-frequency circuit impedance of a laminated board containing an inner circuit used for a multilayer printed board.
  • multilayer printed circuit boards have been widely used to realize high-frequency circuits incorporated in electronic devices such as mobile telephone terminals, and various types of basic circuits are formed by processing a laminated board having an inner layer circuit formed in advance in an inner layer.
  • a multilayer printed board is manufactured.
  • the laminated board with the inner layer circuit is prepared as follows. First, the first conductor layer and the second conductor layer are laminated over the entire upper and lower surfaces of the insulating base material, a basic high-frequency circuit is formed on the first conductor layer, and the second conductor layer is used as a ground layer. Then, the third conductor layer is formed on the entire surface of the first conductor layer via the first insulating layer.
  • the second conductor layer is a ground layer having a predetermined circuit pattern
  • a fourth conductor layer is formed over the entire surface of the ground layer via a second insulating layer.
  • the laminated board with the inner layer circuit of the outermost unprocessed conductor layer manufactured in this manner is then formed with a circuit on the unprocessed conductor layer in accordance with various circuit design requirements. Therefore, in order to improve the yield, it is necessary to inspect non-defective products of the laminated board with the inner layer circuit before the final circuit formation.
  • impedance matching with high-frequency signals flowing through the circuit is required, and it is necessary to check that the predetermined impedance is within the allowable range of the design value. .
  • the impedance of the circuit is out of a certain allowable range, it is discarded as defective.
  • the manufacture of the laminated board with the inner circuit and the final circuit formation are often performed by different manufacturers, it is required that such non-defective inspection be performed.
  • the main TDR Time Domain Refrectometry
  • a high-frequency incident signal such as a pulse or a step signal is transmitted to a test conductor formed on an inner conductor layer using this conductor layer and another conductor layer as a ground, and the test conductor (inner signal circuit) is formed.
  • the impedance value of the cost conductor is obtained by using the reflection coefficient obtained from the reflection signal while detecting the reflection signal.
  • What is required for the above impedance measurement is a measuring instrument for TDR, a cable for signal transmission, and a probe.
  • the probe is used as an intermediary for electrically connecting the measuring instrument and the cable connected to the test conductor to the test conductor. Electrical design is performed by matching impedance with cables and test conductors.
  • a microstrip structure which has a signal pin that contacts a test conductor (signal circuit) and a ground pin that contacts a conductor layer, which is a different layer from the test conductor.
  • the probe is separated by a dielectric layer, and the other is of a coaxial structure, in which the center conductor is surrounded by an outer conductor via a dielectric layer, and the signal pin and the ground are respectively separated from the center conductor and the outer conductor.
  • the pins protrude.
  • Both types of probes require that the signal pin be in contact with the test conductor and the ground pin be in contact with another conductor layer at the same time, so that the test conductor and the other conductor must match the distance between the pins.
  • the present invention has been made in order to solve the above problems, and has as its object to provide a probe that can easily perform positioning with respect to a laminate and that enables highly reliable impedance measurement. Things.
  • the impedance measuring probe is for measuring the high-frequency circuit impedance of a laminated board containing an inner-layer circuit used for a multilayer printed circuit board, and comes into contact with an internal conductor layer forming a high-frequency circuit in the laminated board. And a ground electrode for contacting the inner conductor layer and another conductor layer.
  • the probe needle is connected to an external impedance measuring instrument, and a high-frequency signal from the probe needle is transmitted to the inner conductor layer. It is used to transmit the high-frequency signal transmitted and reflected from it to the measuring instrument.
  • the contact edge of the ground electrode that comes into contact with another conductor layer has an annular shape that surrounds the probe needle coaxially.
  • the probe needle if the probe needle is brought into contact with a part of the inner conductor layer, it can be brought into contact with another conductor layer somewhere on the annular contact edge surrounding the probe needle.
  • the distance between the measurement point of the inner conductor layer and another conductor layer is within the range of the diameter of the annular contact edge, impedance measurement will be possible, and the probe will be controlled to rotate around its axis.
  • the probe be easily positioned at the measurement point without performing, but also accurate impedance measurement can be performed on the laminated board with different dimensions between the inner conductor layer and another conductor layer. Has advantages.
  • the probe has a socket at the rear end to which the coaxial cable extending from the impedance measuring instrument is connected.
  • the center conductor of the coaxial cable inserted into the socket is connected to the probe needle, and the coaxial cable connected to the outer periphery of the socket. Outer conductor is connected to the ground electrode.
  • the contact edge of the ground electrode When the contact edge of the ground electrode is made of conductive rubber, it can make close contact with the conductor layer with irregularities on the surface by utilizing the deformability of the conductive rubber, providing a highly reliable impedance. Measurement can be performed.
  • the probe needle be detachable from the probe body holding the ground electrode, so that the probe needle having a relatively short life can be easily replaced. Further, it is preferable that the probe needle is movable with respect to the ground electrode along the axial direction and is supported by a float, so that an impact when the probe needle is brought into contact with the inner conductor layer can be absorbed, and Damage to the needle and the inner conductor layer can be minimized.
  • a dielectric made of a material having a low dielectric constant and a low dielectric loss tangent is provided between the probe needle and the ground electrode to reduce loss in a high frequency region and improve the reliability of impedance measurement.
  • the probe needle is self-moving between a forward position in which the probe needle projects forward in the axial direction by the force of the spring and a retracted position in which the probe needle is pushed backward by being piled on the spring.
  • a part of the probe needle comes into contact with the ground electrode, and the probe needle is separated from the ground electrode when in the retracted position. For this reason, only by first bringing the probe needle into contact with the inner conductor, static electricity charged on the inner conductor can be removed through the ground electrode, and subsequently, the probe needle is brought into contact with the inner electrode at a predetermined contact pressure. Pushing the probe needle away from the ground electrode Impedance measurement is effective, and static electricity removal and impedance measurement can be performed continuously. '
  • the ground electrode is composed of a ground electrode body and a detachable cover at the front end thereof, and it is desirable to form a contact edge of the ground electrode on the cover. This allows the probe to be maintained by replacing the cover if the contact edge is worn or damaged.
  • the temporary electrical connection between the probe needle and the ground electrode is achieved by bringing the flange provided on the probe needle into contact with the inner surface of the cover.
  • a ground electrode is movably held along the axial direction of the probe needle on the outer periphery of a support cylinder that surrounds and supports the probe needle.
  • the ground electrode is connected to a rear member provided on the rear side of the support cylinder in the axial direction by a spring member.
  • This spring member By the action of this spring member, the contact edge of the ground electrode is brought into contact with the conductor by a sufficient contact pressure. Layer, and a stable electrical connection can be made even if the contact surface of the conductor layer is irregular.
  • This rear member is used to be connected to an external actuator overnight, and is moved axially forward by the actuator to bring the contact edge of the ground electrode into contact with the target conductor layer at a predetermined contact pressure. Can be.
  • FIG. 1 is an exploded perspective view showing a laminated board with an inner circuit measured by a high-frequency circuit impedance measuring probe of the present invention.
  • FIG. 2 is a plan view showing an inner layer circuit formed in the laminated plate of the above.
  • FIGS. 3, 3B, 3C, 3D, and 3E are perspective views showing a process of forming a multilayer printed board formed from the laminated board using the same.
  • FIG. 4 is a cross-sectional view showing the impedance measurement probe of the present invention.
  • FIG. 5 is a side view showing the front end surface of the probe.
  • FIG. 6 is a partial cross-sectional view showing a partially modified example of the above probe.
  • FIG. 7 is a perspective view showing a usage form of the above probe.
  • FIG. 8 is a front view showing a usage form of the above probe.
  • FIG. 9 is a cross-sectional view showing a usage form of the above probe.
  • FIG. 10 is a cross-sectional view showing another usage form of the probe of the above.
  • FIGS. 11 and 12 are cross-sectional views showing an impedance measurement probe according to another embodiment of the present invention.
  • FIGS. 13 and 14 are cross-sectional views showing an impedance measuring probe according to still another embodiment of the present invention.
  • FIG. 15 is a perspective view showing a part of the probe of the above. BEST MODE FOR CARRYING OUT THE INVENTION
  • the impedance measurement probe according to the present invention is designed for measuring the impedance of a high-frequency circuit of a laminated board containing an inner circuit used for a multilayer printed board. Things.
  • the target laminated board L with an inner layer circuit is an intermediate product that is finally finished as a multilayer printed board, and has a basic high-frequency circuit (hereinafter referred to as an inner layer circuit) 12 in the inner layer, and the outermost This is an external conductor layer to be formed later as a circuit.
  • FIG. 1 shows the first and second insulating layers 10 and 20 as inner layers on the upper and lower surfaces of the insulating substrate 1, and the first and second insulating layers 11 and 20, respectively, outside these inner layers.
  • the third conductor layer 30 and the fourth conductor layer 40 are provided via the interface 12.
  • the inner circuit 12 is formed on the first conductor layer 10
  • the second conductor layer 20 is Although not shown, when this intermediate product is configured to have three conductor layers, an inner circuit is formed on the inner conductor layer and two outer layers are formed. A final signal circuit is formed on one of the conductor layers, and a grant circuit is formed on the other one.
  • the laminated board L with the inner layer circuit is formed by forming the first conductor layer 10 and the second conductor layer 20 on the entire surface of both sides of the insulating base material 1 and then forming the first conductor layer 10
  • An inner layer circuit 12 is formed in the second conductor layer 20, and a ground circuit of a high-frequency circuit to be completed later is formed in the second conductor layer 20.
  • a test conductor 13 for measuring circuit impedance is formed in addition to the inner layer circuit 12.
  • the third conductor layer 30 and the fourth conductor layer 40 are formed on the first conductor layer 10 and the second conductor layer 20 via the first insulation layer 11 and the second insulation layer 12, respectively, over the entire surface of the laminate. It is formed over.
  • the laminated board is formed with predetermined high-frequency circuits 32 and 42 of the third and fourth conductor layers 30 and 40, which are the outermost layers.
  • the connection is made by through holes 33 to obtain a final multilayer printed board.
  • a plurality of identical inner-layer circuits 12 are formed on the first conductor layer 10, and a plurality of circuits are also formed on the other conductor layers at the same time. By cutting out into a plurality, a plurality of circuit components are formed at the same time.
  • a plurality of test conductors 13 are formed, and each test conductor 13 extends over the entire length in the longitudinal direction of the laminated plate, and the ends thereof are exposed at both end surfaces of the laminated plate L.
  • the edge of the second conductor layer 20 after the formation of the ground circuit is exposed on the end face of the laminate, and when measuring the circuit impedance, the reference potential for the test conductor 13, that is, the ground potential Function to give.
  • a probe P specially designed according to the laminated board above, a measuring instrument that applies a high-frequency signal to the test conductor 13 via the probe and analyzes the reflected wave from it, a measuring instrument and a probe A coaxial cable connecting P is used.
  • the probe P has a probe needle 111 and a ground electrode 120.As shown in FIGS. 7 and 9, the probe P contacts the one end of the test conductor 13 and the front end of the ground electrode 120.
  • the impedance of the inner layer circuit is measured by bringing the annular contact edge 121 formed in the above into contact with the second conductor layer 20 or the third conductor layer 30.
  • the measuring instrument has an input signal generator that generates a high-frequency signal for oscilloscope II measurement.
  • the probe P includes a metal main body tube 100 provided with a socket 101 into which a center pin of a coaxial cable is inserted at a rear end, and a needle unit 110 housed in the main body tube 100.
  • the needle unit 1 10 is composed of a holder 1 1 2 that supports the probe fl 1 1 to move forward and backward along the axial direction.
  • the spring 1 1 3 housed inside the holder 1 urges the probe needle 11 forward. Has been done.
  • the holder 1 1 2 is electrically connected to the probe needle 1 1 1 and is electrically connected to the socket 1 01 into which the center pin of the coaxial cable is inserted.
  • 04 and 105 are electrically isolated from the main body cylinder 100.
  • a screw portion 102 is formed at the rear end of the main body tube 100, and a nut integrated with the outer conductor of the coaxial cable is coupled to the screw portion 102 here.
  • the body cylinder 100 defines the ground electrode 120, and an annular projection is formed on the front end surface of the body cylinder 100 to define an annular contact edge 121 concentrically surrounding the probe needle 111.
  • a mounting flange 106 is formed at the center of the main body cylinder 100 in the axial direction, and an actuator of a moving mechanism for moving the probe P is connected to the mounting flange 106.
  • the probe P is held by the moving mechanism so as to come close to the end face of the laminate L placed on the XY table.
  • the laminate is moved in the horizontal direction by the XY table, and horizontal positioning is performed between the probe 13 and the conductor 13 exposed at the end face of the laminate.
  • the position of the probe P is adjusted in the Z direction by another moving mechanism, and the alignment between the probe needle 11 and the test conductor 13 is completed.
  • the probe P is moved closer to the end face of the laminated plate L by the moving mechanism, and as shown in FIGS. 7, 8, and 9, the probe needle 11 comes in contact with the test conductor 13 and the ground electrode 120
  • the annular edge 121 contacts the edges of the second conductor 20 and the third conductor 30 which are another layer around the test conductor 1.
  • a high-frequency signal is sent from the measuring instrument to the test conductor 13, and the high-frequency signal reflected therefrom is analyzed to measure the impedance of the test conductor 13, that is, the impedance of the inner layer circuit.
  • the probe P is designed to have the same impedance as the coaxial cable 69 (for example, a pass characteristic of 10 GHz: ⁇ -50 ⁇ ⁇ 1 ⁇ ), and is impedance-matched.
  • the test conductor 13 is provided over the entire length of the laminate, the impedance at each point of the length of the test conductor is measured by analyzing the reflected high-frequency signal in consideration of time. Can be determined.
  • impedance measurement can be performed on any end face of the laminate L.
  • the insulating sleeves 104 and 105 are preferably formed of a material having a low dielectric constant and a low dielectric loss tangent in order to improve the characteristics at high frequencies.
  • PTFE polytetrafluoride
  • fluororesins such as ethylene
  • resins such as PPO (polyphenylene oxide) and PPE (polyphenylene ether). It has the same low dielectric constant and low dielectric loss tangent as fluororesins, and Any material having the same shape stability as fluororesin can be used.
  • the probe needle 1 1 1 is formed so that it can be inserted and removed from the holder 1 1 2, it can be replaced when the probe needle is worn.
  • a probe needle having a diameter of 100 jUm and a diameter other than the tip of 300 jUm can be used as the probe needle 111.
  • the probe needle 1 1 1 is slidable forward and backward with respect to the holder 1 1 1 2 and is urged forward by the spring 1 1 3, the probe needle 1 1 1 1 is pressed with an appropriate contact pressure. A reliable electrical connection is made by contacting the test conductor 13. At the same time, the action of the spring prevents an excessive impact on the laminated plate L and the tip of the probe needle 111 during impedance measurement.
  • an annular contact edge 121 made of conductive rubber may be fitted into the ground electrode 120.
  • An appropriate contact pressure can be obtained by the elastic deformability of the rubber, and the contact edge 121 and the corresponding conductor layer can be prevented from being damaged.
  • Conductive rubber has a lower resistance value than normal rubber and has the same conductivity as conductive metal even when there is no distortion due to pressure, etc., and the change in resistance value due to compression is small Things.
  • “EC-A” manufactured by Shin-Etsu Chemical Co., Ltd. can be used.
  • the contact edge 121 can be formed by using a pressurized conductive rubber instead of the conductive rubber.
  • Pressurized conductive rubber usually has the same conductive properties as general rubber, but when compressed, the resistance value decreases, leading to the same conductivity as conductive metals.
  • rpCRJ manufactured by Nippon Synthetic Rubber Co., Ltd. can be used.
  • the probe P is brought into contact with the end face of
  • the probe P of the present invention also has the third conductor 30 and a part of the first insulating layer 11 cut away as shown in FIG. It is also possible to make impedance measurement by bringing the probe needle 1 1 1 directly into contact with the test conductor 13 and the internal circuit, and by bringing the ground electrode 1 20 into contact with the external conductor layer 30 exposed on the top surface of the laminate L. It is.
  • FIG. 11 and 12 show a probe according to another embodiment of the present invention.
  • This probe P has basically the same structure as the above embodiment, except that a detachable force par is provided at the front end of the main body cylinder 100A and this is used as a ground electrode 120A. Identical parts are indicated by the same reference numerals with the reference symbol ⁇ ”added.
  • An annular contact edge 121 ⁇ ⁇ is formed on the front end face of the cover 120 ⁇ , and a rear end thereof is coupled to the main body cylinder 100A with a screw to form a space 124 between itself and the main body cylinder. ing.
  • a flange 1 14 located in this space 1 24 is integrally formed with the probe 1 11 A, and as shown in Fig.
  • the probe 1 " ⁇ A is urged forward by a spring 1 13A.
  • the flange 114 contacts the inner surface of the cover 120A, and as shown in Fig. 12, when the probe needle 111A is pushed in, the flange 114 moves away from the cover 120A.
  • the insulation sleeve 104A comes into contact with the end face of the insulation sleeve 104A.An insulation ring 108 is provided at the center of the cover 120A to provide insulation from the probe needle 111A.
  • the static electricity can be released from the flange 114 to the ground electrode 120A when the probe needle 11A comes into contact with the test conductor 13 and then the ground electrode 1 As the contact edge of 20A 1 21A is pressed against the end face of the laminate L, By lobe needle 1 1 1 A is pressed, the flange 1 1 4 away from the ground electrode 1 20A, Ru immediately impedance measurement is performed.
  • FIGS. 13, 14, and 15 show a probe according to still another embodiment of the present invention.
  • This probe P has basically the same structure as the above embodiment, except that a ground electrode 120B is supported on the main body cylinder 100B so as to be slidable along the axial direction of the main body cylinder.
  • the same members are denoted by the same reference numerals with the reference symbol "BJ" attached.
  • the ground electrode 120B holds the annular contact edge 121B made of conductive rubber, and the rear end in the axial direction of the main body cylinder 100B.
  • Attached to the mounting flange 106B, which is also slidably supported by the coil, is a coil panel 126.
  • the threaded portion 102B at the rear end of the main body tube 10OB is coupled to the outer conductor of the coaxial cable with a nut.
  • it is used to be fixed to a moving mechanism for controlling the position of the probe P.
  • the mounting flange 106B is connected to an actuator provided in the moving mechanism, and the moving mechanism is used for the drawing. As shown in 13, after the probe needle 1 1 1B is brought into contact with the test conductor 13 on the end face of the laminated plate L, the mounting flange 106B is pushed forward by an actuator, thereby causing the coil spring 1 Joined at 26 The land electrode 120B is moved forward, and as shown in Fig.
  • the annular contact edge 121B is laminated and brought into contact with the conductor layers 20, 40 on the end faces, whereby impedance measurement is performed.
  • an appropriate contact pressure is applied by the coil panel 126, and an excessive impact on the contact edge 121 against the laminated plate is also prevented.

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measuring Leads Or Probes (AREA)
  • Measurement Of Resistance Or Impedance (AREA)

Abstract

A probe capable of simply being positioned with respect to a laminated sheet and measuring a high impedance reliably, comprising a probe needle for contacting an internal conductor layer forming a high frequency circuit inside the laminated sheet, and a ground electrode for contacting another conductor layer separate from this internal conductor layer, wherein the probe needle is connected to an external impedance measuring instrument and is used to send a high-frequency signal to the internal conductor layer from the instrument and transmit a high-frequency signal reflected off the layer to the measuring instrument. A contact end edge of the ground electrode to contact the other conductor layer is formed into an annular shape coaxially surrounding the probe needle to allow some portion of the annular contact end edge surrounding the probe needle to contact the other conductor layer when the probe needle is allowed to contact a portion of the internal conductor layer.

Description

明細書 多層プリント板に使用される内層回路入り積層板の高周波回路インピーダンス 測定プローブ 技術分野  Description Probe for measuring high frequency circuit impedance of laminated board with inner layer circuit used for multilayer printed circuit board
本発明は、多層プリント板に用いられる内層回路入り積層板の高周波回路ィ ンピ一ダンス測定に使用するプローブに関するものである。  The present invention relates to a probe used for measuring a high-frequency circuit impedance of a laminated board containing an inner circuit used for a multilayer printed board.
背景技術 Background art
近年、携帯電話端末のような電子機器に組み込まれる高周波回路を実現する ために多層プリント板が多く使用されており、基本回路が内層に予め形成された 内層回路入り積層板を加工して種々の多層プリント板が製造される。この内層 回路入り積層板とは、以下のようにして用意される。先ず、絶縁基材の上下両 面の全面に亘つて第 1導体層と第 2導体層と積層し、第 1導体層に基本の高周 波回路を形成し、第 2導体層はグランド層として未加工のま审残し、その後、第 1 導体層の上に第 1絶縁層を介して第 3導体層を全面に亘つて形成する。或いは, 第 2導体層を所定の回路パターンを有するグランド層とする場合は、このグラン ド層の上に第 2の絶縁層を介して第 4導体層を全面に亘つて形成する。このよう にして製造された、最外の両面が未加工の導体層の内層回路入り積層板は、 その後、種々の回路設計の要求に従って、未加工の導体層に回路が形成され る。このため、歩留まり向上の点で、最後の回路形成の前には、内層回路入り 積層板の良品検査が必要となる。特に、高周波回路においては、回路に流れる 高周波信号との間のインピーダンス整合が要求されており、所定のインピーダ ンスが設計値の許容範囲内に収まっていることをチェックすることが必要でぁレ J . 回路のインピーダンスが一定の許容範囲から外れるものは不良品として破棄す るようにしている。特に、内層回路入り積層板の製造と、最後の回路形成とは 別々の製造者によって行なわれることが多いため、このような良品検査は必ず 行なわれることが要求される。 In recent years, multilayer printed circuit boards have been widely used to realize high-frequency circuits incorporated in electronic devices such as mobile telephone terminals, and various types of basic circuits are formed by processing a laminated board having an inner layer circuit formed in advance in an inner layer. A multilayer printed board is manufactured. The laminated board with the inner layer circuit is prepared as follows. First, the first conductor layer and the second conductor layer are laminated over the entire upper and lower surfaces of the insulating base material, a basic high-frequency circuit is formed on the first conductor layer, and the second conductor layer is used as a ground layer. Then, the third conductor layer is formed on the entire surface of the first conductor layer via the first insulating layer. Alternatively, when the second conductor layer is a ground layer having a predetermined circuit pattern, a fourth conductor layer is formed over the entire surface of the ground layer via a second insulating layer. The laminated board with the inner layer circuit of the outermost unprocessed conductor layer manufactured in this manner is then formed with a circuit on the unprocessed conductor layer in accordance with various circuit design requirements. Therefore, in order to improve the yield, it is necessary to inspect non-defective products of the laminated board with the inner layer circuit before the final circuit formation. In particular, in high-frequency circuits, impedance matching with high-frequency signals flowing through the circuit is required, and it is necessary to check that the predetermined impedance is within the allowable range of the design value. . If the impedance of the circuit is out of a certain allowable range, it is discarded as defective. In particular, since the manufacture of the laminated board with the inner circuit and the final circuit formation are often performed by different manufacturers, it is required that such non-defective inspection be performed.
従来より、回路板の回路のインピーダンスを測定するにあたっては、主【こ TDR (Time Domain Refrectometry)法が用いられている。この方法は、内層の導体層 に形成したテスト導体に、この導体層と別の導体層をグランドとして、パルスある いはステップ信号などの高周波入射信号を伝送し、テスト導体(内層信号回路) 内での反射信号を検知すると共に反射信号から求められる反射係数を用いて 亍スト導体(内層信号回路)のインピーダンス値を得るようにするものである。 上記のインピーダンス測定に必要なものとしては、 TDR用の計測器、信号伝 送用のケーブル、プローブがある。プローブは計測器及びこれと接続されている ケーブルをテスト導体に電気的に接続するための仲介役として用いられるもの であり、できるだけ低損失で入射信号や反射信号などの電気信号が流れるよう に、ケーブルやテスト導体とのインピーダンス整合等がとられて電気的設計がな されている。  Conventionally, when measuring the impedance of a circuit on a circuit board, the main TDR (Time Domain Refrectometry) method has been used. According to this method, a high-frequency incident signal such as a pulse or a step signal is transmitted to a test conductor formed on an inner conductor layer using this conductor layer and another conductor layer as a ground, and the test conductor (inner signal circuit) is formed. Then, the impedance value of the cost conductor (inner layer signal circuit) is obtained by using the reflection coefficient obtained from the reflection signal while detecting the reflection signal. What is required for the above impedance measurement is a measuring instrument for TDR, a cable for signal transmission, and a probe. The probe is used as an intermediary for electrically connecting the measuring instrument and the cable connected to the test conductor to the test conductor. Electrical design is performed by matching impedance with cables and test conductors.
このプローブとしては 2つのタイプが提案されている。一つは、マイクロストリツ プ構造のもので、テスト導体 (信号回路)に接触する信号ピンと、テスト導体と異 なる層である導体層に接触するグランドピンとを有し、両ピンが板状の誘電体層 で隔離されたプローブであり、もう一つは、同軸構造のもので、中央導体の回り を誘電体層を介して外部導体で包囲し、中央導体と外部導体から夫々信号ピン とグランドピンとが突出するものである。いずれのタイプのプローブも、信号ピン をテスト導体に接触させると同時にグランドピンを別の導体層に接触させること が必要であるため、両ピン間の距離に一致するようにテスト導体と別の導体層 の位置を予め決定し、更に、プローブをこれに併せて正確に位置制御すること が要求され、テスト導体と別の導体層との距離がずれたり、プローブの位置置 制御が少しでもずれたりすると、正確なインピーダンス測定ができなくなるという 問題があった。特に、積層板が小型で薄型であるばあいは、この問題が重要で あり、正確なインピーダンス測定が難しくなる。 発明の開示 Two types of this probe have been proposed. One is a microstrip structure, which has a signal pin that contacts a test conductor (signal circuit) and a ground pin that contacts a conductor layer, which is a different layer from the test conductor. The probe is separated by a dielectric layer, and the other is of a coaxial structure, in which the center conductor is surrounded by an outer conductor via a dielectric layer, and the signal pin and the ground are respectively separated from the center conductor and the outer conductor. The pins protrude. Both types of probes require that the signal pin be in contact with the test conductor and the ground pin be in contact with another conductor layer at the same time, so that the test conductor and the other conductor must match the distance between the pins. layer It is necessary to determine the position of the probe in advance, and to precisely control the position of the probe accordingly.If the distance between the test conductor and another conductor layer shifts or the position control of the probe shifts even slightly, However, there is a problem that accurate impedance measurement cannot be performed. This problem is particularly important when the laminated board is small and thin, making accurate impedance measurement difficult. Disclosure of the invention
本発明は、上記の問題点を解消するためになされたものであり、積層板に対 する位置決めが簡単に行えて信頼性の高いインピーダンス測定を可能としたプ ローブを提供することを目的とするものである。  The present invention has been made in order to solve the above problems, and has as its object to provide a probe that can easily perform positioning with respect to a laminate and that enables highly reliable impedance measurement. Things.
本発明に係るインピーダンス測定用プローブは、多層プリント板に使用される 内層回路入り積層板の高周波回路インピーダンスを測定するためのものであり、 積層板内で高周波回路を形成する内部導体層に接触するためのプローブ針と、 この内部導体層と別の導体層に接触するためのグランド電極とを備え、プロ一 ブ針は外部のインピーダンス計測器に接続されてここからの高周波信号を内部 導体層に送ってここから反射される高周波信号を計測器に伝えるために使用さ れるものであり、別の導体層に接触するグランド電極の接触端縁がプローブ針 を同軸状で包囲する環状となった。従って、プローブ針を内部導体層の一部に 接触させれば、プローブ針を囲む環状の接触端縁のどこかで別の導体層に接 触できるものである。この結果、内部導体層の測定点と別の導体層との距離が 環状の接触端縁の直径の範囲内にあれば、インピーダンス測定が可能となり、 プローブに対してその軸の回りの回転制御を行なうことなく、プローブを測定点 へ容易に位置決めすることができるだけでなく、内部導体層とこれと別の導体層 間の寸法が異なる積層板についても、正確なインピーダンス測定が可能となる 利点を有する。 The impedance measuring probe according to the present invention is for measuring the high-frequency circuit impedance of a laminated board containing an inner-layer circuit used for a multilayer printed circuit board, and comes into contact with an internal conductor layer forming a high-frequency circuit in the laminated board. And a ground electrode for contacting the inner conductor layer and another conductor layer.The probe needle is connected to an external impedance measuring instrument, and a high-frequency signal from the probe needle is transmitted to the inner conductor layer. It is used to transmit the high-frequency signal transmitted and reflected from it to the measuring instrument. The contact edge of the ground electrode that comes into contact with another conductor layer has an annular shape that surrounds the probe needle coaxially. Therefore, if the probe needle is brought into contact with a part of the inner conductor layer, it can be brought into contact with another conductor layer somewhere on the annular contact edge surrounding the probe needle. As a result, if the distance between the measurement point of the inner conductor layer and another conductor layer is within the range of the diameter of the annular contact edge, impedance measurement will be possible, and the probe will be controlled to rotate around its axis. Not only can the probe be easily positioned at the measurement point without performing, but also accurate impedance measurement can be performed on the laminated board with different dimensions between the inner conductor layer and another conductor layer. Has advantages.
プローブは、インピーダンス計測器から延出する同軸ケーブルが接続されるソ ケットを後端に備え、ソケットに挿入される同軸ケーブルの中心導体がプローブ 針に接続され、ソケットの外周に接続される同軸ケーブルの外側導体がグランド 電極に接続される。  The probe has a socket at the rear end to which the coaxial cable extending from the impedance measuring instrument is connected.The center conductor of the coaxial cable inserted into the socket is connected to the probe needle, and the coaxial cable connected to the outer periphery of the socket. Outer conductor is connected to the ground electrode.
グランド電極の接触端縁を導電性ゴムで形成した場合は、導電性ゴムの変形 能を利用して、表面に凹凸がある導体層に対しても密着接触することができて 信頼性の高いインピーダンス測定が行える。  When the contact edge of the ground electrode is made of conductive rubber, it can make close contact with the conductor layer with irregularities on the surface by utilizing the deformability of the conductive rubber, providing a highly reliable impedance. Measurement can be performed.
プローブ針はグランド電極を保持するプローブ本体に対して着脱自在であるこ とが望ましぐこれにより比較的寿命の短いプローブ針の交換が容易に行える。 また、プローブ針がその軸方向に沿ってグランド電極に対して移動自在となり、 フロー卜支持されることが好ましく、これにより、プローブ針を内部導体層へ接触 させるときの衝撃が吸収できて、プローブ針及び内部導体層の損傷を最小とす ることができる。  It is desirable that the probe needle be detachable from the probe body holding the ground electrode, so that the probe needle having a relatively short life can be easily replaced. Further, it is preferable that the probe needle is movable with respect to the ground electrode along the axial direction and is supported by a float, so that an impact when the probe needle is brought into contact with the inner conductor layer can be absorbed, and Damage to the needle and the inner conductor layer can be minimized.
プローブ針とグランド電極との間には低誘電率、低誘電正接の材料からなる 誘電体が設けられて、高周波領域における損出を低 Mしてインピーダンス測定 の信頼性を向上させる。  A dielectric made of a material having a low dielectric constant and a low dielectric loss tangent is provided between the probe needle and the ground electrode to reduce loss in a high frequency region and improve the reliability of impedance measurement.
好ましい実施形態にあっては、プローブ針がばねの力によって軸方向の前方 に突出する前方位置と、ばねに杭して後方に押される後退位置との間で移動自 在となり、前方位置の時にプローブ針の一部がグランド電極に接触し、後退位 置の時にプローブ針がグランド電極から離れるよう構成される。このため、プロ 一ブ針を最初に内部導体に接触させるだけで、内部導体に帯電した静電気をグ ランド電極を通して除去することができ、これに引き続いてプローブ針を所定の 接触圧で内部電極に押し当てることで、プローブ針がグランド電極から離れてィ ンピ一ダンス測定が ¾能となるものであり、静電気の除去とインピーダンス測定 を連続して行なうことができる。 ' In a preferred embodiment, the probe needle is self-moving between a forward position in which the probe needle projects forward in the axial direction by the force of the spring and a retracted position in which the probe needle is pushed backward by being piled on the spring. A part of the probe needle comes into contact with the ground electrode, and the probe needle is separated from the ground electrode when in the retracted position. For this reason, only by first bringing the probe needle into contact with the inner conductor, static electricity charged on the inner conductor can be removed through the ground electrode, and subsequently, the probe needle is brought into contact with the inner electrode at a predetermined contact pressure. Pushing the probe needle away from the ground electrode Impedance measurement is effective, and static electricity removal and impedance measurement can be performed continuously. '
この場合、グランド電極は、グランド電極本体とこれの前端に着脱自在のカバ 一とで構成され、カバーにグランド電極の接触端縁を形成することが望ましい。 これにより、接触端縁が摩耗したり損傷を受けた場合は、カバーを取り替えるこ とでプローブの保守が行えるものである。また、プローブ針とグランド電極との間 の一時的な電気接続は、プローブ針に設けたフランジをカバーの内面に当接さ せることで達成される。  In this case, the ground electrode is composed of a ground electrode body and a detachable cover at the front end thereof, and it is desirable to form a contact edge of the ground electrode on the cover. This allows the probe to be maintained by replacing the cover if the contact edge is worn or damaged. The temporary electrical connection between the probe needle and the ground electrode is achieved by bringing the flange provided on the probe needle into contact with the inner surface of the cover.
別の好ましい実施形態においては、プローブ針を包囲してこれを支持する支持 筒の外周にプローブ針の軸方向に沿ってグランド電極が移動自在に保持される。 これにより、プローブ針を内部導体に接触させるためのプローブの移動と、グラ ンド電極の接触端縁を別の導体層に接触させるためのグランド電極との移動と を別々に行なうことができて、プローブの正確な位置決めを行なうことができる。 すなわち、プローブ針が内部導体に接触したことを確認した後に、グランド電極 を移動させることができて、両者とも正しい位置で対応する導体へ接触すること が可能になる。  In another preferred embodiment, a ground electrode is movably held along the axial direction of the probe needle on the outer periphery of a support cylinder that surrounds and supports the probe needle. Thereby, the movement of the probe for bringing the probe needle into contact with the inner conductor and the movement of the probe with the ground electrode for bringing the contact edge of the ground electrode into contact with another conductor layer can be performed separately. Accurate positioning of the probe can be performed. That is, after confirming that the probe needle has contacted the internal conductor, the ground electrode can be moved, and both can contact the corresponding conductor at the correct position.
これに関連して、グランド電極は支持筒の軸方向の後方に設けた後方部材と ばね部材で結合されており、このばね部材の作用によって、グランド電極の接触 端縁を十分な接触圧で導体層に接触させることができ、導体層の接触面が不規 則となっていても、安定した電気接続が行える。この後部材は外部のァクチユエ 一夕に接続されるために使用され、ァクチユエータによって軸方向の前方に移動 することによってグランド電極の接触端縁を所定の接触圧で対象となる導体層 に接触させることができる。  In this connection, the ground electrode is connected to a rear member provided on the rear side of the support cylinder in the axial direction by a spring member. By the action of this spring member, the contact edge of the ground electrode is brought into contact with the conductor by a sufficient contact pressure. Layer, and a stable electrical connection can be made even if the contact surface of the conductor layer is irregular. This rear member is used to be connected to an external actuator overnight, and is moved axially forward by the actuator to bring the contact edge of the ground electrode into contact with the target conductor layer at a predetermined contact pressure. Can be.
上述した本発明の特徴点及びその他の特徵点は添付する図面に基づく以下 の詳細な説明から明白になる。 図面の簡単な説明 The above-mentioned features of the present invention and other features are described below with reference to the accompanying drawings. Will be apparent from the detailed description of BRIEF DESCRIPTION OF THE FIGURES
図 1は、本発明の高周波回路インピーダンス測定プローブにて測定される内層 回路入り積層板を示す分解斜視図。 FIG. 1 is an exploded perspective view showing a laminated board with an inner circuit measured by a high-frequency circuit impedance measuring probe of the present invention.
図 2は、同上の積層板内に形成される内層回路を示す平面図。 FIG. 2 is a plan view showing an inner layer circuit formed in the laminated plate of the above.
図 3、 3B、 3C、 3D、 3Eは、同上の積層板からこれを用いて形成される多層プ リント板の形成過程を示す斜視図。 FIGS. 3, 3B, 3C, 3D, and 3E are perspective views showing a process of forming a multilayer printed board formed from the laminated board using the same.
図 4は、本発明のインピーダンス測定プローブを示す断面図。 FIG. 4 is a cross-sectional view showing the impedance measurement probe of the present invention.
図 5は、同上のプローブの前端面を示す側面図。 FIG. 5 is a side view showing the front end surface of the probe.
図 6は、同上のプローブの一部変更例を示す部分断面図。 FIG. 6 is a partial cross-sectional view showing a partially modified example of the above probe.
図 7は、同上のプローブの使用形態を示す斜視図。 FIG. 7 is a perspective view showing a usage form of the above probe.
図 8は、同上のプローブの使用形態を示す正面図。 FIG. 8 is a front view showing a usage form of the above probe.
図 9は、同上のプローブの使用形態を示す断面図。 FIG. 9 is a cross-sectional view showing a usage form of the above probe.
図 1 0は、同上のプローブの別の使用形態を示す断面図。 FIG. 10 is a cross-sectional view showing another usage form of the probe of the above.
図 1 1及び図 1 2は本発明の別の実施形態に係るインピーダンス測定プローブを 示す断面図。 FIGS. 11 and 12 are cross-sectional views showing an impedance measurement probe according to another embodiment of the present invention.
図 1 3及び図 1 4は本発明の更に他の実施形態に係るインピーダンス測定プロ ーブを示す断面図。 FIGS. 13 and 14 are cross-sectional views showing an impedance measuring probe according to still another embodiment of the present invention.
図 1 5は、同上のプローブの一部を示す斜視図。 発明を実施するための最良の実施形態 FIG. 15 is a perspective view showing a part of the probe of the above. BEST MODE FOR CARRYING OUT THE INVENTION
本発明に係るインピーダンス測定プローブは、多層プリント板に使用される内 層回路入り積層板の高周波回路のインピーダンスを測定するために設計された ものである。対象となる内層回路入り積層板 Lは、最終的に多層プリント板とし て仕上げられる中間製品であり、内層に基本高周波回路(以下内層回路と称 す) 1 2を有し、最外の両面が後に回路形成される外部導体層であるものである。 図 1には、絶縁基材 1の上下両面に内層となる第"!導体層 10と第 2導体層 20を 有し、これらの内層の外側に夫々第 1絶縁層 1 1と第 2絶縁層 1 2を介して第 3導 体層 30と第 4導体層 40を設けた例を示す。この場合、第 1導体層 1 0に、内層 回路 1 2が形成され、第 2導体層 20は最終的な回路のグランド回路を構成する ように形成される。図示しないが、この中間製品を 3層の導体層を有する構成と する場合は、内部導体層に内層回路が形成され、 2層の外部導体層の一つに 最終の信号回路が形成され、残りの一つにグラント回路が形成される使用とな る。 The impedance measurement probe according to the present invention is designed for measuring the impedance of a high-frequency circuit of a laminated board containing an inner circuit used for a multilayer printed board. Things. The target laminated board L with an inner layer circuit is an intermediate product that is finally finished as a multilayer printed board, and has a basic high-frequency circuit (hereinafter referred to as an inner layer circuit) 12 in the inner layer, and the outermost This is an external conductor layer to be formed later as a circuit. FIG. 1 shows the first and second insulating layers 10 and 20 as inner layers on the upper and lower surfaces of the insulating substrate 1, and the first and second insulating layers 11 and 20, respectively, outside these inner layers. An example is shown in which the third conductor layer 30 and the fourth conductor layer 40 are provided via the interface 12. In this case, the inner circuit 12 is formed on the first conductor layer 10, and the second conductor layer 20 is Although not shown, when this intermediate product is configured to have three conductor layers, an inner circuit is formed on the inner conductor layer and two outer layers are formed. A final signal circuit is formed on one of the conductor layers, and a grant circuit is formed on the other one.
この内層回路入り積層板 Lは、図 3A— 3Cに示すように、絶縁基材 1の両面の 全面に第 1導体層 1 0と第 2導体層 20を形成した後に、第 1導体層 1 0に内層回 路 1 2を形成すると共に、第 2導体層 20に後に完成される高周波回路のグラン ド回路を形成する。第 1導体層 1 0には、内層回路 1 2に加えて、回路インピーダ ンス測定用のテスト導体 1 3が形成される。その後、第 1導体層 1 0及び第 2導体 層 20に夫々第 1絶縁層 1 1と第 2絶縁層 1 2を介して第 3導体層 30と第 4導体層 40とが積層板の全面に亘つて形成される。  As shown in FIGS. 3A-3C, the laminated board L with the inner layer circuit is formed by forming the first conductor layer 10 and the second conductor layer 20 on the entire surface of both sides of the insulating base material 1 and then forming the first conductor layer 10 An inner layer circuit 12 is formed in the second conductor layer 20, and a ground circuit of a high-frequency circuit to be completed later is formed in the second conductor layer 20. On the first conductor layer 10, a test conductor 13 for measuring circuit impedance is formed in addition to the inner layer circuit 12. After that, the third conductor layer 30 and the fourth conductor layer 40 are formed on the first conductor layer 10 and the second conductor layer 20 via the first insulation layer 11 and the second insulation layer 12, respectively, over the entire surface of the laminate. It is formed over.
この後、積層板は図 3D、 3Eに示されるように、最外層である第 3導体層 30と 第 4導体層 40との所定の高周波回路 32, 42が形成されて、内層と外層との間 をスルーホール 33で接続して最終の多層プリント板が得られる。  Thereafter, as shown in FIGS. 3D and 3E, the laminated board is formed with predetermined high-frequency circuits 32 and 42 of the third and fourth conductor layers 30 and 40, which are the outermost layers. The connection is made by through holes 33 to obtain a final multilayer printed board.
図 2に示すように、第 1導体層 10には複数の同一の内層回路 1 2が形成され、 これに併せて他の導体層にも複数の回路が形成されて、最終の多層プリント板 を複数に切り出すことによって同時に複数の回路部品が形成される。同図に示 すように、テスト導体 1 3は複数本形成され、各テスト導体 1 3は積層板しの長手 方向の全長に亘つて延出して積層板 Lの両端面にその端部が露出きせている。 これに関連して、グランド回路を形成した後の第 2導体層 20の端縁は積層板の 端面に露出して、回路インピーダンスを測定する時に、テスト導体 1 3に対する 基準電位、すなわち、グランド電位を与えるように機能する。 As shown in FIG. 2, a plurality of identical inner-layer circuits 12 are formed on the first conductor layer 10, and a plurality of circuits are also formed on the other conductor layers at the same time. By cutting out into a plurality, a plurality of circuit components are formed at the same time. Shown in the figure As described above, a plurality of test conductors 13 are formed, and each test conductor 13 extends over the entire length in the longitudinal direction of the laminated plate, and the ends thereof are exposed at both end surfaces of the laminated plate L. In this connection, the edge of the second conductor layer 20 after the formation of the ground circuit is exposed on the end face of the laminate, and when measuring the circuit impedance, the reference potential for the test conductor 13, that is, the ground potential Function to give.
インピーダンスの測定には、上の積層板に応じて特別に設計されたプローブ P、 プローブを介してテスト導体 1 3に高周波信号を与えここからの反射波を分析す る計測器、計測器とプローブ Pとを接続する同軸ケーブルが用いら る。プロ一 ブ Pはプローブ針 1 1 1とグランド電極 1 20とを備え、図 7や図 9に示すように、プ ローブ針 Pをテスト導体 1 3の一端に接触させると共に、グランド電極 1 20前端 に形成した環状の接触端縁 1 21を、第 2導体層 20や第 3導体層 30に接触させ ることで内層回路のインピーダンスの測定が行なわれる。計測器はオシロスコ ープゃ測定用の高周波信号を発生する入力信号発生器を備えたものである。 図 4に本発明の一実施形態に係るプローブを示す。プローブ Pは、後端に同軸 ケーブルの中央ピンが揷入されるソケット 1 01を備えた金属製の本体筒 100と、 本体筒 100内に収められた針ユニット 1 10とで構成される。針ユニット 1 10は、 プローブ fl 1 1を軸方向に沿って進退自在に支持するホルダー 1 1 2とで構成さ れ、ホルダ一内部に収めたばね 1 1 3によってプローブ針 1 1が前方へ付勢さ れている。このホルダー 1 1 2はプローブ針 1 1 1と電気的に接続されると共に、 同軸ケーブルの中央ピンが揷入されるソケット 1 01と電気接続され、ホルダー 1 1 2 びソケット 1 01は絶縁スリーブ 1 04、 1 05とによって本体筒 1 00と電気的 に隔離される。本体筒 1 00の後端にはネジ部 1 02が形成され、ここへ同軸ケ一 ブルの外部導体と一体となったナットが結合される。このようにして計測器との 接続に用いられる同軸ケーブルの外部導体 (シールド)と電気的に接続される本 体筒 100がグランド電極 1 20を規定し、本体筒 1 00の前端面には環状突起が 形成されてプローブ針 1 1 1を同心円状に囲む環状の接触端縁 1 21を規定する。 また、本体筒 1 00の軸方向の中央部には取付フランジ 1 06が形成され、プロ一 ブ Pを移動させるための移動機構のァクチユエ一タが取付フランジ 1 06に結合さ れる。 To measure impedance, a probe P specially designed according to the laminated board above, a measuring instrument that applies a high-frequency signal to the test conductor 13 via the probe and analyzes the reflected wave from it, a measuring instrument and a probe A coaxial cable connecting P is used. The probe P has a probe needle 111 and a ground electrode 120.As shown in FIGS. 7 and 9, the probe P contacts the one end of the test conductor 13 and the front end of the ground electrode 120. The impedance of the inner layer circuit is measured by bringing the annular contact edge 121 formed in the above into contact with the second conductor layer 20 or the third conductor layer 30. The measuring instrument has an input signal generator that generates a high-frequency signal for oscilloscope II measurement. FIG. 4 shows a probe according to an embodiment of the present invention. The probe P includes a metal main body tube 100 provided with a socket 101 into which a center pin of a coaxial cable is inserted at a rear end, and a needle unit 110 housed in the main body tube 100. The needle unit 1 10 is composed of a holder 1 1 2 that supports the probe fl 1 1 to move forward and backward along the axial direction. The spring 1 1 3 housed inside the holder 1 urges the probe needle 11 forward. Has been done. The holder 1 1 2 is electrically connected to the probe needle 1 1 1 and is electrically connected to the socket 1 01 into which the center pin of the coaxial cable is inserted. 04 and 105 are electrically isolated from the main body cylinder 100. A screw portion 102 is formed at the rear end of the main body tube 100, and a nut integrated with the outer conductor of the coaxial cable is coupled to the screw portion 102 here. In this way, a book electrically connected to the outer conductor (shield) of the coaxial cable used to connect to the measuring instrument The body cylinder 100 defines the ground electrode 120, and an annular projection is formed on the front end surface of the body cylinder 100 to define an annular contact edge 121 concentrically surrounding the probe needle 111. A mounting flange 106 is formed at the center of the main body cylinder 100 in the axial direction, and an actuator of a moving mechanism for moving the probe P is connected to the mounting flange 106.
このプローブ Pは、 X— Yテーブル上に載置された積層板 Lの端面に対して接 近するように移動機構に保持される。積層板は X—Yテーブルによって水平方向 に移動され、積層板端面に露出する亍スト導体 1 3とプローブ Pとの間の水平方 向の位置決めなされる。その後、プローブ Pは別の移動機構により Z方向の位 置調整がなされ、プローブ針 1 1 1とテス卜導体 1 3との位置合わせが完了する。 次いで、移動機構によりプローブ Pが積層板 Lの端面に近づけられて、図 7, 8, 9に示すように、プローブ針 1 1 1がテスト導体 1 3に接触すると共に、グランド電 極 1 20の環状端縁 1 21がテスト導体 1の周囲の別の層である第 2導体 20及び 第 3導体 30の端縁に接触する。この状態で、計測器から高周波信号をテスト導 体 1 3に送り、ここから反射される高周波信号を分析することで亍ス卜導体 1 3、 すなわち、内層回路のインピーダンスが計測される。このプローブ Pは、同軸ケ —ブル 69と同じインピーダンス(例えば、 1 0GHzの通過特性 Ζο-50 Ω± 1 Ω) となるように設計されてインピーダンス整合がとられている。ここで、テスト導体 1 3は積層板の全長に亘つて設けられていることから、反射される高周波信号を 時間を考慮して分析することでテスト導体の長さの各点でのインピーダンスが測 定できるものである。また、テスト導体は積層板 Lの両端面に露出しているため, インピーダンス測定は積層板 Lのいずれの端面でも行える。  The probe P is held by the moving mechanism so as to come close to the end face of the laminate L placed on the XY table. The laminate is moved in the horizontal direction by the XY table, and horizontal positioning is performed between the probe 13 and the conductor 13 exposed at the end face of the laminate. Thereafter, the position of the probe P is adjusted in the Z direction by another moving mechanism, and the alignment between the probe needle 11 and the test conductor 13 is completed. Then, the probe P is moved closer to the end face of the laminated plate L by the moving mechanism, and as shown in FIGS. 7, 8, and 9, the probe needle 11 comes in contact with the test conductor 13 and the ground electrode 120 The annular edge 121 contacts the edges of the second conductor 20 and the third conductor 30 which are another layer around the test conductor 1. In this state, a high-frequency signal is sent from the measuring instrument to the test conductor 13, and the high-frequency signal reflected therefrom is analyzed to measure the impedance of the test conductor 13, that is, the impedance of the inner layer circuit. The probe P is designed to have the same impedance as the coaxial cable 69 (for example, a pass characteristic of 10 GHz: Ζ-50 Ω ± 1 Ω), and is impedance-matched. Here, since the test conductor 13 is provided over the entire length of the laminate, the impedance at each point of the length of the test conductor is measured by analyzing the reflected high-frequency signal in consideration of time. Can be determined. In addition, since the test conductor is exposed on both end faces of the laminate L, impedance measurement can be performed on any end face of the laminate L.
絶縁スリーブ 1 04、 1 05は高周波での特性の向上を図るために低誘電率で 低誘電正接の材料で形成することが好まし 例えば、 PTFE (ポリテトラフルォ 口エチレン)などのフッ素樹脂や PPO (ポリフエ二レンオキサイド)、 PPE (ポリフ ェニレンエーテル)等の樹脂を用いることができる力 フッ素樹脂と同程度の低 誘電率で低誘電正接を有し、しかもフッ素樹脂と同程度の形状安定性を有する あらゆる材料を用いることができる。 The insulating sleeves 104 and 105 are preferably formed of a material having a low dielectric constant and a low dielectric loss tangent in order to improve the characteristics at high frequencies. For example, PTFE (polytetrafluoride) The ability to use fluororesins such as ethylene) and resins such as PPO (polyphenylene oxide) and PPE (polyphenylene ether). It has the same low dielectric constant and low dielectric loss tangent as fluororesins, and Any material having the same shape stability as fluororesin can be used.
プローブ針 1 1 1はホルダー 1 1 2に対して抜き差し可能に形成されているので、 プローブ針が摩耗した場合は交換できる。プローブ針 1 1 1としては |、例えば、テ スト導体 1 3の厚みが 1 8 imの場合、先端の径が 1 00 jUm、先端以外の径が 3 00 jUmのものが使用できる。プローブ針 1 1 1は、ホルダ一 1 1 2に対して前後方 向にスライド移動自在でばね 1 1 3によって前方へ付勢されているため、プロ一 ブ針 1 1 1を適切な接触圧でテスト導体 1 3へ接触させて確実な電気接続が果た される。同時にばねの作用により、インピーダンスの測定時に、積層板 Lやプロ ーブ針 1 1 1の先端への過度の衝撃が加わるのが防止される。  Since the probe needle 1 1 1 is formed so that it can be inserted and removed from the holder 1 1 2, it can be replaced when the probe needle is worn. For example, when the thickness of the test conductor 13 is 18 im, a probe needle having a diameter of 100 jUm and a diameter other than the tip of 300 jUm can be used as the probe needle 111. Since the probe needle 1 1 1 is slidable forward and backward with respect to the holder 1 1 1 2 and is urged forward by the spring 1 1 3, the probe needle 1 1 1 is pressed with an appropriate contact pressure. A reliable electrical connection is made by contacting the test conductor 13. At the same time, the action of the spring prevents an excessive impact on the laminated plate L and the tip of the probe needle 111 during impedance measurement.
尚、図 6に示すように、導電性ゴムでできた環状の接触端縁 1 21をグランド電 極 1 20に嵌め込むようにしてもよし、。このゴムの弾性変形能により適当な接触 圧が得られると共に、接触端縁 1 21及び対応する導体層の損傷が防止できる。 導電性ゴムは圧力などによる歪みが無い状態であっても通常のゴムよりも低い 抵抗値を有して導電性金属と同程度の導電性を有するものであり、圧縮による 抵抗値の変化が小さいものである。例えば、信越化学工業 (株)製の「EC— A」 などを用いることができる。また、導電性ゴムの代わりに加圧導電ゴムを用いて 接触端縁 1 21を形成することができる。加圧導電ゴムは通常では一般のゴ と 同程度の導電性質を有しているものであるが、圧縮することにより抵抗値が下 がり、導電性金属と同程度の導電率を持つに至るものであり、例えば、日本合 成ゴム (株〉製の rpCRJなどを用いることができる。  As shown in FIG. 6, an annular contact edge 121 made of conductive rubber may be fitted into the ground electrode 120. An appropriate contact pressure can be obtained by the elastic deformability of the rubber, and the contact edge 121 and the corresponding conductor layer can be prevented from being damaged. Conductive rubber has a lower resistance value than normal rubber and has the same conductivity as conductive metal even when there is no distortion due to pressure, etc., and the change in resistance value due to compression is small Things. For example, “EC-A” manufactured by Shin-Etsu Chemical Co., Ltd. can be used. Further, the contact edge 121 can be formed by using a pressurized conductive rubber instead of the conductive rubber. Pressurized conductive rubber usually has the same conductive properties as general rubber, but when compressed, the resistance value decreases, leading to the same conductivity as conductive metals. For example, rpCRJ manufactured by Nippon Synthetic Rubber Co., Ltd. can be used.
尚、図 9では、プローブ Pを積層板しの端面に接触させて積層板 Lに対する非 破壊検査によるインピーダンス測定を行なう例を示したが、本発明のプローブ P は、この他に、図 1 0に示すように、第 3導体 30及び第 1絶縁層 1 1の一部を切り 欠いて、プローブ針 1 1 1をテスト導体 1 3や内部回路に直接接触させると共に、 グランド電極 1 20を積層板 L上面に露出する外部導体層 30に接触させるように してインピーダンス測定を行なうことも可能である。 In FIG. 9, the probe P is brought into contact with the end face of Although an example in which impedance measurement is performed by destructive inspection has been described, the probe P of the present invention also has the third conductor 30 and a part of the first insulating layer 11 cut away as shown in FIG. It is also possible to make impedance measurement by bringing the probe needle 1 1 1 directly into contact with the test conductor 13 and the internal circuit, and by bringing the ground electrode 1 20 into contact with the external conductor layer 30 exposed on the top surface of the laminate L. It is.
図 1 1と図 1 2は、本発明の他の実施形態に係るプローブを示す。このプローブ Pは基本的に上の実施例と同一の構造であるが、本体筒 1 00Aの前端に着脱 自在の力パーを設けてこれをグランド電極 1 20Aとした点が異なる。同一の部ネオ については同一の番号に参照記号 ΓΑ」を付して示す。このカバ一 1 20Αの前端 面には環状の接触端縁 1 21 Αがー体に形成され、後端がネジによって本体筒 1 00Aに結合されて本体筒との間に空間 1 24を形成している。プローブ針 1 1 1 A にはこの空間 1 24内に位置するフランジ 1 1 4が一体に形成され、図 1 1に示す ように、プローブ針 1 "Π Aがばね 1 1 3Aによって前方に付勢された位置の時に、 フランジ 1 14がカバー 1 20Aの内面に当接し、図 1 2に示すように、プローブ針 1 1 1 Aが押し込まれたときには、フランジ 1 1 4がカバ一 1 20Aから離れて絶縁スリ ーブ 1 04Aの端面に当接するようになつている。カバー 1 20Aの中央にはプロ一 ブ針 1 1 1 Aとの絶縁をとるために絶縁リング 1 08が設けられる。この構成により、 テスト導体 1 3が静電気を帯びている場合は、プローブ針 1 1 Aがテスト導体 1 3 に接触した時点で静電気をフランジ 1 14からグランド電極 1 20Aに逃がすことが でき、その後グランド電極 1 20Aの接触端縁 1 21 Aが積層板 Lの端面に押し付 けられることに伴って、プローブ針 1 1 1 Aが押し込まれることで、フランジ 1 1 4が グランド電極 1 20Aから離れるため、直ぐにインピーダンスの測定が行なわれ る。  11 and 12 show a probe according to another embodiment of the present invention. This probe P has basically the same structure as the above embodiment, except that a detachable force par is provided at the front end of the main body cylinder 100A and this is used as a ground electrode 120A. Identical parts are indicated by the same reference numerals with the reference symbol ΓΑ ”added. An annular contact edge 121 こ の is formed on the front end face of the cover 120Α, and a rear end thereof is coupled to the main body cylinder 100A with a screw to form a space 124 between itself and the main body cylinder. ing. A flange 1 14 located in this space 1 24 is integrally formed with the probe 1 11 A, and as shown in Fig. 11, the probe 1 "ΠA is urged forward by a spring 1 13A. In this position, the flange 114 contacts the inner surface of the cover 120A, and as shown in Fig. 12, when the probe needle 111A is pushed in, the flange 114 moves away from the cover 120A. The insulation sleeve 104A comes into contact with the end face of the insulation sleeve 104A.An insulation ring 108 is provided at the center of the cover 120A to provide insulation from the probe needle 111A. Therefore, if the test conductor 13 is charged with static electricity, the static electricity can be released from the flange 114 to the ground electrode 120A when the probe needle 11A comes into contact with the test conductor 13 and then the ground electrode 1 As the contact edge of 20A 1 21A is pressed against the end face of the laminate L, By lobe needle 1 1 1 A is pressed, the flange 1 1 4 away from the ground electrode 1 20A, Ru immediately impedance measurement is performed.
図 1 3、図 14、図 1 5は、本発明の更に他の実施形態に係るプローブを示す。 このプローブ Pは基本的に上の実施例と同一の構造であるが、本体筒 1 00Bに グランド電極 1 20Bが本体筒の軸方向に沿ってスライド自在に支持された点が 異なる。同一の部材については同一の番号に参照記号「BJを付して示す。この グランド電極 1 20Bは導電性ゴムでできた環状接触端縁 1 21 Bを保持し、本体 筒 100Bの軸方向後端部に同じくスライド自在に支持された取付フランジ 1 06B とコイルパネ 1 26で結合される。本実施形態においては、本体筒 10OB後端の ネジ部 102Bは、同軸ケーブルの外側導体にナットで結合されると共に、プロ一 ブ Pの位置制御を行なう移動機構に固定されるために使用される。この場合、取 付フランジ 1 06Bはこの移動機構に設けたァクチユエ一タに結合され、移動機構 によって、図 1 3に示すように、プローブ針 1 1 1 Bを積層板 Lの端面のテスト導体 1 3に接触させた後に、ァクチユエータによって取付フランジ 1 06Bが前方に押し 出されることで、これとコイルばね 1 26で結合したグランド電極 1 20Bを前方に 移動させて、図 1 4に示すように、環状接触端縁 1 21 Bを積層板し端面の導体層 20, 40へ接触させる。これによつてインピーダンス測定が行なわれる。この場 合、コイルパネ 1 26によって適切な接触圧が与えられると共に、積層板しに対す る接触端縁 1 21への過度の衝撃も防止される。 FIGS. 13, 14, and 15 show a probe according to still another embodiment of the present invention. This probe P has basically the same structure as the above embodiment, except that a ground electrode 120B is supported on the main body cylinder 100B so as to be slidable along the axial direction of the main body cylinder. The same members are denoted by the same reference numerals with the reference symbol "BJ" attached. The ground electrode 120B holds the annular contact edge 121B made of conductive rubber, and the rear end in the axial direction of the main body cylinder 100B. Attached to the mounting flange 106B, which is also slidably supported by the coil, is a coil panel 126. In this embodiment, the threaded portion 102B at the rear end of the main body tube 10OB is coupled to the outer conductor of the coaxial cable with a nut. In addition, it is used to be fixed to a moving mechanism for controlling the position of the probe P. In this case, the mounting flange 106B is connected to an actuator provided in the moving mechanism, and the moving mechanism is used for the drawing. As shown in 13, after the probe needle 1 1 1B is brought into contact with the test conductor 13 on the end face of the laminated plate L, the mounting flange 106B is pushed forward by an actuator, thereby causing the coil spring 1 Joined at 26 The land electrode 120B is moved forward, and as shown in Fig. 14, the annular contact edge 121B is laminated and brought into contact with the conductor layers 20, 40 on the end faces, whereby impedance measurement is performed. In this case, an appropriate contact pressure is applied by the coil panel 126, and an excessive impact on the contact edge 121 against the laminated plate is also prevented.

Claims

請求の範囲 The scope of the claims
1 . 多層プリント板に使用される内層回路入り積層板の高周波回路インピーダン ス測定プローブであって、 1. A high frequency circuit impedance measurement probe for a laminated board with an inner layer circuit used for a multilayer printed board,
上記のプローブは、積層板内で高周波回路を形成する内部導体層に接触す るためのプローブ針と、内部導体層と別の導体層に接触するためのグランド 電極とを備え、  The probe includes a probe needle for contacting an internal conductor layer forming a high-frequency circuit in the laminate, and a ground electrode for contacting the internal conductor layer and another conductor layer.
プローブ針は外部のインピーダンス計測器に接続されてここからの高周波信 号を内部導体に送ってここから反射される高周波信号を計測器に伝えるため に使用され、  The probe needle is connected to an external impedance measuring instrument and is used to send the high-frequency signal from this to the inner conductor and transmit the high-frequency signal reflected from it to the measuring instrument,
別の導体層に接触するグランド電極の接触端縁力《プローブ針を同軸状で包囲 する環状となった。  The contact edge force of the ground electrode that comes into contact with another conductor layer << the coaxial shape surrounding the probe needle.
2.請求項 1に記載のプローブにおいて、 2. In the probe according to claim 1,
上記プローブは、インピーダンス計測器から延出する同軸ケーブルが接続さ れるソケットを後端に備え、ソケットに揷入される同軸ケーブルの中心導体がプ ローブ針に接続され、ソケットの外周に接続される同軸ケーブルの外側導体が グランド電極に接続される。  The probe has a socket at the rear end to which a coaxial cable extending from the impedance measuring instrument is connected, and the center conductor of the coaxial cable inserted into the socket is connected to the probe needle and connected to the outer periphery of the socket. The outer conductor of the coaxial cable is connected to the ground electrode.
3.請求項 1に記載のプローブにおいて、 3. In the probe according to claim 1,
グランド電極の接触端縁が導電性ゴムで形成された c The contact edge of the ground electrode is made of conductive rubber c
4.請求項 1に記載のプローブにおいて、 4. In the probe according to claim 1,
プローブ針がグランド電極を支持するプローブ本体に対して着脱自在となつ た。  The probe needle is now detachable from the probe body that supports the ground electrode.
5.請求項 1に記載のプローブにおいて、 , 5. The probe according to claim 1, wherein
プローブ針がその軸方向に沿ってグランド電極に対して移動自在となり、フロ ート支持された。  The probe needle was movable with respect to the ground electrode along the axial direction, and was float supported.
6.請求項 5に記載のプローブにおいて、 6. In the probe according to claim 5,
プローブ針がばねによってグランド電極に対してフロート支持された c Probe needle float supported by spring against ground electrode c
7.請求項 1に記載のプローブにおいて、 7. In the probe according to claim 1,
プローブ針とグランド電極との間に介在する誘電体が低誘電率、低誘電正接 の材料で成形された。  The dielectric interposed between the probe needle and the ground electrode was formed of a material with a low dielectric constant and a low dielectric loss tangent.
8.請求項 5に記載のプローブにおいて、 8. In the probe according to claim 5,
プローブ針がばねの力によって軸方向の前方に突出する前方位置と、ばねに 杭して後方に押される後退位置との間で移動自在となり、前方位置の時にプロ ーブ針の一部がグランド電極に接触し、後退位置の時にプローブ針がグランド 電極から離れるようになった c The probe needle can move freely between the forward position where it protrudes forward in the axial direction by the force of the spring, and the retracted position where it is piled on the spring and pushed backward. The probe needle touches the electrode, and the probe needle C came away from the electrode
9.請求項 8に記載のプローブにおいて、 9. In the probe according to claim 8,
グランド電極は、グランド電極本体とこれの前端に着脱自在のカバ一とで構成 され、カバーにグランド電極の接触縁が形成された。  The ground electrode was composed of a ground electrode body and a detachable cover at the front end thereof, and a contact edge of the ground electrode was formed on the cover.
1 0.請求項 9に記載のプローブにおいて、 10.In the probe according to claim 9,
プローブ針が前方位置にある時プローブ針に設けたフランジがカバーの内面 に接触し後退位置に移動した時にフランジがカバーから外れる。  When the probe needle is in the forward position, the flange provided on the probe needle contacts the inner surface of the cover, and the flange comes off the cover when it moves to the retracted position.
1 1 .請求項 1に記載のプローブにおいて、 11.The probe according to claim 1,
プローブ針を包囲してこれを支持する支持筒の外周にプローブ針の軸方向に 沿ってグランド電極が移動自在に保持された。  A ground electrode was movably held along the axial direction of the probe needle on the outer periphery of a support cylinder surrounding and supporting the probe needle.
1 2.請求項 1 1に記載のプローブにおいて、 1 2. In the probe according to claim 11,
グランド電極は支持筒の軸方向の後方に設けた後方部材とばね部材で結合さ れた。 The ground electrode was connected to a rear member provided at the rear of the support cylinder in the axial direction by a spring member.
1 3.請求項 1 2(こ記載のプローブにおいて、 上記のばね部材がコイルパネである c 1 3.Claim 1 2 (In the probe of this description, The above spring member is a coil panel c
1 4.請求項" 12に記載のプローブにおいて、 1 4. The probe according to claim "12,
上記の後方部材は支持筒の軸方向に沿って移動自在であり、外部のァクチユエ 一夕に接続されるために使用され、ァクチユエータによって軸方向の前方に移動 することによってグランド電極の接触端縁を所定の接触圧で対象となる導体層 に接触させる。 The above-mentioned rear member is movable along the axial direction of the support cylinder, and is used to be connected to an external actuator. The rear member is moved forward in the axial direction by an actuator, thereby forming the contact edge of the ground electrode. The target conductor layer is brought into contact with a predetermined contact pressure.
PCT/JP2001/002570 2000-03-28 2001-03-28 High frequency circuit impedance measuring probe for inner-layer-containing laminated sheet used for multi-layer printed board WO2001073451A1 (en)

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JP2000-89912 2000-03-28
JP2000089912A JP2001281281A (en) 2000-03-28 2000-03-28 Probe for impedance measurement
JP2000-124530 2000-04-25
JP2000124530A JP2001305159A (en) 2000-04-25 2000-04-25 Countermeasure type probe against static electricity
JP2000157452A JP2001337118A (en) 2000-05-26 2000-05-26 Probe for measuring impedance
JP2000-157452 2000-05-26

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