JPS5769263A - Method for checking internal layer pattern - Google Patents

Method for checking internal layer pattern

Info

Publication number
JPS5769263A
JPS5769263A JP55146024A JP14602480A JPS5769263A JP S5769263 A JPS5769263 A JP S5769263A JP 55146024 A JP55146024 A JP 55146024A JP 14602480 A JP14602480 A JP 14602480A JP S5769263 A JPS5769263 A JP S5769263A
Authority
JP
Japan
Prior art keywords
clearance hole
pattern
slit
copper
lamp
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP55146024A
Other languages
Japanese (ja)
Inventor
Yoshifumi Kitagawa
Osamu Konoe
Keiji Haga
Keiji Miyamoto
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Electric Works Co Ltd
Original Assignee
Matsushita Electric Works Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Works Ltd filed Critical Matsushita Electric Works Ltd
Priority to JP55146024A priority Critical patent/JPS5769263A/en
Publication of JPS5769263A publication Critical patent/JPS5769263A/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
    • G01R31/52—Testing for short-circuits, leakage current or ground faults

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)

Abstract

PURPOSE:The identify abnormality by lighting of a lamp, by compressing and contacting a spring type probe to a pattern part, a clearance hole part, and a slit part of an internal material and flowing a current. CONSTITUTION:The spring type probe checking device 4 is compressed and contacted to the pattern part 1, the clearance hole part, and the slit part 3 of the internal material 2, such as a laminated plate whose one side is covered by copper or a laminated plate whose both sides are covered by copper. The pattern 1 for an electric circuit is formed on the internal material 1. Then a current is flowed. If the spring type probe checking device which is contacted with the clearance hole part and the slit part 3 finds no abnormality in the clearance hole part and the slit part 3, the lamp 5 is not lit. If remaining copper such as flash and whisker are present in the clearance hole part and the slit part 3, the remaining copper and the pattern part 1 are short-circuited, and the lamp 5 is lit. Thus the abnormal part is identified.
JP55146024A 1980-10-17 1980-10-17 Method for checking internal layer pattern Pending JPS5769263A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP55146024A JPS5769263A (en) 1980-10-17 1980-10-17 Method for checking internal layer pattern

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP55146024A JPS5769263A (en) 1980-10-17 1980-10-17 Method for checking internal layer pattern

Publications (1)

Publication Number Publication Date
JPS5769263A true JPS5769263A (en) 1982-04-27

Family

ID=15398371

Family Applications (1)

Application Number Title Priority Date Filing Date
JP55146024A Pending JPS5769263A (en) 1980-10-17 1980-10-17 Method for checking internal layer pattern

Country Status (1)

Country Link
JP (1) JPS5769263A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2001073451A1 (en) * 2000-03-28 2001-10-04 Matsushita Electric Works, Ltd. High frequency circuit impedance measuring probe for inner-layer-containing laminated sheet used for multi-layer printed board
EP1273924A2 (en) * 2001-07-07 2003-01-08 Robert Bosch Gmbh Device for the detection of electrically conducting contamination of the contact side of an electric connector

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2001073451A1 (en) * 2000-03-28 2001-10-04 Matsushita Electric Works, Ltd. High frequency circuit impedance measuring probe for inner-layer-containing laminated sheet used for multi-layer printed board
EP1273924A2 (en) * 2001-07-07 2003-01-08 Robert Bosch Gmbh Device for the detection of electrically conducting contamination of the contact side of an electric connector
EP1273924A3 (en) * 2001-07-07 2004-01-02 Robert Bosch Gmbh Device for the detection of electrically conducting contamination of the contact side of an electric connector

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