JPS61187464U - - Google Patents
Info
- Publication number
- JPS61187464U JPS61187464U JP7179585U JP7179585U JPS61187464U JP S61187464 U JPS61187464 U JP S61187464U JP 7179585 U JP7179585 U JP 7179585U JP 7179585 U JP7179585 U JP 7179585U JP S61187464 U JPS61187464 U JP S61187464U
- Authority
- JP
- Japan
- Prior art keywords
- pedestal
- spring
- center hole
- cylindrical hole
- hole
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000000523 sample Substances 0.000 claims description 5
- NJPPVKZQTLUDBO-UHFFFAOYSA-N novaluron Chemical compound C1=C(Cl)C(OC(F)(F)C(OC(F)(F)F)F)=CC=C1NC(=O)NC(=O)C1=C(F)C=CC=C1F NJPPVKZQTLUDBO-UHFFFAOYSA-N 0.000 claims 2
- 239000012777 electrically insulating material Substances 0.000 claims 1
Landscapes
- Measuring Leads Or Probes (AREA)
- Measuring Instrument Details And Bridges, And Automatic Balancing Devices (AREA)
- Measurement Of Resistance Or Impedance (AREA)
Description
第１図イは本考案の一実施例を示す側面図、ロ
はその要部の縦断面図、第２図はその下端面図、
第３図はスプリング内装型プローブの断面図、第
４図はスプリング外装型プローブの断面図、第５
，６図は夫々リング電極の２例を示す斜視図であ
る。
１……架台、４……スプリングコンタクトプロ
ーブ、５……リング電極、６……接触子、７……
スプリング。
Fig. 1A is a side view showing one embodiment of the present invention, B is a vertical cross-sectional view of its main parts, Fig. 2 is a bottom end view thereof,
Figure 3 is a sectional view of a spring-internal probe, Figure 4 is a sectional view of a spring-equipped probe, and Figure 5 is a sectional view of a spring-equipped probe.
, 6 are perspective views showing two examples of ring electrodes. 1... Frame, 4... Spring contact probe, 5... Ring electrode, 6... Contact, 7...
spring.
Claims (1)
内には中心孔及び下端が開放した筒型の孔を設け
、上記中心孔内にはスプリングコンタクトプロー
ブを軸方向に固定し、このスプリングコンタクト
プローブの下端の接触子はスプリングの弾力によ
り架台の下端面より僅か突出するよう弾撥せしめ
、上記筒型の孔内にはリング電極を弾力により下
方に突出するように嵌合してなる簡易表面抵抗測
定器。 A pedestal is constructed of an electrically insulating material, a center hole and a cylindrical hole with an open bottom end are provided in the pedestal, and a spring contact probe is fixed in the axial direction in the center hole. The contact at the lower end is elastically repelled by the spring so as to protrude slightly from the lower end surface of the mount, and a ring electrode is fitted into the cylindrical hole so as to protrude downward due to the elasticity, thereby creating a simple surface resistor. Measuring instrument.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP7179585U JPS61187464U (en) | 1985-05-14 | 1985-05-14 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP7179585U JPS61187464U (en) | 1985-05-14 | 1985-05-14 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS61187464U true JPS61187464U (en) | 1986-11-21 |
Family
ID=30609606
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP7179585U Pending JPS61187464U (en) | 1985-05-14 | 1985-05-14 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS61187464U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2001073451A1 (en) * | 2000-03-28 | 2001-10-04 | Matsushita Electric Works, Ltd. | High frequency circuit impedance measuring probe for inner-layer-containing laminated sheet used for multi-layer printed board |
-
1985
- 1985-05-14 JP JP7179585U patent/JPS61187464U/ja active Pending
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2001073451A1 (en) * | 2000-03-28 | 2001-10-04 | Matsushita Electric Works, Ltd. | High frequency circuit impedance measuring probe for inner-layer-containing laminated sheet used for multi-layer printed board |