JPS61187465U - - Google Patents
Info
- Publication number
- JPS61187465U JPS61187465U JP7179685U JP7179685U JPS61187465U JP S61187465 U JPS61187465 U JP S61187465U JP 7179685 U JP7179685 U JP 7179685U JP 7179685 U JP7179685 U JP 7179685U JP S61187465 U JPS61187465 U JP S61187465U
- Authority
- JP
- Japan
- Prior art keywords
- spring
- frame
- center hole
- cylindrical holes
- contact probe
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000000523 sample Substances 0.000 claims description 5
- 239000012777 electrically insulating material Substances 0.000 claims 1
Landscapes
- Measuring Instrument Details And Bridges, And Automatic Balancing Devices (AREA)
- Measurement Of Resistance Or Impedance (AREA)
- Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
- Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
- Measuring Leads Or Probes (AREA)
Description
第１図は本考案の一実施例を示す縦断面図、第
２図はその下端面図、第３図はスプリング内装型
プローブの断面図、第４図はスプリング外装型プ
ローブの断面図である。
１……架台、２……中心孔、２ａ……スプリン
グコンタクトプローブ、３，４，５……筒型の孔
、６，７，８……リング電極、９……接触子、１
０，１１，１２，１３……スプリング。
Fig. 1 is a longitudinal sectional view showing an embodiment of the present invention, Fig. 2 is a bottom end view thereof, Fig. 3 is a sectional view of a spring-internal probe, and Fig. 4 is a sectional view of a spring-equipped probe. . 1... Frame, 2... Center hole, 2a... Spring contact probe, 3, 4, 5... Cylindrical hole, 6, 7, 8... Ring electrode, 9... Contact, 1
0, 11, 12, 13... spring.
Claims (1)
内には中心孔及び複数個の下端が開放した筒型の
孔を設け、上記中心孔内にはスプリングコンタク
トプローブを軸方向に固定し、このスプリングコ
ンタクトプローブの下端の接触子はスプリングの
弾力により架台の下端面より僅か突出するよう弾
撥せしめ、上記複数個の筒型の孔内には夫々リン
グ電極を弾力により下方に突出するように嵌合し
てなる簡易表面抵抗測定器。 A frame is constructed of an electrically insulating material, and the frame is provided with a center hole and a plurality of cylindrical holes with open bottom ends, and a spring contact probe is fixed in the axial direction in the center hole. The contact at the lower end of the spring contact probe is elastically elasticized by the spring so as to protrude slightly from the lower end surface of the mount, and a ring electrode is fitted into each of the plurality of cylindrical holes so as to protrude downward due to the elasticity. A simple surface resistance measuring device.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1985071796U JPH0648405Y2 (en) | 1985-05-14 | 1985-05-14 | Surface resistance measuring probe |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1985071796U JPH0648405Y2 (en) | 1985-05-14 | 1985-05-14 | Surface resistance measuring probe |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS61187465U true JPS61187465U (en) | 1986-11-21 |
| JPH0648405Y2 JPH0648405Y2 (en) | 1994-12-12 |
Family
ID=30609608
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1985071796U Expired - Lifetime JPH0648405Y2 (en) | 1985-05-14 | 1985-05-14 | Surface resistance measuring probe |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0648405Y2 (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102410822A (en) * | 2010-09-21 | 2012-04-11 | 捷毅系统股份有限公司 | Device and method for measuring thickness |
| CN109596677A (en) * | 2018-11-02 | 2019-04-09 | 大族激光科技产业集团股份有限公司 | A kind of quality detection device, method, system and integrated probe component |
| KR20200051627A (en) * | 2018-11-02 | 2020-05-13 | 한스 레이저 테크놀러지 인더스트리 그룹 컴퍼니 리미티드 | Quality inspection devices, methods, systems and integral probe assemblies |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5287943U (en) * | 1975-12-25 | 1977-06-30 | ||
| JPS6169165U (en) * | 1984-10-11 | 1986-05-12 |
-
1985
- 1985-05-14 JP JP1985071796U patent/JPH0648405Y2/en not_active Expired - Lifetime
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5287943U (en) * | 1975-12-25 | 1977-06-30 | ||
| JPS6169165U (en) * | 1984-10-11 | 1986-05-12 |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102410822A (en) * | 2010-09-21 | 2012-04-11 | 捷毅系统股份有限公司 | Device and method for measuring thickness |
| CN109596677A (en) * | 2018-11-02 | 2019-04-09 | 大族激光科技产业集团股份有限公司 | A kind of quality detection device, method, system and integrated probe component |
| KR20200051627A (en) * | 2018-11-02 | 2020-05-13 | 한스 레이저 테크놀러지 인더스트리 그룹 컴퍼니 리미티드 | Quality inspection devices, methods, systems and integral probe assemblies |
| JP2021503591A (en) * | 2018-11-02 | 2021-02-12 | ハンズ レーザー テクノロジー インダストリー グループ カンパニー リミテッド | Quality inspection equipment, methods, systems and integrated probe assemblies |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0648405Y2 (en) | 1994-12-12 |