AU4319672A - Low voltage field emission scanning electron microscope - Google Patents

Low voltage field emission scanning electron microscope

Info

Publication number
AU4319672A
AU4319672A AU43196/72A AU4319672A AU4319672A AU 4319672 A AU4319672 A AU 4319672A AU 43196/72 A AU43196/72 A AU 43196/72A AU 4319672 A AU4319672 A AU 4319672A AU 4319672 A AU4319672 A AU 4319672A
Authority
AU
Australia
Prior art keywords
low voltage
electron microscope
scanning electron
field emission
emission scanning
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
AU43196/72A
Other versions
AU466190B2 (en
Inventor
JOHN COATES and LEONARD MELVIN WELTER VINCENT
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nanometrics Inc
Original Assignee
American Optical Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by American Optical Corp filed Critical American Optical Corp
Application granted granted Critical
Publication of AU466190B2 publication Critical patent/AU466190B2/en
Publication of AU4319672A publication Critical patent/AU4319672A/en
Expired legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02Details
    • H01J37/04Arrangements of electrodes and associated parts for generating or controlling the discharge, e.g. electron-optical arrangement, ion-optical arrangement
    • H01J37/09Diaphragms; Shields associated with electron or ion-optical arrangements; Compensation of disturbing fields
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02Details
    • H01J37/04Arrangements of electrodes and associated parts for generating or controlling the discharge, e.g. electron-optical arrangement, ion-optical arrangement
    • H01J37/06Electron sources; Electron guns
    • H01J37/073Electron guns using field emission, photo emission, or secondary emission electron sources
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02Details
    • H01J37/18Vacuum locks ; Means for obtaining or maintaining the desired pressure within the vessel
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02Details
    • H01J37/248Components associated with high voltage supply
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/26Electron or ion microscopes; Electron or ion diffraction tubes
    • H01J37/29Reflection microscopes
    • H01J37/292Reflection microscopes using scanning ray

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Electron Sources, Ion Sources (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
AU43196/72A 1970-06-15 1972-06-07 Low voltage field emission scanning electron microscope Expired AU466190B2 (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US4642570A 1970-06-15 1970-06-15
US17181571A 1971-08-16 1971-08-16
USUS171815 1971-08-16

Publications (2)

Publication Number Publication Date
AU466190B2 AU466190B2 (en) 1973-12-13
AU4319672A true AU4319672A (en) 1973-12-13

Family

ID=26723901

Family Applications (1)

Application Number Title Priority Date Filing Date
AU43196/72A Expired AU466190B2 (en) 1970-06-15 1972-06-07 Low voltage field emission scanning electron microscope

Country Status (7)

Country Link
US (2) US3678333A (en)
AU (1) AU466190B2 (en)
CA (1) CA950592A (en)
DE (2) DE2129636C2 (en)
FR (2) FR2099295A5 (en)
GB (2) GB1355365A (en)
NL (2) NL161297C (en)

Families Citing this family (38)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5217392B1 (en) * 1970-09-18 1977-05-14
JPS5015109B1 (en) * 1970-12-24 1975-06-02
US3921078A (en) * 1971-04-20 1975-11-18 Jeol Ltd Breakdown protection for field emission electron gun
JPS5318862B1 (en) * 1971-07-19 1978-06-17
DE2151167C3 (en) * 1971-10-14 1974-05-09 Siemens Ag, 1000 Berlin Und 8000 Muenchen Electron beam micro analyzer with Auger electron detection
CA976594A (en) * 1972-02-14 1975-10-21 Vincent J. Coates Field emission electron gun
JPS5420828B2 (en) * 1972-06-09 1979-07-25
DE2234381C3 (en) * 1972-07-10 1975-10-16 Siemens Ag, 1000 Berlin Und 8000 Muenchen Electron beam lighting system
US3809899A (en) * 1972-08-17 1974-05-07 Tektronix Inc Electron-beam tube including a thermionic-field emission cathode for a scanning electron microscope
NL7213355A (en) * 1972-10-03 1974-04-05
JPS49112565A (en) * 1973-02-23 1974-10-26
US3842272A (en) * 1973-07-24 1974-10-15 American Optical Corp Scanning charged particle microprobe with external spurious electric field effect correction
US4041316A (en) * 1974-09-20 1977-08-09 Hitachi, Ltd. Field emission electron gun with an evaporation source
US3946268A (en) * 1974-10-21 1976-03-23 American Optical Corporation Field emission gun improvement
DE2548831C2 (en) * 1974-12-20 1985-11-14 Nanometrics Inc., Sunnyvale, Calif. Pulse generator for raster display devices
DE2819165A1 (en) * 1978-05-02 1979-11-15 Siemens Ag SCANNING ELECTRON MICROSCOPE
FR2527383A1 (en) * 1982-05-24 1983-11-25 Univ Reims Champagne Ardenne ELECTRON GUN WITH FIELD EMISSION CATHODE AND MAGNETIC LENS
US4663525A (en) * 1985-07-08 1987-05-05 Nanometrics Incorporated Method for electron gun alignment in electron microscopes
WO1988002180A1 (en) * 1986-09-18 1988-03-24 Crewe Albert V Differential pressure electron beam system, method and gun
JPH0640475B2 (en) * 1988-01-25 1994-05-25 日本電子株式会社 Field emission electron gun
US4833362A (en) * 1988-04-19 1989-05-23 Orchid One Encapsulated high brightness electron beam source and system
US5150001A (en) * 1990-04-10 1992-09-22 Orchid One Corporation Field emission electron gun and method having complementary passive and active vacuum pumping
EP0689224B1 (en) * 1990-08-10 1999-12-22 Koninklijke Philips Electronics N.V. Charged particle beam device
US5401973A (en) * 1992-12-04 1995-03-28 Atomic Energy Of Canada Limited Industrial material processing electron linear accelerator
US5698942A (en) * 1996-07-22 1997-12-16 University Of North Carolina Field emitter flat panel display device and method for operating same
JP3147227B2 (en) * 1998-09-01 2001-03-19 日本電気株式会社 Cold cathode electron gun
EP1122761B1 (en) * 2000-02-01 2004-05-26 ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH Optical column for charged particle beam device
JP4262158B2 (en) * 2004-07-13 2009-05-13 株式会社日立ハイテクサイエンスシステムズ Low vacuum scanning electron microscope
JP2006216396A (en) * 2005-02-04 2006-08-17 Hitachi High-Technologies Corp Charged particle beam device
EP1983548A1 (en) * 2007-04-20 2008-10-22 ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH Emitter chamber, charged particle apparatus and method for operating same
US9189728B2 (en) 2009-07-23 2015-11-17 I-Property Holding Corp. Method for the authentication of dosage forms
DE112011100476T5 (en) * 2010-02-08 2012-12-27 Hitachi High-Technologies Corporation Charged Particle Microscope and Ion Microscope
US8796638B2 (en) 2011-06-08 2014-08-05 Mks Instruments, Inc. Mass spectrometry for a gas analysis with a two-stage charged particle deflector lens between a charged particle source and a charged particle analyzer both offset from a central axis of the deflector lens
US8796620B2 (en) * 2011-06-08 2014-08-05 Mks Instruments, Inc. Mass spectrometry for gas analysis with a one-stage charged particle deflector lens between a charged particle source and a charged particle analyzer both offset from a central axis of the deflector lens
US8450681B2 (en) 2011-06-08 2013-05-28 Mks Instruments, Inc. Mass spectrometry for gas analysis in which both a charged particle source and a charged particle analyzer are offset from an axis of a deflector lens, resulting in reduced baseline signal offsets
US9224572B2 (en) * 2012-12-18 2015-12-29 General Electric Company X-ray tube with adjustable electron beam
US10297416B2 (en) 2014-10-20 2019-05-21 Hitachi High-Technologies Corporation Scanning electron microscope
US9981293B2 (en) * 2016-04-21 2018-05-29 Mapper Lithography Ip B.V. Method and system for the removal and/or avoidance of contamination in charged particle beam systems

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE735313C (en) * 1937-06-30 1943-05-12 Aeg Device for generating a preferably intensity-controlled electron beam by field emission from a cold cathode provided with a tip using an electron-optical imaging system
US2243362A (en) * 1938-08-20 1941-05-27 Thomas W Sukumlyn Electron microscope system
US2363359A (en) * 1941-05-01 1944-11-21 Gen Electric Electron microscope
US2289071A (en) * 1941-10-03 1942-07-07 Gen Electric Electron lens
FR937296A (en) * 1947-06-21 1948-08-12 Csf Improvements to focusing devices, for electron microscopes
BE481554A (en) * 1947-06-26
US3090882A (en) * 1960-04-13 1963-05-21 Rca Corp Electron gun
US3191028A (en) * 1963-04-22 1965-06-22 Albert V Crewe Scanning electron microscope
US3394874A (en) * 1967-02-09 1968-07-30 Gen Electrodynamics Corp Ion pumping electron gun

Also Published As

Publication number Publication date
NL7108096A (en) 1971-12-17
FR2099295A5 (en) 1972-03-10
FR2149412A1 (en) 1973-03-30
NL7209179A (en) 1973-02-20
DE2129636A1 (en) 1971-12-23
NL161297B (en) 1979-08-15
DE2129636C2 (en) 1986-04-10
CA950592A (en) 1974-07-02
DE2235903C2 (en) 1986-04-17
US3678333A (en) 1972-07-18
NL165604C (en) 1981-04-15
AU466190B2 (en) 1973-12-13
NL165604B (en) 1980-11-17
GB1378554A (en) 1974-12-27
US3784815A (en) 1974-01-08
FR2149412B1 (en) 1978-02-03
DE2235903A1 (en) 1973-03-01
GB1355365A (en) 1974-06-05
NL161297C (en) 1980-01-15

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