AU2003249279A1 - Composition and process for wet stripping removal of sacrificial anti-reflective material - Google Patents

Composition and process for wet stripping removal of sacrificial anti-reflective material

Info

Publication number
AU2003249279A1
AU2003249279A1 AU2003249279A AU2003249279A AU2003249279A1 AU 2003249279 A1 AU2003249279 A1 AU 2003249279A1 AU 2003249279 A AU2003249279 A AU 2003249279A AU 2003249279 A AU2003249279 A AU 2003249279A AU 2003249279 A1 AU2003249279 A1 AU 2003249279A1
Authority
AU
Australia
Prior art keywords
composition
reflective material
wet stripping
sacrificial anti
stripping removal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
AU2003249279A
Other languages
English (en)
Inventor
Thomas H. Baum
David Bernhard
David Minsek
Melissa MURPHY
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Advanced Technology Materials Inc
Original Assignee
Advanced Technology Materials Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advanced Technology Materials Inc filed Critical Advanced Technology Materials Inc
Publication of AU2003249279A1 publication Critical patent/AU2003249279A1/en
Abandoned legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
    • H01L21/31—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to form insulating layers thereon, e.g. for masking or by using photolithographic techniques; After treatment of these layers; Selection of materials for these layers
    • H01L21/3105—After-treatment
    • H01L21/311—Etching the insulating layers by chemical or physical means
    • H01L21/31127—Etching organic layers
    • H01L21/31133—Etching organic layers by chemical means
    • C—CHEMISTRY; METALLURGY
    • C03—GLASS; MINERAL OR SLAG WOOL
    • C03C—CHEMICAL COMPOSITION OF GLASSES, GLAZES OR VITREOUS ENAMELS; SURFACE TREATMENT OF GLASS; SURFACE TREATMENT OF FIBRES OR FILAMENTS MADE FROM GLASS, MINERALS OR SLAGS; JOINING GLASS TO GLASS OR OTHER MATERIALS
    • C03C15/00—Surface treatment of glass, not in the form of fibres or filaments, by etching
    • C—CHEMISTRY; METALLURGY
    • C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09K—MATERIALS FOR MISCELLANEOUS APPLICATIONS, NOT PROVIDED FOR ELSEWHERE
    • C09K13/00—Etching, surface-brightening or pickling compositions
    • C09K13/04—Etching, surface-brightening or pickling compositions containing an inorganic acid
    • C09K13/08—Etching, surface-brightening or pickling compositions containing an inorganic acid containing a fluorine compound
    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/26—Processing photosensitive materials; Apparatus therefor
    • G03F7/42—Stripping or agents therefor
    • G03F7/422—Stripping or agents therefor using liquids only
    • G03F7/423—Stripping or agents therefor using liquids only containing mineral acids or salts thereof, containing mineral oxidizing substances, e.g. peroxy compounds
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/02041—Cleaning
    • H01L21/02057—Cleaning during device manufacture
    • H01L21/0206—Cleaning during device manufacture during, before or after processing of insulating layers
    • H01L21/02063—Cleaning during device manufacture during, before or after processing of insulating layers the processing being the formation of vias or contact holes

Landscapes

  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • General Chemical & Material Sciences (AREA)
  • Power Engineering (AREA)
  • Materials Engineering (AREA)
  • Organic Chemistry (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Geochemistry & Mineralogy (AREA)
  • Inorganic Chemistry (AREA)
  • Cleaning Or Drying Semiconductors (AREA)
  • Weting (AREA)
AU2003249279A 2002-07-23 2003-07-16 Composition and process for wet stripping removal of sacrificial anti-reflective material Abandoned AU2003249279A1 (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US10/201,340 US6849200B2 (en) 2002-07-23 2002-07-23 Composition and process for wet stripping removal of sacrificial anti-reflective material
US10/201,340 2002-07-23
PCT/US2003/022148 WO2004009730A1 (en) 2002-07-23 2003-07-16 Composition and process for wet stripping removal of sacrificial anti-reflective material

Publications (1)

Publication Number Publication Date
AU2003249279A1 true AU2003249279A1 (en) 2004-02-09

Family

ID=30769632

Family Applications (1)

Application Number Title Priority Date Filing Date
AU2003249279A Abandoned AU2003249279A1 (en) 2002-07-23 2003-07-16 Composition and process for wet stripping removal of sacrificial anti-reflective material

Country Status (7)

Country Link
US (1) US6849200B2 (enExample)
EP (1) EP1551936A4 (enExample)
JP (1) JP2005533896A (enExample)
CN (1) CN1671821A (enExample)
AU (1) AU2003249279A1 (enExample)
TW (1) TW200408003A (enExample)
WO (1) WO2004009730A1 (enExample)

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US7888302B2 (en) * 2005-02-03 2011-02-15 Air Products And Chemicals, Inc. Aqueous based residue removers comprising fluoride
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TWI339780B (en) * 2005-07-28 2011-04-01 Rohm & Haas Elect Mat Stripper
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US20070099806A1 (en) * 2005-10-28 2007-05-03 Stewart Michael P Composition and method for selectively removing native oxide from silicon-containing surfaces
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US7879783B2 (en) * 2007-01-11 2011-02-01 Air Products And Chemicals, Inc. Cleaning composition for semiconductor substrates
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US8101561B2 (en) 2009-11-17 2012-01-24 Wai Mun Lee Composition and method for treating semiconductor substrate surface
TWI548738B (zh) 2010-07-16 2016-09-11 安堤格里斯公司 用於移除蝕刻後殘餘物之水性清潔劑
JP6101421B2 (ja) 2010-08-16 2017-03-22 インテグリス・インコーポレーテッド 銅または銅合金用エッチング液
US9416338B2 (en) 2010-10-13 2016-08-16 Advanced Technology Materials, Inc. Composition for and method of suppressing titanium nitride corrosion
JP5933950B2 (ja) 2011-09-30 2016-06-15 アドバンスド テクノロジー マテリアルズ，インコーポレイテッド 銅または銅合金用エッチング液
CN104145324B (zh) 2011-12-28 2017-12-22 恩特格里斯公司 用于选择性蚀刻氮化钛的组合物和方法
KR102105381B1 (ko) 2012-02-15 2020-04-29 엔테그리스, 아이엔씨. 조성물을 이용한 cmp-후 제거 방법 및 그의 이용 방법
KR20150016574A (ko) 2012-05-18 2015-02-12 인티그리스, 인코포레이티드 티타늄 나이트라이드를 포함한 표면에서 포토레지스트를 제거하는 조성물 및 방법
KR102118964B1 (ko) 2012-12-05 2020-06-08 엔테그리스, 아이엔씨. Iii-v 반도체 물질을 세척하기 위한 조성물 및 이를 사용하는 방법
CN105102584B (zh) 2013-03-04 2018-09-21 恩特格里斯公司 用于选择性蚀刻氮化钛的组合物和方法
KR102338550B1 (ko) 2013-06-06 2021-12-14 엔테그리스, 아이엔씨. 질화 티타늄의 선택적인 에칭을 위한 조성물 및 방법
KR102338526B1 (ko) 2013-07-31 2021-12-14 엔테그리스, 아이엔씨. Cu/W 호환성을 갖는, 금속 하드 마스크 및 에칭-후 잔여물을 제거하기 위한 수성 제형
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KR102290209B1 (ko) 2013-12-31 2021-08-20 엔테그리스, 아이엔씨. 규소 및 게르마늄을 선택적으로 에칭하기 위한 배합물
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CN105621893B (zh) * 2014-12-01 2018-05-01 焦作飞鸿安全玻璃有限公司 蚀刻印刷玻璃的生产方法
CN109399947B (zh) * 2018-10-11 2020-01-31 海南大学 减反射玻璃及其制备方法
JP7395795B1 (ja) * 2022-03-14 2023-12-11 日本化薬株式会社 処理液およびその使用方法

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Also Published As

Publication number Publication date
JP2005533896A (ja) 2005-11-10
EP1551936A4 (en) 2008-04-16
WO2004009730A1 (en) 2004-01-29
EP1551936A1 (en) 2005-07-13
US20040016904A1 (en) 2004-01-29
CN1671821A (zh) 2005-09-21
TW200408003A (en) 2004-05-16
US6849200B2 (en) 2005-02-01

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Legal Events

Date Code Title Description
MK6 Application lapsed section 142(2)(f)/reg. 8.3(3) - pct applic. not entering national phase