AU2003230145A1 - Cell with fixed output voltage for integrated circuit - Google Patents

Cell with fixed output voltage for integrated circuit

Info

Publication number
AU2003230145A1
AU2003230145A1 AU2003230145A AU2003230145A AU2003230145A1 AU 2003230145 A1 AU2003230145 A1 AU 2003230145A1 AU 2003230145 A AU2003230145 A AU 2003230145A AU 2003230145 A AU2003230145 A AU 2003230145A AU 2003230145 A1 AU2003230145 A1 AU 2003230145A1
Authority
AU
Australia
Prior art keywords
cell
output voltage
integrated circuit
fixed output
circuit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
AU2003230145A
Other languages
English (en)
Inventor
Patrick Da Silva
Laurent Souef
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Koninklijke Philips NV
Original Assignee
Koninklijke Philips Electronics NV
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Koninklijke Philips Electronics NV filed Critical Koninklijke Philips Electronics NV
Publication of AU2003230145A1 publication Critical patent/AU2003230145A1/en
Abandoned legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
    • G01R31/318541—Scan latches or cell details
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
    • G01R31/318536—Scan chain arrangements, e.g. connections, test bus, analog signals
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
    • G01R31/318572—Input/Output interfaces

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Measurement Of Current Or Voltage (AREA)
  • Electronic Switches (AREA)
  • Logic Circuits (AREA)
AU2003230145A 2002-05-22 2003-05-15 Cell with fixed output voltage for integrated circuit Abandoned AU2003230145A1 (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
FR0206227 2002-05-22
FR0206227A FR2840074A1 (fr) 2002-05-22 2002-05-22 Cellule de tension fixe pour circuit integre
PCT/IB2003/002077 WO2003098244A1 (fr) 2002-05-22 2003-05-15 Cellule dotee d'une tension de sortie fixee pour circuit integre

Publications (1)

Publication Number Publication Date
AU2003230145A1 true AU2003230145A1 (en) 2003-12-02

Family

ID=29414984

Family Applications (1)

Application Number Title Priority Date Filing Date
AU2003230145A Abandoned AU2003230145A1 (en) 2002-05-22 2003-05-15 Cell with fixed output voltage for integrated circuit

Country Status (10)

Country Link
US (2) US7459928B2 (fr)
EP (1) EP1509778B1 (fr)
JP (1) JP2005526429A (fr)
KR (1) KR20050007548A (fr)
CN (1) CN100414314C (fr)
AT (1) ATE368866T1 (fr)
AU (1) AU2003230145A1 (fr)
DE (1) DE60315289T2 (fr)
FR (1) FR2840074A1 (fr)
WO (1) WO2003098244A1 (fr)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102008060663A1 (de) * 2008-12-08 2010-06-10 KROHNE Meßtechnik GmbH & Co. KG Schaltungsanordnung zur Erzeugung kurzer elektrischer Impulse

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR910002236B1 (ko) * 1986-08-04 1991-04-08 미쓰비시 뎅기 가부시끼가이샤 반도체집적회로장치
EP0369047A1 (fr) * 1988-11-15 1990-05-23 Siemens Aktiengesellschaft Dispositif de commutation d'une horloge sur une horloge de même fréquence mais en retard de phase
JP3640671B2 (ja) * 1993-12-16 2005-04-20 コーニンクレッカ フィリップス エレクトロニクス エヌ ヴイ 固定論理値を出力する手段の出力と回路の入力との間の接続を検査する装置及び方法
US5574853A (en) 1994-01-03 1996-11-12 Texas Instruments Incorporated Testing integrated circuit designs on a computer simulation using modified serialized scan patterns
US5444404A (en) * 1994-03-03 1995-08-22 Vlsi Technology, Inc. Scan flip-flop with power saving feature
US6014762A (en) * 1997-06-23 2000-01-11 Sun Microsystems, Inc. Method and apparatus for scan test of SRAM for microprocessor without full scan capability
EP0992809A1 (fr) * 1998-09-28 2000-04-12 Siemens Aktiengesellschaft Circuit avec trajet d'analyse désactivable
JP4579370B2 (ja) * 2000-04-24 2010-11-10 ルネサスエレクトロニクス株式会社 スキャンフリップフロップ回路及びこれを用いたスキャンテスト方法
DE60112616T2 (de) * 2000-10-02 2006-06-22 Koninklijke Philips Electronics N.V. Scan-test-system und methode zum manipulieren der logikwerte, die während normalbetrieb konstant bleiben

Also Published As

Publication number Publication date
DE60315289T2 (de) 2008-05-08
ATE368866T1 (de) 2007-08-15
WO2003098244A1 (fr) 2003-11-27
EP1509778B1 (fr) 2007-08-01
CN1656385A (zh) 2005-08-17
US20050180196A1 (en) 2005-08-18
JP2005526429A (ja) 2005-09-02
DE60315289D1 (de) 2007-09-13
US7688103B2 (en) 2010-03-30
US20090051385A1 (en) 2009-02-26
CN100414314C (zh) 2008-08-27
FR2840074A1 (fr) 2003-11-28
EP1509778A1 (fr) 2005-03-02
US7459928B2 (en) 2008-12-02
KR20050007548A (ko) 2005-01-19

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Legal Events

Date Code Title Description
MK6 Application lapsed section 142(2)(f)/reg. 8.3(3) - pct applic. not entering national phase