AU2001242179A1 - System for simultaneous projections of multiple phase-shifted patterns for the three-dimensional inspection of an object - Google Patents

System for simultaneous projections of multiple phase-shifted patterns for the three-dimensional inspection of an object

Info

Publication number
AU2001242179A1
AU2001242179A1 AU2001242179A AU4217901A AU2001242179A1 AU 2001242179 A1 AU2001242179 A1 AU 2001242179A1 AU 2001242179 A AU2001242179 A AU 2001242179A AU 4217901 A AU4217901 A AU 4217901A AU 2001242179 A1 AU2001242179 A1 AU 2001242179A1
Authority
AU
Australia
Prior art keywords
shifted patterns
phase
simultaneous
patterns
multiple phase
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
AU2001242179A
Other languages
English (en)
Inventor
Michel Cantin
Alain Coulombe
Alexandre Nikitine
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Solvision Inc
Original Assignee
Solvision Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Solvision Inc filed Critical Solvision Inc
Publication of AU2001242179A1 publication Critical patent/AU2001242179A1/en
Abandoned legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G01B11/2509—Color coding
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G01B11/2518—Projection by scanning of the object
    • G01B11/2527—Projection by scanning of the object with phase change by in-plane movement of the patern
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
    • G06V10/00—Arrangements for image or video recognition or understanding
    • G06V10/10—Image acquisition
    • G06V10/12—Details of acquisition arrangements; Constructional details thereof
    • G06V10/14—Optical characteristics of the device performing the acquisition or on the illumination arrangements
    • G06V10/145—Illumination specially adapted for pattern recognition, e.g. using gratings
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
    • G06V2201/00—Indexing scheme relating to image or video recognition or understanding
    • G06V2201/06—Recognition of objects for industrial automation

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Artificial Intelligence (AREA)
  • Multimedia (AREA)
  • Theoretical Computer Science (AREA)
  • Length Measuring Devices By Optical Means (AREA)
AU2001242179A 2000-03-24 2001-03-20 System for simultaneous projections of multiple phase-shifted patterns for the three-dimensional inspection of an object Abandoned AU2001242179A1 (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
CA002301822A CA2301822A1 (fr) 2000-03-24 2000-03-24 Projection simultanee de plusieurs patrons avec acquisition simultanee pour l'inspection d'objets en trois dimensions
CA2301822 2000-03-24
PCT/CA2001/000376 WO2001071279A1 (en) 2000-03-24 2001-03-20 System for simultaneous projections of multiple phase-shifted patterns for the three-dimensional inspection of an object

Publications (1)

Publication Number Publication Date
AU2001242179A1 true AU2001242179A1 (en) 2001-10-03

Family

ID=4165604

Family Applications (1)

Application Number Title Priority Date Filing Date
AU2001242179A Abandoned AU2001242179A1 (en) 2000-03-24 2001-03-20 System for simultaneous projections of multiple phase-shifted patterns for the three-dimensional inspection of an object

Country Status (12)

Country Link
US (2) US7079666B2 (zh)
EP (1) EP1266187B1 (zh)
JP (1) JP2003528303A (zh)
KR (1) KR100815283B1 (zh)
CN (1) CN1185464C (zh)
AT (1) ATE347682T1 (zh)
AU (1) AU2001242179A1 (zh)
CA (1) CA2301822A1 (zh)
DE (1) DE60125025T2 (zh)
IL (1) IL151528A0 (zh)
TW (1) TW571072B (zh)
WO (1) WO2001071279A1 (zh)

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CN102980511B (zh) * 2012-08-23 2016-05-25 杭州先临三维科技股份有限公司 一种扫描动态物体的三维扫描系统及其扫描方法
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CN105043300A (zh) * 2015-05-27 2015-11-11 东莞市盟拓光电科技有限公司 可从多方位对被测物同时投影的三维测量系统
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CN105806253B (zh) * 2016-04-18 2018-10-09 国家电网公司 一种定日镜面形的检测方法
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TWI639829B (zh) * 2017-06-21 2018-11-01 致茂電子股份有限公司 太陽能電池的檢測方法與檢測系統
CN112930468B (zh) * 2018-11-08 2022-11-18 成都频泰鼎丰企业管理中心（有限合伙） 三维测量设备
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US11450083B2 (en) * 2019-09-27 2022-09-20 Honeywell International Inc. Dual-pattern optical 3D dimensioning
CN112113511B (zh) * 2020-08-17 2021-11-23 上海交通大学 一种半透明物体表面轮廓线提取方法、系统及终端
CN112666698B (zh) * 2021-01-27 2022-11-22 之江实验室 一种基于色散超表面的光纤束多方位三维共聚焦成像装置及方法
WO2022178678A1 (zh) * 2021-02-23 2022-09-01 华为技术有限公司 一种光学系统、装置及终端

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Also Published As

Publication number Publication date
US20070146727A1 (en) 2007-06-28
JP2003528303A (ja) 2003-09-24
IL151528A0 (en) 2003-04-10
US7079666B2 (en) 2006-07-18
EP1266187A1 (en) 2002-12-18
CN1419647A (zh) 2003-05-21
DE60125025T2 (de) 2007-07-05
TW571072B (en) 2004-01-11
WO2001071279A1 (en) 2001-09-27
US20020018118A1 (en) 2002-02-14
KR100815283B1 (ko) 2008-03-19
US7403650B2 (en) 2008-07-22
ATE347682T1 (de) 2006-12-15
CA2301822A1 (fr) 2001-09-24
DE60125025D1 (de) 2007-01-18
EP1266187B1 (en) 2006-12-06
KR20030009403A (ko) 2003-01-29
CN1185464C (zh) 2005-01-19

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