ATE70639T1 - Logische schaltung mit verbesserter testmoeglichkeit fuer defekte durchgangskontakte. - Google Patents

Logische schaltung mit verbesserter testmoeglichkeit fuer defekte durchgangskontakte.

Info

Publication number
ATE70639T1
ATE70639T1 AT86901643T AT86901643T ATE70639T1 AT E70639 T1 ATE70639 T1 AT E70639T1 AT 86901643 T AT86901643 T AT 86901643T AT 86901643 T AT86901643 T AT 86901643T AT E70639 T1 ATE70639 T1 AT E70639T1
Authority
AT
Austria
Prior art keywords
conductor
defective
logic circuit
improved test
couples
Prior art date
Application number
AT86901643T
Other languages
English (en)
Inventor
Laszlo Volgyesi Gal
Original Assignee
Unisys Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Unisys Corp filed Critical Unisys Corp
Application granted granted Critical
Publication of ATE70639T1 publication Critical patent/ATE70639T1/de

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
    • H01L22/30—Structural arrangements specially adapted for testing or measuring during manufacture or treatment, or specially adapted for reliability measurements
    • H01L22/34—Circuits for electrically characterising or monitoring manufacturing processes, e. g. whole test die, wafers filled with test structures, on-board-devices incorporated on each die, process control monitors or pad structures thereof, devices in scribe line
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31712—Input or output aspects
    • G01R31/31717—Interconnect testing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318505—Test of Modular systems, e.g. Wafers, MCM's
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318505—Test of Modular systems, e.g. Wafers, MCM's
    • G01R31/318513—Test of Multi-Chip-Moduls
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
    • H01L22/10—Measuring as part of the manufacturing process
    • H01L22/12—Measuring as part of the manufacturing process for structural parameters, e.g. thickness, line width, refractive index, temperature, warp, bond strength, defects, optical inspection, electrical measurement of structural dimensions, metallurgic measurement of diffusions

Landscapes

  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Power Engineering (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Automation & Control Theory (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Design And Manufacture Of Integrated Circuits (AREA)
  • Monitoring And Testing Of Exchanges (AREA)
AT86901643T 1985-02-25 1986-02-18 Logische schaltung mit verbesserter testmoeglichkeit fuer defekte durchgangskontakte. ATE70639T1 (de)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US70519285A 1985-02-25 1985-02-25
PCT/US1986/000330 WO1986004995A1 (en) 1985-02-25 1986-02-18 Logic circuit having improved testability for defective via contacts
EP86901643A EP0214229B1 (de) 1985-02-25 1986-02-18 Logische schaltung mit verbesserter testmöglichkeit für defekte durchgangskontakte

Publications (1)

Publication Number Publication Date
ATE70639T1 true ATE70639T1 (de) 1992-01-15

Family

ID=24832428

Family Applications (1)

Application Number Title Priority Date Filing Date
AT86901643T ATE70639T1 (de) 1985-02-25 1986-02-18 Logische schaltung mit verbesserter testmoeglichkeit fuer defekte durchgangskontakte.

Country Status (6)

Country Link
US (1) US4697139A (de)
EP (1) EP0214229B1 (de)
JP (1) JPH0727007B2 (de)
AT (1) ATE70639T1 (de)
DE (1) DE3682981D1 (de)
WO (1) WO1986004995A1 (de)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4779041A (en) * 1987-05-20 1988-10-18 Hewlett-Packard Company Integrated circuit transfer test device system
CH691237A5 (fr) * 1997-07-15 2001-05-31 Em Microelectronic Marin Sa Photocapteur intégré.

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3792349A (en) * 1972-10-25 1974-02-12 Honeywell Inf Systems Dual channel, dual potential open-circuit test apparatus
JPS5810070B2 (ja) * 1981-01-07 1983-02-24 日本たばこ産業株式会社 紙巻たばこ解放分離装置
US4499579A (en) * 1983-03-10 1985-02-12 Honeywell Information Systems Inc. Programmable logic array with dynamic test capability in the unprogrammed state

Also Published As

Publication number Publication date
DE3682981D1 (de) 1992-01-30
EP0214229A1 (de) 1987-03-18
US4697139A (en) 1987-09-29
WO1986004995A1 (en) 1986-08-28
JPH0727007B2 (ja) 1995-03-29
JPS62500262A (ja) 1987-01-29
EP0214229B1 (de) 1991-12-18

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Legal Events

Date Code Title Description
RER Ceased as to paragraph 5 lit. 3 law introducing patent treaties