ATE540408T1 - Offsetunterdrückung für probendatenschaltungen - Google Patents
Offsetunterdrückung für probendatenschaltungenInfo
- Publication number
- ATE540408T1 ATE540408T1 AT07758608T AT07758608T ATE540408T1 AT E540408 T1 ATE540408 T1 AT E540408T1 AT 07758608 T AT07758608 T AT 07758608T AT 07758608 T AT07758608 T AT 07758608T AT E540408 T1 ATE540408 T1 AT E540408T1
- Authority
- AT
- Austria
- Prior art keywords
- offset
- time period
- ground during
- voltage source
- offset voltage
- Prior art date
Links
- 230000001629 suppression Effects 0.000 title 1
- 239000003990 capacitor Substances 0.000 abstract 3
Classifications
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H19/00—Networks using time-varying elements, e.g. N-path filters
- H03H19/004—Switched capacitor networks
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03F—AMPLIFIERS
- H03F3/00—Amplifiers with only discharge tubes or only semiconductor devices as amplifying elements
- H03F3/45—Differential amplifiers
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C27/00—Electric analogue stores, e.g. for storing instantaneous values
- G11C27/02—Sample-and-hold arrangements
- G11C27/024—Sample-and-hold arrangements using a capacitive memory element
- G11C27/026—Sample-and-hold arrangements using a capacitive memory element associated with an amplifier
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03F—AMPLIFIERS
- H03F3/00—Amplifiers with only discharge tubes or only semiconductor devices as amplifying elements
- H03F3/181—Low-frequency amplifiers, e.g. audio preamplifiers
- H03F3/183—Low-frequency amplifiers, e.g. audio preamplifiers with semiconductor devices only
- H03F3/187—Low-frequency amplifiers, e.g. audio preamplifiers with semiconductor devices only in integrated circuits
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
- H03M1/00—Analogue/digital conversion; Digital/analogue conversion
- H03M1/06—Continuously compensating for, or preventing, undesired influence of physical parameters
- H03M1/0602—Continuously compensating for, or preventing, undesired influence of physical parameters of deviations from the desired transfer characteristic
- H03M1/0604—Continuously compensating for, or preventing, undesired influence of physical parameters of deviations from the desired transfer characteristic at one point, i.e. by adjusting a single reference value, e.g. bias or gain error
- H03M1/0607—Offset or drift compensation
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
- H03M3/00—Conversion of analogue values to or from differential modulation
- H03M3/30—Delta-sigma modulation
- H03M3/322—Continuously compensating for, or preventing, undesired influence of physical parameters
- H03M3/352—Continuously compensating for, or preventing, undesired influence of physical parameters of deviations from the desired transfer characteristic
- H03M3/354—Continuously compensating for, or preventing, undesired influence of physical parameters of deviations from the desired transfer characteristic at one point, i.e. by adjusting a single reference value, e.g. bias or gain error
- H03M3/356—Offset or drift compensation
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
- G11C7/06—Sense amplifiers; Associated circuits, e.g. timing or triggering circuits
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
- H03M1/00—Analogue/digital conversion; Digital/analogue conversion
- H03M1/12—Analogue/digital converters
- H03M1/34—Analogue value compared with reference values
- H03M1/38—Analogue value compared with reference values sequentially only, e.g. successive approximation type
- H03M1/40—Analogue value compared with reference values sequentially only, e.g. successive approximation type recirculation type
- H03M1/403—Analogue value compared with reference values sequentially only, e.g. successive approximation type recirculation type using switched capacitors
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
- H03M1/00—Analogue/digital conversion; Digital/analogue conversion
- H03M1/12—Analogue/digital converters
- H03M1/34—Analogue value compared with reference values
- H03M1/38—Analogue value compared with reference values sequentially only, e.g. successive approximation type
- H03M1/44—Sequential comparisons in series-connected stages with change in value of analogue signal
- H03M1/442—Sequential comparisons in series-connected stages with change in value of analogue signal using switched capacitors
Landscapes
- Engineering & Computer Science (AREA)
- Theoretical Computer Science (AREA)
- Power Engineering (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Multimedia (AREA)
- Amplifiers (AREA)
- Manipulation Of Pulses (AREA)
- Measurement Of Current Or Voltage (AREA)
- Analogue/Digital Conversion (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US74360106P | 2006-03-21 | 2006-03-21 | |
PCT/US2007/064071 WO2007109506A2 (en) | 2006-03-21 | 2007-03-15 | Offset cancellation for sampled-data circuits |
Publications (1)
Publication Number | Publication Date |
---|---|
ATE540408T1 true ATE540408T1 (de) | 2012-01-15 |
Family
ID=38523171
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
AT07758608T ATE540408T1 (de) | 2006-03-21 | 2007-03-15 | Offsetunterdrückung für probendatenschaltungen |
Country Status (7)
Country | Link |
---|---|
US (3) | US7843233B2 (de) |
EP (1) | EP1999758B1 (de) |
JP (1) | JP2009545188A (de) |
KR (1) | KR101252331B1 (de) |
CN (2) | CN101449336B (de) |
AT (1) | ATE540408T1 (de) |
WO (1) | WO2007109506A2 (de) |
Families Citing this family (20)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP1999758B1 (de) * | 2006-03-21 | 2012-01-04 | Cambridge Analog Technologies, Inc. | Offsetunterdrückung für probendatenschaltungen |
US8305131B2 (en) | 2006-03-21 | 2012-11-06 | Maxim Integrated, Inc. | Passive offset and overshoot cancellation for sampled-data circuits |
US7936291B2 (en) * | 2008-10-10 | 2011-05-03 | Robert Bosch Gmbh | System and method for removing nonlinearities and cancelling offset errors in comparator based/zero crossing based switched capacitor circuits |
JP2010283713A (ja) * | 2009-06-08 | 2010-12-16 | Sanyo Electric Co Ltd | オフセットキャンセル回路 |
US8040264B2 (en) * | 2010-03-04 | 2011-10-18 | Analog Devices, Inc. | Pipeline analog to digital converter and a residue amplifier for a pipeline analog to digital converter |
US8289074B2 (en) * | 2010-03-22 | 2012-10-16 | Qualcomm Incorporated | Discrete time operational transconductance amplifier for switched capacitor circuits |
CN101820257B (zh) * | 2010-04-30 | 2012-05-30 | 深圳市芯海科技有限公司 | 一种开关电容电路及模数转换器 |
KR101919056B1 (ko) * | 2011-04-28 | 2018-11-15 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 반도체 회로 |
US9252658B2 (en) * | 2011-10-14 | 2016-02-02 | Massachusetts Institute Of Technology | Level-crossing based circuit and method with offset voltage cancellation |
KR101508158B1 (ko) | 2013-07-08 | 2015-04-07 | 한국과학기술연구원 | 전기 자극 시스템에서의 전극 오프셋 전압의 제어 |
CN104579185B (zh) * | 2014-12-23 | 2017-10-27 | 灿芯半导体(上海)有限公司 | 高精度静噪控制电路 |
US10082916B2 (en) * | 2015-07-08 | 2018-09-25 | Samsung Electronics Co., Ltd. | Circuit for cancelling offset capacitance of capacitive touch screen panel and device including the same |
US9490795B1 (en) * | 2015-08-18 | 2016-11-08 | Cadence Design Systems, Inc. | System and method for selectively coupled parasitic compensation for input referred voltage offset in electronic circuit |
EP3493528B1 (de) | 2016-07-28 | 2021-05-26 | Sony Semiconductor Solutions Corporation | Bildaufnahmeelement |
CN108063608B (zh) * | 2018-01-31 | 2021-04-09 | 上海贝岭股份有限公司 | 无源采样网络的高速比较器 |
CN111147076B (zh) * | 2019-12-31 | 2021-10-29 | 清华大学 | 可抵消采样噪声的模数转换器 |
US11108404B1 (en) | 2020-07-22 | 2021-08-31 | Analog Devices, Inc. | Low noise integrated circuit techniques |
EP4024713A1 (de) | 2021-01-04 | 2022-07-06 | Stichting IMEC Nederland | System und verfahren zur analog-digital-signalumwandlung |
EP4211795A4 (de) | 2021-06-06 | 2024-04-10 | Trieye Ltd. | Elektronische integrationsschaltung mit schaltungen zur offset- und gesammelten ladungsreduzierung und zugehörige verfahren |
US11855651B2 (en) | 2022-04-09 | 2023-12-26 | Caelus Technologies Limited | Discrete-time offset correction circuit embedded in a residue amplifier in a pipelined analog-to-digital converter (ADC) |
Family Cites Families (25)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3649924A (en) * | 1970-03-02 | 1972-03-14 | Gordon Eng Co | Sampling amplifier |
FR2138234A1 (de) * | 1971-05-19 | 1972-09-22 | Commissariat Energie Atomique | |
US4439693A (en) * | 1981-10-30 | 1984-03-27 | Hughes Aircraft Co. | Sample and hold circuit with improved offset compensation |
US4553052A (en) * | 1982-04-23 | 1985-11-12 | Nec Corporation | High speed comparator circuit with input-offset compensation function |
DE3922068A1 (de) * | 1989-07-05 | 1991-01-17 | Thomson Brandt Gmbh | Abtast- und halteglied |
JP2523998B2 (ja) * | 1991-01-31 | 1996-08-14 | 株式会社東芝 | コンパレ―タ |
US5159341A (en) * | 1991-03-12 | 1992-10-27 | Analog Devices, Inc. | Two phase sampling for a delta sigma modulator |
US5617093A (en) * | 1994-09-30 | 1997-04-01 | Imp, Inc. | Switched capacitor analog circuits with low input capacitance |
JPH0983316A (ja) * | 1995-09-07 | 1997-03-28 | Sanyo Electric Co Ltd | コンパレータおよびアナログ−デジタル変換回路 |
US6104492A (en) * | 1999-02-22 | 2000-08-15 | Lucent Technologies Inc | Optical signal monitor for multiwave optical signals |
US6252454B1 (en) * | 1999-09-09 | 2001-06-26 | Cirrus Logic, Inc. | Calibrated quasi-autozeroed comparator systems and methods |
US6201489B1 (en) * | 2000-03-21 | 2001-03-13 | International Business Machines Corporation | Method and circuit for temporal cancellation of DC offset |
DE60008094T2 (de) * | 2000-07-24 | 2004-07-01 | Stmicroelectronics S.R.L., Agrate Brianza | Integrator mit Gleichrichtungsfunktion und mit einem der Speisespannung entsprechenden Ausgangsspannungsbereich |
JP4319413B2 (ja) * | 2001-04-11 | 2009-08-26 | エヌエックスピー ビー ヴィ | 演算増幅器の高デューティサイクルオフセット補償 |
US6611163B1 (en) * | 2002-03-20 | 2003-08-26 | Texas Instruments Incorporated | Switched capacitor scheme for offset compensated comparators |
US6570411B1 (en) * | 2002-06-17 | 2003-05-27 | Analog Devices, Inc. | Switched-capacitor structures with reduced distortion and noise and enhanced isolation |
US7348824B2 (en) * | 2005-03-07 | 2008-03-25 | Cadence Design Systems, Inc. | Auto-zero circuit |
US7319425B2 (en) | 2005-03-21 | 2008-01-15 | Massachusetts Institute Of Technology | Comparator-based switched capacitor circuit for scaled semiconductor fabrication processes |
US7221191B2 (en) * | 2005-05-23 | 2007-05-22 | Analog Devices, Inc. | Signal samplers with enhanced dynamic range |
JP2007074447A (ja) * | 2005-09-07 | 2007-03-22 | Fujitsu Ltd | Cmosセンサ |
US7541857B1 (en) * | 2005-12-29 | 2009-06-02 | Altera Corporation | Comparator offset cancellation assisted by PLD resources |
US8305131B2 (en) * | 2006-03-21 | 2012-11-06 | Maxim Integrated, Inc. | Passive offset and overshoot cancellation for sampled-data circuits |
EP1999758B1 (de) * | 2006-03-21 | 2012-01-04 | Cambridge Analog Technologies, Inc. | Offsetunterdrückung für probendatenschaltungen |
JP5191214B2 (ja) * | 2006-12-21 | 2013-05-08 | セイコーインスツル株式会社 | コンパレータ回路 |
US7564273B2 (en) * | 2007-02-06 | 2009-07-21 | Massachusetts Institute Of Technology | Low-voltage comparator-based switched-capacitor networks |
-
2007
- 2007-03-15 EP EP07758608A patent/EP1999758B1/de active Active
- 2007-03-15 WO PCT/US2007/064071 patent/WO2007109506A2/en active Application Filing
- 2007-03-15 AT AT07758608T patent/ATE540408T1/de active
- 2007-03-15 JP JP2009501658A patent/JP2009545188A/ja active Pending
- 2007-03-15 CN CN2007800186456A patent/CN101449336B/zh active Active
- 2007-03-15 KR KR1020087025567A patent/KR101252331B1/ko active IP Right Grant
- 2007-03-15 US US11/686,739 patent/US7843233B2/en active Active
- 2007-03-15 CN CN201210217068.6A patent/CN103065686B/zh not_active Expired - Fee Related
-
2010
- 2010-10-21 US US12/909,168 patent/US8373489B2/en active Active
-
2013
- 2013-01-11 US US13/739,406 patent/US8519769B2/en not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
EP1999758A4 (de) | 2009-04-15 |
JP2009545188A (ja) | 2009-12-17 |
CN101449336B (zh) | 2012-07-25 |
EP1999758A2 (de) | 2008-12-10 |
US20130127516A1 (en) | 2013-05-23 |
US20110032003A1 (en) | 2011-02-10 |
KR20080113076A (ko) | 2008-12-26 |
WO2007109506A3 (en) | 2008-10-02 |
CN103065686A (zh) | 2013-04-24 |
WO2007109506A2 (en) | 2007-09-27 |
EP1999758B1 (de) | 2012-01-04 |
US20070222483A1 (en) | 2007-09-27 |
CN101449336A (zh) | 2009-06-03 |
CN103065686B (zh) | 2016-09-14 |
US8519769B2 (en) | 2013-08-27 |
US7843233B2 (en) | 2010-11-30 |
KR101252331B1 (ko) | 2013-04-08 |
US8373489B2 (en) | 2013-02-12 |
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