ATE540408T1 - Offsetunterdrückung für probendatenschaltungen - Google Patents

Offsetunterdrückung für probendatenschaltungen

Info

Publication number
ATE540408T1
ATE540408T1 AT07758608T AT07758608T ATE540408T1 AT E540408 T1 ATE540408 T1 AT E540408T1 AT 07758608 T AT07758608 T AT 07758608T AT 07758608 T AT07758608 T AT 07758608T AT E540408 T1 ATE540408 T1 AT E540408T1
Authority
AT
Austria
Prior art keywords
offset
time period
ground during
voltage source
offset voltage
Prior art date
Application number
AT07758608T
Other languages
English (en)
Inventor
Hae-Seung Lee
Original Assignee
Cambridge Analog Technologies Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Cambridge Analog Technologies Inc filed Critical Cambridge Analog Technologies Inc
Application granted granted Critical
Publication of ATE540408T1 publication Critical patent/ATE540408T1/de

Links

Classifications

    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
    • H03H19/00—Networks using time-varying elements, e.g. N-path filters
    • H03H19/004—Switched capacitor networks
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03F—AMPLIFIERS
    • H03F3/00—Amplifiers with only discharge tubes or only semiconductor devices as amplifying elements
    • H03F3/45—Differential amplifiers
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C27/00—Electric analogue stores, e.g. for storing instantaneous values
    • G11C27/02—Sample-and-hold arrangements
    • G11C27/024—Sample-and-hold arrangements using a capacitive memory element
    • G11C27/026—Sample-and-hold arrangements using a capacitive memory element associated with an amplifier
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03F—AMPLIFIERS
    • H03F3/00—Amplifiers with only discharge tubes or only semiconductor devices as amplifying elements
    • H03F3/181—Low-frequency amplifiers, e.g. audio preamplifiers
    • H03F3/183—Low-frequency amplifiers, e.g. audio preamplifiers with semiconductor devices only
    • H03F3/187—Low-frequency amplifiers, e.g. audio preamplifiers with semiconductor devices only in integrated circuits
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/06—Continuously compensating for, or preventing, undesired influence of physical parameters
    • H03M1/0602—Continuously compensating for, or preventing, undesired influence of physical parameters of deviations from the desired transfer characteristic
    • H03M1/0604—Continuously compensating for, or preventing, undesired influence of physical parameters of deviations from the desired transfer characteristic at one point, i.e. by adjusting a single reference value, e.g. bias or gain error
    • H03M1/0607—Offset or drift compensation
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M3/00—Conversion of analogue values to or from differential modulation
    • H03M3/30—Delta-sigma modulation
    • H03M3/322—Continuously compensating for, or preventing, undesired influence of physical parameters
    • H03M3/352—Continuously compensating for, or preventing, undesired influence of physical parameters of deviations from the desired transfer characteristic
    • H03M3/354—Continuously compensating for, or preventing, undesired influence of physical parameters of deviations from the desired transfer characteristic at one point, i.e. by adjusting a single reference value, e.g. bias or gain error
    • H03M3/356—Offset or drift compensation
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
    • G11C7/06—Sense amplifiers; Associated circuits, e.g. timing or triggering circuits
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/12—Analogue/digital converters
    • H03M1/34—Analogue value compared with reference values
    • H03M1/38—Analogue value compared with reference values sequentially only, e.g. successive approximation type
    • H03M1/40—Analogue value compared with reference values sequentially only, e.g. successive approximation type recirculation type
    • H03M1/403—Analogue value compared with reference values sequentially only, e.g. successive approximation type recirculation type using switched capacitors
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/12—Analogue/digital converters
    • H03M1/34—Analogue value compared with reference values
    • H03M1/38—Analogue value compared with reference values sequentially only, e.g. successive approximation type
    • H03M1/44—Sequential comparisons in series-connected stages with change in value of analogue signal
    • H03M1/442—Sequential comparisons in series-connected stages with change in value of analogue signal using switched capacitors

Landscapes

  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Power Engineering (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Multimedia (AREA)
  • Amplifiers (AREA)
  • Manipulation Of Pulses (AREA)
  • Measurement Of Current Or Voltage (AREA)
  • Analogue/Digital Conversion (AREA)
AT07758608T 2006-03-21 2007-03-15 Offsetunterdrückung für probendatenschaltungen ATE540408T1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US74360106P 2006-03-21 2006-03-21
PCT/US2007/064071 WO2007109506A2 (en) 2006-03-21 2007-03-15 Offset cancellation for sampled-data circuits

Publications (1)

Publication Number Publication Date
ATE540408T1 true ATE540408T1 (de) 2012-01-15

Family

ID=38523171

Family Applications (1)

Application Number Title Priority Date Filing Date
AT07758608T ATE540408T1 (de) 2006-03-21 2007-03-15 Offsetunterdrückung für probendatenschaltungen

Country Status (7)

Country Link
US (3) US7843233B2 (de)
EP (1) EP1999758B1 (de)
JP (1) JP2009545188A (de)
KR (1) KR101252331B1 (de)
CN (2) CN101449336B (de)
AT (1) ATE540408T1 (de)
WO (1) WO2007109506A2 (de)

Families Citing this family (21)

* Cited by examiner, † Cited by third party
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US8305131B2 (en) 2006-03-21 2012-11-06 Maxim Integrated, Inc. Passive offset and overshoot cancellation for sampled-data circuits
CN101449336B (zh) * 2006-03-21 2012-07-25 剑桥模拟技术有限公司 采样数据电路的偏移消除
US7936291B2 (en) * 2008-10-10 2011-05-03 Robert Bosch Gmbh System and method for removing nonlinearities and cancelling offset errors in comparator based/zero crossing based switched capacitor circuits
JP2010283713A (ja) * 2009-06-08 2010-12-16 Sanyo Electric Co Ltd オフセットキャンセル回路
US8040264B2 (en) * 2010-03-04 2011-10-18 Analog Devices, Inc. Pipeline analog to digital converter and a residue amplifier for a pipeline analog to digital converter
US8289074B2 (en) * 2010-03-22 2012-10-16 Qualcomm Incorporated Discrete time operational transconductance amplifier for switched capacitor circuits
CN101820257B (zh) * 2010-04-30 2012-05-30 深圳市芯海科技有限公司 一种开关电容电路及模数转换器
KR101919056B1 (ko) * 2011-04-28 2018-11-15 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 회로
US9252658B2 (en) * 2011-10-14 2016-02-02 Massachusetts Institute Of Technology Level-crossing based circuit and method with offset voltage cancellation
KR101508158B1 (ko) 2013-07-08 2015-04-07 한국과학기술연구원 전기 자극 시스템에서의 전극 오프셋 전압의 제어
CN104579185B (zh) * 2014-12-23 2017-10-27 灿芯半导体(上海)有限公司 高精度静噪控制电路
US10082916B2 (en) * 2015-07-08 2018-09-25 Samsung Electronics Co., Ltd. Circuit for cancelling offset capacitance of capacitive touch screen panel and device including the same
US9490795B1 (en) * 2015-08-18 2016-11-08 Cadence Design Systems, Inc. System and method for selectively coupled parasitic compensation for input referred voltage offset in electronic circuit
WO2018021053A1 (ja) 2016-07-28 2018-02-01 ソニーセミコンダクタソリューションズ株式会社 撮像素子
CN108063608B (zh) * 2018-01-31 2021-04-09 上海贝岭股份有限公司 无源采样网络的高速比较器
CN111147076B (zh) * 2019-12-31 2021-10-29 清华大学 可抵消采样噪声的模数转换器
US11108404B1 (en) 2020-07-22 2021-08-31 Analog Devices, Inc. Low noise integrated circuit techniques
EP4024713B1 (de) 2021-01-04 2025-11-26 Stichting IMEC Nederland System und verfahren zur analog-digital-signalumwandlung
KR102510278B1 (ko) 2021-02-02 2023-03-15 중앙대학교 산학협력단 오프셋 출력전압의 제거를 위한 회로 및 이를 포함하는 전자 장치
CN116406494B (zh) * 2021-06-06 2023-10-24 趣眼有限公司 具有偏移和收集电荷减小电路系统的电子积分电路和相关方法
US11855651B2 (en) 2022-04-09 2023-12-26 Caelus Technologies Limited Discrete-time offset correction circuit embedded in a residue amplifier in a pipelined analog-to-digital converter (ADC)

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US3649924A (en) * 1970-03-02 1972-03-14 Gordon Eng Co Sampling amplifier
FR2138234A1 (de) * 1971-05-19 1972-09-22 Commissariat Energie Atomique
US4439693A (en) * 1981-10-30 1984-03-27 Hughes Aircraft Co. Sample and hold circuit with improved offset compensation
US4553052A (en) * 1982-04-23 1985-11-12 Nec Corporation High speed comparator circuit with input-offset compensation function
DE3922068A1 (de) * 1989-07-05 1991-01-17 Thomson Brandt Gmbh Abtast- und halteglied
JP2523998B2 (ja) * 1991-01-31 1996-08-14 株式会社東芝 コンパレ―タ
US5159341A (en) * 1991-03-12 1992-10-27 Analog Devices, Inc. Two phase sampling for a delta sigma modulator
US5617093A (en) * 1994-09-30 1997-04-01 Imp, Inc. Switched capacitor analog circuits with low input capacitance
JPH0983316A (ja) * 1995-09-07 1997-03-28 Sanyo Electric Co Ltd コンパレータおよびアナログ−デジタル変換回路
US6104492A (en) * 1999-02-22 2000-08-15 Lucent Technologies Inc Optical signal monitor for multiwave optical signals
US6252454B1 (en) * 1999-09-09 2001-06-26 Cirrus Logic, Inc. Calibrated quasi-autozeroed comparator systems and methods
US6201489B1 (en) * 2000-03-21 2001-03-13 International Business Machines Corporation Method and circuit for temporal cancellation of DC offset
EP1176721B1 (de) * 2000-07-24 2004-02-04 STMicroelectronics S.r.l. Integrator mit Gleichrichtungsfunktion und mit einem der Speisespannung entsprechenden Ausgangsspannungsbereich
WO2002084862A1 (en) * 2001-04-11 2002-10-24 Koninklijke Philips Electronics N.V. High duty cycle offset compensation for operational amplifiers
US6611163B1 (en) * 2002-03-20 2003-08-26 Texas Instruments Incorporated Switched capacitor scheme for offset compensated comparators
US6570411B1 (en) * 2002-06-17 2003-05-27 Analog Devices, Inc. Switched-capacitor structures with reduced distortion and noise and enhanced isolation
US7348824B2 (en) * 2005-03-07 2008-03-25 Cadence Design Systems, Inc. Auto-zero circuit
US7319425B2 (en) 2005-03-21 2008-01-15 Massachusetts Institute Of Technology Comparator-based switched capacitor circuit for scaled semiconductor fabrication processes
US7221191B2 (en) * 2005-05-23 2007-05-22 Analog Devices, Inc. Signal samplers with enhanced dynamic range
JP2007074447A (ja) * 2005-09-07 2007-03-22 Fujitsu Ltd Ｃｍｏｓセンサ
US7541857B1 (en) * 2005-12-29 2009-06-02 Altera Corporation Comparator offset cancellation assisted by PLD resources
US8305131B2 (en) * 2006-03-21 2012-11-06 Maxim Integrated, Inc. Passive offset and overshoot cancellation for sampled-data circuits
CN101449336B (zh) * 2006-03-21 2012-07-25 剑桥模拟技术有限公司 采样数据电路的偏移消除
JP5191214B2 (ja) * 2006-12-21 2013-05-08 セイコーインスツル株式会社 コンパレータ回路
US7564273B2 (en) * 2007-02-06 2009-07-21 Massachusetts Institute Of Technology Low-voltage comparator-based switched-capacitor networks

Also Published As

Publication number Publication date
CN101449336A (zh) 2009-06-03
WO2007109506A2 (en) 2007-09-27
US20110032003A1 (en) 2011-02-10
EP1999758A4 (de) 2009-04-15
EP1999758B1 (de) 2012-01-04
CN103065686A (zh) 2013-04-24
CN101449336B (zh) 2012-07-25
JP2009545188A (ja) 2009-12-17
US20070222483A1 (en) 2007-09-27
US20130127516A1 (en) 2013-05-23
WO2007109506A3 (en) 2008-10-02
KR101252331B1 (ko) 2013-04-08
CN103065686B (zh) 2016-09-14
KR20080113076A (ko) 2008-12-26
US7843233B2 (en) 2010-11-30
US8373489B2 (en) 2013-02-12
EP1999758A2 (de) 2008-12-10
US8519769B2 (en) 2013-08-27

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