ATE534029T1 - Phasenkontrastbildgebung - Google Patents

Phasenkontrastbildgebung

Info

Publication number
ATE534029T1
ATE534029T1 AT07804124T AT07804124T ATE534029T1 AT E534029 T1 ATE534029 T1 AT E534029T1 AT 07804124 T AT07804124 T AT 07804124T AT 07804124 T AT07804124 T AT 07804124T AT E534029 T1 ATE534029 T1 AT E534029T1
Authority
AT
Austria
Prior art keywords
individual
pixels
phase contrast
mask
detector
Prior art date
Application number
AT07804124T
Other languages
English (en)
Inventor
Alessandro Olivo
Robert Speller
Original Assignee
Ucl Business Plc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ucl Business Plc filed Critical Ucl Business Plc
Application granted granted Critical
Publication of ATE534029T1 publication Critical patent/ATE534029T1/de

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G01N23/041—Phase-contrast imaging, e.g. using grating interferometers
    • A—HUMAN NECESSITIES
    • A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B6/00—Apparatus or devices for radiation diagnosis; Apparatus or devices for radiation diagnosis combined with radiation therapy equipment
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials

Landscapes

  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Physics & Mathematics (AREA)
  • General Health & Medical Sciences (AREA)
  • Pathology (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Radiology & Medical Imaging (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Medical Informatics (AREA)
  • Engineering & Computer Science (AREA)
  • Surgery (AREA)
  • Veterinary Medicine (AREA)
  • Optics & Photonics (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Biomedical Technology (AREA)
  • Heart & Thoracic Surgery (AREA)
  • Biophysics (AREA)
  • Animal Behavior & Ethology (AREA)
  • Molecular Biology (AREA)
  • Public Health (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Measurement Of Radiation (AREA)
  • Apparatus For Radiation Diagnosis (AREA)
  • Medicines Containing Antibodies Or Antigens For Use As Internal Diagnostic Agents (AREA)
AT07804124T 2006-09-08 2007-09-03 Phasenkontrastbildgebung ATE534029T1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
GB0617637A GB2441578A (en) 2006-09-08 2006-09-08 Phase Contrast X-Ray Imaging
PCT/GB2007/003318 WO2008029107A2 (en) 2006-09-08 2007-09-03 Phase contrast imaging

Publications (1)

Publication Number Publication Date
ATE534029T1 true ATE534029T1 (de) 2011-12-15

Family

ID=37232542

Family Applications (1)

Application Number Title Priority Date Filing Date
AT07804124T ATE534029T1 (de) 2006-09-08 2007-09-03 Phasenkontrastbildgebung

Country Status (9)

Country Link
US (1) US7869567B2 (de)
EP (1) EP2076760B1 (de)
JP (1) JP5280361B2 (de)
AT (1) ATE534029T1 (de)
CA (1) CA2662329C (de)
DK (1) DK2076760T3 (de)
ES (1) ES2377831T3 (de)
GB (1) GB2441578A (de)
WO (1) WO2008029107A2 (de)

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JP4847568B2 (ja) 2008-10-24 2011-12-28 キヤノン株式会社 Ｘ線撮像装置およびｘ線撮像方法
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JP5143147B2 (ja) * 2009-01-15 2013-02-13 キヤノン株式会社 Ｘ線撮像装置およびｘ線撮像方法
US8351569B2 (en) * 2009-06-12 2013-01-08 Lawrence Livermore National Security, Llc Phase-sensitive X-ray imager
CN102460237B (zh) 2009-06-16 2015-04-15 皇家飞利浦电子股份有限公司 倾斜光栅和用于生产倾斜光栅的方法
JP5675169B2 (ja) * 2009-06-18 2015-02-25 キヤノン株式会社 Ｘ線撮像装置およびｘ線撮像方法
JP5697370B2 (ja) * 2009-07-24 2015-04-08 キヤノン株式会社 Ｘ線撮像装置
JP5269041B2 (ja) 2009-12-04 2013-08-21 キヤノン株式会社 Ｘ線撮像装置およびｘ線撮像方法
JP5213923B2 (ja) * 2010-01-29 2013-06-19 キヤノン株式会社 Ｘ線撮像装置およびｘ線撮像方法
JP5586986B2 (ja) * 2010-02-23 2014-09-10 キヤノン株式会社 Ｘ線撮像装置
JP4795472B2 (ja) 2010-03-05 2011-10-19 キヤノン株式会社 Ｘ線撮像装置およびｘ線撮像方法
JP5733908B2 (ja) * 2010-04-27 2015-06-10 キヤノン株式会社 Ｘ線撮像装置
JP5610885B2 (ja) 2010-07-12 2014-10-22 キヤノン株式会社 Ｘ線撮像装置および撮像方法
JP5646906B2 (ja) * 2010-08-06 2014-12-24 キヤノン株式会社 Ｘ線装置およびｘ線測定方法
JP5935693B2 (ja) * 2010-09-29 2016-06-15 コニカミノルタ株式会社 医用画像表示方法
JP2012103237A (ja) * 2010-10-14 2012-05-31 Canon Inc 撮像装置
RU2573114C2 (ru) * 2010-10-19 2016-01-20 Конинклейке Филипс Электроникс Н.В. Формирование изображений методом дифференциального фазового контраста
JP5697430B2 (ja) 2010-12-17 2015-04-08 キヤノン株式会社 Ｘ線撮像装置
WO2012104770A2 (en) * 2011-02-01 2012-08-09 Koninklijke Philips Electronics N.V. Differential phase-contrast imaging with focussing deflection structure plates
JP5836679B2 (ja) * 2011-07-19 2015-12-24 キヤノン株式会社 放射線撮像装置および放射線撮像システム
GB201112537D0 (en) * 2011-07-21 2011-08-31 Ucl Business Plc X-ray imaging
GB201112506D0 (en) 2011-07-21 2011-08-31 Ucl Business Plc Phase imaging
US9557549B2 (en) * 2011-12-09 2017-01-31 Massachusetts Institute Of Technology Systems and methods for self-referenced quantitative phase microscopy
US20150179293A1 (en) 2012-06-07 2015-06-25 Canon Kabushiki Kaisha X-ray device and x-ray measurement method
US20150153290A1 (en) * 2012-06-07 2015-06-04 Canon Kabushiki Kaisha X-ray apparatus and method of measuring x-rays
US20150160141A1 (en) * 2012-06-15 2015-06-11 Canon Kabushiki Kaisha X-ray apparatus and x-ray measurement method
JP6150648B2 (ja) 2012-08-02 2017-06-21 キヤノン株式会社 被検体情報取得装置及び被検体情報取得システム
WO2014052029A1 (en) * 2012-09-30 2014-04-03 Saint-Gobain Ceramics & Plastics, Inc. Scintillation pixel array, radiation sensing apparatus including the scintillation pixel array and a method of forming a scintillation pixel array
JP6277204B2 (ja) 2013-02-13 2018-02-07 コーニンクレッカ フィリップス エヌ ヴェＫｏｎｉｎｋｌｉｊｋｅ Ｐｈｉｌｉｐｓ Ｎ．Ｖ． 多重ｘ線ビーム管
EP2978377B1 (de) * 2013-03-26 2021-05-05 Institute of Experimental and Applied Physics Verfahren zur phasengradientenradiografie und anordnung eines abbildungssystems zur anwendung des verfahrens
GB201311091D0 (en) 2013-06-21 2013-08-07 Ucl Business Plc X-Ray imaging
DE102013221818A1 (de) * 2013-10-28 2015-04-30 Siemens Aktiengesellschaft Bildgebendes System und Verfahren zur Bildgebung
CN104622492A (zh) * 2013-11-11 2015-05-20 中国科学技术大学 一种x射线光栅相位衬度成像装置和方法
GB201407826D0 (en) * 2014-05-02 2014-06-18 Johnson Matthey Plc Apparatus and method for scanning a structure
DE102014219910B4 (de) * 2014-10-01 2018-10-31 Siemens Healthcare Gmbh Rasteranordnung und Verfahren für die Röntgenbildaufnahme
CN107144583A (zh) * 2017-06-21 2017-09-08 兰州大学 一种用于x射线相衬成像平板探测器及其使用方法
EP3427663B1 (de) 2017-07-13 2020-03-04 Agfa Nv Phasenkontrastbildgebungsverfahren
EP3570015A1 (de) 2018-05-18 2019-11-20 Agfa Nv Ausrichtungsverfahren für pci-raster
JP2021156578A (ja) * 2018-06-27 2021-10-07 株式会社ニコン Ｘ線装置、ｘ線画像生成方法および構造物の製造方法
FR3092398B1 (fr) 2019-01-31 2021-02-26 Imagine Optic Procédés et systèmes pour l’imagerie de contraste phase
DE102019202442A1 (de) * 2019-02-22 2020-08-27 Bruker Axs Gmbh Messanordnung für Röntgenstrahlung für eine spaltfreie 1D-Messung
DE102019209188B4 (de) * 2019-06-25 2021-01-28 Bruker Axs Gmbh Messanordnung für Röntgenstrahlung mit verminderten Parallax-Effekten
EP3922180A1 (de) 2020-06-09 2021-12-15 Koninklijke Philips N.V. Vorrichtung zur verarbeitung von daten, die durch ein dunkelfeld-und / oder phasenkontraströntgenbildgebungssystem gewonnen wurden

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CN1216109A (zh) * 1997-01-24 1999-05-05 匡塔威神公司 使用小角度图象测定物体内部结构和组成的检测设备
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JP4118535B2 (ja) * 2001-07-03 2008-07-16 株式会社日立メディコ Ｘ線検査装置
JP3843830B2 (ja) * 2001-12-21 2006-11-08 コニカミノルタホールディングス株式会社 デジタル位相コントラストｘ線画像撮影システム
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Also Published As

Publication number Publication date
WO2008029107A3 (en) 2008-05-29
EP2076760A2 (de) 2009-07-08
GB0617637D0 (en) 2006-10-18
JP2010502977A (ja) 2010-01-28
ES2377831T3 (es) 2012-04-02
WO2008029107A2 (en) 2008-03-13
GB2441578A (en) 2008-03-12
JP5280361B2 (ja) 2013-09-04
CA2662329C (en) 2016-04-12
DK2076760T3 (da) 2012-03-05
US20100054415A1 (en) 2010-03-04
US7869567B2 (en) 2011-01-11
EP2076760B1 (de) 2011-11-16
CA2662329A1 (en) 2008-03-13

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