ATE531081T1 - Transistoren auf nirtridbasis mit seitlich aufgewachsener aktivregion und herstellungsverfahren dafür - Google Patents
Transistoren auf nirtridbasis mit seitlich aufgewachsener aktivregion und herstellungsverfahren dafürInfo
- Publication number
- ATE531081T1 ATE531081T1 AT05730396T AT05730396T ATE531081T1 AT E531081 T1 ATE531081 T1 AT E531081T1 AT 05730396 T AT05730396 T AT 05730396T AT 05730396 T AT05730396 T AT 05730396T AT E531081 T1 ATE531081 T1 AT E531081T1
- Authority
- AT
- Austria
- Prior art keywords
- group iii
- nitride
- layer
- nirtride
- production process
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D30/00—Field-effect transistors [FET]
- H10D30/40—FETs having zero-dimensional [0D], one-dimensional [1D] or two-dimensional [2D] charge carrier gas channels
- H10D30/47—FETs having zero-dimensional [0D], one-dimensional [1D] or two-dimensional [2D] charge carrier gas channels having two-dimensional [2D] charge carrier gas channels, e.g. nanoribbon FETs or high electron mobility transistors [HEMT]
- H10D30/471—High electron mobility transistors [HEMT] or high hole mobility transistors [HHMT]
- H10D30/475—High electron mobility transistors [HEMT] or high hole mobility transistors [HHMT] having wider bandgap layer formed on top of lower bandgap active layer, e.g. undoped barrier HEMTs such as i-AlGaN/GaN HEMTs
- H10D30/4755—High electron mobility transistors [HEMT] or high hole mobility transistors [HHMT] having wider bandgap layer formed on top of lower bandgap active layer, e.g. undoped barrier HEMTs such as i-AlGaN/GaN HEMTs having wide bandgap charge-carrier supplying layers, e.g. modulation doped HEMTs such as n-AlGaAs/GaAs HEMTs
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D30/00—Field-effect transistors [FET]
- H10D30/01—Manufacture or treatment
- H10D30/015—Manufacture or treatment of FETs having heterojunction interface channels or heterojunction gate electrodes, e.g. HEMT
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D62/00—Semiconductor bodies, or regions thereof, of devices having potential barriers
- H10D62/80—Semiconductor bodies, or regions thereof, of devices having potential barriers characterised by the materials
- H10D62/85—Semiconductor bodies, or regions thereof, of devices having potential barriers characterised by the materials being Group III-V materials, e.g. GaAs
- H10D62/8503—Nitride Group III-V materials, e.g. AlN or GaN
Landscapes
- Junction Field-Effect Transistors (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US10/899,215 US20060017064A1 (en) | 2004-07-26 | 2004-07-26 | Nitride-based transistors having laterally grown active region and methods of fabricating same |
| PCT/US2005/010869 WO2006022872A1 (en) | 2004-07-26 | 2005-03-30 | Nitride-based transistors having laterally grown active region and methods of fabricating same |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| ATE531081T1 true ATE531081T1 (de) | 2011-11-15 |
Family
ID=34964204
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| AT05730396T ATE531081T1 (de) | 2004-07-26 | 2005-03-30 | Transistoren auf nirtridbasis mit seitlich aufgewachsener aktivregion und herstellungsverfahren dafür |
Country Status (6)
| Country | Link |
|---|---|
| US (2) | US20060017064A1 (de) |
| EP (1) | EP1779437B1 (de) |
| JP (1) | JP2008507853A (de) |
| AT (1) | ATE531081T1 (de) |
| TW (1) | TW200605349A (de) |
| WO (1) | WO2006022872A1 (de) |
Families Citing this family (35)
| Publication number | Priority date | Publication date | Assignee | Title |
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| US7612390B2 (en) * | 2004-02-05 | 2009-11-03 | Cree, Inc. | Heterojunction transistors including energy barriers |
| US7525130B2 (en) * | 2004-09-29 | 2009-04-28 | The Regents Of The University Of California | Polarization-doped field effect transistors (POLFETS) and materials and methods for making the same |
| KR100630197B1 (ko) * | 2004-11-03 | 2006-09-29 | 삼성전자주식회사 | 플립 칩 본딩을 위한 반도체 광소자의 제작 방법 |
| DE102005010821B4 (de) * | 2005-03-07 | 2007-01-25 | Technische Universität Berlin | Verfahren zum Herstellen eines Bauelements |
| US7405430B2 (en) * | 2005-06-10 | 2008-07-29 | Cree, Inc. | Highly uniform group III nitride epitaxial layers on 100 millimeter diameter silicon carbide substrates |
| US9331192B2 (en) * | 2005-06-29 | 2016-05-03 | Cree, Inc. | Low dislocation density group III nitride layers on silicon carbide substrates and methods of making the same |
| US20070018198A1 (en) * | 2005-07-20 | 2007-01-25 | Brandes George R | High electron mobility electronic device structures comprising native substrates and methods for making the same |
| JP2007059595A (ja) * | 2005-08-24 | 2007-03-08 | Toshiba Corp | 窒化物半導体素子 |
| US20090233414A1 (en) * | 2005-10-20 | 2009-09-17 | Shah Pankaj B | Method for fabricating group III-nitride high electron mobility transistors (HEMTs) |
| JP2007294769A (ja) * | 2006-04-26 | 2007-11-08 | Toshiba Corp | 窒化物半導体素子 |
| US8421119B2 (en) | 2006-09-13 | 2013-04-16 | Rohm Co., Ltd. | GaN related compound semiconductor element and process for producing the same and device having the same |
| JP2008071877A (ja) * | 2006-09-13 | 2008-03-27 | Rohm Co Ltd | GaN系半導体素子 |
| US8823057B2 (en) | 2006-11-06 | 2014-09-02 | Cree, Inc. | Semiconductor devices including implanted regions for providing low-resistance contact to buried layers and related devices |
| JP2008311355A (ja) * | 2007-06-13 | 2008-12-25 | Rohm Co Ltd | 窒化物半導体素子 |
| US8637924B2 (en) * | 2011-06-03 | 2014-01-28 | Infineon Technologies Austria Ag | Lateral trench MESFET |
| US8692319B2 (en) * | 2011-06-03 | 2014-04-08 | Infineon Technologies Austria Ag | Lateral trench MESFET |
| KR101813180B1 (ko) | 2011-06-28 | 2017-12-29 | 삼성전자주식회사 | 고 전자 이동도 트랜지스터 및 그 제조방법 |
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| KR101513123B1 (ko) * | 2013-07-17 | 2015-04-22 | 경북대학교 산학협력단 | 반도체소자 및 그 제조방법 |
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| KR20150103800A (ko) * | 2014-03-04 | 2015-09-14 | 전북대학교산학협력단 | 고효율 이종접합 전계효과 트랜지스터 및 이의 제조방법 |
| US10276712B2 (en) | 2014-05-29 | 2019-04-30 | Hrl Laboratories, Llc | III-nitride field-effect transistor with dual gates |
| WO2015195788A1 (en) * | 2014-06-17 | 2015-12-23 | The Regents Of The University Of Michigan | Resonant body high electron mobility transistor |
| CN104617136A (zh) * | 2015-01-08 | 2015-05-13 | 山东大学 | 4h-碳化硅基n沟道积累型高压绝缘栅双极晶体管 |
| US9812532B1 (en) | 2015-08-28 | 2017-11-07 | Hrl Laboratories, Llc | III-nitride P-channel transistor |
| EP3378097B1 (de) | 2015-11-19 | 2025-12-31 | HRL Laboratories, LLC | Iii-nitrid-feldeffekttransistor mit zwei gates |
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| CN114514616A (zh) * | 2019-10-09 | 2022-05-17 | 松下知识产权经营株式会社 | 氮化物半导体结构体、氮化物半导体器件以及用于制作该器件的方法 |
| WO2022104074A1 (en) * | 2020-11-13 | 2022-05-19 | The Regents Of The University Of California | Epitaxy-enabled substrate transfer |
| US11978790B2 (en) * | 2020-12-01 | 2024-05-07 | Texas Instruments Incorporated | Normally-on gallium nitride based transistor with p-type gate |
| US12218202B2 (en) * | 2021-09-16 | 2025-02-04 | Wolfspeed, Inc. | Semiconductor device incorporating a substrate recess |
| CN114883192B (zh) * | 2022-04-25 | 2024-11-12 | 浙江集迈科微电子有限公司 | 绝缘衬底上硅与iii-v族器件的单片异质集成结构及制备方法 |
| TWI812573B (zh) * | 2023-01-31 | 2023-08-11 | 新唐科技股份有限公司 | 半導體裝置及其形成方法 |
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-
2004
- 2004-07-26 US US10/899,215 patent/US20060017064A1/en not_active Abandoned
-
2005
- 2005-03-30 EP EP05730396A patent/EP1779437B1/de not_active Expired - Lifetime
- 2005-03-30 JP JP2007523541A patent/JP2008507853A/ja active Pending
- 2005-03-30 WO PCT/US2005/010869 patent/WO2006022872A1/en not_active Ceased
- 2005-03-30 AT AT05730396T patent/ATE531081T1/de not_active IP Right Cessation
- 2005-04-19 TW TW094112474A patent/TW200605349A/zh unknown
-
2009
- 2009-09-22 US US12/564,473 patent/US8946777B2/en not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| US20100012952A1 (en) | 2010-01-21 |
| TW200605349A (en) | 2006-02-01 |
| JP2008507853A (ja) | 2008-03-13 |
| WO2006022872A1 (en) | 2006-03-02 |
| EP1779437A1 (de) | 2007-05-02 |
| US8946777B2 (en) | 2015-02-03 |
| US20060017064A1 (en) | 2006-01-26 |
| EP1779437B1 (de) | 2011-10-26 |
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| RER | Ceased as to paragraph 5 lit. 3 law introducing patent treaties |