ATE523904T1 - Magnetowiderstandsvorrichtung - Google Patents
MagnetowiderstandsvorrichtungInfo
- Publication number
- ATE523904T1 ATE523904T1 AT08157888T AT08157888T ATE523904T1 AT E523904 T1 ATE523904 T1 AT E523904T1 AT 08157888 T AT08157888 T AT 08157888T AT 08157888 T AT08157888 T AT 08157888T AT E523904 T1 ATE523904 T1 AT E523904T1
- Authority
- AT
- Austria
- Prior art keywords
- channel
- magnetic resistance
- resistance device
- face
- substantially perpendicular
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N50/00—Galvanomagnetic devices
- H10N50/10—Magnetoresistive devices
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y25/00—Nanomagnetism, e.g. magnetoimpedance, anisotropic magnetoresistance, giant magnetoresistance or tunneling magnetoresistance
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R33/00—Arrangements or instruments for measuring magnetic variables
- G01R33/0005—Geometrical arrangement of magnetic sensor elements; Apparatus combining different magnetic sensor types
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R33/00—Arrangements or instruments for measuring magnetic variables
- G01R33/0052—Manufacturing aspects; Manufacturing of single devices, i.e. of semiconductor magnetic sensor chips
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R33/00—Arrangements or instruments for measuring magnetic variables
- G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux
- G01R33/06—Measuring direction or magnitude of magnetic fields or magnetic flux using galvano-magnetic devices
- G01R33/09—Magnetoresistive devices
- G01R33/093—Magnetoresistive devices using multilayer structures, e.g. giant magnetoresistance sensors
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R33/00—Arrangements or instruments for measuring magnetic variables
- G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux
- G01R33/06—Measuring direction or magnitude of magnetic fields or magnetic flux using galvano-magnetic devices
- G01R33/09—Magnetoresistive devices
- G01R33/095—Magnetoresistive devices extraordinary magnetoresistance sensors
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
- G11B5/00—Recording by magnetisation or demagnetisation of a record carrier; Reproducing by magnetic means; Record carriers therefor
- G11B5/127—Structure or manufacture of heads, e.g. inductive
- G11B5/33—Structure or manufacture of flux-sensitive heads, i.e. for reproduction only; Combination of such heads with means for recording or erasing only
- G11B5/39—Structure or manufacture of flux-sensitive heads, i.e. for reproduction only; Combination of such heads with means for recording or erasing only using magneto-resistive devices or effects
- G11B5/3903—Structure or manufacture of flux-sensitive heads, i.e. for reproduction only; Combination of such heads with means for recording or erasing only using magneto-resistive devices or effects using magnetic thin film layers or their effects, the films being part of integrated structures
- G11B5/3993—Structure or manufacture of flux-sensitive heads, i.e. for reproduction only; Combination of such heads with means for recording or erasing only using magneto-resistive devices or effects using magnetic thin film layers or their effects, the films being part of integrated structures in semi-conductors
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
EP08157888A EP2133931B1 (de) | 2008-06-09 | 2008-06-09 | Magnetowiderstandsvorrichtung |
Publications (1)
Publication Number | Publication Date |
---|---|
ATE523904T1 true ATE523904T1 (de) | 2011-09-15 |
Family
ID=39832554
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
AT08157888T ATE523904T1 (de) | 2008-06-09 | 2008-06-09 | Magnetowiderstandsvorrichtung |
Country Status (4)
Country | Link |
---|---|
US (1) | US8094417B2 (de) |
EP (1) | EP2133931B1 (de) |
JP (1) | JP5275144B2 (de) |
AT (1) | ATE523904T1 (de) |
Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP2317581B1 (de) | 2009-10-30 | 2012-03-07 | Hitachi, Ltd. | Magnetowiderstandsvorrichtung |
JP5998380B2 (ja) * | 2011-03-07 | 2016-09-28 | 国立研究開発法人産業技術総合研究所 | 半導体基板、半導体装置および半導体基板の製造方法 |
US11867775B2 (en) * | 2019-03-04 | 2024-01-09 | Government Of The United States Of America | Systems, devices, and methods for resistance metrology using graphene with superconducting components |
Family Cites Families (14)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4065797A (en) * | 1974-12-20 | 1977-12-27 | Matsushita Electric Industrial Co., Ltd. | Multi-element magnetic head |
US4523243A (en) * | 1982-05-24 | 1985-06-11 | Storage Technology Corporation | Magnetoresistive transducer using an independent recessed electromagnetic bias |
JPS6169183A (ja) * | 1985-08-30 | 1986-04-09 | Nec Corp | Mos型ホール素子の製造方法 |
US4978938A (en) * | 1988-12-23 | 1990-12-18 | General Motors Corporation | Magnetoresistor |
CA1303246C (en) * | 1988-12-23 | 1992-06-09 | Dale Lee Partin | Magnetoresistor with accumulation layer |
DE59108800D1 (de) * | 1991-12-21 | 1997-08-28 | Itt Ind Gmbh Deutsche | Offsetkompensierter Hallsensor |
US5652445A (en) * | 1995-04-21 | 1997-07-29 | Johnson; Mark B. | Hybrid hall effect device and method of operation |
JP4408334B2 (ja) | 2001-03-08 | 2010-02-03 | 株式会社日立グローバルストレージテクノロジーズ | 磁気ヘッド素子の研磨装置 |
US7016167B2 (en) * | 2002-11-29 | 2006-03-21 | Hitachi Global Storage Technologies Netherlands B.V. | Spin valve transistor with stabilization and method for producing the same |
US7136264B2 (en) * | 2003-04-10 | 2006-11-14 | Hitachi Global Storage Technologies Netherlands, B.V. | Use of gold leads in lead overlaid type of GMR sensor |
JP4287905B2 (ja) * | 2003-07-31 | 2009-07-01 | 光照 木村 | 半導体磁気センサとこれを用いた磁気計測装置 |
JP2006019728A (ja) * | 2004-06-30 | 2006-01-19 | Hitachi Global Storage Technologies Netherlands Bv | 交換結合された反強磁性/強磁性構造による垂直磁気バイアスを有する異常磁気抵抗センサ |
US7203036B2 (en) * | 2004-07-30 | 2007-04-10 | Hitachi Global Storage Technologies Netherlands B.V. | Planar extraordinary magnetoresistance sensor |
EP1868254B1 (de) | 2006-06-13 | 2010-03-24 | Hitachi Ltd. | Magnetowiderstandsvorrichtung |
-
2008
- 2008-06-09 EP EP08157888A patent/EP2133931B1/de not_active Not-in-force
- 2008-06-09 AT AT08157888T patent/ATE523904T1/de not_active IP Right Cessation
-
2009
- 2009-02-23 US US12/390,547 patent/US8094417B2/en not_active Expired - Fee Related
- 2009-06-08 JP JP2009136857A patent/JP5275144B2/ja not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
EP2133931A1 (de) | 2009-12-16 |
JP5275144B2 (ja) | 2013-08-28 |
JP2009295987A (ja) | 2009-12-17 |
US8094417B2 (en) | 2012-01-10 |
EP2133931B1 (de) | 2011-09-07 |
US20090303638A1 (en) | 2009-12-10 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
RER | Ceased as to paragraph 5 lit. 3 law introducing patent treaties |