ATE548764T1 - Magnetowiderstandsvorrichtung - Google Patents

Magnetowiderstandsvorrichtung

Info

Publication number
ATE548764T1
ATE548764T1 AT09174576T AT09174576T ATE548764T1 AT E548764 T1 ATE548764 T1 AT E548764T1 AT 09174576 T AT09174576 T AT 09174576T AT 09174576 T AT09174576 T AT 09174576T AT E548764 T1 ATE548764 T1 AT E548764T1
Authority
AT
Austria
Prior art keywords
channel
substrate
magnetic resistance
resistance device
contacts
Prior art date
Application number
AT09174576T
Other languages
English (en)
Inventor
Susumu Ogawa
David Williams
Hiroshi Fukuda
Washio Katsuyoshi
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Application granted granted Critical
Publication of ATE548764T1 publication Critical patent/ATE548764T1/de

Links

Classifications

    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10N50/00—Galvanomagnetic devices
    • H10N50/10—Magnetoresistive devices
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B82—NANOTECHNOLOGY
    • B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
    • B82Y25/00—Nanomagnetism, e.g. magnetoimpedance, anisotropic magnetoresistance, giant magnetoresistance or tunneling magnetoresistance
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux
    • G01R33/06—Measuring direction or magnitude of magnetic fields or magnetic flux using galvano-magnetic devices
    • G01R33/09—Magnetoresistive devices
    • G01R33/093—Magnetoresistive devices using multilayer structures, e.g. giant magnetoresistance sensors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux
    • G01R33/06—Measuring direction or magnitude of magnetic fields or magnetic flux using galvano-magnetic devices
    • G01R33/09—Magnetoresistive devices
    • G01R33/095—Magnetoresistive devices extraordinary magnetoresistance sensors
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
    • G11B5/00—Recording by magnetisation or demagnetisation of a record carrier; Reproducing by magnetic means; Record carriers therefor
    • G11B5/127—Structure or manufacture of heads, e.g. inductive
    • G11B5/33—Structure or manufacture of flux-sensitive heads, i.e. for reproduction only; Combination of such heads with means for recording or erasing only
    • G11B5/39—Structure or manufacture of flux-sensitive heads, i.e. for reproduction only; Combination of such heads with means for recording or erasing only using magneto-resistive devices or effects
    • G11B5/3903—Structure or manufacture of flux-sensitive heads, i.e. for reproduction only; Combination of such heads with means for recording or erasing only using magneto-resistive devices or effects using magnetic thin film layers or their effects, the films being part of integrated structures
    • G11B5/3993—Structure or manufacture of flux-sensitive heads, i.e. for reproduction only; Combination of such heads with means for recording or erasing only using magneto-resistive devices or effects using magnetic thin film layers or their effects, the films being part of integrated structures in semi-conductors
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10N50/00—Galvanomagnetic devices
    • H10N50/01—Manufacture or treatment

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Nanotechnology (AREA)
  • Manufacturing & Machinery (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Hall/Mr Elements (AREA)
  • Magnetic Heads (AREA)
AT09174576T 2009-10-30 2009-10-30 Magnetowiderstandsvorrichtung ATE548764T1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
EP09174576A EP2317581B1 (de) 2009-10-30 2009-10-30 Magnetowiderstandsvorrichtung

Publications (1)

Publication Number Publication Date
ATE548764T1 true ATE548764T1 (de) 2012-03-15

Family

ID=41716474

Family Applications (1)

Application Number Title Priority Date Filing Date
AT09174576T ATE548764T1 (de) 2009-10-30 2009-10-30 Magnetowiderstandsvorrichtung

Country Status (5)

Country Link
US (1) US8711523B2 (de)
EP (1) EP2317581B1 (de)
JP (1) JP5632694B2 (de)
CN (1) CN102097584B (de)
AT (1) ATE548764T1 (de)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8611043B2 (en) 2011-06-02 2013-12-17 International Business Machines Corporation Magnetic head having polycrystalline coating
US8611044B2 (en) 2011-06-02 2013-12-17 International Business Machines Corporation Magnetic head having separate protection for read transducers and write transducers
US8837082B2 (en) 2012-04-27 2014-09-16 International Business Machines Corporation Magnetic recording head having quilted-type coating
US9036297B2 (en) 2012-08-31 2015-05-19 International Business Machines Corporation Magnetic recording head having protected reader sensors and near zero recession writer poles
US8780496B2 (en) 2012-09-21 2014-07-15 International Business Machines Corporation Device such as magnetic head having hardened dielectric portions
US9140735B2 (en) * 2013-05-03 2015-09-22 Infineon Technologies Ag Integration of current measurement in wiring structure of an electronic circuit

Family Cites Families (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6707122B1 (en) * 1999-11-30 2004-03-16 Nec Laboratories America, Inc. Extraordinary magnetoresistance at room temperature in inhomogeneous narrow-gap semiconductors
JP2002163808A (ja) * 2000-11-22 2002-06-07 Tdk Corp 磁気抵抗効果装置およびその製造方法ならびに薄膜磁気ヘッドおよびその製造方法
JP4408334B2 (ja) 2001-03-08 2010-02-03 株式会社日立グローバルストレージテクノロジーズ 磁気ヘッド素子の研磨装置
JP2003187983A (ja) * 2001-12-17 2003-07-04 Ricoh Co Ltd 有機ｅｌトランジスタ
US7141841B2 (en) * 2003-07-03 2006-11-28 Micron Technology, Inc. Image sensor having a transistor for allowing increased dynamic range
JP2006019728A (ja) * 2004-06-30 2006-01-19 Hitachi Global Storage Technologies Netherlands Bv 交換結合された反強磁性／強磁性構造による垂直磁気バイアスを有する異常磁気抵抗センサ
US7203036B2 (en) 2004-07-30 2007-04-10 Hitachi Global Storage Technologies Netherlands B.V. Planar extraordinary magnetoresistance sensor
US20070064351A1 (en) * 2005-09-13 2007-03-22 Wang Shan X Spin filter junction and method of fabricating the same
EP1868254B1 (de) * 2006-06-13 2010-03-24 Hitachi Ltd. Magnetowiderstandsvorrichtung
US8125742B2 (en) * 2007-09-18 2012-02-28 Hitachi Global Storage Technologies Netherlands B.V. Fabrication of mesoscopic lorentz magnetoresistive structures
US8035927B2 (en) * 2008-01-28 2011-10-11 Hitachi Global Storage Technologies Netherlands B.V. EMR magnetic sensor having its active quantum well layer extending beyond an over-lying semiconductor layer end with tab and lead structure for improved electrical contact
US20090218563A1 (en) * 2008-02-28 2009-09-03 Bruce Alvin Gurney Novel fabrication of semiconductor quantum well heterostructure devices
EP2133931B1 (de) 2008-06-09 2011-09-07 Hitachi, Ltd. Magnetowiderstandsvorrichtung
EP2133930B1 (de) 2008-06-09 2011-10-05 Hitachi, Ltd. Magnetwiderstandsvorrichtung
US20110037464A1 (en) * 2009-08-11 2011-02-17 Bruce Alvin Gurney Tunable graphene magnetic field sensor

Also Published As

Publication number Publication date
JP5632694B2 (ja) 2014-11-26
US20110102947A1 (en) 2011-05-05
EP2317581B1 (de) 2012-03-07
EP2317581A1 (de) 2011-05-04
CN102097584B (zh) 2013-10-23
CN102097584A (zh) 2011-06-15
JP2011097046A (ja) 2011-05-12
US8711523B2 (en) 2014-04-29

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