ATE521988T1 - Verfahren zur elektrischen verbindung eines bauteils mit einsätzen mit ausgleichsblöcken - Google Patents

Verfahren zur elektrischen verbindung eines bauteils mit einsätzen mit ausgleichsblöcken

Info

Publication number
ATE521988T1
ATE521988T1 AT09726241T AT09726241T ATE521988T1 AT E521988 T1 ATE521988 T1 AT E521988T1 AT 09726241 T AT09726241 T AT 09726241T AT 09726241 T AT09726241 T AT 09726241T AT E521988 T1 ATE521988 T1 AT E521988T1
Authority
AT
Austria
Prior art keywords
component
inserts
electrically connecting
compensation blocks
conductive
Prior art date
Application number
AT09726241T
Other languages
English (en)
Inventor
Damien Saint-Patrice
Francois Marion
Original Assignee
Commissariat Energie Atomique
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Commissariat Energie Atomique filed Critical Commissariat Energie Atomique
Application granted granted Critical
Publication of ATE521988T1 publication Critical patent/ATE521988T1/de

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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
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    • H01L24/00Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
    • H01L24/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L24/10Bump connectors ; Manufacturing methods related thereto
    • H01L24/12Structure, shape, material or disposition of the bump connectors prior to the connecting process
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    • H01L24/10Bump connectors ; Manufacturing methods related thereto
    • H01L24/11Manufacturing methods
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    • H01L24/10Bump connectors ; Manufacturing methods related thereto
    • H01L24/15Structure, shape, material or disposition of the bump connectors after the connecting process
    • H01L24/16Structure, shape, material or disposition of the bump connectors after the connecting process of an individual bump connector
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    • H01L24/83Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a layer connector
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    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
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    • Y10T29/49139Assembling to base an electrical component, e.g., capacitor, etc. by inserting component lead or terminal into base aperture

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  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Computer Hardware Design (AREA)
  • Power Engineering (AREA)
  • Manufacturing & Machinery (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Wire Bonding (AREA)
  • Joining Of Building Structures In Genera (AREA)
  • Buildings Adapted To Withstand Abnormal External Influences (AREA)
  • Prostheses (AREA)
AT09726241T 2008-02-22 2009-02-19 Verfahren zur elektrischen verbindung eines bauteils mit einsätzen mit ausgleichsblöcken ATE521988T1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
FR0851141A FR2928032B1 (fr) 2008-02-22 2008-02-22 Composant de connexion muni d'inserts avec cales compensatrices.
PCT/FR2009/000185 WO2009118468A2 (fr) 2008-02-22 2009-02-19 Composant de connexion muni d'inserts avec cales compensatrices

Publications (1)

Publication Number Publication Date
ATE521988T1 true ATE521988T1 (de) 2011-09-15

Family

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Family Applications (1)

Application Number Title Priority Date Filing Date
AT09726241T ATE521988T1 (de) 2008-02-22 2009-02-19 Verfahren zur elektrischen verbindung eines bauteils mit einsätzen mit ausgleichsblöcken

Country Status (6)

Country Link
US (1) US20110041332A1 (de)
EP (1) EP2250670B1 (de)
JP (1) JP2011515019A (de)
AT (1) ATE521988T1 (de)
FR (1) FR2928032B1 (de)
WO (1) WO2009118468A2 (de)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2994331B1 (fr) 2012-07-31 2014-09-12 Commissariat Energie Atomique Procede d'assemblage de deux composants electroniques entre eux, de type flip-chip
FR2996053A1 (fr) * 2012-09-27 2014-03-28 Commissariat Energie Atomique Procede d'assemblage de deux composants electroniques, de type flip-chip, assemblage obtenu selon le procede.

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US5768109A (en) * 1991-06-26 1998-06-16 Hughes Electronics Multi-layer circuit board and semiconductor flip chip connection
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JPH07153796A (ja) * 1993-11-30 1995-06-16 Toshiba Corp 半導体実装装置およびその製造方法
JP3160175B2 (ja) * 1995-02-13 2001-04-23 三菱電機株式会社 電子部品の実装方法
JPH10233413A (ja) * 1997-02-21 1998-09-02 Nec Kansai Ltd 半導体装置およびその製造方法並びに配線基板
US6406989B1 (en) * 1997-02-21 2002-06-18 Nec Corporation Method of fabricating semiconductor device with bump electrodes
JP2000151057A (ja) * 1998-11-09 2000-05-30 Hitachi Ltd 電子部品実装構造体およびその製造方法並びに無線icカードおよびその製造方法
JP3494357B2 (ja) * 1999-01-28 2004-02-09 関西日本電気株式会社 半導体装置
JP2000299338A (ja) * 1999-04-14 2000-10-24 Sony Corp 突起電極を有するベアチップic及び突起電極の形成方法
US20020180029A1 (en) * 2001-04-25 2002-12-05 Hideki Higashitani Semiconductor device with intermediate connector
US20050151273A1 (en) * 2003-12-30 2005-07-14 Arnold Richard W. Semiconductor chip package
FR2876243B1 (fr) * 2004-10-04 2007-01-26 Commissariat Energie Atomique Composant a protuberances conductrices ductiles enterrees et procede de connexion electrique entre ce composant et un composant muni de pointes conductrices dures
US7534722B2 (en) * 2005-06-14 2009-05-19 John Trezza Back-to-front via process
JP5052605B2 (ja) * 2007-05-11 2012-10-17 パナソニック株式会社 半導体チップ

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JP2011515019A (ja) 2011-05-12
EP2250670B1 (de) 2011-08-24
EP2250670A2 (de) 2010-11-17
US20110041332A1 (en) 2011-02-24
WO2009118468A3 (fr) 2009-12-23
FR2928032A1 (fr) 2009-08-28
FR2928032B1 (fr) 2011-06-17
WO2009118468A2 (fr) 2009-10-01

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