ATE517428T1 - Flugzeit-massenspektrometer - Google Patents

Flugzeit-massenspektrometer

Info

Publication number
ATE517428T1
ATE517428T1 AT05792139T AT05792139T ATE517428T1 AT E517428 T1 ATE517428 T1 AT E517428T1 AT 05792139 T AT05792139 T AT 05792139T AT 05792139 T AT05792139 T AT 05792139T AT E517428 T1 ATE517428 T1 AT E517428T1
Authority
AT
Austria
Prior art keywords
ion
mass spectrometer
extraction device
source
time
Prior art date
Application number
AT05792139T
Other languages
English (en)
Inventor
Uwe Dahlke
Christian Luedke
Carsten Roland
Jochen Skole
Rainer Sorge
Joerg Wollbrandt
Original Assignee
Analytik Jena Ag
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Analytik Jena Ag filed Critical Analytik Jena Ag
Application granted granted Critical
Publication of ATE517428T1 publication Critical patent/ATE517428T1/de

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/06—Electron- or ion-optical arrangements
    • H01J49/061—Ion deflecting means, e.g. ion gates
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/06—Electron- or ion-optical arrangements
    • H01J49/062—Ion guides
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/10—Ion sources; Ion guns
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • H01J49/34—Dynamic spectrometers
    • H01J49/40—Time-of-flight spectrometers

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Sources, Ion Sources (AREA)
AT05792139T 2004-09-17 2005-09-12 Flugzeit-massenspektrometer ATE517428T1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE102004045315A DE102004045315A1 (de) 2004-09-17 2004-09-17 Flugzeit-Massenspektrometer
PCT/EP2005/054525 WO2006029999A2 (de) 2004-09-17 2005-09-12 Flugzeit-massenspektrometer

Publications (1)

Publication Number Publication Date
ATE517428T1 true ATE517428T1 (de) 2011-08-15

Family

ID=35809639

Family Applications (1)

Application Number Title Priority Date Filing Date
AT05792139T ATE517428T1 (de) 2004-09-17 2005-09-12 Flugzeit-massenspektrometer

Country Status (5)

Country Link
EP (1) EP1817788B1 (de)
AT (1) ATE517428T1 (de)
AU (1) AU2005284150B2 (de)
DE (1) DE102004045315A1 (de)
WO (1) WO2006029999A2 (de)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB201317774D0 (en) * 2013-10-08 2013-11-20 Micromass Ltd An ion inlet assembly
EP3047509B1 (de) * 2013-09-20 2023-02-22 Micromass UK Limited Ioneneinlassanordnung

Family Cites Families (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE705691C (de) * 1939-03-25 1941-05-07 Ernst Weese Vorrichtung zum Spannen ebener Membranen
US2925774A (en) * 1955-11-08 1960-02-23 Admiral Corp Frame for a screen
US4150319A (en) * 1977-09-22 1979-04-17 The Bendix Corporation Ion gating grid
DE3025764C2 (de) * 1980-07-08 1984-04-19 Hermann Prof. Dr. 6301 Fernwald Wollnik Laufzeit-Massenspektrometer
JPH07123036B2 (ja) * 1987-06-29 1995-12-25 株式会社島津製作所 誘導結合プラズマ質量分析装置
US5160840A (en) * 1991-10-25 1992-11-03 Vestal Marvin L Time-of-flight analyzer and method
US5621270A (en) * 1995-03-22 1997-04-15 Litton Systems, Inc. Electron window for toxic remediation device with a support grid having diverging angle holes
US6032513A (en) * 1997-06-30 2000-03-07 Texas Instruments Incorporated Apparatus and method for measuring contaminants in semiconductor processing chemicals
US6331702B1 (en) * 1999-01-25 2001-12-18 University Of Manitoba Spectrometer provided with pulsed ion source and transmission device to damp ion motion and method of use
US6013913A (en) * 1998-02-06 2000-01-11 The University Of Northern Iowa Multi-pass reflectron time-of-flight mass spectrometer
US6518569B1 (en) * 1999-06-11 2003-02-11 Science & Technology Corporation @ Unm Ion mirror
AU2001247243A1 (en) * 2000-02-29 2001-09-12 Ionwerks, Inc. Improved mobility spectrometer
DE10162267B4 (de) * 2001-12-18 2007-05-31 Bruker Daltonik Gmbh Reflektor für Flugzeitmassenspektrometer mit orthogonalem Ioneneinschuss
GB2388704B (en) * 2002-05-17 2004-08-11 * Micromass Limited Mass spectrometer and method of mass spectrometry
US7067803B2 (en) * 2002-10-11 2006-06-27 The Board Of Trustees Of The Leland Stanford Junior University Gating device and driver for modulation of charged particle beams

Also Published As

Publication number Publication date
DE102004045315A1 (de) 2006-03-30
AU2005284150B2 (en) 2011-05-12
AU2005284150A1 (en) 2006-03-23
AU2005284150A8 (en) 2010-06-03
WO2006029999A3 (de) 2007-08-02
EP1817788A2 (de) 2007-08-15
EP1817788B1 (de) 2011-07-20
WO2006029999A2 (de) 2006-03-23

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