AU2005284150A8 - Flight time mass spectrometer - Google Patents

Flight time mass spectrometer

Info

Publication number
AU2005284150A8
AU2005284150A8 AU2005284150A AU2005284150A AU2005284150A8 AU 2005284150 A8 AU2005284150 A8 AU 2005284150A8 AU 2005284150 A AU2005284150 A AU 2005284150A AU 2005284150 A AU2005284150 A AU 2005284150A AU 2005284150 A8 AU2005284150 A8 AU 2005284150A8
Authority
AU
Australia
Prior art keywords
ion
mass spectrometer
extraction device
source
flight time
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
AU2005284150A
Other versions
AU2005284150B2 (en
AU2005284150A1 (en
Inventor
Uwe Dahlke
Erwin Hoffmann
Christian Ludke
Carsten Roland
Jochen Skole
Rainer Sorge
Jorg Wollbrandt
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Analytik Jena AG
Original Assignee
FORDERUNG ANGEWANDTER OPTIK OP
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by FORDERUNG ANGEWANDTER OPTIK OP filed Critical FORDERUNG ANGEWANDTER OPTIK OP
Publication of AU2005284150A1 publication Critical patent/AU2005284150A1/en
Publication of AU2005284150A8 publication Critical patent/AU2005284150A8/en
Assigned to ANALYTIK JENA AG reassignment ANALYTIK JENA AG Request for Assignment Assignors: GESELLSCHAFT ZUR FORDERUNG ANGEWANDTER OPTIK, OPTOELEKTRONIK, QUANTENELEKTRONIK UND SPEKTROSKOPIE E.V., GESELLSCHAFT ZUR FORDERUNG DER ANALYTISCHEN WISSENSCHAFTEN E.V., HOFFMANN, ERWIN
Application granted granted Critical
Publication of AU2005284150B2 publication Critical patent/AU2005284150B2/en
Ceased legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/06—Electron- or ion-optical arrangements
    • H01J49/061—Ion deflecting means, e.g. ion gates
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/06—Electron- or ion-optical arrangements
    • H01J49/062—Ion guides
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/10—Ion sources; Ion guns
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • H01J49/34—Dynamic spectrometers
    • H01J49/40—Time-of-flight spectrometers

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Sources, Ion Sources (AREA)

Abstract

A device for producing an ion beam (120) from positively charged ions in an evacuated flight time mass spectrometer (10) containing an ion source (12), an interface (14) for transferring the ion beam of atmospheric pressure into the mass spectrometer (10), and an ion extraction device (64) with a voltage source (74) for the production of a negative potential difference between the ion extraction device (64) and the ion source (12), characterized in that the negative potential difference amounts to at least one - 1 kV and the ion extraction device (64) is connected to the voltage source (74) via a high ohm resistor (72), the value of which is selected in such a way that no spontaneous discharge occurs between the ion source (12) and ion extraction device (64) when voltage is applied.
AU2005284150A 2004-09-17 2005-09-12 Flight time mass spectrometer Ceased AU2005284150B2 (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
DE102004045315.2 2004-09-17
DE102004045315A DE102004045315A1 (en) 2004-09-17 2004-09-17 Time of Flight Mass Spectrometer
PCT/EP2005/054525 WO2006029999A2 (en) 2004-09-17 2005-09-12 Flight time mass spectrometer

Publications (3)

Publication Number Publication Date
AU2005284150A1 AU2005284150A1 (en) 2006-03-23
AU2005284150A8 true AU2005284150A8 (en) 2010-06-03
AU2005284150B2 AU2005284150B2 (en) 2011-05-12

Family

ID=35809639

Family Applications (1)

Application Number Title Priority Date Filing Date
AU2005284150A Ceased AU2005284150B2 (en) 2004-09-17 2005-09-12 Flight time mass spectrometer

Country Status (5)

Country Link
EP (1) EP1817788B1 (en)
AT (1) ATE517428T1 (en)
AU (1) AU2005284150B2 (en)
DE (1) DE102004045315A1 (en)
WO (1) WO2006029999A2 (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP3047509B1 (en) 2013-09-20 2023-02-22 Micromass UK Limited Ion inlet assembly
GB201317774D0 (en) * 2013-10-08 2013-11-20 Micromass Ltd An ion inlet assembly

Family Cites Families (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE705691C (en) * 1939-03-25 1941-05-07 Ernst Weese Device for tensioning flat membranes
US2925774A (en) * 1955-11-08 1960-02-23 Admiral Corp Frame for a screen
US4150319A (en) * 1977-09-22 1979-04-17 The Bendix Corporation Ion gating grid
DE3025764C2 (en) * 1980-07-08 1984-04-19 Hermann Prof. Dr. 6301 Fernwald Wollnik Time of flight mass spectrometer
JPH07123036B2 (en) * 1987-06-29 1995-12-25 株式会社島津製作所 Inductively coupled plasma mass spectrometer
US5160840A (en) * 1991-10-25 1992-11-03 Vestal Marvin L Time-of-flight analyzer and method
US5621270A (en) * 1995-03-22 1997-04-15 Litton Systems, Inc. Electron window for toxic remediation device with a support grid having diverging angle holes
US6032513A (en) * 1997-06-30 2000-03-07 Texas Instruments Incorporated Apparatus and method for measuring contaminants in semiconductor processing chemicals
US6331702B1 (en) * 1999-01-25 2001-12-18 University Of Manitoba Spectrometer provided with pulsed ion source and transmission device to damp ion motion and method of use
US6013913A (en) * 1998-02-06 2000-01-11 The University Of Northern Iowa Multi-pass reflectron time-of-flight mass spectrometer
US6518569B1 (en) * 1999-06-11 2003-02-11 Science & Technology Corporation @ Unm Ion mirror
CA2401610C (en) * 2000-02-29 2009-10-06 Ionwerks, Inc. Improved mobility spectrometer
DE10162267B4 (en) * 2001-12-18 2007-05-31 Bruker Daltonik Gmbh Reflector for time-of-flight mass spectrometers with orthogonal ion injection
GB2388704B (en) * 2002-05-17 2004-08-11 * Micromass Limited Mass spectrometer and method of mass spectrometry
US7067803B2 (en) * 2002-10-11 2006-06-27 The Board Of Trustees Of The Leland Stanford Junior University Gating device and driver for modulation of charged particle beams

Also Published As

Publication number Publication date
ATE517428T1 (en) 2011-08-15
AU2005284150B2 (en) 2011-05-12
AU2005284150A1 (en) 2006-03-23
DE102004045315A1 (en) 2006-03-30
WO2006029999A2 (en) 2006-03-23
WO2006029999A3 (en) 2007-08-02
EP1817788A2 (en) 2007-08-15
EP1817788B1 (en) 2011-07-20

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Legal Events

Date Code Title Description
TH Corrigenda

Free format text: IN VOL 21, NO 15, PAGE(S) 1722 UNDER THE HEADING PCT APPLICATIONS THAT HAVE ENTERED THE NATIONAL PHASE - NAME INDEX UNDER THE NAME GESELLSCHAFT ZUR FORDERUNG DER SPEKTROCHEMIE UND ANGEWANDTEN SPEKTOSKOPIE E. V., GESELLSCHAFT ZUR FORDERUNG DER ANALYTISCHEN WISSENSCHAFTEN E.V., AND ERWIN HOFFMANN, APPLICATION NO. 2005284150, UNDER INID (71), CORRECT THE CO-APPLICANT TO READ GESELLSCHAFT ZUR FORDERUNG ANGEWANDTER OPTIK, OPTOELEKTRONIK, QUANTENELEKTRONIK UND SPEKTROSKOPIE E.V.

PC1 Assignment before grant (sect. 113)

Owner name: ANALYTIK JENA AG

Free format text: FORMER APPLICANT(S): GESELLSCHAFT ZUR FORDERUNG ANGEWANDTER OPTIK, OPTOELEKTRONIK, QUANTENELEKTRONIK UND SPEKTROSKOPIE E.V.; HOFFMANN, ERWIN; GESELLSCHAFT ZUR FORDERUNG DER ANALYTISCHEN WISSENSCHAFTEN E.V.

FGA Letters patent sealed or granted (standard patent)
MK14 Patent ceased section 143(a) (annual fees not paid) or expired