ATE448547T1 - Aktivierung von speicherredundanz während des testens - Google Patents

Aktivierung von speicherredundanz während des testens

Info

Publication number
ATE448547T1
ATE448547T1 AT02797402T AT02797402T ATE448547T1 AT E448547 T1 ATE448547 T1 AT E448547T1 AT 02797402 T AT02797402 T AT 02797402T AT 02797402 T AT02797402 T AT 02797402T AT E448547 T1 ATE448547 T1 AT E448547T1
Authority
AT
Austria
Prior art keywords
activation
during testing
storage redundancy
redundancy during
storage
Prior art date
Application number
AT02797402T
Other languages
English (en)
Inventor
Michael Ouellette
Jeremy Rowland
Original Assignee
Ibm
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ibm filed Critical Ibm
Application granted granted Critical
Publication of ATE448547T1 publication Critical patent/ATE448547T1/de

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
    • G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
    • G11C29/44—Indication or identification of errors, e.g. for repair
    • G11C29/4401—Indication or identification of errors, e.g. for repair for self repair
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
    • G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
    • G11C29/14—Implementation of control logic, e.g. test mode decoders
    • G11C29/16—Implementation of control logic, e.g. test mode decoders using microprogrammed units, e.g. state machines
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
    • G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
    • G11C29/18—Address generation devices; Devices for accessing memories, e.g. details of addressing circuits
    • G11C29/24—Accessing extra cells, e.g. dummy cells or redundant cells
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
    • G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
    • G11C29/44—Indication or identification of errors, e.g. for repair
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/70—Masking faults in memories by using spares or by reconfiguring
    • G11C29/702—Masking faults in memories by using spares or by reconfiguring by replacing auxiliary circuits, e.g. spare voltage generators, decoders or sense amplifiers, to be used instead of defective ones
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/70—Masking faults in memories by using spares or by reconfiguring
    • G11C29/72—Masking faults in memories by using spares or by reconfiguring with optimized replacement algorithms
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
    • G11C11/34—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
    • G11C11/40—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
    • G11C11/41—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming static cells with positive feedback, i.e. cells not needing refreshing or charge regeneration, e.g. bistable multivibrator or Schmitt trigger
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C2029/0407—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals on power on
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C2029/0409—Online test
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
    • G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
    • G11C2029/1208—Error catch memory
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
    • G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
    • G11C2029/4402—Internal storage of test result, quality data, chip identification, repair information

Landscapes

  • For Increasing The Reliability Of Semiconductor Memories (AREA)
  • Techniques For Improving Reliability Of Storages (AREA)
  • Tests Of Electronic Circuits (AREA)
AT02797402T 2002-12-16 2002-12-16 Aktivierung von speicherredundanz während des testens ATE448547T1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/US2002/040473 WO2004061852A1 (en) 2002-12-16 2002-12-16 Enabling memory redundancy during testing

Publications (1)

Publication Number Publication Date
ATE448547T1 true ATE448547T1 (de) 2009-11-15

Family

ID=32710251

Family Applications (1)

Application Number Title Priority Date Filing Date
AT02797402T ATE448547T1 (de) 2002-12-16 2002-12-16 Aktivierung von speicherredundanz während des testens

Country Status (8)

Country Link
EP (1) EP1620857B1 (de)
JP (1) JP4215723B2 (de)
CN (1) CN100552805C (de)
AT (1) ATE448547T1 (de)
AU (1) AU2002361765A1 (de)
DE (1) DE60234394D1 (de)
TW (1) TWI257103B (de)
WO (1) WO2004061852A1 (de)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7219275B2 (en) * 2005-02-08 2007-05-15 International Business Machines Corporation Method and apparatus for providing flexible modular redundancy allocation for memory built in self test of SRAM with redundancy
TWI409820B (zh) * 2009-02-18 2013-09-21 King Yuan Electronics Co Ltd Semiconductor Test System with Self - Test for Memory Repair Analysis
CN102411994B (zh) * 2011-11-24 2015-01-07 深圳市芯海科技有限公司 集成电路内置存储器的数据校验方法及装置
KR102038036B1 (ko) * 2013-05-28 2019-10-30 에스케이하이닉스 주식회사 반도체 장치 및 반도체 장치를 포함하는 반도체 시스템
JP6706371B2 (ja) * 2018-08-08 2020-06-03 シャープ株式会社 表示装置およびその制御方法
CN109857606A (zh) * 2019-02-12 2019-06-07 深圳忆联信息系统有限公司 避免损失良率的memory冗余位测试方法及装置
CN114267402B (zh) * 2021-11-22 2022-11-18 上海芯存天下电子科技有限公司 闪存的坏存储单元测试方法、装置、设备及存储介质

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4819205A (en) * 1985-03-25 1989-04-04 Motorola, Inc. Memory system having memory elements independently defined as being on-line or off-line
EP0802541B1 (de) * 1996-04-18 2003-03-12 STMicroelectronics S.r.l. Verfahren, um redundante fehlerhafte Adressen in einer Speicheranordnung mit Redundanz zu erkennen
KR100234377B1 (ko) * 1997-04-10 1999-12-15 윤종용 메모리 집적 회로의 리던던시 메모리 셀 제어회로 및 그 제어방법

Also Published As

Publication number Publication date
DE60234394D1 (de) 2009-12-24
CN100552805C (zh) 2009-10-21
JP2006510156A (ja) 2006-03-23
WO2004061852A1 (en) 2004-07-22
TWI257103B (en) 2006-06-21
JP4215723B2 (ja) 2009-01-28
AU2002361765A1 (en) 2004-07-29
CN1708808A (zh) 2005-12-14
TW200519954A (en) 2005-06-16
EP1620857A1 (de) 2006-02-01
EP1620857A4 (de) 2006-08-02
EP1620857B1 (de) 2009-11-11

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