ATE446528T1 - Oszillator, optische ablenkeinheit und optisches instrument mit dieser - Google Patents

Oszillator, optische ablenkeinheit und optisches instrument mit dieser

Info

Publication number
ATE446528T1
ATE446528T1 AT07109640T AT07109640T ATE446528T1 AT E446528 T1 ATE446528 T1 AT E446528T1 AT 07109640 T AT07109640 T AT 07109640T AT 07109640 T AT07109640 T AT 07109640T AT E446528 T1 ATE446528 T1 AT E446528T1
Authority
AT
Austria
Prior art keywords
oscillation
optical
oscillator
projected parts
oscillation part
Prior art date
Application number
AT07109640T
Other languages
German (de)
English (en)
Inventor
Takahisa Kato
Yukio Furukawa
Takahiro Akiyama
Original Assignee
Canon Kk
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Canon Kk filed Critical Canon Kk
Application granted granted Critical
Publication of ATE446528T1 publication Critical patent/ATE446528T1/de

Links

Classifications

    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B26/00—Optical devices or arrangements for the control of light using movable or deformable optical elements
    • G02B26/08—Optical devices or arrangements for the control of light using movable or deformable optical elements for controlling the direction of light
    • G02B26/10—Scanning systems
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B81—MICROSTRUCTURAL TECHNOLOGY
    • B81B—MICROSTRUCTURAL DEVICES OR SYSTEMS, e.g. MICROMECHANICAL DEVICES
    • B81B3/00—Devices comprising flexible or deformable elements, e.g. comprising elastic tongues or membranes
    • B81B3/0064—Constitution or structural means for improving or controlling the physical properties of a device
    • B81B3/0067—Mechanical properties
    • B81B3/0078—Constitution or structural means for improving mechanical properties not provided for in B81B3/007 - B81B3/0075
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02083—Interferometers characterised by particular signal processing and presentation
    • G01B9/02084—Processing in the Fourier or frequency domain when not imaged in the frequency domain
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
    • G01L1/00—Measuring force or stress, in general
    • G01L1/24—Measuring force or stress, in general by measuring variations of optical properties of material when it is stressed, e.g. by photoelastic stress analysis using infrared, visible light, ultraviolet

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Mechanical Engineering (AREA)
  • Signal Processing (AREA)
  • Optics & Photonics (AREA)
  • Mathematical Physics (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Computer Hardware Design (AREA)
  • Mechanical Optical Scanning Systems (AREA)
  • Facsimile Scanning Arrangements (AREA)
  • Laser Beam Printer (AREA)
  • Micromachines (AREA)
  • Instruments For Measurement Of Length By Optical Means (AREA)
  • Measurement Of Mechanical Vibrations Or Ultrasonic Waves (AREA)
  • Exposure Or Original Feeding In Electrophotography (AREA)
  • Mechanical Light Control Or Optical Switches (AREA)
AT07109640T 2006-06-07 2007-06-05 Oszillator, optische ablenkeinheit und optisches instrument mit dieser ATE446528T1 (de)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2006158004 2006-06-07
JP2007065950 2007-03-15
JP2007130619A JP5121301B2 (ja) 2006-06-07 2007-05-16 揺動体装置、光偏向器、及びそれを用いた光学機器

Publications (1)

Publication Number Publication Date
ATE446528T1 true ATE446528T1 (de) 2009-11-15

Family

ID=39978264

Family Applications (1)

Application Number Title Priority Date Filing Date
AT07109640T ATE446528T1 (de) 2006-06-07 2007-06-05 Oszillator, optische ablenkeinheit und optisches instrument mit dieser

Country Status (4)

Country Link
JP (2) JP5121301B2 (enExample)
KR (1) KR101030847B1 (enExample)
AT (1) ATE446528T1 (enExample)
DE (2) DE602007002362D1 (enExample)

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP2330456A4 (en) * 2008-09-25 2012-04-11 Konica Minolta Opto Inc OPTICAL SCANNER
JP2010230792A (ja) * 2009-03-26 2010-10-14 Seiko Epson Corp 光学デバイス、光スキャナー及び画像形成装置
JP6060577B2 (ja) * 2012-09-13 2017-01-18 Jsr株式会社 ネガ型レジストパターン形成方法
JP5922603B2 (ja) * 2013-03-04 2016-05-24 日本電信電話株式会社 マイクロミラー素子およびマイクロミラーアレイ
JP5993509B2 (ja) * 2015-10-05 2016-09-14 京セラドキュメントソリューションズ株式会社 光走査装置及び該光走査装置を備えた画像形成装置、並びに、光走査装置の振動ミラー部の質量調整方法。
JP6959525B2 (ja) * 2017-12-21 2021-11-02 ミツミ電機株式会社 光走査装置
JP6651110B1 (ja) * 2019-05-28 2020-02-19 Ｄｏｌｐｈｉｎ株式会社 物体検出装置
JP2021060556A (ja) 2019-10-09 2021-04-15 パイオニア株式会社 光反射体
JP6890856B1 (ja) * 2020-03-04 2021-06-18 国立大学法人東北大学 全方位走査ミラー
CN113495335B (zh) * 2020-03-18 2023-08-25 扬明光学股份有限公司 光路调整机构及其制造方法
JP7695131B2 (ja) * 2021-07-13 2025-06-18 スタンレー電気株式会社 光走査装置、光走査装置の製造方法及び調整方法
DE102021212327A1 (de) * 2021-11-02 2023-05-04 Robert Bosch Gesellschaft mit beschränkter Haftung Verfahren und Einrichtung zum Ermitteln dynamischer Parameter einer MEMS-Vorrichtung, und MEMS-Vorrichtung

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0875475A (ja) * 1994-09-01 1996-03-22 Omron Corp 共振子、当該共振子を用いた光走査装置、視覚認識装置、振動センサ及び振動ジャイロ
EP1012890A1 (en) * 1997-04-01 2000-06-28 Xros, Inc. Adjusting operating characteristics of micromachined torsional oscillators
US6384406B1 (en) * 1999-08-05 2002-05-07 Microvision, Inc. Active tuning of a torsional resonant structure
JP4516673B2 (ja) * 2000-07-28 2010-08-04 シチズンファインテックミヨタ株式会社 プレーナ型ガルバノミラーの製造方法
JP4390174B2 (ja) * 2001-09-14 2009-12-24 株式会社リコー 光走査装置
JP2005521098A (ja) * 2002-03-26 2005-07-14 オプティスキャン ピーティーワイ リミテッド 光走査デバイス
JP2005181926A (ja) * 2003-12-24 2005-07-07 Canon Inc 光偏向器及びその製造方法、それを用いた光学機器
JP4027359B2 (ja) * 2003-12-25 2007-12-26 キヤノン株式会社 マイクロ揺動体、光偏向器、画像形成装置
JP2005326745A (ja) * 2004-05-17 2005-11-24 Canon Inc 光偏向装置およびその制御方法
JP2006178408A (ja) * 2004-11-25 2006-07-06 Ricoh Co Ltd スキャナ素子、光走査装置および画像形成装置
JP2006230048A (ja) * 2005-02-15 2006-08-31 Seiko Epson Corp アクチュエータの共振周波数の調整方法およびアクチュエータ
JP2006243034A (ja) * 2005-02-28 2006-09-14 Ricoh Co Ltd 光走査装置、および画像形成装置
JP4881073B2 (ja) * 2006-05-30 2012-02-22 キヤノン株式会社 光偏向器、及びそれを用いた光学機器

Also Published As

Publication number Publication date
KR101030847B1 (ko) 2011-04-22
DE602007002362D1 (de) 2009-10-22
JP2008254162A (ja) 2008-10-23
JP2012226359A (ja) 2012-11-15
KR20090015179A (ko) 2009-02-11
JP5400925B2 (ja) 2014-01-29
JP5121301B2 (ja) 2013-01-16
DE602007002846D1 (de) 2009-12-03

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Legal Events

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RER Ceased as to paragraph 5 lit. 3 law introducing patent treaties