ATE313807T1 - Bist verfahren zur prufung der grenzfrequenz eines tiefpassfilters - Google Patents

Bist verfahren zur prufung der grenzfrequenz eines tiefpassfilters

Info

Publication number
ATE313807T1
ATE313807T1 AT01975435T AT01975435T ATE313807T1 AT E313807 T1 ATE313807 T1 AT E313807T1 AT 01975435 T AT01975435 T AT 01975435T AT 01975435 T AT01975435 T AT 01975435T AT E313807 T1 ATE313807 T1 AT E313807T1
Authority
AT
Austria
Prior art keywords
cut
frequency
feedback loop
delay
oscillation
Prior art date
Application number
AT01975435T
Other languages
English (en)
Inventor
Hara Susuma
Hassan Ihs
Original Assignee
Intel Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Intel Corp filed Critical Intel Corp
Application granted granted Critical
Publication of ATE313807T1 publication Critical patent/ATE313807T1/de

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R23/00—Arrangements for measuring frequencies; Arrangements for analysing frequency spectra
    • G01R23/02—Arrangements for measuring frequency, e.g. pulse repetition rate; Arrangements for measuring period of current or voltage
    • G01R23/06—Arrangements for measuring frequency, e.g. pulse repetition rate; Arrangements for measuring period of current or voltage by converting frequency into an amplitude of current or voltage
    • G01R23/07—Arrangements for measuring frequency, e.g. pulse repetition rate; Arrangements for measuring period of current or voltage by converting frequency into an amplitude of current or voltage using response of circuits tuned on resonance, e.g. grid-drip meter

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
  • Separation Using Semi-Permeable Membranes (AREA)
  • Piezo-Electric Or Mechanical Vibrators, Or Delay Or Filter Circuits (AREA)
  • Logic Circuits (AREA)
  • Networks Using Active Elements (AREA)
  • Filters And Equalizers (AREA)
  • Manipulation Of Pulses (AREA)
AT01975435T 2000-09-26 2001-09-25 Bist verfahren zur prufung der grenzfrequenz eines tiefpassfilters ATE313807T1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US09/670,306 US6448754B1 (en) 2000-09-26 2000-09-26 BIST method for testing cut-off frequency of low-pass filters
PCT/US2001/030158 WO2002027336A2 (en) 2000-09-26 2001-09-25 Bist method for testing cut-off frequency of low-pass filters

Publications (1)

Publication Number Publication Date
ATE313807T1 true ATE313807T1 (de) 2006-01-15

Family

ID=24689874

Family Applications (1)

Application Number Title Priority Date Filing Date
AT01975435T ATE313807T1 (de) 2000-09-26 2001-09-25 Bist verfahren zur prufung der grenzfrequenz eines tiefpassfilters

Country Status (9)

Country Link
US (1) US6448754B1 (de)
EP (1) EP1330658B1 (de)
CN (1) CN1252483C (de)
AT (1) ATE313807T1 (de)
AU (1) AU2001294761A1 (de)
DE (1) DE60116134T2 (de)
HK (1) HK1054791A1 (de)
TW (1) TW515900B (de)
WO (1) WO2002027336A2 (de)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6777921B2 (en) * 2002-01-30 2004-08-17 Intel Corporation Analog filter with built-in self test
US7409621B2 (en) 2002-12-26 2008-08-05 Intel Corporation On-chip jitter testing
US20060029671A1 (en) * 2004-08-06 2006-02-09 Grain Processing Corporation Tablet coating composition
US7378833B2 (en) * 2005-09-30 2008-05-27 Intel Corporation Supply voltage characteristic measurement
US7573326B2 (en) * 2005-12-30 2009-08-11 Intel Corporation Forwarded clock filtering
US20100121596A1 (en) * 2008-11-12 2010-05-13 Honeywell International Inc. Methods and systems for frequency estimation for accelerometers
CN104049142B (zh) * 2013-03-14 2018-11-09 爱德万测试公司 用于rf频率／功率测量的ate数字通道
US9297853B2 (en) 2013-06-18 2016-03-29 Globalfoundries Inc. In-line measurement of transistor device cut-off frequency
CN103529295B (zh) * 2013-10-25 2015-11-25 佟晓白 一种基于滤波和采样计算谐波幅值的采样频率确定方法
CN110401431B (zh) * 2019-07-18 2020-11-10 江苏康众数字医疗科技股份有限公司 一种频率跟随数字离散滤波器、实现方法及其应用

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3961255A (en) * 1974-08-15 1976-06-01 Hekimian Laboratories, Inc. Measurement bandwidth enhancement in phase lock loops
EP0487874B1 (de) * 1990-11-30 2000-07-26 Yokogawa Electric Corporation Signalgestalter
US5475315A (en) * 1991-09-20 1995-12-12 Audio Precision, Inc. Method and apparatus for fast response and distortion measurement
US5625317A (en) * 1994-08-08 1997-04-29 Texas Instruments Incorporated Tuning method for integrated continuous-time filters
US5621408A (en) * 1995-02-24 1997-04-15 Lecroy Corporation Delta sigma analog-to-digital converter with temporally interleaved architecture
US5555452A (en) * 1995-05-12 1996-09-10 Callaway, Jr.; Edgar H. Peak and valley signal measuring circuit using single digital-to-analog converter
JP3114680B2 (ja) * 1997-12-15 2000-12-04 日本電気株式会社 アクティブフィルタ

Also Published As

Publication number Publication date
EP1330658A2 (de) 2003-07-30
CN1252483C (zh) 2006-04-19
TW515900B (en) 2003-01-01
DE60116134D1 (de) 2006-01-26
WO2002027336A2 (en) 2002-04-04
WO2002027336A3 (en) 2003-05-01
AU2001294761A1 (en) 2002-04-08
CN1466688A (zh) 2004-01-07
US6448754B1 (en) 2002-09-10
HK1054791A1 (en) 2003-12-12
EP1330658B1 (de) 2005-12-21
DE60116134T2 (de) 2006-07-27

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Legal Events

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