AU2001294761A1 - Bist method for testing cut-off frequency of low-pass filters - Google Patents

Bist method for testing cut-off frequency of low-pass filters

Info

Publication number
AU2001294761A1
AU2001294761A1 AU2001294761A AU9476101A AU2001294761A1 AU 2001294761 A1 AU2001294761 A1 AU 2001294761A1 AU 2001294761 A AU2001294761 A AU 2001294761A AU 9476101 A AU9476101 A AU 9476101A AU 2001294761 A1 AU2001294761 A1 AU 2001294761A1
Authority
AU
Australia
Prior art keywords
frequency
cut
feedback loop
delay
oscillation
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
AU2001294761A
Inventor
Hassan Ihs
Hara Susuma
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Intel Corp
Original Assignee
Intel Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Intel Corp filed Critical Intel Corp
Publication of AU2001294761A1 publication Critical patent/AU2001294761A1/en
Abandoned legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R23/00—Arrangements for measuring frequencies; Arrangements for analysing frequency spectra
    • G01R23/02—Arrangements for measuring frequency, e.g. pulse repetition rate; Arrangements for measuring period of current or voltage
    • G01R23/06—Arrangements for measuring frequency, e.g. pulse repetition rate; Arrangements for measuring period of current or voltage by converting frequency into an amplitude of current or voltage
    • G01R23/07—Arrangements for measuring frequency, e.g. pulse repetition rate; Arrangements for measuring period of current or voltage by converting frequency into an amplitude of current or voltage using response of circuits tuned on resonance, e.g. grid-drip meter

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Separation Using Semi-Permeable Membranes (AREA)
  • Piezo-Electric Or Mechanical Vibrators, Or Delay Or Filter Circuits (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
  • Manipulation Of Pulses (AREA)
  • Logic Circuits (AREA)
  • Networks Using Active Elements (AREA)
  • Filters And Equalizers (AREA)

Abstract

A method and circuitry for implementing a built-in self test (BIST) for determining the frequency characteristics of filter circuits in mixed-signal integrated circuits (ICs). The method comprises inserting a Circuit Under Test (CUT) into a feedback loop that looks like a sigma delta modulation loop and adjust the feedback loop so that it oscillates at the cut-off frequency of the filter. The frequency of oscillation can then easily be measured using either on on-chip counter or digital automated testing equipment. The feedback loop preferably comprises a comparator, a phase-delay component, such as a delay-line, and a one-bit DAC (digital-to-analog converter), wherein the comparator is connected to the output of the CUT, and the output of the one-bit DAC is connected to the input of the CUT. The phase delay of the feedback loop can be tuned through adjustment of the delay-line (e.g., an n-length shift register) until an oscillation frequency is obtained. In the case of low-pass filters circuits, the tuned frequency of oscillation corresponds to the cut-off frequency of the CUT.
AU2001294761A 2000-09-26 2001-09-25 Bist method for testing cut-off frequency of low-pass filters Abandoned AU2001294761A1 (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US09/670,306 2000-09-26
US09/670,306 US6448754B1 (en) 2000-09-26 2000-09-26 BIST method for testing cut-off frequency of low-pass filters
PCT/US2001/030158 WO2002027336A2 (en) 2000-09-26 2001-09-25 Bist method for testing cut-off frequency of low-pass filters

Publications (1)

Publication Number Publication Date
AU2001294761A1 true AU2001294761A1 (en) 2002-04-08

Family

ID=24689874

Family Applications (1)

Application Number Title Priority Date Filing Date
AU2001294761A Abandoned AU2001294761A1 (en) 2000-09-26 2001-09-25 Bist method for testing cut-off frequency of low-pass filters

Country Status (9)

Country Link
US (1) US6448754B1 (en)
EP (1) EP1330658B1 (en)
CN (1) CN1252483C (en)
AT (1) ATE313807T1 (en)
AU (1) AU2001294761A1 (en)
DE (1) DE60116134T2 (en)
HK (1) HK1054791A1 (en)
TW (1) TW515900B (en)
WO (1) WO2002027336A2 (en)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6777921B2 (en) * 2002-01-30 2004-08-17 Intel Corporation Analog filter with built-in self test
US7409621B2 (en) 2002-12-26 2008-08-05 Intel Corporation On-chip jitter testing
US20060029671A1 (en) * 2004-08-06 2006-02-09 Grain Processing Corporation Tablet coating composition
US7378833B2 (en) * 2005-09-30 2008-05-27 Intel Corporation Supply voltage characteristic measurement
US7573326B2 (en) * 2005-12-30 2009-08-11 Intel Corporation Forwarded clock filtering
US20100121596A1 (en) * 2008-11-12 2010-05-13 Honeywell International Inc. Methods and systems for frequency estimation for accelerometers
CN104049142B (en) * 2013-03-14 2018-11-09 爱德万测试公司 ATE digital channels for RF frequency/power measurement
US9297853B2 (en) 2013-06-18 2016-03-29 Globalfoundries Inc. In-line measurement of transistor device cut-off frequency
CN103529295B (en) * 2013-10-25 2015-11-25 佟晓白 A kind of sample frequency defining method calculating harmonic amplitude based on filtering and sampling
CN110401431B (en) * 2019-07-18 2020-11-10 江苏康众数字医疗科技股份有限公司 Frequency following digital discrete filter, implementation method and application thereof

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3961255A (en) * 1974-08-15 1976-06-01 Hekimian Laboratories, Inc. Measurement bandwidth enhancement in phase lock loops
SG43345A1 (en) * 1990-11-30 1997-10-17 Yokogawa Electric Corp Signal conditioner
US5475315A (en) * 1991-09-20 1995-12-12 Audio Precision, Inc. Method and apparatus for fast response and distortion measurement
US5625317A (en) * 1994-08-08 1997-04-29 Texas Instruments Incorporated Tuning method for integrated continuous-time filters
US5621408A (en) * 1995-02-24 1997-04-15 Lecroy Corporation Delta sigma analog-to-digital converter with temporally interleaved architecture
US5555452A (en) * 1995-05-12 1996-09-10 Callaway, Jr.; Edgar H. Peak and valley signal measuring circuit using single digital-to-analog converter
JP3114680B2 (en) * 1997-12-15 2000-12-04 日本電気株式会社 Active filter

Also Published As

Publication number Publication date
ATE313807T1 (en) 2006-01-15
TW515900B (en) 2003-01-01
HK1054791A1 (en) 2003-12-12
EP1330658A2 (en) 2003-07-30
EP1330658B1 (en) 2005-12-21
WO2002027336A3 (en) 2003-05-01
DE60116134D1 (en) 2006-01-26
WO2002027336A2 (en) 2002-04-04
CN1252483C (en) 2006-04-19
DE60116134T2 (en) 2006-07-27
CN1466688A (en) 2004-01-07
US6448754B1 (en) 2002-09-10

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