ATE212733T1 - Vibrationsstabilisator für emissionsmikroskop - Google Patents

Vibrationsstabilisator für emissionsmikroskop

Info

Publication number
ATE212733T1
ATE212733T1 AT97922535T AT97922535T ATE212733T1 AT E212733 T1 ATE212733 T1 AT E212733T1 AT 97922535 T AT97922535 T AT 97922535T AT 97922535 T AT97922535 T AT 97922535T AT E212733 T1 ATE212733 T1 AT E212733T1
Authority
AT
Austria
Prior art keywords
chip
microscope
camera
rubber boot
cylinder
Prior art date
Application number
AT97922535T
Other languages
English (en)
Inventor
James Barry Colvin
Original Assignee
Alpha Innotech Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Alpha Innotech Corp filed Critical Alpha Innotech Corp
Application granted granted Critical
Publication of ATE212733T1 publication Critical patent/ATE212733T1/de

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/302—Contactless testing
    • G01R31/305—Contactless testing using electron beams
    • G01R31/307—Contactless testing using electron beams of integrated circuits
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/0016—Technical microscopes, e.g. for inspection or measuring in industrial production processes
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
    • G02B27/64—Imaging systems using optical elements for stabilisation of the lateral and angular position of the image
AT97922535T 1996-04-26 1997-04-28 Vibrationsstabilisator für emissionsmikroskop ATE212733T1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US08/638,638 US5764409A (en) 1996-04-26 1996-04-26 Elimination of vibration by vibration coupling in microscopy applications
PCT/US1997/007169 WO1997041479A1 (en) 1996-04-26 1997-04-28 Anti-vibration stabilizer for a portable emission microscope

Publications (1)

Publication Number Publication Date
ATE212733T1 true ATE212733T1 (de) 2002-02-15

Family

ID=24560847

Family Applications (1)

Application Number Title Priority Date Filing Date
AT97922535T ATE212733T1 (de) 1996-04-26 1997-04-28 Vibrationsstabilisator für emissionsmikroskop

Country Status (7)

Country Link
US (1) US5764409A (de)
EP (1) EP0895607B1 (de)
JP (1) JP2000510606A (de)
AT (1) ATE212733T1 (de)
AU (1) AU2817997A (de)
DE (1) DE69710185T2 (de)
WO (1) WO1997041479A1 (de)

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US6134365A (en) * 1998-06-01 2000-10-17 Colvin; James Barry Coherent illumination system and method
US6112004A (en) * 1998-06-01 2000-08-29 Colvin; James Barry Emission microscopy system and method
CA2243090A1 (en) 1998-07-10 2000-01-10 Timothy M. Richardson Inverted darkfield contrast microscope and method
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US6731327B1 (en) 1999-02-12 2004-05-04 Hypervision, Inc. Dynamic structural coupling mechanism for reducing optical degradation in vibrating environments
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FR2833718A1 (fr) * 2001-12-13 2003-06-20 Commissariat Energie Atomique Dispositif d'observation d'objets, notamment pour plaques de microtitration
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US7759949B2 (en) * 2004-05-21 2010-07-20 Microprobe, Inc. Probes with self-cleaning blunt skates for contacting conductive pads
US9097740B2 (en) * 2004-05-21 2015-08-04 Formfactor, Inc. Layered probes with core
US7733101B2 (en) * 2004-05-21 2010-06-08 Microprobe, Inc. Knee probe having increased scrub motion
US9476911B2 (en) 2004-05-21 2016-10-25 Microprobe, Inc. Probes with high current carrying capability and laser machining methods
US7659739B2 (en) * 2006-09-14 2010-02-09 Micro Porbe, Inc. Knee probe having reduced thickness section for control of scrub motion
USRE43503E1 (en) 2006-06-29 2012-07-10 Microprobe, Inc. Probe skates for electrical testing of convex pad topologies
JP4624725B2 (ja) * 2004-05-28 2011-02-02 オリンパス株式会社 顕微鏡観察システムおよび顕微鏡観察方法
DE102005018239B3 (de) * 2005-04-19 2006-10-12 Carl Mahr Holding Gmbh Optische Messeinrichtung mit reduzierter Schwingungsempfindlichkeit
US7649367B2 (en) * 2005-12-07 2010-01-19 Microprobe, Inc. Low profile probe having improved mechanical scrub and reduced contact inductance
US7312617B2 (en) 2006-03-20 2007-12-25 Microprobe, Inc. Space transformers employing wire bonds for interconnections with fine pitch contacts
JP5530051B2 (ja) * 2006-08-25 2014-06-25 オリンパス株式会社 対物レンズ用ガイド装置および対物レンズユニット
JP4932384B2 (ja) 2006-08-25 2012-05-16 オリンパス株式会社 生体観察装置
US7786740B2 (en) * 2006-10-11 2010-08-31 Astria Semiconductor Holdings, Inc. Probe cards employing probes having retaining portions for potting in a potting region
US8907689B2 (en) 2006-10-11 2014-12-09 Microprobe, Inc. Probe retention arrangement
CN101201371B (zh) * 2006-12-15 2011-12-21 鸿富锦精密工业（深圳）有限公司 印刷电路检测装置和方法
US7514948B2 (en) 2007-04-10 2009-04-07 Microprobe, Inc. Vertical probe array arranged to provide space transformation
US8444124B2 (en) * 2007-08-15 2013-05-21 Honda Motor Co., Ltd. Engine natural vibration frequency detection method, active vibration isolation support device control method, engine natural vibration frequency detection apparatus, active vibration isolation support device control apparatus, active vibration isolation support device, and vibration frequency detection apparatus for vibrating body
US7671610B2 (en) * 2007-10-19 2010-03-02 Microprobe, Inc. Vertical guided probe array providing sideways scrub motion
US8723546B2 (en) * 2007-10-19 2014-05-13 Microprobe, Inc. Vertical guided layered probe
US8230593B2 (en) * 2008-05-29 2012-07-31 Microprobe, Inc. Probe bonding method having improved control of bonding material
US8073019B2 (en) * 2009-03-02 2011-12-06 Jian Liu 810 nm ultra-short pulsed fiber laser
CN102436062B (zh) * 2010-09-29 2015-08-05 鸿富锦精密工业（深圳）有限公司 显微镜装置
TWI494596B (zh) * 2013-08-21 2015-08-01 Miruc Optical Co Ltd 顯微鏡用可攜式終端轉接器和使用可攜式終端轉接器的顯微鏡拍攝方法
CN104076500A (zh) * 2014-06-27 2014-10-01 苏州科德溯源仪器有限公司 一种显微镜用快捷调焦装置
WO2017087381A1 (en) * 2015-11-17 2017-05-26 The Research Institute At Nationwide Children's Hospital Portable image diagnostic apparatus and system
US10191108B2 (en) * 2015-11-19 2019-01-29 Globalfoundries Inc. On-chip sensor for monitoring active circuits on integrated circuit (IC) chips
JP6546672B1 (ja) * 2018-02-22 2019-07-17 陽程科技股▲ふん▼有限公司 光路検出装置の検出方法
US11125815B2 (en) * 2019-09-27 2021-09-21 Advanced Micro Devices, Inc. Electro-optic waveform analysis process
CN111722409B (zh) * 2020-07-14 2022-06-14 东南大学 一种超长焦镜头与工业相机稳定连接辅助装置

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US4811090A (en) * 1988-01-04 1989-03-07 Hypervision Image emission microscope with improved image processing capability
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Also Published As

Publication number Publication date
DE69710185D1 (de) 2002-03-14
WO1997041479A1 (en) 1997-11-06
EP0895607B1 (de) 2002-01-30
US5764409A (en) 1998-06-09
AU2817997A (en) 1997-11-19
EP0895607A1 (de) 1999-02-10
DE69710185T2 (de) 2002-06-27
JP2000510606A (ja) 2000-08-15

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