ATE137595T1 - Mit integrierten schaltungen versehene prüfvorrichtung für eine gedruckte schaltung und anwendung dieser vorrichtung zum prüfen einer solchen gedruckten schaltung - Google Patents

Mit integrierten schaltungen versehene prüfvorrichtung für eine gedruckte schaltung und anwendung dieser vorrichtung zum prüfen einer solchen gedruckten schaltung

Info

Publication number
ATE137595T1
ATE137595T1 AT91104175T AT91104175T ATE137595T1 AT E137595 T1 ATE137595 T1 AT E137595T1 AT 91104175 T AT91104175 T AT 91104175T AT 91104175 T AT91104175 T AT 91104175T AT E137595 T1 ATE137595 T1 AT E137595T1
Authority
AT
Austria
Prior art keywords
test
printed circuit
cell
testing
tracks
Prior art date
Application number
AT91104175T
Other languages
English (en)
Inventor
Dominique Castel
Original Assignee
Alcatel Mobile Comm France
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Alcatel Mobile Comm France filed Critical Alcatel Mobile Comm France
Application granted granted Critical
Publication of ATE137595T1 publication Critical patent/ATE137595T1/de

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/2205—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested
    • G06F11/2236—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested to test CPU or processors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/2806—Apparatus therefor, e.g. test stations, drivers, analysers, conveyors
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
    • G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
    • G11C29/18—Address generation devices; Devices for accessing memories, e.g. details of addressing circuits
    • G11C29/24—Accessing extra cells, e.g. dummy cells or redundant cells

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Quality & Reliability (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Nitrogen And Oxygen Or Sulfur-Condensed Heterocyclic Ring Systems (AREA)
  • Transition And Organic Metals Composition Catalysts For Addition Polymerization (AREA)
  • Measuring Or Testing Involving Enzymes Or Micro-Organisms (AREA)
  • Transmitters (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
  • Monitoring And Testing Of Exchanges (AREA)
AT91104175T 1990-03-23 1991-03-18 Mit integrierten schaltungen versehene prüfvorrichtung für eine gedruckte schaltung und anwendung dieser vorrichtung zum prüfen einer solchen gedruckten schaltung ATE137595T1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR9003754A FR2660071B1 (fr) 1990-03-23 1990-03-23 Systeme de test d'un circuit imprime pourvu de circuits integres et application de ce systeme au test d'un tel circuit imprime.

Publications (1)

Publication Number Publication Date
ATE137595T1 true ATE137595T1 (de) 1996-05-15

Family

ID=9395057

Family Applications (1)

Application Number Title Priority Date Filing Date
AT91104175T ATE137595T1 (de) 1990-03-23 1991-03-18 Mit integrierten schaltungen versehene prüfvorrichtung für eine gedruckte schaltung und anwendung dieser vorrichtung zum prüfen einer solchen gedruckten schaltung

Country Status (9)

Country Link
EP (1) EP0453758B1 (de)
AT (1) ATE137595T1 (de)
DE (1) DE69119140T2 (de)
DK (1) DK0453758T3 (de)
ES (1) ES2087922T3 (de)
FI (1) FI911366A (de)
FR (1) FR2660071B1 (de)
GR (1) GR3020493T3 (de)
NO (1) NO302446B1 (de)

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
AU8963582A (en) * 1981-10-30 1983-05-05 Honeywell Information Systems Incorp. Design and testing electronic components
JPS62220879A (ja) * 1986-03-22 1987-09-29 Hitachi Ltd 半導体装置
JPH01259274A (ja) * 1988-04-08 1989-10-16 Fujitsu Ltd 集積回路の試験方式
DE3839289C1 (en) * 1988-11-21 1990-05-23 Fraunhofer-Gesellschaft Zur Foerderung Der Angewandten Forschung Ev, 8000 Muenchen, De Circuit for the operation of an integrated circuit of which it is a component, optionally in a test operation mode or a functional operation mode

Also Published As

Publication number Publication date
DK0453758T3 (da) 1996-08-12
DE69119140T2 (de) 1996-08-14
DE69119140D1 (de) 1996-06-05
FI911366A0 (fi) 1991-03-20
NO911131D0 (no) 1991-03-21
FR2660071A1 (fr) 1991-09-27
ES2087922T3 (es) 1996-08-01
NO302446B1 (no) 1998-03-02
EP0453758A1 (de) 1991-10-30
FI911366A (fi) 1991-09-24
GR3020493T3 (en) 1996-10-31
FR2660071B1 (fr) 1992-07-24
EP0453758B1 (de) 1996-05-01
NO911131L (no) 1991-09-24

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Legal Events

Date Code Title Description
UEP Publication of translation of european patent specification
REN Ceased due to non-payment of the annual fee