NO911131D0 - System for proeving av kretskort beregnet for integrerte kretser og anvendelse av dette system for proeving av et saadant kretskort. - Google Patents

System for proeving av kretskort beregnet for integrerte kretser og anvendelse av dette system for proeving av et saadant kretskort.

Info

Publication number
NO911131D0
NO911131D0 NO911131A NO911131A NO911131D0 NO 911131 D0 NO911131 D0 NO 911131D0 NO 911131 A NO911131 A NO 911131A NO 911131 A NO911131 A NO 911131A NO 911131 D0 NO911131 D0 NO 911131D0
Authority
NO
Norway
Prior art keywords
test
cell
test system
circuit test
tracks
Prior art date
Application number
NO911131A
Other languages
English (en)
Other versions
NO302446B1 (no
NO911131L (no
Inventor
Dominique Castel
Original Assignee
Alcatel Radiotelephone
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Alcatel Radiotelephone filed Critical Alcatel Radiotelephone
Publication of NO911131D0 publication Critical patent/NO911131D0/no
Publication of NO911131L publication Critical patent/NO911131L/no
Publication of NO302446B1 publication Critical patent/NO302446B1/no

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/2205—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested
    • G06F11/2236—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested to test CPU or processors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/2806—Apparatus therefor, e.g. test stations, drivers, analysers, conveyors
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
    • G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
    • G11C29/18—Address generation devices; Devices for accessing memories, e.g. details of addressing circuits
    • G11C29/24—Accessing extra cells, e.g. dummy cells or redundant cells

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Quality & Reliability (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Nitrogen And Oxygen Or Sulfur-Condensed Heterocyclic Ring Systems (AREA)
  • Transition And Organic Metals Composition Catalysts For Addition Polymerization (AREA)
  • Measuring Or Testing Involving Enzymes Or Micro-Organisms (AREA)
  • Transmitters (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
  • Monitoring And Testing Of Exchanges (AREA)
NO911131A 1990-03-23 1991-03-21 Anordning for utprövning av trykte kretskort og anvendelse av denne NO302446B1 (no)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR9003754A FR2660071B1 (fr) 1990-03-23 1990-03-23 Systeme de test d'un circuit imprime pourvu de circuits integres et application de ce systeme au test d'un tel circuit imprime.

Publications (3)

Publication Number Publication Date
NO911131D0 true NO911131D0 (no) 1991-03-21
NO911131L NO911131L (no) 1991-09-24
NO302446B1 NO302446B1 (no) 1998-03-02

Family

ID=9395057

Family Applications (1)

Application Number Title Priority Date Filing Date
NO911131A NO302446B1 (no) 1990-03-23 1991-03-21 Anordning for utprövning av trykte kretskort og anvendelse av denne

Country Status (9)

Country Link
EP (1) EP0453758B1 (no)
AT (1) ATE137595T1 (no)
DE (1) DE69119140T2 (no)
DK (1) DK0453758T3 (no)
ES (1) ES2087922T3 (no)
FI (1) FI911366A (no)
FR (1) FR2660071B1 (no)
GR (1) GR3020493T3 (no)
NO (1) NO302446B1 (no)

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
AU8963582A (en) * 1981-10-30 1983-05-05 Honeywell Information Systems Incorp. Design and testing electronic components
JPS62220879A (ja) * 1986-03-22 1987-09-29 Hitachi Ltd 半導体装置
JPH01259274A (ja) * 1988-04-08 1989-10-16 Fujitsu Ltd 集積回路の試験方式
DE3839289C1 (en) * 1988-11-21 1990-05-23 Fraunhofer-Gesellschaft Zur Foerderung Der Angewandten Forschung Ev, 8000 Muenchen, De Circuit for the operation of an integrated circuit of which it is a component, optionally in a test operation mode or a functional operation mode

Also Published As

Publication number Publication date
DK0453758T3 (da) 1996-08-12
DE69119140T2 (de) 1996-08-14
DE69119140D1 (de) 1996-06-05
FI911366A0 (fi) 1991-03-20
FR2660071A1 (fr) 1991-09-27
ES2087922T3 (es) 1996-08-01
NO302446B1 (no) 1998-03-02
EP0453758A1 (fr) 1991-10-30
FI911366A (fi) 1991-09-24
ATE137595T1 (de) 1996-05-15
GR3020493T3 (en) 1996-10-31
FR2660071B1 (fr) 1992-07-24
EP0453758B1 (fr) 1996-05-01
NO911131L (no) 1991-09-24

Similar Documents

Publication Publication Date Title
SE8703460D0 (sv) Undersokning av integrerade kretsar anordnade pa en berare
GB2281403B (en) Detecting faults on a printed circuit board
EP0154048A3 (en) Circuit for generating test signals for in-circuit digital testing
ATE67861T1 (de) Schaltungsanordnung zum pruefen integrierter schaltungseinheiten.
ATE183012T1 (de) Informationsverarbeitungsgerät mit multisondensteuerung
AU5790590A (en) Printed circuit board test system and application thereof to testing printed circuit boards forming digital signal multiplex-demultiplex equipment
ATE149070T1 (de) Verfahren und schaltungsanordnung zum ermitteln der güte von über eine atm- vermittlungseinrichtung verlaufenden virtuellen verbindungen
DE69429741T2 (de) Analoge, selbstständige Prüfbusstruktur zum Testen integrierter Schaltungen auf einer gedruckten Leiterplatte
EP0604032A3 (en) Scan testing of integrated circuits.
DE69724742D1 (de) Speicherfeldprüfschaltung mit Fehlermeldung
ES8609738A1 (es) Una instalacion para comprobar circuitos electronicos fun- cionales
NO911131D0 (no) System for proeving av kretskort beregnet for integrerte kretser og anvendelse av dette system for proeving av et saadant kretskort.
DE69021105D1 (de) Verfahren und Gerät zur Prüfung von integrierten Schaltungen mit hoher Geschwindigkeit.
EP0514700A3 (no)
ATE156945T1 (de) Schaltkreis zum schalten der leseköpfe eines videorecorders
EP0382360A3 (en) Event qualified testing architecture for integrated circuits
JPS5727041A (en) Large-scale integrated circuit having testing function
DE68919557D1 (de) Integrierte Halbleiterschaltung mit Ausgangspuffer.
GB2268277B (en) Improvements in or relating to electronic circuit test apparatus
MIRONOVSKII Dynamic inspection of simulation circuits(for analog computer tests)
JPS5688148A (en) Operation checking method of recorder
Peacock Route to compliance via EMC testing
ATE137305T1 (de) Vorrichtung zum prüfen einer zündanlage
JPS57111474A (en) Test system for memory printed board
EP0493013A3 (en) Semiconductor integrated circuit having test circuit