NO911131D0 - CIRCUIT TEST SYSTEM INTENDED FOR INTEGRATED CIRCUITS AND USE OF THIS CIRCUIT TEST SYSTEM. - Google Patents

CIRCUIT TEST SYSTEM INTENDED FOR INTEGRATED CIRCUITS AND USE OF THIS CIRCUIT TEST SYSTEM.

Info

Publication number
NO911131D0
NO911131D0 NO911131A NO911131A NO911131D0 NO 911131 D0 NO911131 D0 NO 911131D0 NO 911131 A NO911131 A NO 911131A NO 911131 A NO911131 A NO 911131A NO 911131 D0 NO911131 D0 NO 911131D0
Authority
NO
Norway
Prior art keywords
test
cell
test system
circuit test
tracks
Prior art date
Application number
NO911131A
Other languages
Norwegian (no)
Other versions
NO302446B1 (en
NO911131L (en
Inventor
Dominique Castel
Original Assignee
Alcatel Radiotelephone
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Alcatel Radiotelephone filed Critical Alcatel Radiotelephone
Publication of NO911131D0 publication Critical patent/NO911131D0/en
Publication of NO911131L publication Critical patent/NO911131L/en
Publication of NO302446B1 publication Critical patent/NO302446B1/en

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/2205—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested
    • G06F11/2236—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested to test CPU or processors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/2806—Apparatus therefor, e.g. test stations, drivers, analysers, conveyors
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
    • G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
    • G11C29/18—Address generation devices; Devices for accessing memories, e.g. details of addressing circuits
    • G11C29/24—Accessing extra cells, e.g. dummy cells or redundant cells

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Quality & Reliability (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Nitrogen And Oxygen Or Sulfur-Condensed Heterocyclic Ring Systems (AREA)
  • Transition And Organic Metals Composition Catalysts For Addition Polymerization (AREA)
  • Measuring Or Testing Involving Enzymes Or Micro-Organisms (AREA)
  • Monitoring And Testing Of Exchanges (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Transmitters (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)

Abstract

The system consists of test equipment fitted with a connecting unit and an integrated circuit incorporating at least one functional cell (1) and a test cell. The printed circuit comprises functional tracks (7, 8) and test tracks giving access respectively to the functional cell and the test cell. This test cell incorporates means for connecting an input and an output of the functional cell. The test tracks are suitable for an integrated circuit and the connecting unit giving access to each of the printed circuit tracks. The test cell also includes means for putting all the outputs from the functional cell to a high impedance state in response to a neutralising signal derived from the state of the test track. The system enables a printed circuit to be tested by the injection of signals through the connecting unit. <IMAGE>
NO911131A 1990-03-23 1991-03-21 Apparatus for testing printed circuit boards and their use NO302446B1 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR9003754A FR2660071B1 (en) 1990-03-23 1990-03-23 SYSTEM FOR TESTING A PRINTED CIRCUIT PROVIDED WITH INTEGRATED CIRCUITS AND APPLICATION OF THIS SYSTEM TO TESTING SUCH A PRINTED CIRCUIT.

Publications (3)

Publication Number Publication Date
NO911131D0 true NO911131D0 (en) 1991-03-21
NO911131L NO911131L (en) 1991-09-24
NO302446B1 NO302446B1 (en) 1998-03-02

Family

ID=9395057

Family Applications (1)

Application Number Title Priority Date Filing Date
NO911131A NO302446B1 (en) 1990-03-23 1991-03-21 Apparatus for testing printed circuit boards and their use

Country Status (9)

Country Link
EP (1) EP0453758B1 (en)
AT (1) ATE137595T1 (en)
DE (1) DE69119140T2 (en)
DK (1) DK0453758T3 (en)
ES (1) ES2087922T3 (en)
FI (1) FI911366A (en)
FR (1) FR2660071B1 (en)
GR (1) GR3020493T3 (en)
NO (1) NO302446B1 (en)

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
AU8963582A (en) * 1981-10-30 1983-05-05 Honeywell Information Systems Incorp. Design and testing electronic components
JPS62220879A (en) * 1986-03-22 1987-09-29 Hitachi Ltd Semiconductor device
JPH01259274A (en) * 1988-04-08 1989-10-16 Fujitsu Ltd Test system for integrated circuit
DE3839289C1 (en) * 1988-11-21 1990-05-23 Fraunhofer-Gesellschaft Zur Foerderung Der Angewandten Forschung Ev, 8000 Muenchen, De Circuit for the operation of an integrated circuit of which it is a component, optionally in a test operation mode or a functional operation mode

Also Published As

Publication number Publication date
FI911366A (en) 1991-09-24
FR2660071B1 (en) 1992-07-24
NO302446B1 (en) 1998-03-02
DK0453758T3 (en) 1996-08-12
DE69119140D1 (en) 1996-06-05
ES2087922T3 (en) 1996-08-01
NO911131L (en) 1991-09-24
FI911366A0 (en) 1991-03-20
GR3020493T3 (en) 1996-10-31
EP0453758A1 (en) 1991-10-30
ATE137595T1 (en) 1996-05-15
DE69119140T2 (en) 1996-08-14
EP0453758B1 (en) 1996-05-01
FR2660071A1 (en) 1991-09-27

Similar Documents

Publication Publication Date Title
SE8703460L (en) INVESTIGATION OF INTEGRATED CIRCUITS PROVIDED ON A BEARER
GB2281403B (en) Detecting faults on a printed circuit board
EP0154048A3 (en) Circuit for generating test signals for in-circuit digital testing
AU5790590A (en) Printed circuit board test system and application thereof to testing printed circuit boards forming digital signal multiplex-demultiplex equipment
DE69429741D1 (en) Analog, independent test bus structure for testing integrated circuits on a printed circuit board
EP0604032A3 (en) Scan testing of integrated circuits.
TW360791B (en) Memory array test circuit and method
ES8609738A1 (en) System for testing functional electronic circuits.
NO911131D0 (en) CIRCUIT TEST SYSTEM INTENDED FOR INTEGRATED CIRCUITS AND USE OF THIS CIRCUIT TEST SYSTEM.
DE69021105T2 (en) Method and device for testing integrated circuits at high speed.
ATE156945T1 (en) CIRCUIT FOR SWITCHING THE READING HEADS OF A VIDEO RECORDER
JPS5727041A (en) Large-scale integrated circuit having testing function
DE68919557D1 (en) Integrated semiconductor circuit with output buffer.
GB2268277B (en) Improvements in or relating to electronic circuit test apparatus
MIRONOVSKII Dynamic inspection of simulation circuits(for analog computer tests)
DE69120921D1 (en) Integrated semiconductor circuit with test circuit
JPS5688148A (en) Operation checking method of recorder
Peacock Route to compliance via EMC testing
ATE137305T1 (en) DEVICE FOR TESTING AN IGNITION SYSTEM
JPS57140074A (en) Image pickup device
JPS5661664A (en) Testing device for operation of electronic circuit