DK0453758T3 - System containing integrated circuits for testing printed circuits and using this system for testing such a printed circuit - Google Patents

System containing integrated circuits for testing printed circuits and using this system for testing such a printed circuit

Info

Publication number
DK0453758T3
DK0453758T3 DK91104175.4T DK91104175T DK0453758T3 DK 0453758 T3 DK0453758 T3 DK 0453758T3 DK 91104175 T DK91104175 T DK 91104175T DK 0453758 T3 DK0453758 T3 DK 0453758T3
Authority
DK
Denmark
Prior art keywords
test
cell
testing
printed circuit
tracks
Prior art date
Application number
DK91104175.4T
Other languages
Danish (da)
Inventor
Dominique Castel
Original Assignee
Alcatel Mobile Comm France
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Alcatel Mobile Comm France filed Critical Alcatel Mobile Comm France
Application granted granted Critical
Publication of DK0453758T3 publication Critical patent/DK0453758T3/en

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/2205—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested
    • G06F11/2236—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested to test CPU or processors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/2806—Apparatus therefor, e.g. test stations, drivers, analysers, conveyors
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
    • G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
    • G11C29/18—Address generation devices; Devices for accessing memories, e.g. details of addressing circuits
    • G11C29/24—Accessing extra cells, e.g. dummy cells or redundant cells

Abstract

The system consists of test equipment fitted with a connecting unit and an integrated circuit incorporating at least one functional cell (1) and a test cell. The printed circuit comprises functional tracks (7, 8) and test tracks giving access respectively to the functional cell and the test cell. This test cell incorporates means for connecting an input and an output of the functional cell. The test tracks are suitable for an integrated circuit and the connecting unit giving access to each of the printed circuit tracks. The test cell also includes means for putting all the outputs from the functional cell to a high impedance state in response to a neutralising signal derived from the state of the test track. The system enables a printed circuit to be tested by the injection of signals through the connecting unit. <IMAGE>
DK91104175.4T 1990-03-23 1991-03-18 System containing integrated circuits for testing printed circuits and using this system for testing such a printed circuit DK0453758T3 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR9003754A FR2660071B1 (en) 1990-03-23 1990-03-23 SYSTEM FOR TESTING A PRINTED CIRCUIT PROVIDED WITH INTEGRATED CIRCUITS AND APPLICATION OF THIS SYSTEM TO TESTING SUCH A PRINTED CIRCUIT.

Publications (1)

Publication Number Publication Date
DK0453758T3 true DK0453758T3 (en) 1996-08-12

Family

ID=9395057

Family Applications (1)

Application Number Title Priority Date Filing Date
DK91104175.4T DK0453758T3 (en) 1990-03-23 1991-03-18 System containing integrated circuits for testing printed circuits and using this system for testing such a printed circuit

Country Status (9)

Country Link
EP (1) EP0453758B1 (en)
AT (1) ATE137595T1 (en)
DE (1) DE69119140T2 (en)
DK (1) DK0453758T3 (en)
ES (1) ES2087922T3 (en)
FI (1) FI911366A (en)
FR (1) FR2660071B1 (en)
GR (1) GR3020493T3 (en)
NO (1) NO302446B1 (en)

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
AU8963582A (en) * 1981-10-30 1983-05-05 Honeywell Information Systems Incorp. Design and testing electronic components
JPS62220879A (en) * 1986-03-22 1987-09-29 Hitachi Ltd Semiconductor device
JPH01259274A (en) * 1988-04-08 1989-10-16 Fujitsu Ltd Test system for integrated circuit
DE3839289C1 (en) * 1988-11-21 1990-05-23 Fraunhofer-Gesellschaft Zur Foerderung Der Angewandten Forschung Ev, 8000 Muenchen, De Circuit for the operation of an integrated circuit of which it is a component, optionally in a test operation mode or a functional operation mode

Also Published As

Publication number Publication date
FR2660071B1 (en) 1992-07-24
DE69119140T2 (en) 1996-08-14
FI911366A0 (en) 1991-03-20
ATE137595T1 (en) 1996-05-15
FI911366A (en) 1991-09-24
NO302446B1 (en) 1998-03-02
EP0453758B1 (en) 1996-05-01
DE69119140D1 (en) 1996-06-05
EP0453758A1 (en) 1991-10-30
FR2660071A1 (en) 1991-09-27
NO911131D0 (en) 1991-03-21
GR3020493T3 (en) 1996-10-31
NO911131L (en) 1991-09-24
ES2087922T3 (en) 1996-08-01

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