ATE183012T1 - Informationsverarbeitungsgerät mit multisondensteuerung - Google Patents

Informationsverarbeitungsgerät mit multisondensteuerung

Info

Publication number
ATE183012T1
ATE183012T1 AT93114502T AT93114502T ATE183012T1 AT E183012 T1 ATE183012 T1 AT E183012T1 AT 93114502 T AT93114502 T AT 93114502T AT 93114502 T AT93114502 T AT 93114502T AT E183012 T1 ATE183012 T1 AT E183012T1
Authority
AT
Austria
Prior art keywords
circuit
information processing
processing device
probe control
detection circuit
Prior art date
Application number
AT93114502T
Other languages
English (en)
Inventor
Takahiro Oguchi
Katsunori Hatanaka
Kunihiro Sakai
Akihiko Yamano
Shunichi Shido
Original Assignee
Canon Kk
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Canon Kk filed Critical Canon Kk
Application granted granted Critical
Publication of ATE183012T1 publication Critical patent/ATE183012T1/de

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
    • G11B9/00—Recording or reproducing using a method not covered by one of the main groups G11B3/00 - G11B7/00; Record carriers therefor
    • G11B9/12—Recording or reproducing using a method not covered by one of the main groups G11B3/00 - G11B7/00; Record carriers therefor using near-field interactions; Record carriers therefor
    • G11B9/14—Recording or reproducing using a method not covered by one of the main groups G11B3/00 - G11B7/00; Record carriers therefor using near-field interactions; Record carriers therefor using microscopic probe means, i.e. recording or reproducing by means directly associated with the tip of a microscopic electrical probe as used in Scanning Tunneling Microscopy [STM] or Atomic Force Microscopy [AFM] for inducing physical or electrical perturbations in a recording medium; Record carriers or media specially adapted for such transducing of information
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B82—NANOTECHNOLOGY
    • B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
    • B82Y10/00—Nanotechnology for information processing, storage or transmission, e.g. quantum computing or single electron logic
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q70/00—General aspects of SPM probes, their manufacture or their related instrumentation, insofar as they are not specially adapted to a single SPM technique covered by group G01Q60/00
    • G01Q70/06—Probe tip arrays
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q80/00—Applications, other than SPM, of scanning-probe techniques
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S977/00—Nanotechnology
    • Y10S977/84—Manufacture, treatment, or detection of nanostructure
    • Y10S977/849—Manufacture, treatment, or detection of nanostructure with scanning probe
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S977/00—Nanotechnology
    • Y10S977/84—Manufacture, treatment, or detection of nanostructure
    • Y10S977/849—Manufacture, treatment, or detection of nanostructure with scanning probe
    • Y10S977/86—Scanning probe structure
    • Y10S977/861—Scanning tunneling probe
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S977/00—Nanotechnology
    • Y10S977/84—Manufacture, treatment, or detection of nanostructure
    • Y10S977/849—Manufacture, treatment, or detection of nanostructure with scanning probe
    • Y10S977/86—Scanning probe structure
    • Y10S977/874—Probe tip array
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S977/00—Nanotechnology
    • Y10S977/902—Specified use of nanostructure
    • Y10S977/932—Specified use of nanostructure for electronic or optoelectronic application
    • Y10S977/943—Information storage or retrieval using nanostructure
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S977/00—Nanotechnology
    • Y10S977/902—Specified use of nanostructure
    • Y10S977/932—Specified use of nanostructure for electronic or optoelectronic application
    • Y10S977/953—Detector using nanostructure

Landscapes

  • Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Ultra Sonic Daignosis Equipment (AREA)
  • Measuring Pulse, Heart Rate, Blood Pressure Or Blood Flow (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Hardware Redundancy (AREA)
  • Communication Control (AREA)
AT93114502T 1992-09-10 1993-09-09 Informationsverarbeitungsgerät mit multisondensteuerung ATE183012T1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP24224692 1992-09-10
JP21312093A JP3246987B2 (ja) 1992-09-10 1993-08-27 マルチプローブ制御回路を具備する情報処理装置

Publications (1)

Publication Number Publication Date
ATE183012T1 true ATE183012T1 (de) 1999-08-15

Family

ID=26519619

Family Applications (1)

Application Number Title Priority Date Filing Date
AT93114502T ATE183012T1 (de) 1992-09-10 1993-09-09 Informationsverarbeitungsgerät mit multisondensteuerung

Country Status (5)

Country Link
US (1) US5471458A (de)
EP (1) EP0587165B1 (de)
JP (1) JP3246987B2 (de)
AT (1) ATE183012T1 (de)
DE (1) DE69325860T2 (de)

Families Citing this family (39)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
ES2137167T3 (es) * 1991-07-17 1999-12-16 Canon Kk Aparato para la grabacion/reproduccion de informaciones, para la grabacion y/o reproduccion de informaciones sobre un soporte para grabacion de informaciones por medio de un electrodo sonda.
JP2923190B2 (ja) * 1993-12-16 1999-07-26 シャープ株式会社 高密度記録媒体及びその記録再生装置
US5751683A (en) 1995-07-24 1998-05-12 General Nanotechnology, L.L.C. Nanometer scale data storage device and associated positioning system
US6353219B1 (en) 1994-07-28 2002-03-05 Victor B. Kley Object inspection and/or modification system and method
US6337479B1 (en) 1994-07-28 2002-01-08 Victor B. Kley Object inspection and/or modification system and method
US6339217B1 (en) * 1995-07-28 2002-01-15 General Nanotechnology Llc Scanning probe microscope assembly and method for making spectrophotometric, near-field, and scanning probe measurements
JP3716467B2 (ja) * 1995-07-19 2005-11-16 ソニー株式会社 記録媒体並びに情報再生装置、情報記録装置及び情報記録再生装置
US6014032A (en) * 1997-09-30 2000-01-11 International Business Machines Corporation Micro probe ring assembly and method of fabrication
US6923044B1 (en) 2001-03-08 2005-08-02 General Nanotechnology Llc Active cantilever for nanomachining and metrology
US6787768B1 (en) 2001-03-08 2004-09-07 General Nanotechnology Llc Method and apparatus for tool and tip design for nanomachining and measurement
US6752008B1 (en) 2001-03-08 2004-06-22 General Nanotechnology Llc Method and apparatus for scanning in scanning probe microscopy and presenting results
US6802646B1 (en) 2001-04-30 2004-10-12 General Nanotechnology Llc Low-friction moving interfaces in micromachines and nanomachines
US7196328B1 (en) 2001-03-08 2007-03-27 General Nanotechnology Llc Nanomachining method and apparatus
US7260051B1 (en) 1998-12-18 2007-08-21 Nanochip, Inc. Molecular memory medium and molecular memory integrated circuit
AU6061100A (en) 1999-07-01 2001-01-22 General Nanotechnology, Llc Object inspection and/or modification system and method
US6931710B2 (en) 2001-01-30 2005-08-23 General Nanotechnology Llc Manufacturing of micro-objects such as miniature diamond tool tips
US7253407B1 (en) 2001-03-08 2007-08-07 General Nanotechnology Llc Active cantilever for nanomachining and metrology
US7053369B1 (en) 2001-10-19 2006-05-30 Rave Llc Scan data collection for better overall data accuracy
US6813937B2 (en) 2001-11-28 2004-11-09 General Nanotechnology Llc Method and apparatus for micromachines, microstructures, nanomachines and nanostructures
JP2005538855A (ja) 2002-09-09 2005-12-22 ジェネラル ナノテクノロジー エルエルシー 走査型プローブ顕微鏡の流体送達
US6985377B2 (en) 2002-10-15 2006-01-10 Nanochip, Inc. Phase change media for high density data storage
US7233517B2 (en) 2002-10-15 2007-06-19 Nanochip, Inc. Atomic probes and media for high density data storage
US20040150472A1 (en) * 2002-10-15 2004-08-05 Rust Thomas F. Fault tolerant micro-electro mechanical actuators
US6982898B2 (en) * 2002-10-15 2006-01-03 Nanochip, Inc. Molecular memory integrated circuit utilizing non-vibrating cantilevers
KR100506094B1 (ko) * 2003-05-22 2005-08-04 삼성전자주식회사 탐침을 이용한 정보저장장치의 위치 검출 시스템 및 그 방법
US7379412B2 (en) 2004-04-16 2008-05-27 Nanochip, Inc. Methods for writing and reading highly resolved domains for high density data storage
US20050232061A1 (en) 2004-04-16 2005-10-20 Rust Thomas F Systems for writing and reading highly resolved domains for high density data storage
US7301887B2 (en) 2004-04-16 2007-11-27 Nanochip, Inc. Methods for erasing bit cells in a high density data storage device
KR100580651B1 (ko) * 2004-06-03 2006-05-16 삼성전자주식회사 프로브를 이용한 정보저장시스템의 위치오차 검출 장치 및방법, 이를 이용한 정보저장시스템의 정보 추종 장치 및방법
US7463573B2 (en) 2005-06-24 2008-12-09 Nanochip, Inc. Patterned media for a high density data storage device
US7367119B2 (en) 2005-06-24 2008-05-06 Nanochip, Inc. Method for forming a reinforced tip for a probe storage device
US7309630B2 (en) 2005-07-08 2007-12-18 Nanochip, Inc. Method for forming patterned media for a high density data storage device
US7797757B2 (en) * 2006-08-15 2010-09-14 Georgia Tech Research Corporation Cantilevers with integrated actuators for probe microscopy
US20090009906A1 (en) * 2007-07-02 2009-01-08 Seagate Technology Llc Transducer Assembly and Data Storage Device Including the Transducer Assembly
US7889627B2 (en) * 2007-11-05 2011-02-15 Seagate Technology Llc Preload modulation to reduce head motion hysteresis
US9909993B2 (en) * 2014-12-15 2018-03-06 Arizona Board Of Regents On Behalf Of Arizona State University Label-free detection of small and large molecule interactions, and activities in biological systems
AT519893B1 (de) * 2017-05-03 2020-01-15 Univ Linz Verfahren zum Kalibrieren eines heterodynen elektrostatischen Kraftmikroskops
PL234864B1 (pl) * 2017-11-08 2020-04-30 Kantoch Eliasz Sposób i urządzenie do pomiaru i sygnalizacji wartości biosygnałów
CN111491432A (zh) * 2020-05-22 2020-08-04 安徽理工大学 一种多通道切换朗缪尔探针测量系统

Family Cites Families (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6180536A (ja) * 1984-09-14 1986-04-24 ゼロツクス　コーポレーシヨン 原子規模密度情報記緑および読出し装置並びに方法
DE3633679A1 (de) * 1986-10-03 1988-04-14 Bosch Gmbh Robert Schaltunganordung zur beeinflussung von signalen
DE3786645T2 (de) * 1986-12-10 1994-02-17 Accu Ray Corp Apparat zur Vorbehandlung von Messdaten.
JPH0798463B2 (ja) * 1986-12-15 1995-10-25 東急車輌製造株式会社 コンテナ自動車のコンテナ自力脱着装置
JP2556491B2 (ja) * 1986-12-24 1996-11-20 キヤノン株式会社 記録装置及び記録法
JP2557964B2 (ja) * 1988-01-22 1996-11-27 インターナシヨナル・ビジネス・マシーンズ・コーポレイーシヨン データ記憶装置
JP2936545B2 (ja) * 1988-06-24 1999-08-23 株式会社日立製作所 走査プローブ顕微鏡
JP2896794B2 (ja) * 1988-09-30 1999-05-31 キヤノン株式会社 走査型トンネル電流検出装置，走査型トンネル顕微鏡，及び記録再生装置
DE3850968T2 (de) * 1988-10-14 1995-03-16 Ibm Abstandsgesteuerter Tunneleffektwandler und den Wandler verwendende Speichereinheit mit direktem Zugriff.
JPH02295050A (ja) * 1989-05-09 1990-12-05 Olympus Optical Co Ltd μ―ＳＴＭを用いた回路パターン作製装置および回路パターン作製方法
EP0416920B1 (de) * 1989-09-07 1996-01-03 Canon Kabushiki Kaisha Informationsverarbeitungsverfahren und -vorrichtung
US5237859A (en) * 1989-12-08 1993-08-24 Digital Instruments, Inc. Atomic force microscope
JPH041948A (ja) * 1990-04-18 1992-01-07 Canon Inc 情報記録装置及び情報再生装置及び情報記録再生装置
JP2783672B2 (ja) * 1990-11-13 1998-08-06 キヤノン株式会社 情報記録及び／又は再生方法と情報記録及び／又は再生装置
JP3126409B2 (ja) * 1991-06-05 2001-01-22 キヤノン株式会社 情報記録再生方法
CA2076925C (en) * 1991-08-29 1999-08-31 Kunihiro Sakai Information processing apparatus and scanning tunnel microscope

Also Published As

Publication number Publication date
DE69325860D1 (de) 1999-09-09
JP3246987B2 (ja) 2002-01-15
DE69325860T2 (de) 2000-03-09
EP0587165A2 (de) 1994-03-16
US5471458A (en) 1995-11-28
EP0587165B1 (de) 1999-08-04
EP0587165A3 (de) 1995-01-25
JPH06208735A (ja) 1994-07-26

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Legal Events

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RER Ceased as to paragraph 5 lit. 3 law introducing patent treaties