ZA811935B - Process and device for the contact free measurement of a dimension - Google Patents
Process and device for the contact free measurement of a dimensionInfo
- Publication number
- ZA811935B ZA811935B ZA00811935A ZA811935A ZA811935B ZA 811935 B ZA811935 B ZA 811935B ZA 00811935 A ZA00811935 A ZA 00811935A ZA 811935 A ZA811935 A ZA 811935A ZA 811935 B ZA811935 B ZA 811935B
- Authority
- ZA
- South Africa
- Prior art keywords
- dimension
- free measurement
- contact free
- measurement
- contact
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/08—Measuring arrangements characterised by the use of optical techniques for measuring diameters
- G01B11/10—Measuring arrangements characterised by the use of optical techniques for measuring diameters of objects while moving
- G01B11/105—Measuring arrangements characterised by the use of optical techniques for measuring diameters of objects while moving using photoelectric detection means
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
- G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
- G01B11/0691—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of objects while moving
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Length Measuring Devices With Unspecified Measuring Means (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CH231480A CH645462A5 (de) | 1980-03-25 | 1980-03-25 | Verfahren und vorrichtung zur beruehrungslosen messung einer dimension mindestens eines objekts. |
Publications (1)
Publication Number | Publication Date |
---|---|
ZA811935B true ZA811935B (en) | 1982-04-28 |
Family
ID=4230897
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
ZA00811935A ZA811935B (en) | 1980-03-25 | 1981-03-23 | Process and device for the contact free measurement of a dimension |
Country Status (11)
Country | Link |
---|---|
JP (1) | JPS56150302A (fr) |
AU (1) | AU538202B2 (fr) |
BE (1) | BE888013A (fr) |
CA (1) | CA1168437A (fr) |
CH (1) | CH645462A5 (fr) |
DE (1) | DE3111356A1 (fr) |
ES (1) | ES8203150A1 (fr) |
FR (1) | FR2479447B1 (fr) |
GB (1) | GB2072840B (fr) |
IT (1) | IT1135714B (fr) |
ZA (1) | ZA811935B (fr) |
Families Citing this family (18)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5937405A (ja) * | 1982-08-26 | 1984-02-29 | Mitsutoyo Mfg Co Ltd | 光電式測定装置 |
JPS6134410A (ja) * | 1984-07-26 | 1986-02-18 | Mitsutoyo Mfg Co Ltd | 光学測定装置 |
US4730116A (en) * | 1985-08-06 | 1988-03-08 | Mitsubishi Denki Kabushiki Kaisha | Sheet thickness measuring apparatus by optical scanning |
JPS6249202A (ja) * | 1985-08-28 | 1987-03-03 | Mitsutoyo Mfg Corp | 光学式測定装置 |
CH672184A5 (fr) * | 1985-12-17 | 1989-10-31 | Manfred Meyer | |
CH674774A5 (fr) * | 1986-04-03 | 1990-07-13 | Zumbach Electronic Ag | |
DE3713109A1 (de) * | 1987-04-16 | 1988-11-03 | Limess Licht Messtechnik Gmbh | Vorrichtung zum vermessen von werkstuecken |
KR920004750B1 (ko) * | 1988-01-19 | 1992-06-15 | 미쓰비시전기 주식회사 | 막(膜)두께 측정방법 |
DE3815011A1 (de) * | 1988-04-30 | 1989-11-16 | Leybold Ag | Einrichtung zum zerstoerungsfreien messen des ohmschen widerstands duenner schichten |
DE3816322A1 (de) * | 1988-05-13 | 1989-11-23 | Udo Dr Ing Tutschke | Verfahren und vorrichtung zur beruehrungslosen messung der aussenabmessungen von koerpern |
GB8816346D0 (en) * | 1988-07-08 | 1988-08-10 | Kyriakis J | Apparatus for monitoring product in hostile environment |
DE3824820A1 (de) * | 1988-07-21 | 1990-01-25 | Gebhard Birkle | Geraet zum beruehrungslosen optischen bestimmen von geometrischen abmessungen eines objektes |
DE4024849A1 (de) * | 1990-08-06 | 1992-02-13 | Horn Hannes Dr Schulze | Digitales verfahren zur ermittlung von abmessungen von gegenstaenden |
DE9013559U1 (de) * | 1990-09-27 | 1990-12-06 | Mesacon Gesellschaft für Meßtechnik mbH, 4600 Dortmund | Optisches Gerät zur Messung der Geschwindigkeit oder Länge einer bewegten Oberfläche |
FR2678727A1 (fr) * | 1991-07-04 | 1993-01-08 | Tabacs & Allumettes Ind | Procede et dispositif de calibrage, en particulier de cigarettes, mettant en óoeuvre la determination du temps d'interception d'un faisceau laser. |
DE4201385A1 (de) * | 1992-01-21 | 1993-07-22 | Peter Dipl Ing Renner | Optisches messsystem |
DE19516154A1 (de) * | 1995-05-03 | 1996-11-14 | Hell Ag Linotype | Vorrichtung zur Positionserfassung von rotierenden Objekten |
US9797710B2 (en) | 2013-09-16 | 2017-10-24 | Steinfurth Mess-Systeme GmbH | Method and device for establishing a geometry of a container for packaging a flowable medium |
Family Cites Families (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE1191591B (de) * | 1958-01-17 | 1965-04-22 | Licentia Gmbh | Verfahren zum fotoelektrischen Bestimmen der relativen Lage wenigstens einer Kante eines Objektes |
JPS5335569A (en) * | 1976-09-14 | 1978-04-03 | Asahi Glass Co Ltd | Method of measuring outer diameter of transparent substance |
US4097849A (en) * | 1976-09-27 | 1978-06-27 | Systems Research Laboratories, Inc. | Electronic comparator for process control |
US4082463A (en) * | 1977-01-06 | 1978-04-04 | Systems Research Laboratories, Inc. | Calibrated optical micrometer |
JPS53119079A (en) * | 1977-03-26 | 1978-10-18 | Tatsu Akutsu | Measuring method of diameter of running filamentous articles |
US4168126A (en) * | 1977-07-05 | 1979-09-18 | Altman Associates, Inc. | Electro-optical measuring system using precision light translator |
-
1980
- 1980-03-25 CH CH231480A patent/CH645462A5/de not_active IP Right Cessation
-
1981
- 1981-03-18 CA CA000373326A patent/CA1168437A/fr not_active Expired
- 1981-03-18 FR FR8105566A patent/FR2479447B1/fr not_active Expired
- 1981-03-19 BE BE1/10179A patent/BE888013A/fr not_active IP Right Cessation
- 1981-03-20 AU AU68585/81A patent/AU538202B2/en not_active Ceased
- 1981-03-23 DE DE19813111356 patent/DE3111356A1/de active Granted
- 1981-03-23 GB GB8108947A patent/GB2072840B/en not_active Expired
- 1981-03-23 ZA ZA00811935A patent/ZA811935B/xx unknown
- 1981-03-24 IT IT20686/81A patent/IT1135714B/it active
- 1981-03-25 ES ES500695A patent/ES8203150A1/es not_active Expired
- 1981-03-25 JP JP4258181A patent/JPS56150302A/ja active Pending
Also Published As
Publication number | Publication date |
---|---|
GB2072840A (en) | 1981-10-07 |
BE888013A (fr) | 1981-07-16 |
CA1168437A (fr) | 1984-06-05 |
FR2479447A1 (fr) | 1981-10-02 |
CH645462A5 (de) | 1984-09-28 |
ES500695A0 (es) | 1982-03-01 |
AU6858581A (en) | 1981-10-01 |
GB2072840B (en) | 1983-11-09 |
IT1135714B (it) | 1986-08-27 |
FR2479447B1 (fr) | 1986-06-27 |
ES8203150A1 (es) | 1982-03-01 |
DE3111356A1 (de) | 1982-03-25 |
DE3111356C2 (fr) | 1988-05-11 |
AU538202B2 (en) | 1984-08-02 |
JPS56150302A (en) | 1981-11-20 |
IT8120686A0 (it) | 1981-03-24 |
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