ZA811935B - Process and device for the contact free measurement of a dimension - Google Patents

Process and device for the contact free measurement of a dimension

Info

Publication number
ZA811935B
ZA811935B ZA00811935A ZA811935A ZA811935B ZA 811935 B ZA811935 B ZA 811935B ZA 00811935 A ZA00811935 A ZA 00811935A ZA 811935 A ZA811935 A ZA 811935A ZA 811935 B ZA811935 B ZA 811935B
Authority
ZA
South Africa
Prior art keywords
dimension
free measurement
contact free
measurement
contact
Prior art date
Application number
ZA00811935A
Other languages
English (en)
Inventor
Urs Peter Studer
Original Assignee
Zumbach Electronic Ag
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Zumbach Electronic Ag filed Critical Zumbach Electronic Ag
Publication of ZA811935B publication Critical patent/ZA811935B/xx

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/08—Measuring arrangements characterised by the use of optical techniques for measuring diameters
    • G01B11/10—Measuring arrangements characterised by the use of optical techniques for measuring diameters of objects while moving
    • G01B11/105—Measuring arrangements characterised by the use of optical techniques for measuring diameters of objects while moving using photoelectric detection means
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
    • G01B11/0691—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of objects while moving

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
ZA00811935A 1980-03-25 1981-03-23 Process and device for the contact free measurement of a dimension ZA811935B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CH231480A CH645462A5 (de) 1980-03-25 1980-03-25 Verfahren und vorrichtung zur beruehrungslosen messung einer dimension mindestens eines objekts.

Publications (1)

Publication Number Publication Date
ZA811935B true ZA811935B (en) 1982-04-28

Family

ID=4230897

Family Applications (1)

Application Number Title Priority Date Filing Date
ZA00811935A ZA811935B (en) 1980-03-25 1981-03-23 Process and device for the contact free measurement of a dimension

Country Status (11)

Country Link
JP (1) JPS56150302A (fr)
AU (1) AU538202B2 (fr)
BE (1) BE888013A (fr)
CA (1) CA1168437A (fr)
CH (1) CH645462A5 (fr)
DE (1) DE3111356A1 (fr)
ES (1) ES8203150A1 (fr)
FR (1) FR2479447B1 (fr)
GB (1) GB2072840B (fr)
IT (1) IT1135714B (fr)
ZA (1) ZA811935B (fr)

Families Citing this family (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5937405A (ja) * 1982-08-26 1984-02-29 Mitsutoyo Mfg Co Ltd 光電式測定装置
JPS6134410A (ja) * 1984-07-26 1986-02-18 Mitsutoyo Mfg Co Ltd 光学測定装置
US4730116A (en) * 1985-08-06 1988-03-08 Mitsubishi Denki Kabushiki Kaisha Sheet thickness measuring apparatus by optical scanning
JPS6249202A (ja) * 1985-08-28 1987-03-03 Mitsutoyo Mfg Corp 光学式測定装置
CH672184A5 (fr) * 1985-12-17 1989-10-31 Manfred Meyer
CH674774A5 (fr) * 1986-04-03 1990-07-13 Zumbach Electronic Ag
DE3713109A1 (de) * 1987-04-16 1988-11-03 Limess Licht Messtechnik Gmbh Vorrichtung zum vermessen von werkstuecken
KR920004750B1 (ko) * 1988-01-19 1992-06-15 미쓰비시전기 주식회사 막(膜)두께 측정방법
DE3815011A1 (de) * 1988-04-30 1989-11-16 Leybold Ag Einrichtung zum zerstoerungsfreien messen des ohmschen widerstands duenner schichten
DE3816322A1 (de) * 1988-05-13 1989-11-23 Udo Dr Ing Tutschke Verfahren und vorrichtung zur beruehrungslosen messung der aussenabmessungen von koerpern
GB8816346D0 (en) * 1988-07-08 1988-08-10 Kyriakis J Apparatus for monitoring product in hostile environment
DE3824820A1 (de) * 1988-07-21 1990-01-25 Gebhard Birkle Geraet zum beruehrungslosen optischen bestimmen von geometrischen abmessungen eines objektes
DE4024849A1 (de) * 1990-08-06 1992-02-13 Horn Hannes Dr Schulze Digitales verfahren zur ermittlung von abmessungen von gegenstaenden
DE9013559U1 (fr) * 1990-09-27 1990-12-06 Mesacon Gesellschaft Fuer Messtechnik Mbh, 4600 Dortmund, De
FR2678727A1 (fr) * 1991-07-04 1993-01-08 Tabacs & Allumettes Ind Procede et dispositif de calibrage, en particulier de cigarettes, mettant en óoeuvre la determination du temps d'interception d'un faisceau laser.
DE4201385A1 (de) * 1992-01-21 1993-07-22 Peter Dipl Ing Renner Optisches messsystem
DE19516154A1 (de) * 1995-05-03 1996-11-14 Hell Ag Linotype Vorrichtung zur Positionserfassung von rotierenden Objekten
EP3047232B1 (fr) 2013-09-16 2022-04-06 Steinfurth Mess-Systeme GmbH Procédé et dispositif de détermination de la géométrie d'un contenant destiné à l'emballage d'une substance liquide

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE1191591B (de) * 1958-01-17 1965-04-22 Licentia Gmbh Verfahren zum fotoelektrischen Bestimmen der relativen Lage wenigstens einer Kante eines Objektes
JPS5335569A (en) * 1976-09-14 1978-04-03 Asahi Glass Co Ltd Method of measuring outer diameter of transparent substance
US4097849A (en) * 1976-09-27 1978-06-27 Systems Research Laboratories, Inc. Electronic comparator for process control
US4082463A (en) * 1977-01-06 1978-04-04 Systems Research Laboratories, Inc. Calibrated optical micrometer
JPS53119079A (en) * 1977-03-26 1978-10-18 Tatsu Akutsu Measuring method of diameter of running filamentous articles
US4168126A (en) * 1977-07-05 1979-09-18 Altman Associates, Inc. Electro-optical measuring system using precision light translator

Also Published As

Publication number Publication date
ES500695A0 (es) 1982-03-01
AU538202B2 (en) 1984-08-02
IT8120686A0 (it) 1981-03-24
IT1135714B (it) 1986-08-27
DE3111356C2 (fr) 1988-05-11
ES8203150A1 (es) 1982-03-01
JPS56150302A (en) 1981-11-20
FR2479447A1 (fr) 1981-10-02
GB2072840A (en) 1981-10-07
CA1168437A (fr) 1984-06-05
GB2072840B (en) 1983-11-09
FR2479447B1 (fr) 1986-06-27
AU6858581A (en) 1981-10-01
DE3111356A1 (de) 1982-03-25
BE888013A (fr) 1981-07-16
CH645462A5 (de) 1984-09-28

Similar Documents

Publication Publication Date Title
DE3071910D1 (en) Dimension measuring apparatus
GB2089323B (en) Measuring device
JPS57107046A (en) Article inspecting device
ZA811935B (en) Process and device for the contact free measurement of a dimension
JPS56108906A (en) Dislocation measuring device
GB2088062B (en) Process and apparatus for measuring the ovalisation of a pipe
GB2016710A (en) Device and method for measuring surface properties
JPS5710444A (en) Measuring device
ZA812985B (en) Process and device for the measurement of a dimension of a object located in a liquid
JPS55103403A (en) Method and device for measuring distance
DE2965496D1 (en) Solid surface detecting and measuring device and method
JPS5571902A (en) Dimension measuring device
JPS54164193A (en) Method and device for measuring surface tension
JPS5717803A (en) Measuring device
JPS5746126A (en) Device for measuring mass and force
JPS5694285A (en) Method and device for dopplerrradar measurement
JPS56604A (en) Method and device for measuring distance or thickness without contact
JPS5689677A (en) Contacting stopping device
JPS56119849A (en) Surface inspecting device
GB2060907B (en) Process for the measurement of the specific capacity of a cable and a device for carrying out the process
JPS5771039A (en) Device for sensing contact
DE2961258D1 (en) Method and device for detecting the presence of one or more mfc-frequencies within a pcm-signal
JPS56162107A (en) Interval measuring device
JPS56109642A (en) Measuring device for pressureepulsation
JPS54108695A (en) Method and device for measuring antigennantibody reaction