IT8120686A0 - Procedimento e dispositivo per la misura senza contatto di una dimensione. - Google Patents

Procedimento e dispositivo per la misura senza contatto di una dimensione.

Info

Publication number
IT8120686A0
IT8120686A0 IT8120686A IT2068681A IT8120686A0 IT 8120686 A0 IT8120686 A0 IT 8120686A0 IT 8120686 A IT8120686 A IT 8120686A IT 2068681 A IT2068681 A IT 2068681A IT 8120686 A0 IT8120686 A0 IT 8120686A0
Authority
IT
Italy
Prior art keywords
dimension
procedure
contact measurement
measurement
contact
Prior art date
Application number
IT8120686A
Other languages
English (en)
Other versions
IT1135714B (it
Inventor
Urs Peter Studer
Original Assignee
Zumbach Electronic Ag
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Zumbach Electronic Ag filed Critical Zumbach Electronic Ag
Publication of IT8120686A0 publication Critical patent/IT8120686A0/it
Application granted granted Critical
Publication of IT1135714B publication Critical patent/IT1135714B/it

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/08—Measuring arrangements characterised by the use of optical techniques for measuring diameters
    • G01B11/10—Measuring arrangements characterised by the use of optical techniques for measuring diameters of objects while moving
    • G01B11/105—Measuring arrangements characterised by the use of optical techniques for measuring diameters of objects while moving using photoelectric detection means
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
    • G01B11/0691—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of objects while moving

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
IT20686/81A 1980-03-25 1981-03-24 Procedimento e dispositivo per la misura senza contatto di una dimensione IT1135714B (it)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CH231480A CH645462A5 (de) 1980-03-25 1980-03-25 Verfahren und vorrichtung zur beruehrungslosen messung einer dimension mindestens eines objekts.

Publications (2)

Publication Number Publication Date
IT8120686A0 true IT8120686A0 (it) 1981-03-24
IT1135714B IT1135714B (it) 1986-08-27

Family

ID=4230897

Family Applications (1)

Application Number Title Priority Date Filing Date
IT20686/81A IT1135714B (it) 1980-03-25 1981-03-24 Procedimento e dispositivo per la misura senza contatto di una dimensione

Country Status (11)

Country Link
JP (1) JPS56150302A (it)
AU (1) AU538202B2 (it)
BE (1) BE888013A (it)
CA (1) CA1168437A (it)
CH (1) CH645462A5 (it)
DE (1) DE3111356A1 (it)
ES (1) ES8203150A1 (it)
FR (1) FR2479447B1 (it)
GB (1) GB2072840B (it)
IT (1) IT1135714B (it)
ZA (1) ZA811935B (it)

Families Citing this family (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5937405A (ja) * 1982-08-26 1984-02-29 Mitsutoyo Mfg Co Ltd 光電式測定装置
JPS6134410A (ja) * 1984-07-26 1986-02-18 Mitsutoyo Mfg Co Ltd 光学測定装置
US4730116A (en) * 1985-08-06 1988-03-08 Mitsubishi Denki Kabushiki Kaisha Sheet thickness measuring apparatus by optical scanning
JPS6249202A (ja) * 1985-08-28 1987-03-03 Mitsutoyo Mfg Corp 光学式測定装置
CH672184A5 (it) * 1985-12-17 1989-10-31 Manfred Meyer
CH674774A5 (it) * 1986-04-03 1990-07-13 Zumbach Electronic Ag
DE3713109A1 (de) * 1987-04-16 1988-11-03 Limess Licht Messtechnik Gmbh Vorrichtung zum vermessen von werkstuecken
KR920004750B1 (ko) * 1988-01-19 1992-06-15 미쓰비시전기 주식회사 막(膜)두께 측정방법
DE3815011A1 (de) * 1988-04-30 1989-11-16 Leybold Ag Einrichtung zum zerstoerungsfreien messen des ohmschen widerstands duenner schichten
DE3816322A1 (de) * 1988-05-13 1989-11-23 Udo Dr Ing Tutschke Verfahren und vorrichtung zur beruehrungslosen messung der aussenabmessungen von koerpern
GB8816346D0 (en) * 1988-07-08 1988-08-10 Kyriakis J Apparatus for monitoring product in hostile environment
DE3824820A1 (de) * 1988-07-21 1990-01-25 Gebhard Birkle Geraet zum beruehrungslosen optischen bestimmen von geometrischen abmessungen eines objektes
DE4024849A1 (de) * 1990-08-06 1992-02-13 Horn Hannes Dr Schulze Digitales verfahren zur ermittlung von abmessungen von gegenstaenden
DE9013559U1 (it) * 1990-09-27 1990-12-06 Mesacon Gesellschaft Fuer Messtechnik Mbh, 4600 Dortmund, De
FR2678727A1 (fr) * 1991-07-04 1993-01-08 Tabacs & Allumettes Ind Procede et dispositif de calibrage, en particulier de cigarettes, mettant en óoeuvre la determination du temps d'interception d'un faisceau laser.
DE4201385A1 (de) * 1992-01-21 1993-07-22 Peter Dipl Ing Renner Optisches messsystem
DE19516154A1 (de) * 1995-05-03 1996-11-14 Hell Ag Linotype Vorrichtung zur Positionserfassung von rotierenden Objekten
EP3047232B1 (de) 2013-09-16 2022-04-06 Steinfurth Mess-Systeme GmbH Verfahren und vorrichtung zur ermittlung einer geometrie eines behältnisses zur verpackung eines fliessfähigen mediums

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE1191591B (de) * 1958-01-17 1965-04-22 Licentia Gmbh Verfahren zum fotoelektrischen Bestimmen der relativen Lage wenigstens einer Kante eines Objektes
JPS5335569A (en) * 1976-09-14 1978-04-03 Asahi Glass Co Ltd Method of measuring outer diameter of transparent substance
US4097849A (en) * 1976-09-27 1978-06-27 Systems Research Laboratories, Inc. Electronic comparator for process control
US4082463A (en) * 1977-01-06 1978-04-04 Systems Research Laboratories, Inc. Calibrated optical micrometer
JPS53119079A (en) * 1977-03-26 1978-10-18 Tatsu Akutsu Measuring method of diameter of running filamentous articles
US4168126A (en) * 1977-07-05 1979-09-18 Altman Associates, Inc. Electro-optical measuring system using precision light translator

Also Published As

Publication number Publication date
AU6858581A (en) 1981-10-01
BE888013A (fr) 1981-07-16
GB2072840A (en) 1981-10-07
ES500695A0 (es) 1982-03-01
AU538202B2 (en) 1984-08-02
CA1168437A (en) 1984-06-05
GB2072840B (en) 1983-11-09
DE3111356C2 (it) 1988-05-11
JPS56150302A (en) 1981-11-20
CH645462A5 (de) 1984-09-28
IT1135714B (it) 1986-08-27
DE3111356A1 (de) 1982-03-25
FR2479447A1 (fr) 1981-10-02
FR2479447B1 (fr) 1986-06-27
ES8203150A1 (es) 1982-03-01
ZA811935B (en) 1982-04-28

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Legal Events

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TA Fee payment date (situation as of event date), data collected since 19931001

Effective date: 19970326